CN217443213U - Sample clamp for compression test analysis of in-situ tension table of scanning electron microscope - Google Patents
Sample clamp for compression test analysis of in-situ tension table of scanning electron microscope Download PDFInfo
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- CN217443213U CN217443213U CN202220421673.4U CN202220421673U CN217443213U CN 217443213 U CN217443213 U CN 217443213U CN 202220421673 U CN202220421673 U CN 202220421673U CN 217443213 U CN217443213 U CN 217443213U
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- 238000012669 compression test Methods 0.000 title claims abstract description 21
- 238000004458 analytical method Methods 0.000 title claims abstract description 13
- 238000011065 in-situ storage Methods 0.000 title claims description 13
- 238000002788 crimping Methods 0.000 claims abstract description 4
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 4
- 239000002184 metal Substances 0.000 abstract description 6
- 238000002360 preparation method Methods 0.000 abstract description 2
- 239000000523 sample Substances 0.000 description 33
- 239000000463 material Substances 0.000 description 9
- 230000006835 compression Effects 0.000 description 8
- 238000007906 compression Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 6
- 238000002474 experimental method Methods 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- 230000000149 penetrating effect Effects 0.000 description 3
- 239000007769 metal material Substances 0.000 description 2
- 238000009864 tensile test Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
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Abstract
The utility model relates to a sample anchor clamps for tensile platform compression test analysis of scanning electron microscope normal position, including base, upper cover, base and upper cover symmetry respectively set up, and middle part one side of base is equipped with the open slot, and the opposite side is equipped with heavy groove, places the sample in the open slot, and the middle part of upper cover is equipped with the bulge, and the bulge can cooperate the crimping in the heavy inslot of base, and upper cover and base pass through fastening bolt fixed connection on the base, and the sample passes through the tight bolt top in top on the bulge and connects at the base upper surface. The utility model discloses can realize carrying out compression test to the sheet metal sample on MICROTEST2000 scanning electron microscope normal position tensile bench, the sample shape requirement is simple, and sample thickness scope is adjustable, and sample preparation is simple easy, and loading and unloading sample is simple and convenient, can firmly fix the sample both ends, makes the even atress in sample both ends, satisfies experimental requirement.
Description
Technical Field
The utility model relates to an anchor clamps, in particular to a sample anchor clamps that is used for tensile platform compression test analysis of scanning electron microscope normal position.
Background
In the process of developing metal materials, a compression test is a test for measuring the mechanical property of the materials under the action of axial static pressure, and is one of the basic methods for testing the mechanical property of the materials. However, the microstructure of the material is changed, and the in-situ and real-time high-spatial-resolution structural image information is lacked, so that the MICROTEST2000 scanning electron microscope in-situ stretching platform is equipment with stretching and compressing test functions aiming at the metal plate. The loading effect and the microstructure change of the material can be combined, and the shape change of the material and the fracture process of the material can be dynamically observed in real time from a microscopic level by utilizing the high spatial resolution, the high magnification and the large depth of field of a scanning electron microscope. The equipment is provided with data analysis software, and the corresponding relation between the load and the strain curve can be observed in real time in the process of carrying out tensile and compression tests.
However, the conventional sample compression clamp of the MICROTEST2000 scanning electron microscope in-situ stretching table cannot meet the test requirements. The existing compression clamp of the in-situ stretching table comprises two upper covers, four screws with the diameter of 4mm and two cylinders with the diameter of 3.05 mm. The upper cover is provided with two screw holes and two round holes, and the two screw holes are distributed on two sides of the upper cover; two round holes are distributed in the middle. The samples were sheet metal. The experimental method of the clamp comprises the following steps: the two upper covers are connected with the corresponding bases through fastening bolts respectively without screwing, then the four cylinders are placed in the round holes in the middles of the two upper covers respectively, the two ends of a compressed sample are placed between the upper covers and the bases, the end parts of the sample are propped against the two cylinders, and the fastening bolts at the two ends are screwed to fix the sample. In the compression test, deformation is expected to occur at the intermediate prepared position of the sample after the compressive stress is continuously applied to the two ends of the sample. However, in the actual compression experiment, the surface of the cylinder is smooth and easy to rotate, and the sample is easy to displace in the stress process, so that the experiment fails.
