CN114337807B - Multi-temperature test system of optical communication module - Google Patents
Multi-temperature test system of optical communication module Download PDFInfo
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- CN114337807B CN114337807B CN202011577982.2A CN202011577982A CN114337807B CN 114337807 B CN114337807 B CN 114337807B CN 202011577982 A CN202011577982 A CN 202011577982A CN 114337807 B CN114337807 B CN 114337807B
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- 238000012360 testing method Methods 0.000 title claims abstract description 49
- 238000004891 communication Methods 0.000 title claims abstract description 23
- 230000003287 optical effect Effects 0.000 title claims abstract description 22
- 239000000523 sample Substances 0.000 claims abstract description 67
- 238000006073 displacement reaction Methods 0.000 claims abstract description 6
- 238000009434 installation Methods 0.000 claims description 22
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 6
- 239000000758 substrate Substances 0.000 abstract description 18
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 230000001427 coherent effect Effects 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
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Abstract
The invention discloses a multi-temperature testing system of an optical communication module, which comprises a substrate arranged on a rack, wherein a shell is arranged outside the rack, and at least one temperature control seat for placing a product to be tested is arranged on the upper surface of the substrate; the temperature control seat is characterized in that a mounting plate is further arranged above the temperature control seat, a first probe and a second probe are mounted on the mounting plate at intervals, the first probe is a PD probe, the PD probe is mounted on a vertically arranged movable mounting plate through a mounting block, the movable mounting plate is connected with the first mounting plate through a manual displacement table, the PD probe is mounted on the lower surface of the mounting block, and an included angle of 10-30 degrees is formed between the mounting block and the horizontal direction. The invention greatly improves the testing efficiency, can effectively prevent the light emitted by the product to be tested from entering the product to be tested again through reflection to form interference, avoids the jitter of the test curve caused by the interference, and improves the testing precision.
Description
Technical Field
The invention relates to a multi-temperature test system of an optical communication module, and belongs to the technical field of optical communication.
Background
As one of the most important inventions in the 20 th century, lasers have played an increasingly important role in various industries; unlike natural common light sources, laser is coherent light, i.e. has the characteristics of identical frequency, identical vibration direction and identical phase (or phase difference is kept constant); current optical communication systems rely to a large extent on high quality laser sources.
After the encapsulation is finished, the laser needs to be tested by a testing device, when the laser chip is tested, the laser chip is usually required to be heated, powered and aged for a long time, and the laser chip is required to be tested before and after the laser chip is aged. In the existing laser chip testing flow, the laser chip needs to be subjected to multiple transition, and equipment is restarted after the chip is loaded in each transition, so that the testing time is greatly prolonged, and the testing efficiency is reduced. To complete a batch of laser chips requires a significant amount of time to test.
Disclosure of Invention
The invention aims to provide a multi-temperature test system of an optical communication module, which greatly improves the test efficiency, can effectively prevent light emitted by a product to be tested from entering the product to be tested again through reflection to form interference, avoids jitter of a test curve caused by the reflection, and improves the test precision.
In order to achieve the above purpose, the invention adopts the following technical scheme: the multi-temperature testing system of the optical communication module comprises a substrate arranged on a rack, wherein a shell is arranged outside the rack, the substrate divides an area in the shell into a testing cavity positioned above the substrate and an instrument cavity positioned below the substrate, at least one temperature control seat for placing products to be tested is arranged on the upper surface of the substrate, a plurality of products to be tested are arranged on the temperature control seat through a clamp, and a first probe and a second probe are further arranged and are movably arranged above the temperature control seat through a mounting plate;
a first motor and a second motor are arranged on the mounting plates at intervals, a first mounting plate provided with the first probe can move up and down under the drive of the first motor, a second mounting plate which is horizontally arranged is arranged on the mounting plate, a first movable plate and a second movable plate are overlapped above the second mounting plate in parallel, the first movable plate can move along a first direction, the second movable plate can move along a second direction perpendicular to the first direction, a third mounting plate for fixing the second motor is vertically arranged on the second movable plate, and a fourth mounting plate provided with the second probe can move up and down under the drive of the second motor;
the PD probe is installed on a movable installation plate which is vertically arranged through an installation block, the movable installation plate is connected with the first installation plate through a manual displacement table, the movable installation plate can drive the PD probe on the installation block to move up and down, the first installation plate can move up and down under the driving of a first motor, the PD probe is installed on the lower surface of the installation block, and an included angle of 10-30 degrees is formed between the installation block and the horizontal direction.
