CN211179939U - Probe measuring device - Google Patents
Probe measuring device Download PDFInfo
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- CN211179939U CN211179939U CN201921861530.XU CN201921861530U CN211179939U CN 211179939 U CN211179939 U CN 211179939U CN 201921861530 U CN201921861530 U CN 201921861530U CN 211179939 U CN211179939 U CN 211179939U
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- probe
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Abstract
The utility model discloses a probe measuring device, include: a base frame; and on the bed frame: the electrode clamp assembly is connected with a power supply and comprises a fixed clamp and a movable clamp, and the movable clamp can move relative to the fixed clamp to abut against a piece to be measured placed on the fixed clamp; the probe measuring device comprises a first probe and a second probe, wherein the first probe and the second probe are directly abutted against the piece to be measured to measure a measuring parameter, and the first probe is fixedly connected to the movable clamp. The probe measuring device with the structure reduces the measuring error by arranging the first probe and the second probe to be directly abutted against the piece to be measured; through setting up first probe fixed connection in activity anchor clamps, the same driving piece drive of both accessible for integration of device is higher.
Description
Technical Field
The utility model relates to a measuring device technical field, concretely relates to probe measuring device.
Background
Semiconductor lasers have been widely used in optical communication, laser medical treatment, fiber laser pumping, laser monitoring, laser processing, and other fields. In the working process of the laser, the voltage is one of the important factors influencing the electro-optic conversion efficiency of the whole laser chip under the condition of high working current. For this purpose, a plurality of parameters of the laser, such as voltage, etc., need to be measured.
The prior art discloses a measuring device which comprises a pair of clamping electrodes, a pair of probes, an up-down moving module and a left-right moving module. One clamping electrode is connected with one output end of the direct current pulse power supply, the other clamping electrode is connected with the other output end of the direct current pulse power supply, and the pair of clamping electrodes are connected to the up-down moving module; and the pair of probes are respectively and correspondingly connected with the anode and the cathode of the high-precision digital voltmeter and are connected with the left-right moving module. The clamping electrode is driven by the left-right moving module to clamp the to-be-measured piece, the probe moves to the position below the probe tip leftwards and rightwards, and the probe descends under the driving of the up-down moving module so that the probe tip is in contact with the to-be-measured area of the to-be-measured piece to measure the measurement parameters.
However, in the above-mentioned measuring apparatus, the probe and the clamping electrode are respectively driven by different moving modules, which results in a disadvantage of low integration level.
SUMMERY OF THE UTILITY MODEL
Therefore, the to-be-solved technical problem of the present invention is to overcome the low integration of the measuring device in the prior art, thereby providing a probe measuring device.
A probe measurement device comprising:
a base frame;
and on the bed frame:
the electrode clamp assembly is connected with a power supply and comprises a fixed clamp and a movable clamp, and the movable clamp can move relative to the fixed clamp to abut against a piece to be measured placed on the fixed clamp;
the probe measuring device comprises a first probe and a second probe, wherein the first probe and the second probe are directly abutted against the piece to be measured to measure a measuring parameter, and the first probe is fixedly connected to the movable clamp.
Further, still including locating drive assembly on the bed frame, drive assembly includes first driving piece and second driving piece, first driving piece is connected in movable anchor clamps and first probe, the second driving piece is connected in the second probe.
Further, still include U type connecting piece, U type connecting piece connect in first driving piece just the opening orientation of U type connecting piece the volume of awaiting measuring is measured, movable clamp pass through first guide connect in on the U type connecting piece, first probe link firmly in on the U type connecting piece.
Furthermore, the movable clamp comprises an elastic piece, wherein the elastic piece is arranged along the moving direction of the movable clamp, one end of the elastic piece is abutted to the U-shaped connecting piece, and the other end of the elastic piece is abutted to the movable clamp.
Furthermore, the device also comprises a U-shaped positioning piece, wherein the U-shaped positioning piece is arranged on the fixing clamp to position the piece to be measured.
Furthermore, the device also comprises auxiliary guide parts which are fixedly arranged on the base frame and positioned on two sides of the U-shaped connecting part.
