CN108448279A - An S-type connector and a chip test socket using the connector - Google Patents

Abstract

The invention discloses an S-type connector and a chip test seat using the connector. The chip test socket includes a base and a top cover, the base and the top cover are fixedly connected, the top cover is provided with a chip receiving groove, and the base is provided with a first groove, a second groove and several Jack, the above-mentioned S-shaped connector is arranged in the said jack, and the said S-shaped connector can move along the up and down direction of the base in the said jack, and the said first groove is provided with the matching first An elastic component, a second elastic component matched with the second groove is arranged in the second groove, and the first elastic component and the second elastic component are respectively connected with two inner circular arcs of the S-shaped connector. In the present invention, an S-shaped connector that can move up and down is arranged on the base. When the chip is tested, the length of the connector before and after the chip is pressed remains unchanged, so that the impedance of the test seat remains unchanged and the test error of the chip is smaller.

Description

An S-type connector and a chip test socket using the connector

technical field

The invention relates to the field of electronic product testing, in particular to an S-shaped connector and a chip test socket using the connector.

Background technique

With the increasing integration of electronic circuits, in order to save space and simplify circuit design, multiple functions are integrated. The advanced circuit integration design is packaged in a chip module, such as SIP, SOC technology. Usually the gold fingers or pads of this type of chip are relatively small. In order to accurately test various index parameters of SIP/SOC packaged chips, high-precision pogo pin modules are usually used to make special test sockets for conduction testing. Pogo pin is a precision connector used in mobile phones and other electronic products. It consists of three basic parts: needle shaft, spring and needle tube. It is a spring-type probe formed by riveting and pre-pressing with precision instruments. There is a precision pin inside. spring structure. The base of the chip test piece made of pogo pins has different lengths before and after chip bonding. The different lengths lead to different impedances of the pogo pins, which is not conducive to error calculation during chip testing.

Contents of the invention

In order to solve the above-mentioned technical problems, the object of the present invention is to provide an S-type connector whose impedance of the test socket itself remains unchanged before and after chip pressing, and a chip test socket using the connector.

The technical solution adopted in the present invention is: an S-shaped connector, which includes a sheet-shaped conductor in an S-shaped shape, with a chip contact portion at one end and a PCB contact portion at the other end.

A chip test seat, which includes a base and a top cover, the base and the top cover are fixedly connected, the top cover is provided with a chip receiving groove, and the base is provided with a first groove and a second groove and a plurality of sockets, the above-mentioned S-shaped connectors are arranged in the sockets, and the S-shaped connectors can move along the up and down direction of the base in the sockets, and the corresponding sockets are arranged in the first groove. Match the first elastic part, the second groove is provided with a matching second elastic part, the first elastic part and the second elastic part are respectively connected with the two inner arcs of the S-shaped connector connect.

Further, the positions of the first elastic component and the second elastic component are not parallel.

Further, the positions of the first elastic component and the second elastic component are both elastic rubber strips.

Further, the first groove and the second groove are both circular grooves, the positions of the first elastic part and the second elastic part are cylindrical rubber strips, and the inner diameter of the first groove is less than The diameter of the first elastic component and the inner diameter of the second groove are smaller than the diameter of the second elastic component.

Further, the base is provided with several positioning pins, and the top cover is provided with through holes corresponding to the several positioning pins one by one.

Further, one pair of opposite sides of the chip receiving groove is respectively provided with notches.

Further, several copper nuts are arranged on the base.

The beneficial effects of the present invention are: the present invention arranges the S-shaped connector movable up and down on the base, and provides the first elastic component and the second elastic component, so that the S-shaped connector can be reset after being pressed. In the present invention, the length of the connector remains unchanged before and after the chip is pressed, so that the impedance of the test seat itself remains unchanged, and the test error of the chip is smaller. In addition, the present invention does not need to use Pogo pin elastic probes, so that the production cost of the test seat is reduced. .

Description of drawings

The specific embodiment of the present invention will be further described below in conjunction with accompanying drawing:

Fig. 1 is a structural diagram of an S-type connector in the present invention;

Fig. 2 is the overall schematic diagram of the chip test seat in the present invention;

Fig. 3 is the exploded diagram of chip test seat among the present invention;

Fig. 4 is an assembly diagram of the S-shaped connector, the first elastic component and the second elastic component in the present invention.

Detailed ways

It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.

