CN114337807A - Multi-temperature test system of optical communication module - Google Patents
Multi-temperature test system of optical communication module Download PDFInfo
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- CN114337807A CN114337807A CN202011577982.2A CN202011577982A CN114337807A CN 114337807 A CN114337807 A CN 114337807A CN 202011577982 A CN202011577982 A CN 202011577982A CN 114337807 A CN114337807 A CN 114337807A
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- 238000012360 testing method Methods 0.000 title claims abstract description 52
- 238000004891 communication Methods 0.000 title claims abstract description 22
- 230000003287 optical effect Effects 0.000 title claims abstract description 22
- 239000000523 sample Substances 0.000 claims abstract description 73
- 238000006073 displacement reaction Methods 0.000 claims abstract description 7
- 238000009434 installation Methods 0.000 claims description 32
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 6
- 230000003595 spectral effect Effects 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract description 13
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000001427 coherent effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 238000001228 spectrum Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
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Abstract
The invention discloses a multi-temperature test system of an optical communication module, which comprises a substrate arranged on a rack, wherein a shell is arranged outside the rack, and the upper surface of the substrate is provided with at least one temperature control seat for placing a product to be tested; the temperature control device is characterized in that a mounting plate is further arranged above the temperature control seat, a first probe and a second probe are mounted on the mounting plate at intervals, the first probe is a PD probe, the PD probe is mounted on a vertically arranged movable mounting plate through a mounting block, the movable mounting plate is connected with the first mounting plate through a manual displacement table, the PD probe is mounted on the lower surface of the mounting block, and an included angle of 10-30 degrees is formed between the mounting block and the horizontal direction. The invention greatly improves the testing efficiency, can effectively prevent the interference formed by the light emitted by the product to be tested entering the product to be tested again after reflection, avoids the jitter of the testing curve caused by the interference and improves the testing precision.
Description
Technical Field
The invention relates to a multi-temperature test system of an optical communication module, belonging to the technical field of optical communication.
Background
As one of the most important inventions in the 20 th century, lasers play an increasingly important role in various industries; different from a natural common light source, laser is coherent light, namely, the laser has the characteristics of same frequency, same vibration direction and same phase (or constant phase difference); present optical communication systems rely to a large extent on high quality laser light sources.
After the laser is packaged, a test device is required to perform multiple tests on the laser, when a laser chip is tested, the laser chip is usually required to be heated and power-on aged for a long time, and the laser chip is required to be tested before and after the laser chip is aged. In the existing laser chip testing process, the laser chip needs to be transferred for many times, and equipment needs to be restarted after the chip is loaded every time of transfer, so that the testing time is greatly increased, and the testing efficiency is reduced. Testing a batch of laser chips requires a significant amount of testing time.
Disclosure of Invention
The invention aims to provide a multi-temperature testing system of an optical communication module, which greatly improves the testing efficiency, can effectively prevent the interference formed by the fact that light emitted by a product to be tested enters the product to be tested again after being reflected, avoids the jitter of a testing curve caused by the interference, and improves the testing precision.
In order to achieve the purpose, the invention adopts the technical scheme that: a multi-temperature test system of an optical communication module comprises a base plate installed on a rack, wherein a shell is installed outside the rack, the base plate divides the area in the shell into a test cavity located above the base plate and an instrument cavity located below the base plate, at least one temperature control seat used for placing a to-be-tested product is arranged on the upper surface of the base plate, a plurality of to-be-tested products are installed on the temperature control seat through a clamp, and the multi-temperature test system also comprises a first probe and a second probe, wherein the first probe and the second probe are movably arranged above the temperature control seat through an installation plate;
the mounting plate is provided with a first motor and a second motor at intervals, a first mounting plate provided with the first probe can move up and down under the drive of the first motor, the mounting plate is provided with a horizontally arranged second mounting plate, a first movable plate and a second movable plate are stacked above the second mounting plate in parallel, the first movable plate can move along a first direction, the second movable plate can move along a second direction perpendicular to the first direction, a third mounting plate used for fixing the second motor is vertically arranged on the second movable plate, and a fourth mounting plate provided with the second probe can move up and down under the drive of the second motor;
the PD probe is arranged on a movable mounting plate which is vertically arranged through a mounting block, the movable mounting plate is connected with a first mounting plate through a manual displacement table, the movable mounting plate can drive the PD probe on the mounting block to move up and down, the first mounting plate can move up and down under the driving of a first motor, the PD probe is arranged on the lower surface of the mounting block, and an included angle of 10-30 degrees is formed between the mounting block and the horizontal direction.
The further improved scheme in the technical scheme is as follows:
1. in the above scheme, the second mounting plate and the first movable plate, the first movable plate and the second movable plate, and the fourth mounting plate and the third mounting plate are connected with the sliding block through at least one set of sliding rail.
