CN219084976U

CN219084976U - Test fixture

Info

Publication number: CN219084976U
Application number: CN202220938865.2U
Authority: CN
Inventors: 钟志武; 张国兴
Original assignee: Xiamen Cheerzing Technology Co ltd
Current assignee: Xiamen Cheerzing Technology Co ltd
Priority date: 2022-04-22
Filing date: 2022-04-22
Publication date: 2023-05-26
Anticipated expiration: 2032-04-22

Abstract

The utility model relates to the field of electrical performance testing devices. The utility model discloses a test fixture, which comprises a probe assembly and a carrier plate, wherein the probe assembly is arranged on the top surface of the carrier plate, the probe assembly comprises a fixed plate and a plurality of test probes, the plurality of test probes are fixed on the fixed plate and correspond to test points of a product to be tested, a plurality of conductive points are arranged on the top surface of the carrier plate and are respectively and electrically connected with the bottom ends of the plurality of test probes in a one-to-one contact manner, and test wiring terminals are further arranged on the carrier plate and are electrically connected with corresponding conductive points through circuits arranged on the carrier plate. The utility model does not need to use a lead to be welded with a test probe for wiring, the whole fixture circuit is concise, the problem of needle leakage or easy short circuit is avoided, the safety and the reliability are high, the wiring and the error checking of the test fixture in the later stage of manufacturing the test fixture are convenient, and in addition, the wiring is convenient and rapid during the test.

Description

Test fixture

Technical Field

The utility model belongs to the field of electrical performance testing devices, and particularly relates to a testing jig.

Background

The communication modules (such as a 4G communication module, a 5G communication module, a Bluetooth communication module and the like) need to test the performance of the functional pins after the manufacturing is completed. The traditional test fixture of communication module is that needle cover and thimble under the position of communication module test point is direct, then follow needle cover afterbody welding wire, through the thimble pressfitting, draws forth the functional pin that awaits measuring and is connected to our place that needs. However, with the development of the communication module, the size of the communication module is smaller and smaller, the pins of the function to be tested are more and more, the space is smaller and more, the test fixture manufactured by the method is particularly crowded and disordered, the problem of needle leakage or short circuit is easy to occur, the safety and the reliability are low, and the fault detection of the connection line and the test fixture in the later manufacturing stage of the test fixture is also particularly inconvenient.

Disclosure of Invention

The present utility model is directed to a testing fixture for solving the above-mentioned problems.

In order to achieve the above purpose, the utility model adopts the following technical scheme: the utility model provides a test fixture, includes probe subassembly and carrier plate, and probe subassembly sets up on the top surface of carrier plate, and probe subassembly includes fixed plate and a plurality of test probe, and a plurality of test probes are fixed on the fixed plate, and correspond with the test point of the product that awaits measuring, are equipped with a plurality of conductive points on the top surface of carrier plate, and a plurality of conductive points are connected with the bottom one-to-one contact electricity of a plurality of test probes respectively, still are equipped with the test wiring end on the carrier plate, and the test wiring end is connected with corresponding conductive point electricity through the circuit that sets up on the carrier plate.

Further, the test probe is implemented with a spring probe.

Further, a placing groove for placing products to be tested is formed in the top surface of the fixing plate, a plurality of test probes are fixedly arranged on the bottom of the placing groove in a penetrating mode, the top ends of the test probes are higher than the bottom surface of the placing groove, and the bottom ends of the test probes extend out of the bottom surface of the fixing plate and are in contact electrical connection with the conductive points.

Still further, the fixed plate includes fixed plate body and apron, places the recess setting on the top surface of fixed plate body, and the fixed plate body be equipped with the mounting groove corresponding to the bottom surface of placing the recess, and the apron setting is in the mounting groove, and fixed plate body and apron are equipped with corresponding first fixed orifices and second fixed orifices, and test probe wears to establish in first fixed orifices and second fixed orifices, and the size of the upper end of first fixed orifices and the lower extreme of second fixed orifices is all less than the size at test probe middle part and fixes the middle part restriction of test probe between the upper end of first fixed orifices and the lower extreme of second fixed orifices.