Further, the probe carrier device comprises a carrier assembly, the carrier assembly comprises a first carrier and a second carrier, the to-be-measured piece is arranged between the first carrier and the second carrier, a through hole allowing the first probe to pass through is formed in the first carrier, and the U-shaped connecting piece abuts against the second carrier.
Furthermore, the to-be-measured part is a channel semiconductor laser, the first probe is abutted to a cathode plate of the laser, and the second probe is abutted to a heat sink of the laser.
Furthermore, the laser device further comprises a communicating channel, wherein the communicating channel comprises a water inlet communicating channel and a water outlet communicating channel, the water inlet communicating channel is communicated with the water inlet hole of the laser device, and the water outlet communicating channel is communicated with the water outlet hole of the laser device.
Furthermore, a sealing piece is arranged in the water inlet communication channel and/or the water outlet communication channel which are arranged on the fixing clamp.
The utility model discloses technical scheme has following advantage:
1. the utility model provides a pair of probe measuring device, include: a base frame; and on the bed frame: the electrode clamp assembly is connected with a power supply and comprises a fixed clamp and a movable clamp, and the movable clamp can move relative to the fixed clamp to abut against a piece to be measured placed on the fixed clamp; the probe measuring device comprises a first probe and a second probe, wherein the first probe and the second probe are directly abutted against the piece to be measured to measure a measuring parameter, and the first probe is fixedly connected to the movable clamp. The probe measuring device with the structure reduces the measuring error by arranging the first probe and the second probe to be directly abutted against the piece to be measured; through setting up first probe fixed connection in activity anchor clamps, the same driving piece drive of both accessible for integration of device is higher.
2. The utility model provides a pair of probe measuring device still includes the elastic component, the elastic component is followed the direction of motion setting of activity anchor clamps, one of them tip butt of elastic component in U type connecting piece and another tip butt in activity anchor clamps. The probe measuring device with the structure can buffer the force of the movable clamp abutting against the piece to be measured by arranging the elastic piece, and reduces the position requirement of the movable clamp and the U-shaped connecting piece abutting against the end part of the second carrier between the movable clamp and the end part of the U-shaped connecting piece.
3. The utility model provides a pair of probe measuring device still includes supplementary guide, supplementary guide set firmly in just be located on the bed frame the both sides of U type connecting piece. The probe measuring device with the structure guides and stabilizes the movement of the U-shaped connecting piece by being provided with the auxiliary guide piece.
4. The utility model provides a pair of probe measuring device still includes the carrier subassembly, the carrier subassembly includes first carrier and second carrier, the volume of awaiting measuring is arranged in first carrier with between the second carrier, be equipped with the permission on the first carrier the clearing hole that first probe passes through, U type connecting piece butt in the second carrier. The probe measuring device with the structure is convenient to take and protect the to-be-measured piece by being provided with the carrier assembly.
5. The utility model provides a pair of probe measuring device still includes the intercommunication passageway, the intercommunication passageway is including intaking intercommunication passageway and play water intercommunication passageway, intake intercommunication passageway communicate in the inlet opening of laser instrument, play water intercommunication passageway communicate in the apopore of laser instrument. The probe measuring device with the structure is provided with the communication channel, so that the to-be-measured piece is in a working state when parameters are measured.
6. The utility model provides a pair of probe measuring device locates last water inlet intercommunication passageway of mounting fixture and/or be equipped with the sealing member in the water outlet intercommunication passageway. The probe measuring device with the structure is provided with the sealing element, so that the sealing performance of the joint of the communicating channel arranged on the fixing clamp and the communicating channel arranged on the second carrier is better when the to-be-measured piece is in a working state after water flows through the to-be-measured piece.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the technical solutions in the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a probe measurement device provided in an embodiment of the present invention;
FIG. 2 is an enlarged, fragmentary, front view of the probe measurement device shown in FIG. 1;
FIG. 3 is an enlarged rear partial view of the probe measurement device shown in FIG. 1;
FIG. 4 is a schematic diagram of the structure of the second carrier, channel semiconductor laser shown in FIG. 1;
FIG. 5 is a cross-sectional view of the FIG. 1 assembly showing the communication channel;
description of reference numerals:
1-a base frame;
21-fixed clamp, 22-movable clamp;
31-first probe, 32-second probe, 33-first connector, 34-second connector;
41-a first driving member, 42-a second driving member;
5-U-shaped connecting piece, 51-middle end arm, 52-side arm;
6-U-shaped positioning pieces;
7-an auxiliary guide;
81-a first carrier, 82-a second carrier, 821-high, 822-low;
91-water inlet, 92-water outlet, 93-water inlet communicating channel, and 94-water outlet communicating channel;
10-channel semiconductor laser, 101-water inlet and 102-water outlet;
11-first guide.