2. In the above scheme, the second probe is a spectrum probe.
3. In the scheme, the mounting plate is connected with the X-axis nut sleeved on the X-axis screw rod and can reciprocate along the X-axis screw rod with one end connected with the X-axis motor along the X-axis nut.
4. In the scheme, one end of the support provided with the X-axis screw rod and the X-axis motor is connected with a Y-axis nut sleeved on the Y-axis screw rod and can reciprocate along with the Y-axis nut along the Y-axis screw rod with one end connected with the Y-axis motor, and the other end of the support is connected with a Y-axis guide rail parallel to the Y-axis screw rod in a sliding mode through at least one sliding block.
5. In the above scheme, the temperature control base comprises a base, a water box installed on the base and TEC modules arranged above the water box at intervals.
6. In the scheme, a temperature equalization plate is connected above the TEC module in a covering manner and is used for being in contact with a bottom plate of the clamp.
Due to the application of the technical scheme, compared with the prior art, the invention has the following advantages:
the multi-temperature test system of the optical communication module can realize the test of two chips at the same time, greatly improves the test efficiency, further realizes the continuous test of each parameter through the combined arrangement of different probes, and improves the use efficiency of the instrument in the test process; in addition, a first probe of the test device is a PD probe, the PD probe is installed on a vertically arranged movable installation plate through an installation block, the movable installation plate is connected with a first installation plate through a manual displacement table, the movable installation plate can drive the PD probe on the installation block to move up and down, the first installation plate can move up and down under the driving of a first motor, the PD probe is installed on the lower surface of the installation block, an included angle of 10-30 degrees is formed between the installation block and the horizontal direction, the interference caused by the fact that light emitted by a product to be tested enters the product to be tested again through reflection can be effectively prevented, the shaking of a test curve caused by the interference is avoided, and the test precision is improved.
Drawings
FIG. 1 is a schematic structural diagram of a multi-temperature testing system of an optical communication module according to the present invention;
FIG. 2 is a schematic structural diagram of a fixture and a product to be tested in the multi-temperature testing system of the optical communication module according to the present invention;
fig. 3 is a schematic view of a partial structure of a multi-temperature testing system of an optical communication module according to the present invention.
In the above drawings: 1. a frame; 2. a substrate; 3. a housing; 4. a product to be tested; 5. a temperature control seat; 6. a clamp; 8. mounting a plate; 9. a first probe; 10. a second probe; 11. a first mounting plate; 12. a first motor; 13. a second mounting plate; 14. a first movable plate; 15. a second movable plate; 16. a third mounting plate; 17. a fourth mounting plate; 18. a second motor; 32. mounting blocks; 33. a movable mounting plate; 34. a manual displacement stage.
Detailed Description
In the description of this patent, it is noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, as they may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The meaning of the above terms in this patent may be specifically understood by those of ordinary skill in the art.
Example 1: a multi-temperature test system of an optical communication module comprises a substrate 2 installed on a rack 1, wherein a shell 3 is installed outside the rack 1, the substrate 2 divides the area in the shell 3 into a test cavity located above the substrate 2 and an instrument cavity located below the substrate 2, two temperature control seats 5 used for placing products to be tested 4 are arranged on the upper surface of the substrate 2, one hundred products to be tested 4 are installed on the temperature control seats 5 through a clamp 6, a first probe 9 and a second probe 10 are further arranged, and the first probe 9 and the second probe 10 are movably arranged above the temperature control seats 5 through an installation plate 8;
the first probe 9 and the second probe 10 are arranged on the mounting plate 8 at intervals, a first mounting plate 11 provided with the first probe 9 can move up and down under the drive of a first motor 12, a second mounting plate 13 horizontally arranged is arranged on the mounting plate 8, a first movable plate 14 and a second movable plate 15 are stacked above the second mounting plate 13 in parallel, the first movable plate 14 can move along a first direction, the second movable plate 15 can move along a second direction perpendicular to the first direction, a third mounting plate 16 used for fixing a second motor 18 is vertically arranged on the second movable plate 15, and a fourth mounting plate 17 provided with the second probe 10 can move up and down under the drive of the second motor 18;
first probe 9 is the PD probe, the PD probe is installed on the movable mounting plate 33 of a vertical setting through an installation piece 32, movable mounting plate 33 is connected with a first mounting panel 11 through a manual displacement platform 34, and the PD probe that must movable mounting plate 33 can drive on the installation piece 32 reciprocates, first mounting panel 11 can reciprocate under the drive of first motor 12, the PD probe is installed on the lower surface of installation piece 32, form a 20 contained angle between installation piece 32 and the horizontal direction.