Furthermore, the cover plate and the fixed plate body are locked and fixed through screws.

Further, the side wall of the mounting groove is also provided with an outwards extending abdication groove.

Furthermore, the conductive points are realized by adopting copper exposure points.

Further, the fixing plate and the carrier plate are locked and fixed through the matching of screws and nuts.

Further, the test terminal includes an interface and a pin header.

Further, a functional test circuit is further arranged on the carrier plate, and the functional test circuit is electrically connected with the corresponding conductive point through a circuit arranged on the carrier plate.

The beneficial technical effects of the utility model are as follows:

the utility model does not need to use a lead to be welded with a test probe for wiring, the whole fixture circuit is concise, the problem of needle leakage or easy short circuit is avoided, the safety and the reliability are high, the wiring and the error checking of the test fixture in the later stage of manufacturing the test fixture are convenient, and in addition, the wiring is convenient and rapid during the test.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings that are needed in the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a top view of an embodiment of the present utility model;

FIG. 2 is a bottom view of an embodiment of the present utility model;

FIG. 3 is a partially exploded view of an embodiment of the present utility model;

FIG. 4 is a cross-sectional view of an embodiment of the present utility model;

FIG. 5 is a block diagram of a probe assembly according to an embodiment of the utility model;

FIG. 6 is a block diagram of another view of a probe assembly according to an embodiment of the utility model;

FIG. 7 is an exploded view of a probe assembly according to an embodiment of the present utility model;

fig. 8 is an exploded view of another view of a probe assembly according to an embodiment of the present utility model.

Detailed Description

For further illustration of the various embodiments, the utility model is provided with the accompanying drawings. The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate embodiments and together with the description, serve to explain the principles of the embodiments. With reference to these matters, one of ordinary skill in the art will understand other possible embodiments and advantages of the present utility model. The components in the figures are not drawn to scale and like reference numerals are generally used to designate like components.

The utility model will now be further described with reference to the drawings and detailed description.

As shown in fig. 1-8, a test fixture includes a probe assembly 1 and a carrier plate 2, the probe assembly 1 is disposed on a top surface of the carrier plate 2, the probe assembly 1 includes a fixing plate 11 and a plurality of test probes 12, the plurality of test probes 12 are fixed on the fixing plate 11 and correspond to test points of a product 3 to be tested one by one, in this embodiment, the product 3 to be tested is a communication module, such as a 4G communication module, a 5G communication module, a bluetooth communication module, etc., and the test points are pad centers of all functional pins, but not limited thereto, in some embodiments, the product 3 to be tested may also be a circuit board, etc. other products requiring electrical performance test.

The top surface of the carrier plate 2 is provided with a mounting area 21, the probe assembly 1 is arranged on the mounting area 21, a plurality of conductive points 22 are arranged in the mounting area 21, the plurality of conductive points 22 are respectively in contact electrical connection with the bottom ends of the plurality of test probes 12 one by one, namely, the bottoms of the test probes 12 are pressed on the conductive points 22 to be electrically connected, the carrier plate 2 is also provided with test terminals, the test terminals are electrically connected with the corresponding conductive points 22 through circuits (not shown in the drawing) arranged on the carrier plate 2, and the test terminals are used for being connected with external test instruments or test circuits, so that wiring during testing is more convenient. The circuit on the carrier board 2 can be manufactured by adopting the existing circuit technology of the circuit board, which is already the very mature prior art and is not described in detail.

Preferably, in this embodiment, the test probe 12 is implemented by a spring probe, so that the test probe 12 has good contact with the test point of the product 3 to be tested, and the puncture of the product 3 to be tested by the test probe 12 is reduced, but the present utility model is not limited thereto, and in some embodiments, the test probe 12 may be implemented by other existing probes.

In this embodiment, the length of the test probe 12 is 3.4mm, the maximum diameter is 0.8mm, and the test probe can be used for testing the product 3 to be tested with a pin pitch of 1.0mm, and the test probe 12 is shorter, so that the impedance is reduced, and the test probe is beneficial to signal transmission.