Detailed Description
The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Furthermore, the technical features mentioned in the different embodiments of the invention described below can be combined with each other as long as they do not conflict with each other.
Examples
The probe measuring apparatus shown in fig. 1 to 5 specifically includes a base frame 1, an electrode clamp assembly, a probe measuring assembly, a driving assembly, a U-shaped connecting member 5, an elastic member, a U-shaped positioning member 6, an auxiliary guiding member 7, a carrier assembly, a communicating channel, and the like. By placing the piece to be measured in the probe measuring device, the relevant measurement parameter can be measured. Wherein the component to be measured can be a channel semiconductor laser 10 or else.
As shown in fig. 1 to 3, the electrode clamp assembly in the present embodiment includes a fixed clamp 21 and a movable clamp 22, the fixed clamp 21 is fixed on the base frame 1, and the movable clamp 22 is movable relative to the fixed clamp 21 to abut on the carrier assembly. Wherein the carrier assembly is placed on a fixture 21 and the channel semiconductor laser 10 is placed in the carrier assembly. Specifically, the stationary jig 21 is connected to the anode of the power supply, and the movable jig 22 is connected to the cathode of the power supply, to achieve electrical connection of the motor electrode jig and the power supply.
The probe measurement assembly in this embodiment is connected to a measuring instrument. As shown in fig. 2, the probe measuring device includes a first probe 31 and a second probe 32, the first probe 31 directly abuts against the top of the cathode plate of the channel semiconductor laser 10, the second probe 32 directly abuts against the side of the heat sink of the channel semiconductor laser 10, so as to measure the measurement parameter, wherein the first probe 31 is fixedly connected to the movable clamp 22. Specifically, the measuring instrument may be a voltmeter, whereby the voltage across the channel semiconductor laser 10 can be measured.
As shown in fig. 2, the driving assembly in this embodiment includes a first driving member 41 and a second driving member 42 both fixed on the base frame 1, the first driving member 41 is connected to the movable clamp 22 and the first probe 31, the second driving member 42 is connected to the second probe 32 through a second connecting member 34, wherein the second probe 32 is fixed on the second connecting member 34 in a penetrating manner. Specifically, both the first driver 41 and the second driver 42 may be provided as air cylinders or others.
As shown in fig. 2, the intermediate end arm 51 of the U-shaped connector 5 in the present embodiment is connected to the first driver 41 and the opening of the U-shaped connector 5 faces the channel semiconductor laser 10. As shown in fig. 3, the movable clamp 22 is connected to the middle end arm 51 of the U-shaped connecting member 5 through the first guide member 11; as shown in fig. 2, the first probe 31 is fixed on the first connecting member 33 in a penetrating manner, and the first connecting member 33 is provided with a strip-shaped hole which is fixedly connected to the U-shaped member by a fastening member such as a screw.
The elastic member in this embodiment is disposed along the moving direction of the movable clamp 22. Specifically, the elastic member may be a spring, the spring is sleeved on the first guide member 11, and one end of the spring abuts against the middle end arm 51 of the U-shaped connecting member 5 and the other end abuts against the movable clamp 22. By providing the elastic member, the force of the movable clamp 22 abutting against the member to be measured can be buffered, and the position requirement between the movable clamp 22 and the end of the U-shaped connecting member 5 abutting against the second carrier 82 can be reduced.
As shown in fig. 1 to 3, the U-shaped positioning member 6 in the present embodiment is disposed on a fixing jig 21 to position the channel semiconductor laser 10, and may be fixed on the fixing jig 21 by a fastening member such as a screw.
