CN217443212U - Steel sheet scanning electron microscope sample clamping device - Google Patents
Steel sheet scanning electron microscope sample clamping device Download PDFInfo
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- CN217443212U CN217443212U CN202220421445.7U CN202220421445U CN217443212U CN 217443212 U CN217443212 U CN 217443212U CN 202220421445 U CN202220421445 U CN 202220421445U CN 217443212 U CN217443212 U CN 217443212U
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Abstract
The utility model relates to a steel plate sample clamping device for a scanning electron microscope, which is arranged on a sample table of the scanning electron microscope; comprises 2 clamping blocks, bolts and nuts which are oppositely arranged; the upper part of the clamping block is a sample clamping part, and the lower part of the clamping block is a connecting part; a sample is placed between the sample clamping parts of the 2 clamping blocks, the connecting part is provided with a through hole, and one end of a bolt passes through the through hole on the 2 clamping blocks and is locked by a nut; the clamping block is made of copper. Clamping device adopts copper grip block electric conductivity good, adopts the centre gripping mode to be favorable to defect analysis such as sample fracture, simple structure, convenient operation.
Description
Technical Field
The utility model relates to a scanning electron microscope detects technical field, especially relates to a steel sheet scanning electron microscope sample clamping device.
Background
Scanning electron microscope analysis is one of means for inspecting and analyzing metal materials, and is used for observing microstructure of materials, defects of material products and the like. The movable range of the sample for scanning electron microscope analysis in the sample chamber is large (the space of the sample chamber is large), the thickness of the automobile steel plate is generally 0.8-3 mm, the sample cannot be fixed on a scanning electron microscope sample table due to the fact that the thickness of the sample is too thin, and fracture defects cannot be observed by using a method of embedding the sample.
The prior art partially solves the problem that a scanning sample cannot be fixed, but is not suitable for the situation that the scanning sample cannot be fixed due to the fact that an automobile steel plate is too thin.
Chinese patent application No. CN201920730447.2 discloses "a scanning electron microscope anchor clamps suitable for coiled tubing failure analysis", supporting baseplate's bottom is the disc, and the circumference of disc 0 °, 90 °, 180 ° and 270 ° four directions distribute respectively in supporting baseplate's lateral wall intermediate position has the fixed orifices, all installs the set screw that is used for spacing and fixed sample in every fixed orifices, fixed orifices and set screw threaded connection. The coiled tubing sample pipe ring with the continuous fracture of the failure fracture can be directly placed into the fixture for failure analysis, the pipe ring does not need to be cut, the integrity of the fracture is guaranteed, and the accuracy of a microstructure analysis result is further guaranteed. The test piece is only used for coiled tubing samples and is not suitable for automobile steel plate samples.
Chinese patent application with patent application number CN201921610291.0 discloses "a scanning electron microscope sample stage fixing device for nanometer press-in experiment", including the laboratory bench of impressing, the knurling screw, elasticity clamp and scanning electron microscope sample stage, scanning electron microscope sample stage below stand and the cooperation of impressing test bench centre of circle hole, press the compressing force to scanning electron microscope sample stage through the semicircular recess on the elasticity clamp, the packing force of elasticity clamp is controlled to the knurling screw to be convenient for the clamp of scanning electron microscope sample stage tightly with dismantle. The sample platform is clamped through the clamping piece and the knurled screw pressed into the test bed, so that the rapidness, the stability and the accuracy of detecting the appearance observation from the mechanical property are improved. The device is not suitable for observing the defects at the automobile sheet fracture and clamping the scanning electron microscope sample table can cause abrasion to the scanning electron microscope sample table.
Chinese patent application with patent application number cn200820002530.x discloses "a scanning electron microscope sample platform combiner", it includes metal round platform and bolt, and the metal round platform surface is equipped with 4-8 equal divisions and leads to the round hole as scanning electron microscope sample platform loading position, and scanning electron microscope sample platform loading position entrance is equipped with the round chamfer, and the side is equipped with the screw, and the screw passes through scanning electron microscope sample platform device position. The device can once only pack into 4-8 scanning electron microscope samples, improves work efficiency and ensures scanning electron microscope vacuum degree, and stable performance, simple structure. However, the device is only suitable for inlaying the sample, is not suitable for analyzing fracture defects of the automobile sheet sample, and can influence the imaging of a scanning electron microscope due to poor conductivity.
