CN220340092U - Special clamp for scanning electron microscope for circular titanium sheet section fracture sample - Google Patents
Special clamp for scanning electron microscope for circular titanium sheet section fracture sample Download PDFInfo
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- CN220340092U CN220340092U CN202223060021.1U CN202223060021U CN220340092U CN 220340092 U CN220340092 U CN 220340092U CN 202223060021 U CN202223060021 U CN 202223060021U CN 220340092 U CN220340092 U CN 220340092U
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- electron microscope
- titanium sheet
- sample
- scanning electron
- special clamp
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- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 title claims abstract description 43
- 239000010936 titanium Substances 0.000 title claims abstract description 43
- 229910052719 titanium Inorganic materials 0.000 title claims abstract description 43
- 239000000853 adhesive Substances 0.000 claims description 8
- 230000001070 adhesive effect Effects 0.000 claims description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 239000010949 copper Substances 0.000 claims description 4
- 238000004458 analytical method Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 5
- 239000002121 nanofiber Substances 0.000 description 5
- 239000011248 coating agent Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 4
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 239000002086 nanomaterial Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Landscapes
- Sampling And Sample Adjustment (AREA)
Abstract
The utility model discloses a special clamp for a scanning electron microscope of a fracture sample with a circular titanium sheet section, which belongs to the technical field of clamping and fixing of the fracture sample with the circular titanium sheet section for the scanning electron microscope.
Description
Technical Field
The utility model is suitable for clamping and fixing a fracture sample with a circular titanium section special for a scanning electron microscope, and particularly relates to a special clamp for the scanning electron microscope for the fracture sample with the circular titanium section.
Background
In the field of material surface modification, interface combination and element distribution between a coating and a matrix are important basis for adjusting a surface treatment process, and detection and analysis of the cross section of a treated sample are the first tasks. The scanning electron microscope has high resolution, has the advantage that other equipment cannot replace the special processing sample surface and section microstructure and element composition, has high use frequency, and has high technical requirements on clamping and fixing the sample by electron microscope analysis.
For nanofiber coating, because of specific structural limitation, electron microscope analysis is needed on the premise of not damaging the nanostructure of the nanofiber coating, in the current stage, scanning electron microscope analysis is needed on a fracture sample of a round titanium sheet section, firstly, an embedding polishing method is used, the original state of the nanofiber is damaged, the obtained experimental data and the actual situation deviate greatly, secondly, one side of the fracture is adhered to the vertical wall of an electron microscope sample stage by using conductive adhesive, scanning electron microscope observation analysis is carried out, in order to ensure that the fracture of the measured section is parallel to the surface of the electron microscope sample stage, the leveling of the fracture of the measured section and the surface of the electron microscope sample stage can be realized only by a visual inspection method, the technical level and the tolerance of operators are required to be quite long, the fixation of the sample is quite time-consuming only by the way of the conductive adhesive, the stability is poor, the image easily has drifting phenomenon under the impact of the electron beam, and the reality of the experimental data and the definition of the electron microscope image are greatly influenced.
Meanwhile, before starting scanning analysis, the inside of the electron microscope needs to be vacuumized, when a certain vacuum degree requirement is met, the test can be started, and the sample is scanned and observed, and the preparation process needs about 40 minutes. The operation needs to be repeated once for each sample replacement, which results in complicated detection process and extremely low efficiency.
Based on the problems, the applicant develops a special clamp for the scanning electron microscope, which is specially used for a fracture sample with a circular titanium sheet section, and the clamp is simple in structure and strong in adaptability, and can avoid misoperation and time consumption when a sample is singly stuck and fixed on an electron microscope sample stage, improve the detection efficiency and ensure the image quality of the scanning electron microscope.
Disclosure of Invention
The utility model aims to design a novel special scanning electron microscope sample clamp for fracture of a circular titanium sheet section, and the clamp can load a plurality of fracture samples of the section at one time for electron microscope analysis, so that the scanning efficiency is remarkably improved; the quick leveling can be realized between the section fracture and the electron microscope sample stage, the electron beam bombards the sample section uniformly, the operation difficulty and the time consumption are reduced, and the scanning effect of the electron microscope is ensured.