The second mounting plate 13 is connected with the first movable plate 14, the first movable plate 14 is connected with the second movable plate 15, and the fourth mounting plate 17 is connected with the third mounting plate 16 through a set of slide rails.
The mounting plate 8 is connected with an X-axis nut which is sleeved on the X-axis screw rod and can move along with the X-axis nut along the X-axis screw rod with one end connected with an X-axis motor in a reciprocating mode.
The temperature control base 5 comprises a base, a water box arranged on the base and TEC modules arranged above the water box at intervals.
Example 2: a multi-temperature test system of an optical communication module comprises a substrate 2 installed on a rack 1, wherein a shell 3 is installed outside the rack 1, the substrate 2 divides the area in the shell 3 into a test cavity located above the substrate 2 and an instrument cavity located below the substrate 2, a temperature control seat 5 used for placing products to be tested 4 is arranged on the upper surface of the substrate 2, one hundred and twenty products to be tested 4 are installed on the temperature control seat 5 through a clamp 6, the multi-temperature test system also comprises a first probe 9 and a second probe 10, and the first probe 9 and the second probe 10 are movably arranged above the temperature control seat 5 through an installation plate 8;
the first probe 9 and the second probe 10 are arranged on the mounting plate 8 at intervals, a first mounting plate 11 provided with the first probe 9 can move up and down under the drive of a first motor 12, a second mounting plate 13 horizontally arranged is arranged on the mounting plate 8, a first movable plate 14 and a second movable plate 15 are stacked above the second mounting plate 13 in parallel, the first movable plate 14 can move along a first direction, the second movable plate 15 can move along a second direction perpendicular to the first direction, a third mounting plate 16 used for fixing a second motor 18 is vertically arranged on the second movable plate 15, and a fourth mounting plate 17 provided with the second probe 10 can move up and down under the drive of the second motor 18;
first probe 9 is the PD probe, the PD probe is installed on the movable mounting plate 33 of a vertical setting through an installation piece 32, movable mounting plate 33 is connected with a first mounting panel 11 through a manual displacement platform 34, and the PD probe that must movable mounting plate 33 can drive on the installation piece 32 reciprocates, first mounting panel 11 can reciprocate under the drive of first motor 12, the PD probe is installed on the lower surface of installation piece 32, form a 30 contained angle between installation piece 32 and the horizontal direction.
The second mounting plate 13 is connected with the first movable plate 14, the first movable plate 14 is connected with the second movable plate 15, and the fourth mounting plate 17 is connected with the third mounting plate 16 through a set of slide rails.
The second probe 10 is a spectroscopic probe.
The mounting plate 8 is connected with an X-axis nut sleeved on the X-axis screw rod and can reciprocate along the X-axis screw rod with one end connected with an X-axis motor along with the X-axis nut;
one end of a bracket provided with the X-axis screw rod and the X-axis motor is connected with a Y-axis nut sleeved on the Y-axis screw rod and can reciprocate along the Y-axis screw rod with one end connected with the Y-axis motor along the Y-axis nut, and the other end of the bracket is connected with a Y-axis guide rail parallel to the Y-axis screw rod in a sliding way through a sliding block; the Y-axis screw rod and the Y-axis guide rail are respectively arranged on two sides of the temperature control seat.
When the multi-temperature test system of the optical communication module is adopted, the first probe and the second probe which are installed on the installation plate at intervals can test two chips at the same time, so that the test efficiency is greatly improved, further, the continuous test of each parameter is realized through the combined arrangement of different probes, and the use efficiency of the instrument in the test process is improved;
in addition, the PD probe is installed on the lower surface of the installation block, an included angle of 10-30 degrees is formed between the installation block and the horizontal direction, the angle of the PD probe can effectively prevent the interference formed by the fact that light emitted by a product to be tested enters the product to be tested again through reflection, the jitter of a test curve caused by the interference is avoided, and the test precision is improved.
The above embodiments are merely illustrative of the technical ideas and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered within the protection scope of the present invention.