As shown in fig. 1 to 3, the auxiliary guiding members 7 in this embodiment are fixedly disposed on the base frame 1 and located at two sides of the U-shaped connecting member 5. By providing the auxiliary guide 7, the movement of the U-shaped connecting piece 5 is guided and stabilized.
As shown in fig. 2, the carrier assembly in the present embodiment includes a first carrier 81 and a second carrier 82, wherein the first carrier 81 is located above the channel semiconductor laser 10 in fig. 2, and the second carrier 82 is located below the channel semiconductor laser 10 in fig. 2, so that the channel semiconductor laser 10 is disposed between the first carrier 81 and the second carrier 82, which can be fixedly connected by a fastener such as a screw. Specifically, the first carrier 81 is provided with a through hole for allowing the first probe 31 to pass through, so that the first probe 31 directly abuts against the cathode plate of the channel semiconductor laser 10 through the through hole; the second carrier 82 may be a convex structure, as shown in fig. 2, the channel semiconductor laser 10 is placed on the high platform 821 of the convex structure, and the ends of the two side arms 52 of the U-shaped connector 5 abut on the low platforms 822 of the convex structure at two sides of the high platform 821 to press the second carrier 82 onto the fixing jig 21. Through being provided with carrier subassembly, be convenient for take and protect and measure the measuring piece.
As shown in fig. 2, 3 and 5, the communication channel in this embodiment includes a water inlet communication channel 93 and a water outlet communication channel 94, the water inlet communication channel 93 is communicated with a water inlet 101 of the laser, and the water outlet communication channel 94 is communicated with a water outlet 102 of the laser. Specifically, the water inlet 91 of the water inlet communicating channel 93 and the water outlet 92 of the water outlet communicating channel 94 are both disposed on the base frame 1. The water flowing in through the water inlet 91 on the pedestal 1 sequentially passes through the water inlet communicating channel on the pedestal 1, the water inlet communicating channel on the fixing clamp 21 and the water inlet communicating channel on the second carrier 82 to enter the water inlet hole 101 of the channel semiconductor laser 10; the water flows out to the water outlet communication channel on the second carrier 82, the water outlet communication channel on the fixing clamp 21, the water outlet communication channel on the base frame 1 and the water outlet 92 on the base frame 1 in sequence through the water outlet hole 102 of the channel semiconductor laser 10. Wherein a sealing member is arranged in a passage opening close to the second carrier 82 in the water inlet communicating passage and/or the water outlet communicating passage arranged on the fixing clamp 21. In particular, the sealing element may be arranged protruding from the passage opening.
The communicating channel is arranged, so that the part to be measured is in a working state when parameters are measured. By providing the sealing member, when the member to be measured is in a working state by passing water, the sealing performance of the joint between the communication passage provided on the fixing jig 21 and the communication passage provided on the second carrier 82 is improved.
Wherein the electrode holder assembly, the probe measurement assembly and the carrier assembly are all made of conductive material to be conductive, and other components in the device may be made of insulating material to be insulating.
The utility model discloses a probe measuring device's working process: firstly, placing a channel semiconductor laser 10 in a carrier component; secondly, placing the carrier assembly in an opening of the U-shaped positioning piece 6; third, the first driving member 41 drives the movable clamp 22 to abut against the first carrier 81 first, and the end of the side arm 52 of the U-shaped connecting member 5 abuts against the lower stage 822 of the second carrier 82, at this time, the sealing member will be pressed by the second carrier 82, and the first probe 31 abuts against the cathode plate of the channel semiconductor laser 10; meanwhile, the second driving member 42 drives the second probe 32 to abut against the heat sink of the channel semiconductor laser 10; and fourthly, enabling the channel semiconductor laser 10 to be in a working state by water, and measuring the voltage at two ends of the channel semiconductor laser 10 by the first probe 31 and the second probe 32. It should be noted that the content in the fourth step that is in the working state by water supply may be exchanged with the content in the third step.
