CN218158210U - High-efficiency testing device for laser chip - Google Patents
High-efficiency testing device for laser chip Download PDFInfo
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- CN218158210U CN218158210U CN202221181614.0U CN202221181614U CN218158210U CN 218158210 U CN218158210 U CN 218158210U CN 202221181614 U CN202221181614 U CN 202221181614U CN 218158210 U CN218158210 U CN 218158210U
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- photoelectric detector
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Abstract
The utility model discloses a high-efficient testing arrangement for laser instrument chip, its determine module includes through a pedestal mounting photoelectric detector on the drive support, the photoelectric detector's that is located the testboard outside receipts plain noodles is located towards the testboard, still be provided with a prism between photoelectric detector's receipts plain noodles and the testboard, the prism is used for collecting the scattered light that the chip that awaits measuring that will come from on the testboard sent to photoelectric detector's receipts light region, the drive support further includes two parallel arrangement's pole setting, connect the mounting panel between two pole setting upper ends and connect the connecting plate between two pole setting lower extremes, determine module installs the upper surface in the mounting panel, the test probe subassembly is installed in the upper surface of mounting panel and is evenly distributed in the determine module both sides in proper order. The utility model discloses both can provide mounted position for more test probe subassemblies, can guarantee photoelectric detector again and receive the efficiency of light to the examination chip that awaits measuring.
Description
Technical Field
The utility model relates to a high-efficient testing arrangement for laser instrument chip belongs to chip test technical field.
Background
The semiconductor laser has the advantages of high electro-optical efficiency, small volume, long service life, low price and the like, and is widely applied to the fields of military affairs, medical treatment, communication and the like. In a test link in the Laser production process, the photoelectric performance of a single Laser chip (LD) needs to be tested, and a Laser with a problem in performance is selected in advance. The light emitted by the semiconductor laser chip after being powered on has a certain scattering angle, so that the photoelectric detector needs to be as close to the chip to be tested as possible to ensure that more light emitted by the chip enters the effective light receiving area.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a high-efficient testing arrangement for laser instrument chip, this a high-efficient testing arrangement for laser instrument chip both can provide the mounted position for more test probe subassembly, can guarantee again that photoelectric detector receives the efficiency of light to the chip that awaits measuring.
In order to achieve the above purpose, the utility model adopts the technical scheme that: a high efficiency testing apparatus for laser chips, comprising: the testing device comprises a substrate, a testing platform arranged on the upper surface of the substrate, a driving support arranged on the outer side of the substrate, at least three testing probe assemblies and a detection assembly, wherein the at least three testing probe assemblies and the detection assembly are arranged on the driving support and are positioned above the testing platform, the detection assembly comprises a photoelectric detector arranged on the driving support through a support, a light receiving surface of the photoelectric detector positioned on the outer side of the testing platform is positioned towards the testing platform, a prism is further arranged between the light receiving surface of the photoelectric detector and the testing platform, and the prism is used for collecting divergent light emitted from a chip to be tested on the testing platform into a light receiving area of the photoelectric detector.
The further improved scheme in the technical scheme is as follows:
1. in the above scheme, the drive support further includes two parallel arrangement's pole setting, connects the mounting panel between two pole setting upper ends and connects the connecting plate between two pole setting lower extremes, detecting element installs in the upper surface of mounting panel, the test probe subassembly is installed in the upper surface of mounting panel and evenly distributed in the detecting element both sides in proper order.
2. In the scheme, a fixing plate installed on the base plate is vertically arranged between the vertical rod of the driving support and the base plate, a motor is installed on the lower portion of the fixing plate, a lead screw is installed on an output shaft of the motor in the vertical direction, and a lead screw nut sleeved on the lead screw is connected with a connecting plate of the driving support.
3. In the above scheme, two sides of the screw rod and a sliding rail are respectively arranged between the vertical rod and the fixing plate, and the vertical rod is movably connected with the sliding rail through at least two sliding blocks.
4. In the above scheme, the prism is mounted on the support of the detection assembly through a support seat.
Because of above-mentioned technical scheme's application, compared with the prior art, the utility model have the following advantage:
the utility model discloses a high-efficient testing arrangement for laser instrument chip, it includes three at least test probe subassembly and determine module, is located the testboard outside determine module's photoelectric detector's receipts plain noodles is located towards the testboard, still is provided with a prism between photoelectric detector's receipts plain noodles and the testboard, the prism is used for in the divergent light that will send from the test bench examination chip that awaits measuring collects photoelectric detector's receipt light area, on the basis that adopts a plurality of probes to realize high efficiency test, and the distance between the great photoelectric detector of volume and the testboard among the determine module that both can enlarge provides the mounted position for more test probe subassemblies, can guarantee photoelectric detector again and to await measuring the efficiency that the chip received light, guarantees the precision and the stability of test result among the many detection test processes.
