CN220961612U - Switching module for chip test and chip test device - Google Patents
Switching module for chip test and chip test device Download PDFInfo
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- CN220961612U CN220961612U CN202322673468.4U CN202322673468U CN220961612U CN 220961612 U CN220961612 U CN 220961612U CN 202322673468 U CN202322673468 U CN 202322673468U CN 220961612 U CN220961612 U CN 220961612U
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- 238000012360 testing method Methods 0.000 title claims abstract description 99
- 238000001514 detection method Methods 0.000 claims abstract description 39
- 238000012546 transfer Methods 0.000 claims abstract description 12
- 230000002093 peripheral effect Effects 0.000 abstract description 6
- 238000012827 research and development Methods 0.000 abstract description 4
- 238000012795 verification Methods 0.000 abstract description 4
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 238000013461 design Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
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Abstract
The utility model relates to the technical field of chip testing, and discloses a transfer module for chip testing and a chip testing device, which comprise a module body and a transfer plate, wherein a detection circuit is arranged on the module body; the adapter plate is provided with an adapter circuit, the module body is arranged on the adapter plate, the detection circuit is communicated with the adapter circuit, and the adapter plate is configured to be connected with the testing machine so that the detection circuit is electrically connected with the testing machine through the adapter circuit. According to the utility model, the chip to be tested is only required to be arranged on the module body during testing, and then the module body is connected with the adapter plate, so that the steps of arranging golden fingers or carrying peripheral Kelvin connector components of the chip and peripheral circuits in the research and development stage in the prior art are reduced, the consistency of a verification circuit and an actual mass production circuit is realized, the detection efficiency is improved, the research and development period is shortened, the connection reliability is improved, and the testing accuracy is further ensured.
Description
Technical Field
The present utility model relates to the field of chip testing technologies, and in particular, to a switching module for chip testing and a chip testing device.
Background
At present, the final test of chips requires more and more peripheral circuits, and the influence of parts and high-frequency peripheral circuits required by the test on the chips to be tested is greater and greater.
In the prior art, a chip to be tested is usually connected with a golden finger or a slot in a Kelvin mode and is connected with a test board based on a special design of the chip to be tested, and an automatic tester is connected with the test board based on the special design of the chip to be tested through a wire to test the chip to be tested. However, the above test scheme has the following problems: the test and verification scheme of selecting Kelvin mode slots or golden finger contact connection is very time-consuming and labor-consuming, and has the possibility of distortion of verification results due to poor contact. The position of the chip to be tested during design, development and verification and the connection state of the chip to be tested at the test position of the test board during mass production are easy to generate inconsistency.
Therefore, there is a need for a transfer module for chip testing and a chip testing device to solve the above problems.
Disclosure of utility model
Based on the above, the utility model aims to provide a transfer module for chip test and a chip test device, which are more convenient and quick to connect and have high adaptability.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
The switching module for chip test comprises;
The module body is provided with a detection circuit, and a chip to be detected can be arranged on the module body and is communicated with the detection circuit;
The adapter plate is provided with an adapter circuit, the module body is arranged on the adapter plate, the detection circuit is communicated with the adapter circuit, and the adapter plate is configured to be connected with a testing machine so that the detection circuit is electrically connected with the testing machine through the adapter circuit.
As a preferred scheme of the switching module for chip test, a connecting seat is arranged on the module body, the connecting seat is communicated with the detection circuit, and the chip to be tested is electrically connected with the connecting seat.
As a preferred scheme of the switching module for chip test, the connecting seat is in welded connection with the module body, and the chip to be tested is placed in the connecting seat.
As a preferred scheme of the switching module for chip test, the connecting seat is provided with a plurality of connecting points, the connecting points can be communicated with the detection circuit, the chip to be tested is provided with test contacts, and the number of the connecting points is not less than that of the test contacts.
As a preferred scheme of the switching module for chip test, the connection points comprise universal connection points and special connection points, the universal connection points are divided into two groups, the two groups of the universal connection points are oppositely arranged, and the special connection points are arranged between the two groups of the universal connection points.
