CN213275862U - Low, normal and high temperature test system for TO optical communication device - Google Patents
Low, normal and high temperature test system for TO optical communication device Download PDFInfo
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- CN213275862U CN213275862U CN202021850011.6U CN202021850011U CN213275862U CN 213275862 U CN213275862 U CN 213275862U CN 202021850011 U CN202021850011 U CN 202021850011U CN 213275862 U CN213275862 U CN 213275862U
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Abstract
The utility model discloses a low normal high temperature test system of TO optical communication device, including frame, operation support plate, test microscope carrier and examination probe, the test microscope carrier is installed on the operation support plate, and the test probe sets up above the test microscope carrier, and the test microscope carrier includes base and TEC unit, and the test fixture is placed above the TEC unit; an upper housing is arranged above the operation support plate, a sealed bin is formed between the upper housing and the operation support plate, a feed port is formed in the upper housing, a sealing cover is arranged on the feed port, a second feed port is formed in the sealing cover, and a second sealing cover is arranged on the second feed port; the driving mechanism comprises a Z-axis assembly, a Y-axis assembly, an X-axis motor and an X-axis guide rail, a test probe is mounted on the Z-axis assembly, the Z-axis assembly is mounted on the Y-axis assembly, and a sliding block is arranged on the Y-axis assembly. The utility model discloses both can satisfy the requirement of overhauing and going up unloading, can reduce the probability in the housing again in the outside air gets into, guarantees the leakproofness in the housing, and then guarantees the test effect.
Description
Technical Field
The utility model relates TO a low normal high temperature test system of TO optical communication device belongs TO optical communication test technical field.
Background
The design of a clamp for testing aging of a laser chip is always difficult, particularly the testing of a temperature-sensitive chip is difficult, the current industry only has a normal-temperature TO testing system, but with the development of the optical communication industry, 25G and 50G TO products increasingly need low-temperature testing and high-temperature testing, and the industry lacks a reliable and easy-TO-use low-temperature, normal-temperature and high-temperature testing system.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a TO optical communication device's low normal high temperature test system, it both can satisfy the requirement of overhauing and going up unloading, can reduce the probability in the housing again in the outside air entering, guarantees the leakproofness in the housing, and then guarantees test effect.
In order to achieve the above purpose, the utility model adopts the technical scheme that: a low, normal and high temperature test system of a TO optical communication device comprises a rack, an operation carrier plate, a test carrier platform and at least one test probe, wherein the operation carrier plate is arranged on the rack;
an upper housing is arranged on the machine frame and positioned above the operation support plate, so that a sealed bin is formed between the upper housing and the operation support plate, a feeding hole is formed in the surface of one side of the upper housing, a sealing cover is arranged on the feeding hole, a plurality of second feeding holes are formed in the sealing cover at intervals, and second sealing covers are arranged on the second feeding holes;
the drive mechanism further comprises a Z shaft assembly, a Y shaft assembly movably connected with the Z shaft assembly, an X shaft motor and two X shaft guide rails arranged in parallel, the Z shaft assembly is provided with a test probe for driving the test probe to move up and down, the Z shaft assembly is arranged on the Y shaft assembly and can reciprocate along the Y shaft direction, two ends of the Y shaft assembly are respectively provided with a sliding block and two sliding blocks which are respectively connected with the two X shaft guide rails in a sliding manner, so that the Y shaft assembly can reciprocate along the X shaft direction.
The further improved scheme in the technical scheme is as follows:
1. in the above scheme, the test carrier further includes a temperature equalization plate, and the temperature equalization plate is located above the TEC unit and is in contact with the TEC unit.
2. In the above scheme, the upper part of the sealing cover is rotatably connected with the upper housing, and the lower part of the sealing cover is locked with the upper housing.
3. In the above scheme, a lower shell is arranged on the rack and below the operation support plate, and a control unit and a test source meter are respectively arranged in the lower shell.
4. In the scheme, one of the two X-axis guide rails is a screw rod, one end of the screw rod is connected with the X-axis motor, and one of the two sliding blocks is sleeved on the screw rod and is in threaded connection with the screw rod.
