CN217111418U - Automatic switching test platform for semiconductor laser connector - Google Patents
Automatic switching test platform for semiconductor laser connector Download PDFInfo
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- CN217111418U CN217111418U CN202220313949.7U CN202220313949U CN217111418U CN 217111418 U CN217111418 U CN 217111418U CN 202220313949 U CN202220313949 U CN 202220313949U CN 217111418 U CN217111418 U CN 217111418U
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- semiconductor laser
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Abstract
The utility model discloses a semiconductor laser connector automatic switch-over test platform, the base includes a vertically pterygoid lamina, there is the fixing base through bolt fixed mounting on the pterygoid lamina middle part, step motor automatic movement module is still installed at the base middle part, step motor automatic movement module is formed by driving seat and workstation combination, it can slide around the drive seat drive the workstation, install the fixed tool that is used for laying the semiconductor laser output on the workstation, it can drive fixed tool and switch over the output to the spectrum test end from the power test end to drive the seat. This application adopts step motor automatic movement module and fixed tool cooperation, and is fixed with the semiconductor laser output end through designing suitable fixed tool, starts step motor, can be with power test and spectral test automatic switch-over. By adopting the test platform, the labor intensity of production personnel can be reduced, the time is saved, the error rate is reduced, and the automation is realized.
Description
Technical Field
The utility model relates to a test equipment field, concretely relates to semiconductor laser connector automatic switch-over test platform.
Background
In testing the performance of semiconductor lasers, two main components, optical power and spectral performance, need to be tested. Due to different requirements of power testing and spectrum testing of the semiconductor laser and differences of testing methods and testing equipment, a CT head (computed tomography) of a product (namely a power output end of the product) needs to be manually moved in the testing process of the conventional semiconductor laser to switch the semiconductor laser from the power testing to the spectrum testing.
The existing power spectrum testing equipment has several obvious defects, firstly, a large amount of human resources are needed to wait for and implement switching in the testing process, and the human resources are wasted; secondly, in the waiting process, due to the fact that the number of the test tables is large, if the staff cannot notice the state of the test tables in the waiting process, the test tables are in a waiting state, and time efficiency is wasted; thirdly, errors are easily generated by manual operation, and the CT head of the product is placed wrongly, so that the testing efficiency is wasted; fourth, due to the problem of manual movement, the product must complete the power test before entering the spectrum test, which results in that different test stages require more time to set the conditions required by the test environment temperature, thereby affecting the test efficiency and stability.
SUMMERY OF THE UTILITY MODEL
To the above problem, the utility model aims at providing a semiconductor laser connector automatic switch-over test platform that can automatic accurate switching.
In order to realize the technical purpose, the utility model discloses a scheme is: a semiconductor laser connector automatic switching test platform comprises a base and a control module, wherein the base is of a T-shaped structure and comprises a vertical wing plate, a fixed seat is fixedly installed in the middle of the wing plate through a bolt and is of a U-shaped groove structure, and a power test end is installed on the fixed seat;
a fixing frame is arranged on one side of the tail of the wing plate, a spectrum testing end is fixedly mounted on the fixing frame, an automatic stepping motor moving module is further mounted in the middle of the base and is formed by combining a driving seat and a workbench, the driving seat can drive the workbench to slide back and forth, a fixing jig for placing the output end of the semiconductor laser is mounted on the workbench, and the driving seat can drive the fixing jig to switch the output end from the power testing end to the spectrum testing end;
the driving seat, the power testing end and the spectrum testing end are respectively and electrically connected with the control module.
Preferably, the fixed jig comprises a movable block, a horizontal adjusting seat and a vertical adjusting seat, the movable block is of a trapezoid structure, a first clamping groove is formed in the bottom surface of the movable block, a first clamping protrusion is formed in the side surface of the movable block, a second clamping protrusion and a horizontal knob are arranged on the horizontal adjusting seat, a second clamping groove and a vertical knob are arranged on the vertical adjusting seat, the first clamping groove corresponds to the second clamping protrusion, and the first clamping protrusion corresponds to the second clamping groove.
Preferably, the driving seat is formed by combining a step driving motor, a protective shell and a screw rod, the front end of the step driving motor is connected with the screw rod in a driving mode, strip-shaped notches are arranged in the top of the protective shell in parallel, nuts are arranged at the bottom of the workbench through connecting portions, the connecting portions can horizontally move along the strip-shaped notches, the screw rod is matched with the nuts, and the step driving motor can drive the workbench to horizontally move.
Preferably, the base is provided with two or more fixing holes.
The beneficial effects of the utility model, this application adopts step motor automatic movement module and fixed tool cooperation, and is fixed with the semiconductor laser output end through designing suitable fixed tool, starts step motor, can need not personnel to wait for and remove with power test and spectral test automatic switch-over. By adopting the test platform, the labor intensity of production personnel can be reduced, the time is saved, the error rate is reduced, and the automation is realized.
Drawings
Fig. 1 is a schematic structural diagram of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments. In order to clearly and completely describe the technical scheme, the following embodiments are selected for illustration; the following embodiments are some of the embodiments of the present invention; based on this application, do not make other embodiments that obtain under the creative work prerequisite, all belong to the utility model discloses the scope of protection.
In the following embodiments, it should be noted that the terms "upper", "lower", "left", "right", "inner", "outer", "top/bottom", and the like are all based on the orientations and positional relationships shown in the drawings, and are only for the convenience of clearly describing the embodiments, but do not indicate or imply that the referred devices or elements have to have specific orientations, and therefore, the present application is not limited thereto. Meanwhile, the terms "first" and "second" in the embodiments are used only for distinguishing the descriptive purposes and are not intended to indicate or imply relative importance.