The further improved scheme in the technical scheme is as follows:
1. in the scheme, the second mounting plate is connected with the first movable plate, the first movable plate is connected with the second movable plate, and the fourth mounting plate is connected with the third mounting plate through at least one group of sliding rails.
2. In the above scheme, the second probe is a spectrum probe.
3. In the scheme, the mounting plate is connected with the X-axis nut sleeved on the X-axis screw rod and can reciprocate along the X-axis screw rod with one end connected with the X-axis motor along with the X-axis nut.
4. In the scheme, one end of a bracket provided with the X-axis screw rod and the X-axis motor is connected with a Y-axis nut sleeved on the Y-axis screw rod and can reciprocate along the Y-axis screw rod with one end connected with the Y-axis motor along with the Y-axis nut, and the other end of the bracket is in sliding connection with a Y-axis guide rail parallel to the Y-axis screw rod through at least one sliding block.
5. In the above scheme, the temperature control seat comprises a base, a water box arranged on the base and TEC modules arranged above the water box at intervals.
6. In the scheme, a temperature homogenizing plate is connected above the TEC module in a covering mode, and the temperature homogenizing plate is used for being in contact with the bottom plate of the clamp.
Due to the application of the technical scheme, compared with the prior art, the invention has the following advantages:
the multi-temperature test system of the optical communication module can realize the test of two chips in the same time, greatly improve the test efficiency, further realize the continuous test of each parameter through the combined arrangement of different probes, and improve the use efficiency of the instrument in the test process; in addition, its first probe is the PD probe, the PD probe passes through an installation piece to be installed on a vertical movable mounting panel that sets up, the movable mounting panel passes through manual displacement platform and is connected with a first mounting panel, and the PD probe that obtains the movable mounting panel and can drive on the installation piece reciprocates, first mounting panel can reciprocate under the drive of first motor, the PD probe is installed on the lower surface of installation piece, form an contained angle of 10 ~30 between installation piece and the horizontal direction, can effectively prevent to wait to test the light that the product sent from getting into the interference that the product forms that awaits measuring again through the reflection, avoid the shake of test curve that leads to from this, improve the precision of test.
Drawings
FIG. 1 is a schematic diagram of a multi-temperature test system of an optical communication module according to the present invention;
FIG. 2 is a schematic diagram of the structure of a fixture and a product to be tested in the multi-temperature testing system of the optical communication module of the present invention;
fig. 3 is a schematic diagram of a local structure of a multi-temperature testing system of the optical communication module according to the present invention.
In the above figures: 1. a frame; 2. a substrate; 3. a housing; 4. a product to be tested; 5. a temperature control seat; 6. a clamp; 8. a mounting plate; 9. a first probe; 10. a second probe; 11. a first mounting plate; 12. a first motor; 13. a second mounting plate; 14. a first movable plate; 15. a second movable plate; 16. a third mounting plate; 17. a fourth mounting plate; 18. a second motor; 32. a mounting block; 33. a movable mounting plate; 34. and (5) manually displacing the table.
Detailed Description
In the description of this patent, it should be noted that, directions or positional relationships indicated by terms such as "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., are based on directions or positional relationships shown in the drawings, are merely for convenience of description and simplification of description, and do not indicate or imply that the apparatus or element in question must have a specific direction, be configured and operated in a specific direction, and thus should not be construed as limiting the invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in this patent will be understood by those of ordinary skill in the art in a specific context.