Claims (7)
1. The utility model provides a multi-temperature test system of optical communication module, is including installing base plate (2) on frame (1), frame (1) externally mounted has casing (3), base plate (2) are the regional division in casing (3) for the test chamber that is located base plate (2) top and the appearance chamber that is located base plate (2) below, its characterized in that: the temperature control device comprises a base plate (2), at least one temperature control seat (5) for placing a product (4) to be tested is arranged on the upper surface of the base plate (2), a plurality of products (4) to be tested are arranged on the temperature control seat (5) through a clamp (6), a first probe (9) and a second probe (10) are further arranged, and the first probe (9) and the second probe (10) are movably arranged above the temperature control seat (5) through a mounting plate (8);
install a first motor (12) and a second motor (18) at the interval on mounting panel (8), one installs first mounting panel (11) of first probe (9) can reciprocate under the drive of first motor (12), first probe (9) and second probe (10) are installed at the interval on mounting panel (8), install second mounting panel (13) that a level set up on mounting panel (8), second mounting panel (13) top parallel stack has first fly leaf (14) and second fly leaf (15), first fly leaf (14) can be followed the first direction and removed, second fly leaf (15) can be followed the second direction removal of perpendicular to first direction, vertical third mounting panel (16) that are used for fixed second motor (18) of installing on second fly leaf (15), one installs fourth mounting panel (17) of second probe (10) can reciprocate under the drive of second motor (18) and remove (ii) a
The first probe (9) is a PD probe, the PD probe is installed on a vertically arranged movable installation plate (33) through an installation block (32), the movable installation plate (33) is connected with a first installation plate (11) through a manual displacement table (34), the movable installation plate (33) can drive the PD probe on the installation block (32) to move up and down, the first installation plate (11) can move up and down under the driving of a first motor (12), the PD probe is installed on the lower surface of the installation block (32), and an included angle of 10-30 degrees is formed between the installation block (32) and the horizontal direction.
2. The multi-temperature test system of the optical communication module according to claim 1, wherein: the sliding block is connected between the second mounting plate (13) and the first movable plate (14), between the first movable plate (14) and the second movable plate (15), and between the fourth mounting plate (17) and the third mounting plate (16) through at least one group of sliding rails.
3. The multi-temperature test system of the optical communication module according to claim 1, wherein: the second probe (10) is a spectral probe.
4. The multi-temperature test system of the optical communication module according to claim 1, wherein: the mounting plate (8) is connected with an X-axis nut which is sleeved on the X-axis screw rod and can reciprocate along the X-axis screw rod of which one end is connected with an X-axis motor along with the X-axis nut.
5. The multi-temperature test system of the optical communication module according to claim 4, wherein: the X-axis screw rod and the X-axis motor are mounted at one end of the support, one end of the support is connected with a Y-axis nut sleeved on the Y-axis screw rod, the support can move back and forth along the Y-axis screw rod with one end connected with the Y-axis motor along with the Y-axis nut, and the other end of the support is connected with a Y-axis guide rail parallel to the Y-axis screw rod in a sliding mode through at least one sliding block.
6. The multi-temperature test system of the optical communication module according to claim 1, wherein: the temperature control base (5) comprises a base, a water box arranged on the base and TEC modules arranged above the water box at intervals.
7. The multi-temperature test system of the optical communication module according to claim 6, wherein: and a temperature equalizing plate is covered and connected above the TEC module and is used for contacting with a bottom plate of the clamp (6).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011577982.2A CN114337807B (en) | 2020-12-28 | 2020-12-28 | Multi-temperature test system of optical communication module |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011577982.2A CN114337807B (en) | 2020-12-28 | 2020-12-28 | Multi-temperature test system of optical communication module |
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| CN114337807A true CN114337807A (en) | 2022-04-12 |
| CN114337807B CN114337807B (en) | 2024-03-01 |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104515595A (en) * | 2014-12-20 | 2015-04-15 | 西安炬光科技有限公司 | Testing device for far field intensity of semiconductor light source |
| CN208140348U (en) * | 2018-03-27 | 2018-11-23 | 深圳市检验检疫科学研究院 | The device for quick testing of harmful radiation |
| CN111443272A (en) * | 2020-05-12 | 2020-07-24 | 中南大学 | Laser bar testing method and device |
| CN111443273A (en) * | 2020-05-12 | 2020-07-24 | 中南大学 | Laser bar testing device |
-
2020
- 2020-12-28 CN CN202011577982.2A patent/CN114337807B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104515595A (en) * | 2014-12-20 | 2015-04-15 | 西安炬光科技有限公司 | Testing device for far field intensity of semiconductor light source |
| CN208140348U (en) * | 2018-03-27 | 2018-11-23 | 深圳市检验检疫科学研究院 | The device for quick testing of harmful radiation |
| CN111443272A (en) * | 2020-05-12 | 2020-07-24 | 中南大学 | Laser bar testing method and device |
| CN111443273A (en) * | 2020-05-12 | 2020-07-24 | 中南大学 | Laser bar testing device |
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| CN114337807B (en) | 2024-03-01 |
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Address after: Building 5, No. 1508, Xiangjiang Road, Suzhou High-tech Zone, Suzhou City, Jiangsu Province 215129 Applicant after: Suzhou Lianxun Instrument Co.,Ltd. Address before: 215011 Building 5, no.1508 Xiangjiang Road, high tech Zone, Suzhou City, Jiangsu Province Applicant before: STELIGHT INSTRUMENT Inc. |
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