As a preferable scheme of the switching module for chip test, the switching plate is provided with an avoidance hole, and the avoidance hole is used for avoiding the connecting seat.
As a preferred scheme of the switching module for chip test, a first positioning hole is formed in the module body, a second positioning hole is formed in the switching plate, and the first positioning hole can be connected with the first positioning hole so that the detection circuit is conducted with the switching circuit.
As a preferable scheme of the switching module for chip test, a third positioning hole is formed in the testing machine, and the second positioning hole can be connected with the third positioning hole so as to enable the switching circuit to be conducted with the testing machine; the adapter plate is connected with the wire of the tester.
As a preferable scheme of the switching module for chip test, a plurality of first positioning holes are formed, and a plurality of positioning holes are wound around the periphery of the chip to be tested.
The chip testing device comprises a testing machine and the switching module for chip testing according to any scheme, wherein the switching board is electrically connected with the testing machine.
The beneficial effects of the utility model are as follows:
The utility model is used for placing the chip to be tested by arranging the module body; meanwhile, a detection circuit is further arranged on the detection body, and when the chip to be detected is arranged on the module body, the chip can be communicated with detection. The adapter plate is arranged and used for realizing the connection between the module body and the testing machine; the adapter plate is provided with an adapter circuit, and when the adapter plate is connected with the testing machine, the detection circuit and the adapter circuit are conducted and electrically connected with the testing machine and used for detecting the chip to be tested. According to the transfer module for chip testing, the module body integrated with the detection circuit is arranged, the chip to be tested is only required to be arranged on the module body during testing, and then the module body is connected with the transfer plate, so that the steps of arranging the golden finger, the slot and other peripheral circuits in the prior art are reduced, the detection efficiency is improved, the research and development period is shortened, the connection reliability is improved, and the testing accuracy is further guaranteed.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present utility model, the following description will simply refer to the drawings that are required to be used in the description of the embodiments of the present utility model. The drawings in the following description are only some embodiments of the present utility model and it will be apparent to those skilled in the art from this description and these drawings that other drawings may be made without undue burden.
FIG. 1 is a schematic diagram of a module body of a transfer module for chip testing according to an embodiment of the present utility model;
FIG. 2 is a schematic diagram of an interposer of a chip test interposer module according to an embodiment of the present utility model;
Fig. 3 is a schematic diagram of a transfer module for chip testing according to an embodiment of the utility model.
In the figure:
100. a module body; 110. a detection circuit; 120. a connecting seat;
200. An adapter plate; 210. a switching circuit; 220. avoiding the hole.
Detailed Description
Embodiments of the present utility model are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative and intended to explain the present utility model and should not be construed as limiting the utility model.
In the description of the present utility model, it should be noted that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. Wherein the terms "first position" and "second position" are two different positions.
Unless specifically stated or limited otherwise, the terms "mounted," "connected," and "fixed" are to be construed broadly, and may be, for example, either fixed or removable; the mechanical connection and the electrical connection can be adopted; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.
In the present utility model, unless expressly stated or limited otherwise, a first feature "above" or "below" a second feature may include both the first and second features being in direct contact, as well as the first and second features not being in direct contact but being in contact with each other through additional features therebetween. Moreover, a first feature being "above," "over" and "on" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature includes the first feature being directly under and obliquely below the second feature, or simply means that the first feature is less level than the second feature.
The technical scheme of the utility model is further described below by the specific embodiments with reference to the accompanying drawings.
As shown in fig. 1 to 3, the present embodiment provides a chip testing adapter module, which includes a module body 100 and an adapter board 200, wherein a detection circuit 110 is disposed on the module body 100, and a chip to be tested can be disposed on the module body 100 and is connected to the detection circuit 110; the adapter board 200 is provided with an adapter circuit 210, the module body 100 is disposed on the adapter board 200, and the detection circuit 110 is conducted with the adapter circuit 210, and the adapter board 200 is configured to be connectable with a testing machine, so that the detection circuit 110 is electrically connected with the testing machine through the adapter circuit 210.