Example 1: the multi-temperature testing system of the optical communication module comprises a substrate 2 arranged on a frame 1, wherein a shell 3 is arranged outside the frame 1, the substrate 2 divides an area in the shell 3 into a testing cavity positioned above the substrate 2 and an instrument cavity positioned below the substrate 2, two temperature control seats 5 for placing products 4 to be tested are arranged on the upper surface of the substrate 2, one hundred products 4 to be tested are arranged on the temperature control seats 5 through a clamp 6, a first probe 9 and a second probe 10 are further arranged, and the first probe 9 and the second probe 10 are movably arranged above the temperature control seats 5 through a mounting plate 8;
the first probe 9 and the second probe 10 are arranged on the mounting plate 8 at intervals, a first mounting plate 11 on which the first probe 9 is mounted can move up and down under the drive of a first motor 12, a second mounting plate 13 which is horizontally arranged is mounted on the mounting plate 8, a first movable plate 14 and a second movable plate 15 are stacked above the second mounting plate 13 in parallel, the first movable plate 14 can move along a first direction, the second movable plate 15 can move along a second direction perpendicular to the first direction, a third mounting plate 16 for fixing a second motor 18 is vertically mounted on the second movable plate 15, and a fourth mounting plate 17 on which the second probe 10 is mounted can move up and down under the drive of the second motor 18;
the first probe 9 is a PD probe, the PD probe is mounted on a vertically disposed movable mounting plate 33 through a mounting block 32, the movable mounting plate 33 is connected with a first mounting plate 11 through a manual displacement table 34, the movable mounting plate 33 can drive the PD probe on the mounting block 32 to move up and down, the first mounting plate 11 can be driven by the first motor 12 to move up and down, the PD probe is mounted on the lower surface of the mounting block 32, and an included angle of 20 ° is formed between the mounting block 32 and the horizontal direction.
The second mounting plate 13 is connected with the first movable plate 14, the first movable plate 14 is connected with the second movable plate 15, and the fourth mounting plate 17 is connected with the third mounting plate 16 through a group of sliding rails.
The mounting plate 8 is connected with an X-axis nut sleeved on the X-axis screw rod and can reciprocate along the X-axis screw rod with one end connected with an X-axis motor along with the X-axis nut.
The temperature control seat 5 comprises a base, a water box arranged on the base and TEC modules arranged above the water box at intervals.
Example 2: the multi-temperature testing system of the optical communication module comprises a substrate 2 arranged on a frame 1, wherein a shell 3 is arranged outside the frame 1, the substrate 2 divides an area in the shell 3 into a testing cavity positioned above the substrate 2 and an instrument cavity positioned below the substrate 2, the upper surface of the substrate 2 is provided with a temperature control seat 5 used for placing products 4 to be tested, one hundred and twenty products 4 to be tested are arranged on the temperature control seat 5 through a clamp 6, and the multi-temperature testing system further comprises a first probe 9 and a second probe 10, and the first probe 9 and the second probe 10 are movably arranged above the temperature control seat 5 through a mounting plate 8;
the first probe 9 and the second probe 10 are arranged on the mounting plate 8 at intervals, a first mounting plate 11 on which the first probe 9 is mounted can move up and down under the drive of a first motor 12, a second mounting plate 13 which is horizontally arranged is mounted on the mounting plate 8, a first movable plate 14 and a second movable plate 15 are stacked above the second mounting plate 13 in parallel, the first movable plate 14 can move along a first direction, the second movable plate 15 can move along a second direction perpendicular to the first direction, a third mounting plate 16 for fixing a second motor 18 is vertically mounted on the second movable plate 15, and a fourth mounting plate 17 on which the second probe 10 is mounted can move up and down under the drive of the second motor 18;
the first probe 9 is a PD probe, the PD probe is mounted on a vertically disposed movable mounting plate 33 through a mounting block 32, the movable mounting plate 33 is connected with a first mounting plate 11 through a manual displacement table 34, the movable mounting plate 33 can drive the PD probe on the mounting block 32 to move up and down, the first mounting plate 11 can be driven by the first motor 12 to move up and down, the PD probe is mounted on the lower surface of the mounting block 32, and an included angle of 30 ° is formed between the mounting block 32 and the horizontal direction.