Because of above-mentioned technical scheme's application, compared with the prior art, the utility model have the following advantage:
1. the utility model discloses low normal high temperature test system of TO optical communication device, it can carry out high temperature, normal atmospheric temperature and low temperature test TO the device on the test fixture, and efficiency of software testing is high, and the commonality is good; in addition, its Y axle subassembly both ends are provided with a slider respectively, two the slider respectively with two X axle guide rail sliding connection, make Y axle subassembly can follow X axle direction reciprocating motion, through parallel arrangement's guide rail, play better supporting role to Y axle subassembly, make the removal of Y axle subassembly more stable and the removal precision is higher to improve the precision of probe to the device test.
2. The utility model discloses low normal high temperature test system of TO optical communication device, its frame is located the operation support plate top and is installed a housing, thereby goes up the housing and forms a sealed storehouse between the operation support plate here, it has a feed inlet TO open on one side surface of housing, installs a sealed lid on this feed inlet, and this sealed covering is last TO be separated TO have a plurality of second feed inlets, installs second sealed lid on this second feed inlet, has provided a seal chamber through the housing, both can reduce the influence of external environment TO the result of test when testing high temperature, can avoid the air contact anchor clamps of outside moisture when testing low temperature again, avoid frosting on the anchor clamps, the dewfall, thereby improve the precision of test; and the setting of its feed inlet and a plurality of second feed inlets then both can satisfy the requirement of overhauing and going up unloading, can reduce the probability that outside air got into in the housing again, guarantees the leakproofness in the housing, and then guarantees test effect.
Drawings
Fig. 1 is a schematic structural diagram of a low, normal and high temperature test system of the TO optical communication device of the present invention;
fig. 2 is a schematic view of a local structure of a low, normal and high temperature test system of the TO optical communication device of the present invention;
fig. 3 is the structure diagram of the test carrier of the present invention.
In the above drawings: 1. a frame; 2. an operation carrier plate; 3. testing the carrier; 4. testing the probe; 5. a drive mechanism; 501. a Z-axis assembly; 502. a Y-axis assembly; 504. an X-axis guide rail; 505. a slider; 506. a screw rod; 6. a base; 7. a TEC unit; 8. an upper housing; 9. a feed inlet; 10. a sealing cover; 11. a second feed port; 12. a second sealing cover; 13. a lower housing; 18. a temperature equalizing plate.
Detailed Description
In the description of this patent, it is noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, as they may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The meaning of the above terms in this patent may be specifically understood by those of ordinary skill in the art.
Example 1: a low, normal and high temperature test system of a TO optical communication device comprises a rack 1, an operation carrier plate 2 arranged on the rack 1, a test platform deck 3 and at least one test probe 4, wherein the test platform deck 3 is arranged in the middle of the upper surface of the operation carrier plate 2, the test probe 4 is movably arranged above the test platform deck 3 through a driving mechanism 5, the test platform deck 3 for placing a test fixture comprises a base 6 and a plurality of TEC units 7 uniformly arranged on the base 6, and the test fixture is placed above the TEC units 7;
an upper housing 8 is arranged on the frame 1 and above the operation carrier plate 2, so that a sealed bin is formed between the upper housing 8 and the operation carrier plate 2, a feed inlet 9 is formed on one side surface of the upper housing 8, a sealing cover 10 is arranged on the feed inlet 9, a plurality of second feed inlets 11 are formed on the sealing cover 10 at intervals, and second sealing covers 12 are arranged on the second feed inlets 11;
the driving mechanism 5 further comprises a Z shaft assembly 501, a Y shaft assembly 502 movably connected with the Z shaft assembly 501, an X shaft motor and two X shaft guide rails 504 arranged in parallel, the Z shaft assembly 501 is provided with a test probe 4 for driving the test probe 4 to move up and down, the Z shaft assembly 501 is arranged on the Y shaft assembly 502 and can reciprocate along the Y shaft direction, two ends of the Y shaft assembly 502 are respectively provided with a sliding block 505, and the sliding blocks 505 are respectively connected with the two X shaft guide rails 504 in a sliding manner, so that the Y shaft assembly 502 can reciprocate along the X shaft direction.