A novel special scanning electron microscope sample clamp for a fracture of a circular titanium sheet section comprises a bolt supporting plate, a baffle, a profiling base and a flat head bolt. The bolt support plate and the baffle are connected with the profiling base through the common hexagon bolt, a bolt hole is formed in the center of the bolt support plate, the flat head bolt is in bolt fit with the bolt support plate and penetrates through the bolt hole, the distance between the bottom of the bolt and the baffle can be adjusted by screwing the flat head bolt, and the front and rear direction clamping of the titanium sheet sample is achieved. The profiling base is formed by horizontally arranging a semi-cylindrical groove penetrating through the whole body from the center of the upper surface of a rectangular red copper block, and the base is used as a carrier of a sample to be tested and a main body of a clamp, so that the limitation and the fixation of the vertical direction and the left-right direction of the titanium sheet section sample are realized. The semi-cylindrical groove size of the profiling base is based on the size and the number of the titanium sheet samples to be tested, the diameter of the semi-cylindrical bottom surface of the profiling base is increased by 0.2mm of fit clearance compared with the diameter of the titanium sheet samples, and the semi-cylindrical height, namely the groove length, is determined by the thickness of the titanium sheet and the number of the titanium sheet clamped at one time.
When the test fixture is used, the size of a titanium sheet to be tested is combined, a profiling base with the optimal specification is selected to be connected with a baffle and a bolt supporting plate, a plurality of section sample fractures face upwards, the sections are placed into a groove, a clamp is gently vibrated, all the section fractures to be tested are located in the same horizontal plane with the upper surface of the base, after section leveling is successful, a flat head bolt is screwed, the distance between the bottom of the flat head bolt and the baffle is reduced, a sample is clamped, the clamp and a plurality of section samples are combined into a whole, and conductive adhesive is adhered to the lower surface of the clamp and adhered to an electron microscope sample table together, so that the test can be started.
Because of the different elastic moduli of the nanofiber coating and the metallic titanium matrix, substantial plastic deformation during the preparation of the cross-section samples can lead to artificial damage between the film matrices, such as: the membrane base is torn, so that the original state of the membrane base interface is kept as much as possible, deviation of an analysis result caused by operation reasons is avoided, a slit is needed to be cut on the surface of the titanium sheet in the diameter direction, only 0.5mm thick connection exists between 2 semicircles of the round titanium sheet, after the surface modification treatment is carried out on the titanium sheet subjected to the precutting, the 2 semicircular titanium sheets can be separated by extremely small force, the deformation amount at the fracture is small, the original growth state of the nanofiber modified layer is well reserved, and the accuracy of the scanning result is ensured.
The semicircular titanium sheet section fracture subjected to surface modification treatment is upwards placed in a groove with a size suitable for the semicircular titanium sheet section fracture, and all the to-be-detected section fracture and the upper surface of the base can be positioned in the same horizontal plane by only slightly vibrating the clamp, so that reliable leveling is easily realized, the leveling effect is obvious, the operation method is simple and feasible, and the scanning image quality is ensured. Meanwhile, the profiling base has universality, the groove size of the profiling base corresponds to the size of a semicircular titanium sheet to be measured, when electron microscope analysis is carried out on samples with different sizes, the profiling base with the optimal specification size is only required to be selected to be connected with the baffle and the bolt supporting plate through common hexagon bolts, and the clamp has universality while ensuring the scanning quality and improving the efficiency.
When the electron microscope analysis is carried out on the titanium sheet samples, a plurality of titanium sheet samples can be put into for section scanning analysis at one time, the device is stable, the image does not drift, the photo quality is good, and the detection efficiency is high.
The signal source of the scanning electron microscope is to emit electron beams, and in order to obtain clear images, the non-conductive sample needs to be subjected to metal spraying and conductive adhesive pasting. The clamp is made of red copper, has good conductivity, the titanium sheet has good conductivity, the sample is placed in the groove, the clamp is vibrated to be leveled, the flat head bolt is screwed to clamp and fix the sample, the sample and the clamp are naturally combined into a good-conductivity whole, the samples with the section to be tested are tightly connected under the action of the flat head bolt, conductive adhesive is not required to be adhered, and only the lower surface of the profiling base of the clamp is required to be adhered with the sample table of the electron microscope by the conductive adhesive.
Drawings
FIG. 1 is a schematic diagram of a fixture assembly.
FIG. 2 is a schematic view of a bolt support plate.
FIG. 3 is a schematic view of a contoured base.
FIG. 4 is a schematic view of a bolt baffle.
Figure 5 is a schematic view of a flat head bolt.
