CN212540193U

CN212540193U - A sample anchor clamps for TKD characterization test

Info

Publication number: CN212540193U
Application number: CN201922462390.5U
Authority: CN
Inventors: 赵永好; 刘思路; 徐笑笑; 郝肖杰; 顾雷
Original assignee: Nanjing University of Science and Technology
Current assignee: Nanjing University of Science and Technology
Priority date: 2019-12-31
Filing date: 2019-12-31
Publication date: 2021-02-12
Anticipated expiration: 2029-12-31

Abstract

The utility model belongs to microcosmic representation field, concretely relates to a sample anchor clamps for TKD representation test. The cross sections of the pressing block and the base station are both right-angled trapezoids, the pressing block is in contact with the long bottom of the base station, and the acute-angled ends of the pressing block and the base station are used for clamping; divide into clamping part and fixed part through the recess with the briquetting, the height of the degree of depth briquetting of recess, the clamping part is a plurality of, and clamping part and fixed part all are connected with the base station through fastening screw. The TKD thin sample is firmly fixed between the pressing block and the base station of the fixture body by a physical fixing method, so that the sample is prevented from moving and image drifting due to the fact that the conductive adhesive is flexible and deformed and the conductive performance is not ideal.

Description

A sample anchor clamps for TKD characterization test

Technical Field

The utility model belongs to microcosmic representation field, concretely relates to a sample anchor clamps for TKD representation test.

Background

When the conventional EBSD characterization test is carried out, the action range of incident electrons and a massive sample is large, and the width of a transverse region for generating back scattering electrons is usually larger than 150nm, so that the conventional EBSD has poor spatial resolution; in TKD characterization, however, the incident electrons penetrate the sample, typically in a laterally extended region of less than 100nm, to achieve higher spatial resolution.

TKD collects transmission chrysanthemum flower pattern patterns of sub-surfaces at 10nm in transmission electron microscope samples by using SEM, so as to analyze and measure microscopic information such as grain size, grain morphology, phase distribution and crystal lattice orientation of the characterized samples. The spatial resolution of TKD is increased to the nanometer scale compared to conventional EBSD. The microstructural characterization of various materials has shown that TKD has achieved 2-10nm resolution.

The currently adopted test method clamps a sample on a sample clamping table, and then fixes the sample clamping table on a bracket with an inclination angle of 40-80 degrees. Due to the stretching deformation of the conductive adhesive and the unsatisfactory conductivity, image drift can occur in the experimental process, so that a larger error exists in the result. In addition, only one sample can be held on one clamping table, and the testing efficiency is low.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a sample anchor clamps for TKD sign test.

Realize the utility model discloses the technical solution of purpose does: the sample clamp for the TKD characterization test comprises a pressing block and a base station, wherein the cross sections of the pressing block and the base station are both in a right trapezoid shape, the pressing block is in contact with the long bottom of the base station, and the acute-angled ends of the pressing block and the base station are used for clamping;

will through the recess the briquetting divide into clamping part and fixed part, the degree of depth briquetting of recess is high, the clamping part is a plurality of, clamping part and fixed part all are connected with the base station through fastening screw.

Furthermore, the base station rear end face of base station is equipped with the screw hole, realizes being connected with the stand of sample platform through the screw hole, the base station rear end face is the face at right trapezoid's right angle limit place.

Furthermore, the included angle between the large bottom edge and the bevel edge of the right trapezoid of the clamping part of the pressing block, namely the included angle alpha of the pressing block is 50-80 degrees.

Furthermore, the included angle between the large bottom edge and the bevel edge of the right trapezoid of the base station, namely the included angle beta of the base station, is 50-70 degrees.

Furthermore, the material of the pressing block is stainless steel, aluminum alloy or copper alloy.

Furthermore, the number of the clamping parts is four, and the plurality of clamping parts are divided by the through grooves.

Furthermore, a counter bore matched with a fastening screw is arranged on the pressing platform, and a threaded hole matched with the fastening screw is arranged on the base platform; the clamping part of the pressing table is fixed with the base station by one row, and the fixed part of the pressing table is fixed with the base station by the other row; the number of the fastening screws in each row is the same as that of the clamping parts, and each clamping part is provided with one fastening screw.

Furthermore, the depth of the groove is 3-8 mm, and the width of the groove is 0.5-1 mm.

Further, the thickness of the pressing block is 6-15mm, and the length and the width of the lower bottom surface of the pressing block are the same as those of the matching surface of the base platform.

Furthermore, the length of the matching surface of the base table is 30-60 mm, and the width of the matching surface of the base table is 20-40 mm.