The utility model discloses phenomenon more than the aim at needle improves and innovates, has solved the vapour board sample and has been thin to be difficult to fixedly, and the unable defect scheduling problem of observing after inlaying provides a high efficiency, electric conductive property well and can fix the clamping device of more vapour board scanning sample.
Disclosure of Invention
The utility model provides a steel sheet scanning electron microscope sample clamping device adopts copper grip block electric conductivity good, adopts the centre gripping mode to be favorable to defect analysis such as sample fracture, simple structure, convenient operation.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
a steel plate scanning electron microscope sample clamping device is arranged on a scanning electron microscope sample table; comprises 2 clamping blocks, bolts and nuts which are oppositely arranged; the upper part of the clamping block is a sample clamping part, and the lower part of the clamping block is a connecting part; a sample is placed between the sample clamping parts of the 2 clamping blocks, the connecting part is provided with a through hole, and one end of a bolt passes through the through hole on the 2 clamping blocks and is locked by a nut; the clamping block is made of copper.
The sample clamping part is of a cuboid structure, the height of the sample clamping part is 15-25 mm, the width of the sample clamping part is 8-10 mm, and the length of the sample clamping part is 15-30 mm.
The roughness of the inner side surface of the sample clamping part is Ra3.2-6.3 mu m.
The connecting part consists of a cuboid and a semi-cylinder; the cuboid is equivalent to an extension section of the sample clamping part, namely the width of the cuboid is equal to that of the sample clamping part, the length of the cuboid is equal to that of the sample clamping part, and the height of the cuboid is 8-12 mm; the semi-cylinder is positioned on the outer side of the cuboid; the diameter of the semi-cylinder is equal to the length of the cuboid, and the height of the semi-cylinder is equal to the height of the cuboid; the through hole penetrates through the cuboid and the semi-cylinder.
The steel plate scanning electron microscope sample clamping device also comprises a gasket; the gasket is arranged between the bolt head and the semi-cylinder body and between the nut and the semi-cylinder body, the contact surfaces of the gasket, the inner surface of the bolt head and the inner surface of the nut are planes, and the contact surfaces of the gasket and the outer surface of the semi-cylinder body are cambered surfaces matched with the surfaces of the semi-cylinder bodies.
The thickness of the sample is less than or equal to 10 mm.
Compared with the prior art, the beneficial effects of the utility model are that:
the copper clamping block is good in conductivity, the clamping mode is favorable for analyzing defects such as sample fracture, the structure is simple, and the operation is convenient.
Drawings
Fig. 1 is a front view of the sample clamping device for a steel plate scanning electron microscope of the present invention.
Fig. 2 is a top view of fig. 1.
Fig. 3 is the utility model discloses in the embodiment steel sheet scanning electron microscope sample clamping device is the arrangement on scanning electron microscope sample platform.
In the figure: 1. scanning electron microscope sample table 2, connecting part 3, sample clamping part 4, bolt 5, nut 6, gasket 7 and sample
Detailed Description
The following description of the embodiments of the present invention will be made with reference to the accompanying drawings:
as shown in fig. 1 and fig. 2, the clamping device for a steel plate scanning electron microscope sample of the present invention is disposed on a scanning electron microscope sample stage 1; comprises 2 clamping blocks, bolts and nuts which are oppositely arranged; the upper part of the clamping block is a sample clamping part 3, and the lower part is a connecting part 2; a sample 7 is arranged between the sample clamping parts 3 of the 2 clamping blocks, the connecting part 2 is provided with a through hole, and one end of a bolt 4 penetrates through the through holes on the 2 clamping blocks and then is locked by a nut 5; the clamping block is made of copper.
The roughness of the inner side surface of the sample clamping part 3 is Ra3.2-6.3 mu m.
The connecting part 2 consists of a cuboid and a semi-cylinder; the cuboid is equivalent to an extension section of the sample clamping part 3, namely the width of the cuboid is equal to that of the sample clamping part 3, the length of the cuboid is equal to that of the sample clamping part 3, and the height of the cuboid is 8-12 mm; the semi-cylinder is positioned on the outer side of the cuboid; the diameter of the semi-cylinder is equal to the length of the cuboid, and the height of the semi-cylinder is equal to the height of the cuboid; the through hole penetrates through the cuboid and the semi-cylinder.
The steel plate scanning electron microscope sample clamping device also comprises a gasket 6; the gasket 6 is arranged between the bolt head and the semi-cylinder body and between the nut 5 and the semi-cylinder body, the contact surfaces of the gasket 6 and the inner surface of the bolt head and the inner surface of the nut 5 are planes, and the contact surfaces of the gasket 6 and the outer surface of the semi-cylinder body are cambered surfaces matched with the surfaces of the semi-cylinder bodies.