Detailed Description
A special clamp for a scanning electron microscope suitable for a fracture sample with a circular titanium sheet section is shown in a schematic assembly view in fig. 1, and comprises a bolt supporting plate 2 (shown in fig. 2) and a baffle plate 4 (shown in fig. 4) at two ends and a profiling base 3 (shown in fig. 3) between the bolt supporting plate and the baffle plate, wherein a semi-cylindrical groove penetrating through the whole base in the horizontal direction is formed in the upper surface of the base, the size of the groove is based on the size and the number of the titanium sheet samples to be detected, the diameter of the semi-cylindrical bottom surface of the groove is increased by 0.2mm compared with the diameter of the titanium sheet samples, the height of the semi-cylindrical bottom surface is determined by the thickness of the titanium sheet and the number of the titanium sheet to be clamped once, after the samples are placed in the groove and leveled, the fracture with the upper surface of the base is located in the same horizontal plane, and when the semi-circular titanium sheet samples with different sizes are detected, the profiling grooves corresponding to the size specifications are only needed to be replaced. A bolt hole is formed in the center of the bolt support plate 2, and a flat head bolt 1 (see fig. 5) passes through the bolt hole and is in bolt fit with the bolt support plate 2. The clamp is made of red copper and has excellent conductivity.
When the clamp is used, the fracture of the section samples of the semicircular titanium sheets is upward, the semicircular titanium sheet section samples are placed into the grooves of the profiling base 3, the clamp is gently vibrated, and all the section fracture and the upper surface of the base are in the same horizontal plane. The flat head bolt 1 is screwed, the distance between the bottom of the bolt and the baffle is adjusted, and the samples are clamped. And sticking conductive adhesive on the lower surface of the clamp profiling base to enable the clamp to be tightly adhered with the sample table. The profiling base 3 limits and fixes the sample in the vertical and horizontal directions, the flat head bolt 1, the bolt supporting plate 2 and the baffle 4 fix the sample in the front-rear direction, the sample and the clamp are combined into a whole, the conductivity is good, and when the electron beam bombards the fracture of the section, a high-quality scanning image can be obtained.
Claims (4)
1. A special clamp for a scanning electron microscope of a fracture sample with a circular titanium sheet section is characterized in that: including bolt backup pad (2), profile modeling base (3) and baffle (4), the upper surface of profile modeling base (3) is equipped with the semicylindrical recess along the horizontal direction, the diameter clearance fit of semicylindrical recess and circular titanium piece sample, the length of semicylindrical recess and the thickness cooperation of a plurality of circular titanium pieces, bolt backup pad (2) set up the one end of semicylindrical recess, baffle (4) set up the other end of semicylindrical recess, bolt backup pad (2) and baffle (4) respectively with profile modeling base (3) bolted connection, follow on the bolt backup pad (2) the length direction threaded connection of semicylindrical recess has flat head bolt (1).
2. The special clamp for scanning electron microscope for the fracture sample with the circular titanium sheet section as claimed in claim 1, wherein the special clamp is characterized in that: the diameter of the semi-cylindrical groove on the profiling base (3) is 0.2mm larger than that of the round titanium sheet sample clamped on the profiling base.
3. The special clamp for scanning electron microscope for the fracture sample with the circular titanium sheet section as claimed in claim 1, wherein the special clamp is characterized in that: the profiling base (3) is made of red copper and has conductivity.
4. The special clamp for scanning electron microscope for the fracture sample with the circular titanium sheet section as claimed in claim 1, wherein the special clamp is characterized in that: conductive adhesive is adhered to the lower surface of the profiling base (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223060021.1U CN220340092U (en) | 2022-11-18 | 2022-11-18 | Special clamp for scanning electron microscope for circular titanium sheet section fracture sample |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223060021.1U CN220340092U (en) | 2022-11-18 | 2022-11-18 | Special clamp for scanning electron microscope for circular titanium sheet section fracture sample |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220340092U true CN220340092U (en) | 2024-01-12 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223060021.1U Active CN220340092U (en) | 2022-11-18 | 2022-11-18 | Special clamp for scanning electron microscope for circular titanium sheet section fracture sample |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220340092U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117805000A (en) * | 2024-03-01 | 2024-04-02 | 江苏龙城精锻集团有限公司 | Method for detecting internal micropores of material in hydrogenation environment |
-
2022
- 2022-11-18 CN CN202223060021.1U patent/CN220340092U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117805000A (en) * | 2024-03-01 | 2024-04-02 | 江苏龙城精锻集团有限公司 | Method for detecting internal micropores of material in hydrogenation environment |
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