Drawings
Fig. 1 is an overall structure front view of the high-efficiency testing device for laser chips of the present invention;
FIG. 2 is a schematic diagram of a local structure of the high-efficiency testing device for laser chip
Fig. 3 is a schematic diagram of a partial structure of the high-efficiency testing apparatus for a laser chip according to the present invention;
fig. 4 is a perspective view of a local structure of the high-efficiency testing device for a laser chip of the present invention.
In the above drawings: 1. a substrate; 2. a test bench; 3. a drive bracket; 301. erecting a rod; 302. mounting a plate; 303. a connecting plate; 4. testing the probe assembly; 5. a detection component; 501. a support; 502. a photodetector; 503. a prism; 6. a fixing plate; 7. a motor; 8. a screw rod; 9. a feed screw nut; 10. a slide rail; 11. a slider; 12. and (4) supporting the base.
Detailed Description
In the description of this patent, it is noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, as they may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The meaning of the above terms in this patent may be specifically understood by those of ordinary skill in the art.
Example 1: a high efficiency testing apparatus for laser chips, comprising: the testing device comprises a substrate 1, a testing platform 2 arranged on the upper surface of the substrate 1, a driving bracket 3 arranged on the outer side of the substrate 1, and at least three testing probe assemblies 4 and a detection assembly 5 which are arranged on the driving bracket 3 and positioned above the testing platform 2, wherein the detection assembly 5 comprises a photoelectric detector 502 arranged on the driving bracket 3 through a support 501, the light receiving surface of the photoelectric detector 502 positioned on the outer side of the testing platform 2 is positioned towards the testing platform 2, a prism 503 is also arranged between the light receiving surface of the photoelectric detector 502 and the testing platform 2, and the prism 503 is used for collecting divergent light emitted from a chip to be tested on the testing platform 2 into the light receiving area of the photoelectric detector 502.
The driving bracket 3 further includes two vertical rods 301 disposed in parallel, a mounting plate 302 connected between the upper ends of the two vertical rods 301, and a connecting plate 303 connected between the lower ends of the two vertical rods 301, the testing component 5 is mounted on the upper surface of the mounting plate 302, and the testing probe components 4 are sequentially mounted on the upper surface of the mounting plate 302 and evenly distributed on both sides of the testing component 5.
A fixing plate 6 installed on the base plate 1 is vertically arranged between the upright 301 of the driving bracket 3 and the base plate 1, a motor 7 is installed at the lower part of the fixing plate 6, a screw rod 8 is installed on an output shaft of the motor 7 along the vertical direction, and a screw rod nut 9 sleeved on the screw rod 8 is connected with a connecting plate 303 of the driving bracket 3.
The prism 503 is mounted on a holder 501 of the inspection unit 5 via a support 12.
The number of the test probe assemblies 4 is 4.
Example 2: a high efficiency testing apparatus for laser chips, comprising: the testing device comprises a substrate 1, a testing platform 2 arranged on the upper surface of the substrate 1, a driving bracket 3 arranged on the outer side of the substrate 1, and at least three testing probe assemblies 4 and a detection assembly 5 which are arranged on the driving bracket 3 and positioned above the testing platform 2, wherein the detection assembly 5 comprises a photoelectric detector 502 arranged on the driving bracket 3 through a support 501, the light receiving surface of the photoelectric detector 502 positioned on the outer side of the testing platform 2 is positioned towards the testing platform 2, a prism 503 is also arranged between the light receiving surface of the photoelectric detector 502 and the testing platform 2, and the prism 503 is used for collecting divergent light emitted from a chip to be tested on the testing platform 2 into the light receiving area of the photoelectric detector 502.
The driving bracket 3 further includes two vertical rods 301 disposed in parallel, a mounting plate 302 connected between the upper ends of the two vertical rods 301, and a connecting plate 303 connected between the lower ends of the two vertical rods 301, the testing component 5 is mounted on the upper surface of the mounting plate 302, and the testing probe components 4 are sequentially mounted on the upper surface of the mounting plate 302 and evenly distributed on both sides of the testing component 5.
A fixing plate 6 installed on the base plate 1 is vertically arranged between the upright 301 of the driving bracket 3 and the base plate 1, a motor 7 is installed at the lower part of the fixing plate 6, a screw rod 8 is installed on an output shaft of the motor 7 along the vertical direction, and a screw rod nut 9 sleeved on the screw rod 8 is connected with a connecting plate 303 of the driving bracket 3.