The module body 100 is used for placing a chip to be tested; meanwhile, the detection body is further provided with a detection circuit 110, and when the chip to be detected is arranged on the module body 100, the chip can be communicated with detection. The adapter plate 200 is used for realizing the connection between the module body 100 and the testing machine; specifically, the adapter board 200 is provided with an adapter circuit 210, and when the adapter board 200 is connected to a tester, the detection circuit 110 and the adapter circuit 210 are electrically connected to the tester for detecting the chip to be tested. The above-mentioned transfer module for chip test is through setting up the module body 100 integrated with detection circuit 110, only need to set up the chip to be tested in the module body 100 while testing, and then connect the module body 100 with adapter plate 200, reduce the step of setting up peripheral circuits such as golden finger and slot in the prior art, have not merely improved the detection efficiency, has shortened the research and development cycle; and the reliability of connection is improved, so that the accuracy of the test is ensured.
Optionally, the Kelvin test circuit is adopted in the test circuit, so that the resistance values of the circuit and the contact resistance of the inner conductor of the circuit can be effectively avoided, and the accuracy of the test result is further ensured.
As an alternative scheme of the switching module for chip testing, in order to realize connection between the chip to be tested and the module body 100, the module body 100 is provided with a connection base 120, the connection base 120 is connected to the detection circuit 110, and the chip to be tested is electrically connected to the connection base 120. It can be understood that the connection base 120 is provided with a gold finger for conducting with the chip to be tested and the test circuit.
Specifically, the module body 100 is provided with a mounting groove, and the connecting seat 120 is disposed in the mounting groove. The installation of the installation groove is beneficial to the positioning of the connecting seat 120 on one hand, and on the other hand, the excessive protrusion of the connecting seat 120 on the module body 100 can be reduced.
Optionally, the connection base 120 is welded to the module body 100; the chip to be tested is placed in the connection pad 120. The connection between the connecting seat 120 and the module body 100 and the connection between the chip to be tested and the connecting seat 120 are realized through welding, so that the connection is more reliable, the occurrence of poor contact is effectively avoided, and the reliability of a test result is ensured.
Further, the connection base 120 is provided with a plurality of connection points, the plurality of connection points can be communicated with the detection circuit 110, the chip to be tested is provided with a test contact, and the conduction between the chip to be tested and the detection circuit 110 is realized by electrically connecting the test contact and the connection point. It should be noted that, the number of connection points is not less than the number of test contacts, so that the connection base 120 can adapt to chips to be tested having different test contacts, and the universality of the adapter module for chip testing is improved.
Preferably, the connection points include a general connection point and a special connection point, the general connection point is divided into two groups, the two groups of general connection points are arranged oppositely, and the special connection point is arranged between the two groups of general connection points. Illustratively, the common connection points are provided in eight, four of which are in one group, and the dedicated connection points are provided in one, and are provided between the two groups of common connection points.
In this embodiment, the adapting plate 200 is provided with the avoidance hole 220, and by setting the avoidance hole 220, when the module body 100 provided with the connecting seat 120 is connected with the adapting plate 200, the avoidance hole 220 can be used for avoiding the connecting seat 120, so that interference of the adapting plate 200 to the connecting seat 120 is reduced.
As an alternative scheme of the adapter module for chip testing, in order to realize positioning between the module body 100 and the adapter plate 200, a first positioning hole is provided on the module body 100, and a second positioning hole is provided on the adapter plate 200, when the module body 100 and the adapter plate 200 are connected, the detection circuit 110 and the adapter circuit 210 can be accurately conducted only by aligning and connecting the first positioning hole with the first positioning hole, and the testing efficiency is effectively improved.