Compared with the prior art, the utility model, it is showing the advantage and lies in:

(1) the clamp can firmly fix the TKD thin sample between the pressing block and the base station of the clamp body by a physical fixing method, so that the sample is prevented from moving and image drifting due to the telescopic deformation of conductive adhesive and unsatisfactory conductivity;

(2) the length direction and the width direction of the pressing block are parallel to the edge of the clamp, the pressing block and the step edge of the sample clamp are used for fixing a sample, the same sample can be repeatedly fixed at the same position, and the repeated positioning effect is good;

(3) the traditional gluing method needs to glue a sample on a clamp and then keep stand for a period of time so that the glue can volatilize and prevent a vacuum chamber from being polluted, and the traditional gluing method adopts physical fixation, fundamentally avoids the problem of pollution of the vacuum chamber and is more efficient;

(4) the pressing block is used for physical fixation, the problem of residual adhesive pollution on the back surface of the sample in an adhesive method is solved, and the sample can be repeatedly used for other experiments.

Drawings

Fig. 1 is a three-dimensional schematic diagram of the sample holder of the present invention.

Fig. 2 is a side view of the sample holder of the present invention.

Fig. 3 is a partially enlarged view of fig. 2.

Fig. 4 is a top view of the sample holder of the present invention.

Fig. 5 is a top view of the base station of the present invention.

Fig. 6 is the utility model is a three-dimensional view when being used for when TKD characterization test and sample platform cooperation.

Description of reference numerals:

1-pressing block, 1-1-clamping part, 1-2-groove, 1-3-fixing part, 1-4-fastening screw, 2-base table, 2-1-base table matching surface and 2-2-base table end surface.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings.

The patent relates to a sample clamp for TKD (Transmission Kikuchi differentiation, also called t-EBSD) characterization test. TKD is a novel electron microscopy technique that pioneers the use of conventional Scanning Electron Microscopy (SEM) and backscattered electron diffraction (EBSD) systems. According to the technology, SEM is used for collecting transmission chrysanthemum pool pattern patterns on the sub-surface of a transmission electron microscope sample under 10nm, so that microscopic information such as grain size, grain appearance, phase distribution and crystal lattice orientation of the sample to be characterized is analyzed and measured. The spatial resolution of TKD is increased to the nanometer scale compared to conventional EBSD.

This application includes briquetting 1 and base station 2, joins through the screw between briquetting 1 and the base station 2, forms the centre gripping part of TKD sample. The material of the pressing block 1 is a rectangular stainless steel sheet (aluminum and aluminum alloy or copper and copper alloy can also be adopted), and the stainless steel sheet is divided into a front part and a rear part. The front half part is four (can also be adjusted to be 1-6 according to actual conditions) hexahedron clamping parts 1-1 with right trapezoid cross sections, the bottom of the middle position of each hexahedron is provided with a hole with the same nominal diameter as the screw thread, and the top of each hexahedron is provided with a counter bore corresponding to the hole. The rear half part is a fixed part 1-3 which is provided with four threaded holes and counter bores corresponding to the front part, and the fixture is fixed. A groove 1-2 for separating the clamping part and the fixing part is designed between the clamping part and the fixing part. The base station 2 is a hexahedron with an inverted right trapezoid cross section, two rows of 8 threaded holes are formed in the base station matching surface 2-1 which is in contact with the pressing block, each row of threaded holes are formed in the length direction, and the positions of the threaded holes correspond to the threaded holes in the pressing block one by one. A threaded hole is arranged on the end surface 2-2 corresponding to the right-angle side of the cross section of the base station and is used for being connected with the upright post. This application accessible fastening screw is fixed in the corresponding position of base station with the briquetting, and fixed direction perpendicular to base station length direction.

Referring to fig. 1 to 5, the present application is a sample holder for TKD characterization test, which includes a press block 1 and a base 2 connected by a screw. The pressing block 1 is divided into a clamping part 1-1 and a fixing part 1-3. The clamping part 1-1 is four hexahedrons with right trapezoid cross sections, the included angle alpha between the large bottom edge and the oblique edge of the right trapezoid is 50-80 degrees, the bottom of the middle position of each clamping part 1-1 is provided with a hole with the same nominal diameter as the screw thread, the size is M2, and the top of the clamping part is provided with a counter bore corresponding to the hole.

The fixing part 1-3 is provided with four threaded holes and counter bores corresponding to the front part, and plays a role in fixing the clamp. A groove 1-2 is arranged between the front part and the rear part between the clamping part 1-1 and the fixing part 1-3, the depth of the groove is 3-8 mm, and the width of the groove is 0.5-1 mm.

Because the clamping part 1-1 and the fixing part 1-3 have different functions in use and have different process requirements in processing, the groove is designed to distinguish the clamping part 1-1 and the fixing part 1-3. Can more audio-visual differentiation clamping part and fixed part through the recess, because the difference of its importance, touching clamping part that will try fewest in the use can prevent the destruction of anchor clamps, improves its life.