The thickness of the sample 7 is less than or equal to 10 mm.
The following examples are carried out on the premise of the technical solution of the present invention, and detailed embodiments and specific operation procedures are given, but the scope of the present invention is not limited to the following examples.
[ examples ] A method for producing a compound
In this embodiment, the scanning electron microscope stage has a diameter of
The round table is used for manufacturing 4 groups of steel plate scanning electron microscope sample clamping devices, and each group of clamping devices comprises 2The clamping block, 1 common hexagon bolt and matched nut; the clamping block is integrally made of brass, so that the clamping block has good conductivity and does not damage a sample.
Considering the observation height of a sample table of a scanning electron microscope, the height of a sample clamping part is designed to be 20mm, and the width of the sample clamping part is designed to be 10 mm; the height of the connecting part is 10 mm; the outside of the connecting part is of diameter
Is provided with a semi-cylinder.
The connecting part is provided with a through hole along the central axis of the clamping block.
And 4 samples are respectively arranged between 2 clamping blocks of the clamping device, and the bolts penetrate through the through holes and are locked by nuts, so that the steel plate scanning electron microscope sample of the automobile to be observed is fixed. Then, 4 groups of clamping devices which clamp the sample are uniformly placed on a sample table of the scanning electron microscope along the circumferential direction (as shown in fig. 3), and the sample is observed through the scanning electron microscope.
The thickness of the automobile steel plate scanning electron microscope sample is limited within 10 mm.
The above description is only the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can substitute or change the technical solution and the concept of the present invention within the technical scope disclosed in the present invention.
Claims (6)
1. A steel plate scanning electron microscope sample clamping device is arranged on a scanning electron microscope sample table; the device is characterized by comprising 2 clamping blocks, bolts and nuts which are oppositely arranged; the upper part of the clamping block is a sample clamping part, and the lower part of the clamping block is a connecting part; a sample is placed between the sample clamping parts of the 2 clamping blocks, the connecting part is provided with a through hole, and one end of a bolt passes through the through hole on the 2 clamping blocks and is locked by a nut; the clamping block is made of copper.
2. A steel plate scanning electron microscope sample clamping device according to claim 1, characterized in that the sample clamping portion is of a cuboid structure, the height of the sample clamping portion is 15-25 mm, the width of the sample clamping portion is 8-10 mm, and the length of the sample clamping portion is 15-30 mm.
3. The clamping device for the steel plate scanning electron microscope sample according to claim 1, wherein the roughness of the inner side surface of the sample clamping part is Ra3.2-6.3 μm.
4. The clamping device for the steel plate scanning electron microscope sample according to claim 1, wherein the connecting part is composed of a cuboid and a semi-cylinder; the cuboid is equivalent to an extension section of the sample clamping part, namely the width of the cuboid is equal to that of the sample clamping part, the length of the cuboid is equal to that of the sample clamping part, and the height of the cuboid is 8-12 mm; the semi-cylinder is positioned on the outer side of the cuboid; the diameter of the semi-cylinder is equal to the length of the cuboid, and the height of the semi-cylinder is equal to the height of the cuboid; the through hole penetrates through the cuboid and the semi-cylinder.
5. A steel plate scanning electron microscope sample clamping device according to claim 4, characterized by further comprising a gasket; the gasket is arranged between the bolt head and the semi-cylinder body and between the nut and the semi-cylinder body, the contact surfaces of the gasket, the inner surface of the bolt head and the inner surface of the nut are planes, and the contact surfaces of the gasket and the outer surface of the semi-cylinder body are cambered surfaces matched with the surfaces of the semi-cylinder bodies.
6. A steel plate scanning electron microscope sample clamping device according to claim 4, characterized in that the thickness of the sample is less than or equal to 10 mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220421445.7U CN217443212U (en) | 2022-02-28 | 2022-02-28 | Steel sheet scanning electron microscope sample clamping device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220421445.7U CN217443212U (en) | 2022-02-28 | 2022-02-28 | Steel sheet scanning electron microscope sample clamping device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217443212U true CN217443212U (en) | 2022-09-16 |
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ID=83213547
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220421445.7U Active CN217443212U (en) | 2022-02-28 | 2022-02-28 | Steel sheet scanning electron microscope sample clamping device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217443212U (en) |
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2022
- 2022-02-28 CN CN202220421445.7U patent/CN217443212U/en active Active
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