Further, the testing machine is provided with a third positioning hole, and when the adapter plate 200 is connected with the testing machine, the connection between the adapter circuit 210 and the testing machine can be realized by only aligning and connecting the second positioning hole with the third positioning hole. In this embodiment, the adapter plate 200 is also welded to the testing machine, so that the connection is more convenient and reliable.
Optionally, to ensure positioning and connection reliability, the first positioning holes are provided in plurality, and the plurality of positioning holes are wound around the periphery of the chip to be tested, so that interference of the chip to be tested can be avoided.
The embodiment also discloses a chip testing device, which comprises a testing board and the switching module for chip testing according to any one of the above schemes, wherein the switching board 200 is electrically connected with the testing machine. The chip testing device provided with the switching module for chip testing is more convenient and quick to connect, can rapidly and accurately detect the chip to be tested, effectively shortens the development and mass production period of products, and reduces the cost of the products.
The foregoing is merely exemplary of the present utility model, and those skilled in the art should not be considered as limiting the utility model, since modifications may be made in the specific embodiments and application scope of the utility model in light of the teachings of the present utility model.
Claims (10)
1. The switching module for chip test is characterized by comprising;
The module body (100) is provided with a detection circuit (110), and a chip to be tested can be placed on the module body (100) and is communicated with the detection circuit (110);
the adapter plate (200) is provided with an adapter circuit (210), the module body (100) is arranged on the adapter plate (200), the detection circuit (110) is communicated with the adapter circuit (210), and the adapter plate (200) is configured to be connected with a testing machine so that the detection circuit (110) is electrically connected with the testing machine through the adapter circuit (210).
2. The adapter module for chip testing according to claim 1, wherein a connection base (120) is disposed on the module body (100), the connection base (120) is connected to the detection circuit (110), and the chip to be tested is electrically connected to the connection base (120).
3. The adapter module for chip testing according to claim 2, wherein the connection base (120) is welded to the module body (100), and the chip to be tested is placed in the connection base (120).
4. The transfer module for chip testing according to claim 2, wherein a plurality of connection points are provided on the connection base (120), the plurality of connection points can be communicated with the detection circuit (110), the chip to be tested is provided with test contacts, and the number of the connection points is not less than the number of the test contacts.
5. The adapter module for chip testing according to claim 4, wherein the connection points include a general connection point and a special connection point, the general connection point is divided into two groups, the two groups of the general connection points are oppositely arranged, and the special connection point is arranged between the two groups of the general connection points.
6. The adapter module for chip testing according to claim 2, wherein the adapter plate (200) is provided with an avoidance hole (220), and the avoidance hole (220) is used for avoiding the connection seat (120).
7. The adapter module for chip testing according to claim 1, wherein a first positioning hole is provided on the module body (100), a second positioning hole is provided on the adapter plate (200), and the first positioning hole can be connected with the first positioning hole, so that the detection circuit (110) is conducted with the adapter circuit (210).
8. The transfer module for chip testing according to claim 7, wherein a third positioning hole is provided on the tester, and the second positioning hole can be connected to the third positioning hole, so that the transfer circuit (210) is in conduction with the tester; the adapter plate (200) is connected with the wire of the tester.
9. The adapter module for chip testing according to claim 7, wherein a plurality of the first positioning holes are provided, and a plurality of the positioning holes are wound around the periphery of the chip to be tested.
10. Chip testing device, characterized by comprising a tester and a switching module for chip testing according to any of claims 1-9, said switching board (200) being electrically connected to said tester.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322673468.4U CN220961612U (en) | 2023-10-07 | 2023-10-07 | Switching module for chip test and chip test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322673468.4U CN220961612U (en) | 2023-10-07 | 2023-10-07 | Switching module for chip test and chip test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220961612U true CN220961612U (en) | 2024-05-14 |
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ID=91007091
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322673468.4U Active CN220961612U (en) | 2023-10-07 | 2023-10-07 | Switching module for chip test and chip test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220961612U (en) |
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2023
- 2023-10-07 CN CN202322673468.4U patent/CN220961612U/en active Active
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