The second mounting plate 13 is connected with the first movable plate 14, the first movable plate 14 is connected with the second movable plate 15, and the fourth mounting plate 17 is connected with the third mounting plate 16 through a group of sliding rails.
The second probe 10 is a spectroscopic probe.
The mounting plate 8 is connected with an X-axis nut sleeved on the X-axis screw rod and can reciprocate along the X-axis screw rod with one end connected with an X-axis motor along with the X-axis nut;
one end of a bracket provided with the X-axis screw rod and the X-axis motor is connected with a Y-axis nut sleeved on the Y-axis screw rod and can reciprocate along the Y-axis screw rod with one end connected with the Y-axis motor along with the Y-axis nut, and the other end of the bracket is in sliding connection with a Y-axis guide rail parallel to the Y-axis screw rod through a sliding block; the Y-axis screw rod and the Y-axis guide rail are respectively arranged at two sides of the temperature control seat.
When the multi-temperature test system of the optical communication module is adopted, the first probes and the second probes which are arranged on the mounting plate at intervals can be used for testing two chips at the same time, so that the test efficiency is greatly improved, and further, the continuous test of each parameter is realized through the combined arrangement of different probes, and the use efficiency of the instrument in the test process is improved;
and the PD probe is arranged on the lower surface of the mounting block, an included angle of 10-30 degrees is formed between the mounting block and the horizontal direction, and the angle setting of the PD probe can effectively prevent light emitted by a product to be tested from entering the interference formed by the product to be tested again through reflection, so that the jitter of a test curve caused by the interference is avoided, and the test precision is improved.
The above embodiments are provided to illustrate the technical concept and features of the present invention and are intended to enable those skilled in the art to understand the content of the present invention and implement the same, and are not intended to limit the scope of the present invention. All equivalent changes or modifications made in accordance with the spirit of the present invention should be construed to be included in the scope of the present invention.
Claims (7)
1. The utility model provides a multi-temperature test system of optical communication module, includes base plate (2) of installing on frame (1), frame (1) externally mounted has casing (3), base plate (2) are separated into the test chamber that is located base plate (2) top and the instrument chamber that is located base plate (2) below with the region in casing (3), its characterized in that: the upper surface of the base plate (2) is provided with at least one temperature control seat (5) for placing products to be tested (4), a plurality of products to be tested (4) are arranged on the temperature control seat (5) through a clamp (6), the temperature control seat is also provided with a first probe (9) and a second probe (10), and the first probe (9) and the second probe (10) are movably arranged above the temperature control seat (5) through a mounting plate (8);
a first motor (12) and a second motor (18) are arranged on the mounting plate (8) at intervals, a first mounting plate (11) provided with the first probe (9) can move up and down under the drive of the first motor (12), a third mounting plate (16) used for fixing the second motor (18) is arranged on the mounting plate (8) at intervals, a second horizontally arranged mounting plate (13) is arranged on the mounting plate (8), a first movable plate (14) and a second movable plate (15) are arranged above the second mounting plate (13) in parallel in a stacked manner, the first movable plate (14) can move along a first direction, the second movable plate (15) can move along a second direction perpendicular to the first direction, a third mounting plate (16) used for fixing the second motor (18) is vertically arranged on the second movable plate (15), and a fourth mounting plate (17) provided with the second probe (10) can move up and down under the drive of the second motor (18);
the PD probe is installed on a movable installation plate (33) in vertical arrangement through an installation block (32), the movable installation plate (33) is connected with a first installation plate (11) through a manual displacement table (34), the PD probe on the installation block (32) can be driven to move up and down by the movable installation plate (33), the first installation plate (11) can move up and down under the driving of a first motor (12), the PD probe is installed on the lower surface of the installation block (32), and an included angle of 10-30 degrees is formed between the installation block (32) and the horizontal direction.