Therefore, the utility model relates to a tensile platform panel compression test anchor clamps of scanning electron microscope normal position can firmly fix the sample, and required compression sample easily processes, and thickness is adjustable, ensures that the compression experiment goes on smoothly.
In the prior art, the technical patents related to the compression clamp of the in-situ stretching table are very few, and there are the following in the correlation:
patent CN 208043543U A scanning electron microscope in-situ stretching and compressing device, which designs an in-situ stretching and compressing device to realize the real-time dynamic observation of stretching and compressing microscopic forms of samples with various shapes under a scanning electron microscope. However, the clamping groove for clamping the sample needs to be clamped in the sample, so that the thickness of the sample is extremely high, the thickness of thin plates such as automobile plates does not meet the requirement, the clamping groove cannot be machined in the thickness direction, and the test cannot be carried out. The utility model discloses it is the sheet metal compression, different with the patent publication.
Patent CN205209873U tensile anchor clamps of experiment machine suitable for scanning electron microscope realizes carrying out tensile test to brittle materials such as pottery in the scanning electron microscope vacuum cavity, and this patent can't carry out compression test to sheet metal, with the utility model discloses it is different.
Patent CN203148771A experimental machine compression anchor clamps suitable for scanning electron microscope, this patent are to the special fixture that brittle material carried out compression test, and its aim at prevents that piece after brittle material destroys from splashing probably to damage secondary electron or back scattering electron probe, and this patent is not suitable for the sheet metal material, with the utility model discloses it is different.
Disclosure of Invention
The utility model aims to solve the technical problem that a sample anchor clamps for tensile platform compression test analysis of scanning electron microscope normal position is provided.
In order to achieve the above object, the utility model adopts the following technical scheme:
the utility model provides a sample anchor clamps for tensile platform compression test analysis of scanning electron microscope normal position, which comprises a base, a pedestal, the upper cover, a pedestal, base and upper cover symmetry respectively set up, middle part one side of base is equipped with the open slot, the opposite side is equipped with heavy groove, place the sample in the open slot, the middle part of upper cover is equipped with the bulge, the bulge can cooperate the crimping in the heavy groove of base, upper cover and base pass through fastening bolt fixed connection on the base, the sample passes through the top bolt top on the bulge and connects at the base upper surface.
The base and the two sides of the upper cover are respectively and correspondingly provided with a positioning hole for penetrating and sleeving the fastening bolt, the protruding part of the upper cover is provided with an upper cover threaded hole for connecting the tightening bolt, and the upper cover threaded hole and the positioning hole on the upper cover are arranged in a triangular shape.
The base is provided with a base threaded hole for connecting a fastening bolt.
The depth of the sinking groove is 1-2 mm.
The thickness of the protruding part is 1-2 mm.
Compared with the prior art, the beneficial effects of the utility model are that:
the utility model discloses can realize carrying out compression test to the sheet metal sample on MICROTEST2000 scanning electron microscope normal position tensile bench, the sample shape requirement is simple, and sample thickness scope is adjustable, and sample preparation is simple easy, and loading and unloading sample is simple and convenient, can firmly fix the sample both ends, makes the even atress in sample both ends, satisfies experimental requirement.
Drawings
Fig. 1 is a schematic structural diagram of the present invention.
Fig. 2 is a view showing the structure of the base.
Fig. 3 is a view showing the structure of the upper cover.
In the figure: the device comprises a base 1, a base 2, an upper cover 3, a sample 4, a fastening bolt 5, a puller bolt 6, an open slot 7, a sunken slot 8, a protruding part 9, an upper cover threaded hole 10, a positioning hole 11 and a base threaded hole 12.
Detailed Description
The following further describes the embodiments of the present invention with reference to the attached drawings:
as shown in fig. 1-3, a sample anchor clamps for tensile platform compression test analysis in scanning electron microscope normal position, including the base 1 that sets up, base 2, upper cover 3, base 1, base 2 and upper cover 3 symmetry respectively set up, middle part one side of base 2 is equipped with open slot 7, the opposite side is equipped with heavy groove 8, place sample 4 in the open slot 7, the middle part of upper cover 3 is equipped with projecting part 9, projecting part 9 can cooperate the crimping in heavy groove 8 of base 2, upper cover 3 and base 2 pass through fastening bolt 5 fixed connection on base 1, sample 4 passes through the puller bolt apical grafting on projecting part 9 at base 1 upper surface.