The utility model discloses a probe measuring device, through setting up first probe 31 and second probe 32 and directly butt in the measuring object, in order to reduce the measuring error; through setting up first probe 31 fixed connection in activity anchor clamps 22, both accessible same driving piece drives with synchronous motion for the device integrates more highly integratedly.
It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications can be made without departing from the scope of the invention.
Claims (10)
1. A probe measurement device, comprising:
a base frame;
and on the bed frame:
the electrode clamp assembly is connected with a power supply and comprises a fixed clamp and a movable clamp, and the movable clamp can move relative to the fixed clamp to abut against a piece to be measured placed on the fixed clamp;
the probe measuring device comprises a first probe and a second probe, wherein the first probe and the second probe are directly abutted against the piece to be measured to measure a measuring parameter, and the first probe is fixedly connected to the movable clamp.
2. The probe measurement device of claim 1, further comprising a drive assembly disposed on the base frame, the drive assembly including a first drive member and a second drive member, the first drive member being coupled to the movable clamp and the first probe, the second drive member being coupled to the second probe.
3. The probe measuring device according to claim 2, further comprising a U-shaped connector, wherein the U-shaped connector is connected to the first driving member and the opening of the U-shaped connector faces the member to be measured, the movable clamp is connected to the U-shaped connector through a first guiding member, and the first probe is fixedly connected to the U-shaped connector.
4. The probe measuring device according to claim 3, further comprising an elastic member disposed along a moving direction of the movable clamp, wherein one end of the elastic member abuts against the U-shaped connecting member and the other end abuts against the movable clamp.
5. The probe measuring device according to claim 4, further comprising a U-shaped positioning member disposed on the fixing jig for positioning the object to be measured.
6. The probe measurement device of claim 5, further comprising auxiliary guides fixed to the base frame and located on both sides of the U-shaped connector.
7. The apparatus as claimed in claim 6, further comprising a carrier assembly, wherein the carrier assembly comprises a first carrier and a second carrier, the object to be measured is disposed between the first carrier and the second carrier, the first carrier is provided with a through hole for allowing the first probe to pass through, and the U-shaped connector abuts against the second carrier.
8. The probe measuring device according to any one of claims 1 to 7, wherein the component to be measured is a channel semiconductor laser, the first probe abuts against a cathode plate of the laser, and the second probe abuts against a heat sink of the laser.
9. The probe measurement device according to claim 8, further comprising a communication channel, wherein the communication channel comprises a water inlet communication channel and a water outlet communication channel, the water inlet communication channel is connected to the water inlet of the laser, and the water outlet communication channel is connected to the water outlet of the laser.
10. The probe measuring device according to claim 9, wherein a sealing member is provided in the water inlet communication passage and/or the water outlet communication passage provided in the fixing jig.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921861530.XU CN211179939U (en) | 2019-10-31 | 2019-10-31 | Probe measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921861530.XU CN211179939U (en) | 2019-10-31 | 2019-10-31 | Probe measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211179939U true CN211179939U (en) | 2020-08-04 |
Family
ID=71799769
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921861530.XU Active CN211179939U (en) | 2019-10-31 | 2019-10-31 | Probe measuring device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211179939U (en) |
-
2019
- 2019-10-31 CN CN201921861530.XU patent/CN211179939U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 215163 No.2 workshop-1-102, No.2 workshop-2-203, zone a, industrial square, science and Technology City, No.189 Kunlunshan Road, high tech Zone, Suzhou City, Jiangsu Province Patentee after: Suzhou Changguang Huaxin Optoelectronic Technology Co.,Ltd. Patentee after: SUZHOU EVERBRIGHT SEMICONDUCTOR LASER INNOVATION RESEARCH INSTITUTE Co.,Ltd. Address before: 215163 Building 2, No.189, Kunlunshan Road, high tech Zone, Suzhou City, Jiangsu Province Patentee before: SUZHOU EVERBRIGHT PHOTONICS TECHNOLOGY Co.,Ltd. Patentee before: SUZHOU EVERBRIGHT SEMICONDUCTOR LASER INNOVATION RESEARCH INSTITUTE Co.,Ltd. |
|
| CP03 | Change of name, title or address |