In this embodiment, the fixing plate 11 is a square plate, but the structure is not limited thereto, and in some embodiments, the fixing plate 11 may be a circular plate or other structures.

The top surface of the fixed plate 11 is provided with a placing groove 13 for placing the product 3 to be tested, a plurality of test probes 12 are fixedly arranged on the bottom of the placing groove 13 in a penetrating mode, the top ends of the test probes 12 are higher than the bottom surface of the placing groove 13 and are convenient to contact with test points of the product 3 to be tested for electric connection, and the bottom ends of the test probes 12 extend out of the bottom surface of the fixed plate 11 and are in contact electric connection with the conductive points 22, so that the product 3 to be tested is convenient to fix by arranging the placing groove 13.

Specifically, in the present embodiment, the placement groove 13 is a square groove, but not limited to this, and in some embodiments, the shape of the placement groove 13 may be set according to the shape of the product 3 to be tested.

In this embodiment, the sidewall of the placement groove 13 is further provided with an outwardly extending relief groove 131, so as to facilitate taking and placing the product 3 to be tested. Preferably, the number of the placement grooves 13 is 2, and the placement grooves 13 are arranged on two opposite sides of the placement grooves 13, so that the product 3 to be measured can be conveniently fetched and placed.

The fixed plate 11 includes fixed plate body 111 and apron 112, place recess 13 setting on the top surface of fixed plate body 111, the bottom surface that fixed plate body 111 corresponds to placing recess 13 is equipped with mounting groove 1111, apron 112 sets up in mounting groove 1111, fixed plate body 111 and apron 112 are equipped with corresponding first fixed orifices 1112 and second fixed orifices 1121, test probe 12 wears to establish in first fixed orifices 1112 and second fixed orifices 1121, and the top of test probe 12 stretches out the top of first fixed orifices 1112, the bottom of test probe 12 exposes the bottom of second fixed orifices 1121, the size of the upper end of first fixed orifices 1112 and the lower extreme of second fixed orifices 1121 is all less than the size of test probe 12 middle part and restrict the middle part of test probe 12 to fix between the upper end of first fixed orifices 1112 and the lower extreme of second fixed orifices 1121, and accomplish the fixed mounting of test probe 12, make things convenient for the dismouting.

In this embodiment, the cover plate 112 and the fixing plate body 111 are locked by screws (not shown in the drawings, which can be easily realized by those skilled in the art, and not described in detail), so that the fixing device has good stability and is convenient to disassemble and assemble, but the fixing device is not limited thereto, and in some embodiments, the cover plate 112 and the fixing plate body 111 can be fixedly connected by other existing fixing structures, such as a clamping structure.

Of course, in some embodiments, the test probes 12 may be fixed to the fixing plate 11 using other fixing structures.

Specifically, in the present embodiment, the mounting groove 1111 is a square groove, and accordingly, the cover plate 112 is of a square structure, which is more compact and reasonable, but not limited thereto, and in some embodiments, the shapes of the mounting groove 1111 and the cover plate 112 may be actually required to be set.

In this embodiment, the sidewall of the mounting slot 1111 is further provided with an outwardly extending relief groove 1113 to facilitate access to the cover plate 112. Preferably, the number of the relief grooves 1113 is 2, and the relief grooves are arranged on two opposite sides of the mounting groove 1111, so that the cover plate 112 can be conveniently taken and placed.

In this embodiment, the conductive points 22 are realized by copper exposure points, and the conductive points have good conductive performance, can be realized by the existing circuit board technology, are easy to process, and have low cost, but are not limited thereto, and in some embodiments, the conductive points 22 can be realized by other conductive materials, such as aluminum foil, etc.

Preferably, in this embodiment, the test terminals include test terminals corresponding to various functions to be tested, and are electrically connected to the corresponding conductive points 22 through wires provided on the carrier plate 2, respectively, and the test terminals are provided around the outer periphery of the mounting area 21, so as to facilitate wiring during testing.

In this embodiment, the test terminals include an interface 23 and a pin 24, which are adapted to the wiring of various test instruments or test circuits.