In order to prevent the base station from obstructing the electron beam to enable the required image not to be displayed, the base station 2 is designed to be a hexahedron of an inverted right trapezoid, an included angle beta between a large bottom edge and a bevel edge of the inverted right trapezoid is 50-70 degrees, two rows of 8 threaded holes are formed in the base station matching surface 2-1, each row of threaded holes are arranged along the length direction, and the hole depth is 2 mm. The positions of the screw holes are in one-to-one correspondence with the threaded holes on the pressing block. A threaded hole with the nominal diameter of M4 is arranged on the end surface 2-2 of the base station and is used for connecting with the upright post. The pressing block can be fixed at the corresponding position of the base platform through the fastening screw, and the fixing direction is the direction vertical to the length of the base platform.

Referring to fig. 1, in the present embodiment, a base and a press block fix a sample, a clamping portion is formed by the base 2 and a clamping portion 1-1, the sample can be firmly clamped after a screw is tightened, the sample can be effectively prevented from sliding and image drift, and the fixing direction is a direction perpendicular to the length of the base.

Referring to fig. 2, the briquette 1 of the present embodiment is a stainless steel briquette. The strength is high, and the design requirement and the actual requirement are met.

Referring to fig. 1, 2 and 3, the compact 1 of the present embodiment has a thickness of 9mm and 4 clamping portions 1-1, and is connected to the base by fastening screws. So set up, can stably centre gripping a plurality of samples simultaneously, satisfy design requirement and actual need.

Working process

Referring to fig. 1 to 6, the sample holding end fixes the sample through the holding portion, and when the fastening screws 1 to 4 are loosened, the pressing block 1 is loosened, the transmission sample is placed at the holding portion, and the fastening screws are tightened, so that the sample is firmly fixed between the base 2 and the pressing block 1.

As shown in fig. 6, the utility model discloses a sample anchor clamps for TKD sign test need place and use with the sample platform cooperation in SEM sample chamber, utilizes the screw hole of base station right angle terminal surface, and is fixed through fastening screw and stand, inserts the base with the stand, and then makes anchor clamps wholly be fixed in the sample platform.

Claims

1. The sample clamp for the TKD characterization test is characterized by comprising a pressing block (1) and a base station (2), wherein the cross sections of the pressing block (1) and the base station (2) are both in a right trapezoid shape, the long bottom of the pressing block (1) is in contact with the long bottom of the base station (2), and the acute-angled ends of the pressing block and the base station are used for clamping;

the pressing block (1) is divided into a clamping part (1-1) and a fixing part (1-3) through a groove (1-2), the depth of the pressing block (1) of the groove (1-2) is large, the clamping part (1-1) is divided into a plurality of parts, and the clamping part (1-1) and the fixing part (1-3) are connected with a base platform through fastening screws (1-4).

2. The clamp according to claim 1, characterized in that the rear end face (2-2) of the base (2) is provided with threaded holes for connection with the column of the sample stage, and the rear end face (2-2) is the face of the right-angled side of the right-angled trapezoid.

3. The clamp according to claim 1, characterized in that the angle between the major base and the hypotenuse of the right trapezoid of the clamping portion (1-1) of the pressing piece, i.e. the pressing piece angle α, is 50 ° to 80 °.

4. The clamp according to claim 3, characterized in that the included angle between the large base side and the oblique side of the right trapezoid of the base platform (2), i.e. the included angle β of the base platform, is 50 ° to 70 °.

5. The clamp according to claim 1, characterized in that the material of the pressure block (1) is stainless steel, aluminum alloy or copper alloy.

6. The clamp according to claim 1, wherein the number of the clamping portions (1-1) is four, and a plurality of the clamping portions (1-1) are divided by a through groove.

7. The clamp according to claim 1, characterized in that a counter bore is arranged on the pressing block (1) to be matched with a fastening screw (1-4), and a threaded hole is arranged on the base table (2) to be matched with the fastening screw; the clamping part of the pressing table is fixed with the base station by one row, and the fixed part of the pressing table is fixed with the base station by the other row; the number of the fastening screws in each row is the same as that of the clamping parts, and each clamping part is provided with one fastening screw.

8. The clamp according to claim 1, wherein the grooves (1-2) have a depth of 3 to 8mm and a width of 0.5 to 1 mm.

9. The jig according to claim 1, wherein the compact (1) has a thickness of 6 to 15mm, and the sum of the length and width of the lower surface of the compact is the same as the length and width of the abutment mating surface (2-1) of the abutment.

10. The jig of claim 9, wherein the abutment mating surface has a length of 30 to 60mm and a width of 20 to 40 mm.