CN216117403U - Sample clamp suitable for tensile test analysis of in-situ tensile table of scanning electron microscope - Google Patents
Sample clamp suitable for tensile test analysis of in-situ tensile table of scanning electron microscope Download PDFInfo
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- CN216117403U CN216117403U CN202121417192.8U CN202121417192U CN216117403U CN 216117403 U CN216117403 U CN 216117403U CN 202121417192 U CN202121417192 U CN 202121417192U CN 216117403 U CN216117403 U CN 216117403U
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Abstract
The utility model relates to a sample clamp suitable for tensile test analysis of an in-situ tensile platform of a scanning electron microscope, which comprises two bases which are oppositely arranged, wherein an upper cover is arranged above the bases, screw holes are correspondingly arranged on the bases and the upper cover, the upper cover and the bases are connected with the tensile platform base through fastening bolts, and a sample is clamped between the upper cover and the bases. The base include bottom plate, grip block, the bottom plate upper surface symmetry is equipped with the grip block, is equipped with the centre gripping groove between two grip blocks, forms the sample standing groove between two grip blocks and the bottom plate, sample standing groove and centre gripping groove through connection, the grip block inboard of centre gripping groove both sides be equipped with sample assorted cambered surface. The utility model designs a tensile bench test fixture which is suitable for samples with various thicknesses. The required tensile sample is easy to process, drilling is not needed, and the test requirement is met.
Description
Technical Field
The utility model relates to a sample clamp, in particular to a sample clamp suitable for tensile test analysis of a scanning electron microscope in-situ tensile table.
Background
In the development process of metal materials, a tensile test is one of the most common and important test methods in material mechanical property tests. The basic mechanical property index of the material can be obtained through a tensile test.
The MICROTEST2000 scanning electron microscope in-situ stretching table is a device which is arranged on a scanning electron microscope and used for stretching and compressing tests. The method can fully utilize the large depth of field and high spatial resolution analysis capability of the scanning electron microscope, and can also carry out dynamic research on the deformation morphology and the fracture behavior of the material on a microscopic level. And meanwhile, data analysis software is equipped, and load and strain curves are drawn through data acquisition.
The existing stretching clamp of the in-situ stretching table is composed of two cuboid blocks, wherein the cuboid blocks are provided with four screw holes, the diameters of the two screw holes outside the cuboid blocks are 4mm, the cuboid blocks can be connected with a stretching table base after fastening bolts are screwed tightly, and the cuboid is used for compressing the end part of a sample, so that the end part of the sample is uniformly stressed in the stretching process; the diameter of the middle two screw holes is 3.05mm, the end parts of the samples are correspondingly provided with two screw holes with the diameter of 3.05mm, and two cylinders penetrate through the screw holes with the diameter of 3.05mm to fix the cuboid block, the samples and the base, so that the effect of fixing the positions of the samples is achieved. The working principle of the clamp is as follows: in the process of the tensile test, the end parts of the sample are tightly pressed by the cuboid blocks, the middle two cylinders fix the position of the sample, and after the tensile stress is continuously applied to the two ends of the sample, the crack is expected to be formed in the middle of the sample. However, in an actual tensile test, the pressure of a cuboid block is insufficient, a sample displaces in the tensile process, the middle two cylinders have to bear the weight of resisting the displacement of the end part of the sample, the sample is not stressed at the whole end part but is concentrated on one side of the middle two holes, which is contacted with the cylinders, the stressed area is small, the stress concentration inside the small hole is caused along with the continuous application of tensile stress, and the deformation and the cracking are easy to occur under the action of the tensile stress, so that the test failure is caused. The existing clamp of the tensile test bed has certain limits on the size, thickness and shape of a test sample, the precision requirement is high, only the sample which meets the specific size and shape can be subjected to the tensile test, the specified standard sample is difficult to process, the common processing workshop cannot process, and the unit processing cost with the precision processing capability is high. Not only consumes a great deal of manpower and time cost, but also can not obtain ideal experimental results.
Disclosure of Invention
The utility model aims to solve the technical problem of providing a sample clamp suitable for the tensile test analysis of a scanning electron microscope in-situ tensile table. Firmly fixing the metal plate sample, and simple sample loading and unloading procedure.
In order to achieve the purpose, the utility model adopts the following technical scheme:
the utility model provides a sample anchor clamps suitable for tensile test analysis of scanning electron microscope normal position tensile platform, includes two bases that set up relatively, and the base top is equipped with the upper cover, and base and upper cover are gone up and are covered correspondingly and be equipped with the screw, and upper cover and base pass through fastening bolt and tensile platform base connection, centre gripping sample between upper cover and the base.