2. The multi-temperature test system of an optical communication module of claim 1, wherein: the second mounting plate (13) is connected with the first movable plate (14), the first movable plate (14) is connected with the second movable plate (15), and the fourth mounting plate (17) is connected with the third mounting plate (16) through at least one group of sliding rails.
3. The multi-temperature test system of an optical communication module of claim 1, wherein: the second probe (10) is a spectroscopic probe.
4. The multi-temperature test system of an optical communication module of claim 1, wherein: the mounting plate (8) is connected with an X-axis nut sleeved on the X-axis screw rod and can reciprocate along the X-axis screw rod with one end connected with an X-axis motor along with the X-axis nut.
5. The multi-temperature test system of an optical communication module of claim 4, wherein: one end of a bracket provided with the X-axis screw rod and the X-axis motor is connected with a Y-axis nut sleeved on the Y-axis screw rod and can reciprocate along the Y-axis screw rod with one end connected with the Y-axis motor along with the Y-axis nut, and the other end of the bracket is in sliding connection with a Y-axis guide rail parallel to the Y-axis screw rod through at least one sliding block.
6. The multi-temperature test system of an optical communication module of claim 1, wherein: the temperature control seat (5) comprises a base, a water box arranged on the base and TEC modules arranged above the water box at intervals.
7. The multi-temperature test system of an optical communication module of claim 6, wherein: and a temperature homogenizing plate is connected above the TEC module in a covering manner, and is used for being contacted with the bottom plate of the clamp (6).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011577982.2A CN114337807B (en) | 2020-12-28 | 2020-12-28 | Multi-temperature test system of optical communication module |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011577982.2A CN114337807B (en) | 2020-12-28 | 2020-12-28 | Multi-temperature test system of optical communication module |
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| CN114337807A CN114337807A (en) | 2022-04-12 |
| CN114337807B true CN114337807B (en) | 2024-03-01 |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104515595A (en) * | 2014-12-20 | 2015-04-15 | 西安炬光科技有限公司 | Testing device for far field intensity of semiconductor light source |
| CN208140348U (en) * | 2018-03-27 | 2018-11-23 | 深圳市检验检疫科学研究院 | The device for quick testing of harmful radiation |
| CN111443273A (en) * | 2020-05-12 | 2020-07-24 | 中南大学 | Laser bar testing device |
| CN111443272A (en) * | 2020-05-12 | 2020-07-24 | 中南大学 | Laser bar testing method and device |
-
2020
- 2020-12-28 CN CN202011577982.2A patent/CN114337807B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104515595A (en) * | 2014-12-20 | 2015-04-15 | 西安炬光科技有限公司 | Testing device for far field intensity of semiconductor light source |
| CN208140348U (en) * | 2018-03-27 | 2018-11-23 | 深圳市检验检疫科学研究院 | The device for quick testing of harmful radiation |
| CN111443273A (en) * | 2020-05-12 | 2020-07-24 | 中南大学 | Laser bar testing device |
| CN111443272A (en) * | 2020-05-12 | 2020-07-24 | 中南大学 | Laser bar testing method and device |
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| CN114337807A (en) | 2022-04-12 |
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Address after: Building 5, No. 1508, Xiangjiang Road, Suzhou High-tech Zone, Suzhou City, Jiangsu Province 215129 Applicant after: Suzhou Lianxun Instrument Co.,Ltd. Address before: 215011 Building 5, no.1508 Xiangjiang Road, high tech Zone, Suzhou City, Jiangsu Province Applicant before: STELIGHT INSTRUMENT Inc. |
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