Two sides of the screw rod 8 and between the upright 301 and the fixing plate 6 are respectively provided with a slide rail 10, and the upright 301 is movably connected with the slide rail 10 through at least two slide blocks 11.
When the efficient testing device for the laser chip is adopted, the efficient testing device comprises at least three testing probe assemblies and a detecting assembly, the light receiving surface of a photoelectric detector of the detecting assembly, which is positioned outside the testing platform, is positioned towards the testing platform, a prism is further arranged between the light receiving surface of the photoelectric detector and the testing platform, the prism is used for collecting divergent light emitted from a chip to be tested on the testing platform into the light receiving area of the photoelectric detector, on the basis of realizing high-efficiency testing by adopting a plurality of probes, the distance between the photoelectric detector with larger volume in the detecting assembly and the testing platform can be enlarged to provide mounting positions for more testing probe assemblies, the light receiving efficiency of the photoelectric detector for the chip to be tested can be ensured, and the precision and the stability of testing results in the multi-detection testing process can be ensured.
The utility model discloses a high-efficient testing arrangement for laser instrument chip can expand other trades to the test of semiconductor chip, and the usage is not only limited to the optical communication trade, and all trades that need use the high-efficient testing arrangement for laser instrument chip all can the synchronous extension use, and accommodation is wide.
The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose of the embodiments is to enable people skilled in the art to understand the contents of the present invention and to implement the present invention, which cannot limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered by the protection scope of the present invention.
Claims (5)
1. A high efficiency testing apparatus for laser chips, comprising: base plate (1), install in testboard (2) of base plate (1) upper surface, install in drive support (3) in base plate (1) outside and install on drive support (3) and be located testboard (2) top at least three test probe subassembly (4), determine module (5), its characterized in that: the detection assembly (5) comprises a photoelectric detector (502) which is installed on the driving support (3) through a support (501), a light receiving surface of the photoelectric detector (502) which is positioned on the outer side of the test bench (2) is positioned towards the test bench (2), a prism (503) is further arranged between the light receiving surface of the photoelectric detector (502) and the test bench (2), and the prism (503) is used for collecting divergent light emitted by a chip to be tested on the test bench (2) into a light receiving area of the photoelectric detector (502).
2. A high efficiency testing apparatus for laser chips as defined in claim 1, wherein: drive support (3) further include two parallel arrangement's pole setting (301), connect mounting panel (302) between two pole setting (301) upper ends and connect connecting plate (303) between two pole setting (301) lower extremes, install in the upper surface of mounting panel (302), 4 detection probe subassembly (4) install in proper order in the upper surface of mounting panel (302) and evenly distributed in detection subassembly (5) both sides.
3. The high efficiency testing apparatus for laser chips of claim 2, wherein: a fixing plate (6) installed on the base plate (1) is vertically arranged between the vertical rod (301) of the driving support (3) and the base plate (1), a motor (7) is installed on the lower portion of the fixing plate (6), a lead screw (8) is installed on an output shaft of the motor (7) and arranged in the vertical direction, and a lead screw nut (9) sleeved on the lead screw (8) is connected with a connecting plate (303) of the driving support (3).
4. A high efficiency testing apparatus for laser chips as defined in claim 3, wherein: the two sides of the screw rod (8) are respectively provided with a sliding rail (10) between the vertical rod (301) and the fixing plate (6), and the vertical rod (301) is movably connected with the sliding rails (10) through at least two sliding blocks (11).
5. The high efficiency testing apparatus for laser chips of claim 1, wherein: the prism (503) is arranged on a support (501) of the detection assembly (5) through a support seat (12).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221181614.0U CN218158210U (en) | 2022-05-17 | 2022-05-17 | High-efficiency testing device for laser chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221181614.0U CN218158210U (en) | 2022-05-17 | 2022-05-17 | High-efficiency testing device for laser chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218158210U true CN218158210U (en) | 2022-12-27 |
Family
ID=84573188
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221181614.0U Active CN218158210U (en) | 2022-05-17 | 2022-05-17 | High-efficiency testing device for laser chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218158210U (en) |
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2022
- 2022-05-17 CN CN202221181614.0U patent/CN218158210U/en active Active
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: Building 5, No. 1508, Xiangjiang Road, Suzhou High-tech Zone, Suzhou City, Jiangsu Province 215129 Patentee after: Suzhou Lianxun Instrument Co.,Ltd. Address before: 215007 Building 5, No. 1508, Xiangjiang Road, high tech Zone, Suzhou, Jiangsu Patentee before: STELIGHT INSTRUMENT Inc. |
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| CP03 | Change of name, title or address |