The base include bottom plate, grip block, the bottom plate upper surface symmetry is equipped with the grip block, is equipped with the centre gripping groove between two grip blocks, forms the sample standing groove between two grip blocks and the bottom plate, sample standing groove and centre gripping groove through connection, the grip block inboard of centre gripping groove both sides be equipped with sample assorted cambered surface.
The clamping block is L-shaped.
The width of the clamping groove is 7-9 mm.
The depth of the sample placing groove is 5-8 mm.
Compared with the prior art, the utility model has the beneficial effects that:
the utility model designs a tensile bench test fixture which is suitable for samples with various thicknesses. The required tensile sample is easy to process, drilling is not needed, and the test requirement is met.
Drawings
FIG. 1 is a schematic structural diagram of the present invention.
Fig. 2 is a schematic structural diagram of the base.
Fig. 3 is a schematic structural diagram of a sample.
In the figure: the device comprises a base 1, an upper cover 2, a screw hole 3, a fastening bolt 4, a sample 5, a bottom plate 11, a clamping block 12, a clamping groove 13 and a sample placing groove 14.
Detailed Description
The following further describes embodiments of the present invention with reference to the accompanying drawings:
referring to fig. 1-3, a sample clamp suitable for tensile test analysis of an in-situ tensile table of a scanning electron microscope comprises two bases 1 which are oppositely arranged, an upper cover 2 is arranged above the base 1, screw holes 3 are correspondingly arranged on the base 1 and the upper cover 2, the upper cover 2 and the base 1 are connected with the tensile table base through fastening bolts 4, and a sample 5 is clamped between the upper cover 2 and the base 1.
The base 1 comprises a bottom plate 11 and clamping blocks 12, the clamping blocks 12 are symmetrically arranged on the upper surface of the bottom plate 11, the clamping blocks 12 are L-shaped, and the bottom plate 11 and the clamping blocks 12 are of an integral structure.
A clamping groove 13 is arranged between the two clamping blocks 12, a sample placing groove 14 is formed between the two clamping blocks 12 and the bottom plate 11, the sample placing groove 14 is communicated with the clamping groove 13, and arc surfaces matched with the sample 5 are arranged on the inner sides of the clamping blocks 12 on the two sides of the clamping groove 13.
The width of the clamping groove 13 is 7-9 mm. The depth of the sample-placing groove 14 is 5 to 8 mm.
In practical application, two ends of an I-shaped sample are respectively fixed in the sample placing grooves of the two bases, the two bases are respectively fixed on the two corresponding stretching platform bases, and the upper cover, the bases and the stretching platform bases are fastened by fastening bolts. A tensile test was performed.
In the above embodiments, it is obvious to those skilled in the art that the present invention can be modified and modified without departing from the principle of the present invention, and the modified and modified embodiments also fall within the protection scope of the appended claims. The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and their concepts should be equivalent or changed within the technical scope of the present invention.
Claims (4)
1. A sample clamp suitable for tensile test analysis of an in-situ tensile platform of a scanning electron microscope is characterized by comprising two bases which are oppositely arranged, wherein an upper cover is arranged above the bases, screw holes are correspondingly arranged on the bases and the upper cover, the upper cover and the bases are connected with the tensile platform base through fastening bolts, and a sample is clamped between the upper cover and the bases; the base include bottom plate, grip block, the bottom plate upper surface symmetry is equipped with the grip block, is equipped with the centre gripping groove between two grip blocks, forms the sample standing groove between two grip blocks and the bottom plate, sample standing groove and centre gripping groove through connection, the grip block inboard of centre gripping groove both sides be equipped with sample assorted cambered surface.
2. The sample clamp suitable for being used in tensile test analysis of an in-situ tensile table of a scanning electron microscope according to claim 1, wherein the clamping block is L-shaped.
3. The sample clamp suitable for the tensile test analysis of the in-situ tensile table of the scanning electron microscope according to claim 1, wherein the width of the clamping groove is 7-9 mm.
4. The sample clamp suitable for the tensile test analysis of the in-situ tensile table of the scanning electron microscope according to claim 1, wherein the depth of the sample placement groove is 5-8 mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121417192.8U CN216117403U (en) | 2021-06-24 | 2021-06-24 | Sample clamp suitable for tensile test analysis of in-situ tensile table of scanning electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121417192.8U CN216117403U (en) | 2021-06-24 | 2021-06-24 | Sample clamp suitable for tensile test analysis of in-situ tensile table of scanning electron microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216117403U true CN216117403U (en) | 2022-03-22 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121417192.8U Active CN216117403U (en) | 2021-06-24 | 2021-06-24 | Sample clamp suitable for tensile test analysis of in-situ tensile table of scanning electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216117403U (en) |
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2021
- 2021-06-24 CN CN202121417192.8U patent/CN216117403U/en active Active
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