The first embodiment is as follows:
as shown in fig. 1, a semiconductor laser connector automatic switching test platform, a base 1 is a T-shaped structure, the base 1 includes a vertical wing plate 2, a fixing seat 4 suitable for power testing height is fixedly installed on the middle part of the wing plate 2 through a bolt 3, the fixing seat 4 is a U-shaped groove structure, a power testing end 5 is installed on the fixing seat 4, and the direction of the power testing end is adjusted;
a fixing frame 6 suitable for the spectrum testing height is arranged on one side of the tail of the wing plate 2, a spectrum testing end 7 is fixedly installed on the fixing frame 6, a stepping motor automatic moving module is further installed in the middle of the base 1 and is formed by combining a driving seat 10 and a workbench 9, the driving seat 10 can drive the workbench 9 to slide back and forth, a fixing jig 8 used for placing the output end of the semiconductor laser is installed on the workbench 9, and the driving seat 10 can drive the fixing jig 8 to switch the output end from the power testing end 5 to the spectrum testing end 7; the driving seat 10, the power testing end 5 and the spectrum testing end 7 are respectively electrically connected with the control module.
For accurately clamping and fixing the output end of the semiconductor laser, the fixing jig 8 comprises a movable block 801, a horizontal adjusting seat 802 and a vertical adjusting seat 803, the movable block 801 is of a trapezoidal structure, a first clamping groove 804 is formed in the bottom surface of the movable block 801, a first clamping bulge 805 is formed in the side surface of the movable block 801, a second clamping bulge 806 and a horizontal knob 807 are arranged on the horizontal adjusting seat 802, a second clamping groove 808 and a vertical knob 809 are arranged on the vertical adjusting seat 803, the first clamping groove 804 corresponds to the second clamping bulge 806, and the first clamping bulge 805 corresponds to the second clamping groove 808.
For more stable drive workstation horizontal migration avoids foreign object to disturb, and the drive seat 10 is formed by step drive motor, protective housing 11, screw rod combination, and step drive motor front end drive is connected with the screw rod, and 11 top parallel arrangement of protective housing have strip notch 12, and the installation of workstation 9 bottom has the nut through connecting portion, connecting portion can follow the horizontal activity of strip notch 12, screw rod and nut phase-match, step drive motor function drive workstation 9 horizontal slip.
In order to facilitate the fixing and installation, two or more fixing holes 13 are formed in the base 1.
This application adopts step motor automatic movement module and fixed tool cooperation, and is fixed with semiconductor laser output end (CT head) through designing suitable fixed tool, starts step motor, can be with power test and spectrum test automatic switch-over, need not personnel and waits for and remove. By adopting the test platform, the labor intensity of production personnel can be reduced, the time is saved, the error rate is reduced, and the automation is realized.
The above, only do the preferred embodiment of the present invention, not used to limit the present invention, all the technical matters of the present invention should be included in the protection scope of the present invention for any slight modification, equivalent replacement and improvement of the above embodiments.
Claims (4)
1. The utility model provides a semiconductor laser connector automatic switch-over test platform which characterized in that: the power testing device comprises a base and a control module, wherein the base is of a T-shaped structure and comprises a vertical wing plate, a fixed seat is fixedly arranged on the middle part of the wing plate through a bolt, the fixed seat is of a U-shaped groove structure, and a power testing end is arranged on the fixed seat;
a fixing frame is arranged on one side of the tail of the wing plate, a spectrum testing end is fixedly mounted on the fixing frame, an automatic stepping motor moving module is further mounted in the middle of the base and is formed by combining a driving seat and a workbench, the driving seat can drive the workbench to slide back and forth, a fixing jig for placing the output end of the semiconductor laser is mounted on the workbench, and the driving seat can drive the fixing jig to switch the output end from the power testing end to the spectrum testing end;
the driving seat, the power testing end and the spectrum testing end are respectively and electrically connected with the control module.
2. The automatic switching test platform for semiconductor laser connectors according to claim 1, wherein: the fixed jig comprises a movable block, a horizontal adjusting seat and a vertical adjusting seat, wherein the movable block is of a trapezoidal structure, a first clamping groove is formed in the bottom surface of the movable block, a first clamping protrusion is arranged on the side surface of the movable block, a second clamping protrusion and a horizontal knob are arranged on the horizontal adjusting seat, a second clamping groove and a vertical knob are arranged on the vertical adjusting seat, the first clamping groove corresponds to the second clamping protrusion, and the first clamping protrusion corresponds to the second clamping groove.
3. The automatic switching test platform for semiconductor laser connectors according to claim 1, wherein: the drive seat is formed by step drive motor, protective housing, screw rod combination, step drive motor front end drive is connected with the screw rod, protective housing top parallel arrangement has the strip notch, there is the nut workstation bottom installation through connecting portion, the horizontal activity of strip notch can be followed to connecting portion, screw rod and nut phase-match, step drive motor function drive workstation horizontal migration.
4. The automatic switching test platform for semiconductor laser connectors according to claim 1, wherein: the base is provided with two or more fixing holes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220313949.7U CN217111418U (en) | 2022-02-16 | 2022-02-16 | Automatic switching test platform for semiconductor laser connector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220313949.7U CN217111418U (en) | 2022-02-16 | 2022-02-16 | Automatic switching test platform for semiconductor laser connector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217111418U true CN217111418U (en) | 2022-08-02 |
Family
ID=82598940
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220313949.7U Active CN217111418U (en) | 2022-02-16 | 2022-02-16 | Automatic switching test platform for semiconductor laser connector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217111418U (en) |
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2022
- 2022-02-16 CN CN202220313949.7U patent/CN217111418U/en active Active
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