In this embodiment, the carrier plate 2 is further provided with a functional test circuit 25, and the functional test circuit 25 is electrically connected with the corresponding conductive points 22 through a circuit disposed on the carrier plate 2, so as to test the corresponding function of the product 3 to be tested, such as I/O port on-off test, without external test instruments or test circuits, so that the integration level is higher, and the test is simpler and more convenient. The functional test circuit 25 is disposed around the outside of the mounting area 21.

In this embodiment, the test terminals and the functional test circuit 25 are disposed on the bottom surface of the carrier plate 2, which is more reasonable and compact in structure and more convenient for testing, but not limited thereto.

In this embodiment, the fixing plate 11 and the carrier plate 2 are locked and fixed by the screw 4 and the nut 5, so that the fixing plate is good in stability and easy to disassemble, but the fixing plate is not limited thereto, and in some embodiments, the fixing plate 11 and the carrier plate 2 can be fixedly connected by adopting other existing fixing structures, such as a clamping structure.

During testing, the product 3 to be tested is placed in the placement groove 13 and is pressed, the plurality of test probes 12 are respectively pressed against the test points (pin pads) of the product 3 to be tested, then the test can be performed by connecting corresponding test instruments or test circuits through the test terminals, and meanwhile, the function test circuit 25 can directly perform corresponding function tests.

The utility model does not need to use a lead to be welded with a test probe for wiring, the whole jig has simple circuit, avoids the problem of needle leakage or easy short circuit, has high safety and reliability, is convenient for wiring and jig error checking in the later manufacturing period of the jig, and is convenient for wiring during testing.

While the utility model has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the utility model as defined by the appended claims.

Claims

1. A test fixture is characterized in that: including probe subassembly and carrier plate, probe subassembly sets up on the top surface of carrier plate, and probe subassembly includes fixed plate and a plurality of test probe, and a plurality of test probes are fixed on the fixed plate, and correspond with the test point of the product that awaits measuring, are equipped with a plurality of conductive points on the top surface of carrier plate, and a plurality of conductive points are connected with the bottom one-to-one contact electricity of a plurality of test probes respectively, still are equipped with the test wiring end on the carrier plate, and the test wiring end is connected with corresponding conductive point electricity through the circuit that sets up on the carrier plate.

2. The test fixture of claim 1, wherein: the test probes are implemented with spring probes.

3. The test fixture of claim 1, wherein: the top surface of the fixed plate is provided with a placing groove for placing a product to be tested, a plurality of test probes are fixedly arranged on the bottom of the placing groove in a penetrating mode, the top ends of the test probes are higher than the bottom surface of the placing groove, and the bottom ends of the test probes extend out of the bottom surface of the fixed plate and are in contact electrical connection with the conductive points.

4. The test fixture of claim 3, wherein: the fixed plate comprises a fixed plate body and a cover plate, wherein the placement groove is formed in the top surface of the fixed plate body, an installation groove is formed in the bottom surface of the fixed plate body, corresponding to the placement groove, of the fixed plate body, the cover plate is arranged in the installation groove, the fixed plate body and the cover plate are provided with a first fixed hole and a second fixed hole, the test probe penetrates through the first fixed hole and the second fixed hole, the sizes of the upper end of the first fixed hole and the lower end of the second fixed hole are smaller than those of the middle of the test probe, and the middle of the test probe is limited and fixed between the upper end of the first fixed hole and the lower end of the second fixed hole.

5. The test fixture of claim 4, wherein: the cover plate and the fixed plate body are locked and fixed through screws.

6. The test fixture of claim 4, wherein: the side wall of the mounting groove is also provided with an outwards extending abdication groove.

7. The test fixture of claim 1, wherein: the conductive points are realized by adopting copper exposure points.

8. The test fixture of claim 1, wherein: the fixing plate and the carrier plate are locked and fixed through the matching of screws and nuts.

9. The test fixture of claim 1, wherein: the test terminals include interfaces and pins.

10. The test fixture of claim 1, wherein: and the carrier plate is also provided with a functional test circuit, and the functional test circuit is electrically connected with the corresponding conductive point through a circuit arranged on the carrier plate.