The two sides of the base 2 and the upper cover 3 are respectively and correspondingly provided with a positioning hole 11 for penetrating and sleeving the fastening bolt 5, the protruding part 9 of the upper cover 3 is provided with an upper cover threaded hole 10 for connecting the tightening bolt 6, and the upper cover threaded hole 10 and the positioning hole 11 on the upper cover are arranged in a triangular shape.
The base 1 is provided with a base threaded hole 12 for connecting the fastening bolt 5.
The depth of the sinking groove 8 is 1-2 mm.
The thickness of the protruding part 9 is 1-2 mm.
Examples
The utility model provides a sample anchor clamps for tensile platform compression test analysis of scanning electron microscope normal position, is including base 1, base 2, the upper cover 3 that sets up, and base 1, base 2 and upper cover 3 symmetry respectively set up, and middle part one side of base 2 is equipped with open slot 7, and the opposite side is equipped with heavy groove 8, and the 8 degree of depth in heavy groove is 1 mm. The sample 4 is placed in the open slot 7, the middle part of the upper cover 3 is provided with a protruding part 9, the protruding part 9 can be matched and pressed in a sunken slot 8 of the base 2, and the thickness of the protruding part 9 is 1 mm.
The upper cover 3 and the base 2 are fixedly connected to the base 1 through fastening bolts 5, and base threaded holes 12 for connecting the fastening bolts 5 are formed in the base 1.
The sample 4 is abutted against the upper surface of the base 1 by the puller bolt on the protruding part 9.
The two sides of the base 2 and the upper cover 3 are respectively and correspondingly provided with a positioning hole 11 for penetrating and sleeving the fastening bolt 5, the protruding part 9 of the upper cover 3 is provided with an upper cover threaded hole 10 for connecting the tightening bolt 6, and the upper cover threaded hole 10 and the positioning hole 11 on the upper cover are arranged in a triangular shape.
Above utility model, to the ordinary technical personnel in this technical field, can also be right without deviating from the principle of the utility model, these improve and decorate and also fall into the protection scope of the utility model claims. The above description is only the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can substitute or change the technical solution and the concept of the present invention within the technical scope disclosed in the present invention.
Claims (5)
1. The utility model provides a sample anchor clamps for tensile platform compression test analysis of scanning electron microscope normal position, a serial communication port, which comprises a base, a pedestal, the upper cover, a pedestal, base and upper cover symmetry respectively sets up, middle part one side of base is equipped with the open slot, the opposite side is equipped with heavy groove, place the sample in the open slot, the middle part of upper cover is equipped with the bulge, the bulge can cooperate the crimping in the heavy groove of base, upper cover and base pass through fastening bolt fixed connection on the base, the sample passes through the tight bolt top in top on the bulge and connects at the base upper surface.
2. The sample clamp for the compression test analysis of the in-situ tensile table of the scanning electron microscope according to claim 1, wherein two sides of the base and the upper cover are respectively and correspondingly provided with a positioning hole for threading and sleeving the fastening bolt, the protruding portion of the upper cover is provided with an upper cover threaded hole for connecting the tightening bolt, and the upper cover threaded hole and the positioning hole on the upper cover are arranged in a triangular shape.
3. The sample clamp for the compression test analysis of the in-situ tensile table of the scanning electron microscope according to claim 1, wherein the base is provided with a base threaded hole for connecting a fastening bolt.
4. The sample clamp for the compression test analysis of the in-situ tensile table of the scanning electron microscope according to claim 1, wherein the depth of the sinking groove is 1-2 mm.
5. The sample holder for the compression test analysis of the in-situ tensile table of the scanning electron microscope according to claim 1, wherein the thickness of the protruding part is 1-2 mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220421673.4U CN217443213U (en) | 2022-02-28 | 2022-02-28 | Sample clamp for compression test analysis of in-situ tension table of scanning electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220421673.4U CN217443213U (en) | 2022-02-28 | 2022-02-28 | Sample clamp for compression test analysis of in-situ tension table of scanning electron microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217443213U true CN217443213U (en) | 2022-09-16 |
Family
ID=83212686
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220421673.4U Active CN217443213U (en) | 2022-02-28 | 2022-02-28 | Sample clamp for compression test analysis of in-situ tension table of scanning electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217443213U (en) |
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2022
- 2022-02-28 CN CN202220421673.4U patent/CN217443213U/en active Active
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