As shown in FIG. 1 , it shows an S-type connector, which includes a sheet conductor 1 in the shape of an S, with a chip contact portion 2 at one end and a PCB contact portion 3 at the other end. The sheet conductor 1 is made of metal, preferably copper. The chip contact part 2 is used for connecting with the golden finger or pad of the chip, and the PCB contact part 3 is used for connecting with the test board of the testing instrument.

As shown in Figures 2 to 3, it shows a chip test socket, which includes a base 5 and a top cover 4, the base 5 and the top cover 4 are fixedly connected, and the base 5 is provided with several positioning pins 6. The top cover 4 is provided with through holes corresponding to the plurality of positioning points one by one. The top cover 4 is provided with a chip receiving groove 7, and the shape and size of the chip receiving groove 7 are matched with the chip to be tested. Preferably, one pair of opposite sides of the chip receiving groove 7 is respectively provided with notches 13 to facilitate placement and removal of the chip to be tested. The base is provided with a first groove 8, a second groove 9 and several sockets 10, the socket 10 is provided with the above-mentioned S-type connector, and the S-type connector can be used in the socket Moving along the up and down direction of the base, the first groove 8 is provided with a matching first elastic member 11 , and the second groove 9 is provided with a matching second elastic member 12 . The positions of the first elastic component 11 and the second elastic component 12 are elastic strips.

Preferably, the first groove 8 and the second groove 9 are circular grooves, and the positions of the first elastic part 11 and the second elastic part 12 are cylindrical rubber strips. The inner diameter of the groove 8 is smaller than the diameter of the first elastic component 11 , and the inner diameter of the second groove 9 is smaller than the diameter of the second elastic component 12 .

Several copper nuts 14 are provided on the base 5, and the top cover 4 is provided with corresponding through holes. When using the test socket to test the chip, the test socket is placed on the test instrument and can be fixed by the nut 14 .

As shown in FIG. 4 , the first elastic component 11 and the second elastic component 12 are respectively connected to two inner circular arcs of the S-shaped connector. The first elastic component 11 is not parallel to the second elastic component 12 . Through the first elastic member 11 and the second elastic member 12, the S-shaped connector can be reset after being pressed. When the chip is tested, the length of the connector before and after the chip is pressed remains unchanged, so that the impedance of the test socket remains unchanged. The test error of the chip is reduced, and the present invention does not need to use Pogo pin elastic probes, so that the production cost of the test seat is reduced.

The above is a specific description of the preferred implementation of the present invention, but the invention is not limited to the described embodiments, and those skilled in the art can also make various equivalent deformations or replacements without violating the spirit of the present invention. , these equivalent modifications or replacements are all within the scope defined by the claims of the present application.

Claims (8)

1. An S-type connector, characterized in that: it comprises a sheet-like conductor in an S-shape, one end of which is provided with a chip contact portion, and the other end is provided with a PCB contact portion. 2. A chip test socket, characterized in that: it comprises a base and a top cover, the base and the top cover are fixedly connected, the top cover is provided with a chip receiving groove, The base is provided with a first groove, a second groove and several sockets, and the S-type connector according to claim 1 is arranged in the socket, and the S-type connector is located in the socket. It can move up and down along the base, The first elastic part is provided in the first groove to match it, the second elastic part is provided in the second groove to match it, and the first elastic part and the second elastic part are respectively connected with the The two inner arcs of the S-type connector are connected. 3. The chip test socket according to claim 2, wherein the position of the first elastic component is not parallel to that of the second elastic component. 4 . The chip test socket according to claim 3 , wherein the positions of the first elastic component and the second elastic component are both elastic rubber strips. 5. The chip test socket according to claim 4, characterized in that: the first groove and the second groove are both circular grooves, and the positions of the first elastic part and the second elastic part are both The rubber strip is a cylinder, the inner diameter of the first groove is smaller than the diameter of the first elastic component, and the inner diameter of the second groove is smaller than the diameter of the second elastic component. 6. The chip test socket according to any one of claims 2 to 5, characterized in that: the base is provided with several positioning pins, and the top cover is provided with through holes corresponding to the several positioning pins one by one . 7 . The chip test socket according to claim 6 , wherein a set of opposite sides of the chip receiving groove is respectively provided with notches. 8 . 8. The chip test socket according to claim 7, wherein a plurality of copper nuts are arranged on the base.