The test carrier 3 further comprises a temperature equalizing plate 18, and the temperature equalizing plate 18 is positioned above the TEC unit 7 and is in contact with the TEC unit 7; the upper part of the sealing cover 10 is rotatably connected with the upper casing 8, and the lower part of the sealing cover 10 is locked with the upper casing 8.
Example 2: a low, normal and high temperature test system of a TO optical communication device comprises a rack 1, an operation carrier plate 2 arranged on the rack 1, a test platform deck 3 and at least one test probe 4, wherein the test platform deck 3 is arranged in the middle of the upper surface of the operation carrier plate 2, the test probe 4 is movably arranged above the test platform deck 3 through a driving mechanism 5, the test platform deck 3 for placing a test fixture comprises a base 6 and a plurality of TEC units 7 uniformly arranged on the base 6, and the test fixture is placed above the TEC units 7;
an upper housing 8 is arranged on the frame 1 and above the operation carrier plate 2, so that a sealed bin is formed between the upper housing 8 and the operation carrier plate 2, a feed inlet 9 is formed on one side surface of the upper housing 8, a sealing cover 10 is arranged on the feed inlet 9, a plurality of second feed inlets 11 are formed on the sealing cover 10 at intervals, and second sealing covers 12 are arranged on the second feed inlets 11;
the driving mechanism 5 further comprises a Z shaft assembly 501, a Y shaft assembly 502 movably connected with the Z shaft assembly 501, an X shaft motor and two X shaft guide rails 504 arranged in parallel, the Z shaft assembly 501 is provided with a test probe 4 for driving the test probe 4 to move up and down, the Z shaft assembly 501 is arranged on the Y shaft assembly 502 and can reciprocate along the Y shaft direction, two ends of the Y shaft assembly 502 are respectively provided with a sliding block 505, and the sliding blocks 505 are respectively connected with the two X shaft guide rails 504 in a sliding manner, so that the Y shaft assembly 502 can reciprocate along the X shaft direction.
A lower shell 13 is arranged on the rack 1 and below the operation carrier plate 2, and a control unit and a test source meter are respectively arranged in the lower shell 13; one of the two X-axis guide rails 504 is a screw rod 506, one end of the screw rod 506 is connected with the X-axis motor, and one of the two slide blocks 505 is sleeved on the screw rod 506 and is in threaded connection with the screw rod 506.
When the low, normal and high temperature test system of the TO optical communication device is adopted, the device on the test fixture can be tested at high temperature, normal temperature and low temperature, the test efficiency is high, and the universality is good;
in addition, a sealed cavity is provided by the upper cover shell, so that the influence of the external environment on the test result can be reduced when the test temperature is high, the external water-containing air can be prevented from contacting the clamp when the test temperature is low, the frosting and dewing on the clamp can be avoided, and the test precision can be improved; the arrangement of the feed inlet and the plurality of second feed inlets can meet the requirements of maintenance and feeding and discharging, reduce the probability of external air entering the upper housing, ensure the tightness in the upper housing and further ensure the test effect;
in addition, it plays better supporting role to the Y axle subassembly through parallel arrangement's guide rail, makes the removal of Y axle subassembly more stable and the removal precision is higher to improve the precision of probe to the device test.
The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose of the embodiments is to enable people skilled in the art to understand the contents of the present invention and to implement the present invention, which cannot limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered by the protection scope of the present invention.
Claims (5)
1. The low, normal and high temperature test system of the TO optical communication device is characterized in that: the test device comprises a rack (1), an operation carrier plate (2) arranged on the rack (1), a test platform deck (3) and at least one test probe (4), wherein the test platform deck (3) is arranged in the middle of the upper surface of the operation carrier plate (2), the test probe (4) is movably arranged above the test platform deck (3) through a driving mechanism (5), the test platform deck (3) for placing a test fixture comprises a base (6) and a plurality of TEC units (7) uniformly distributed on the base (6), and the test fixture is placed above the TEC units (7);
an upper housing (8) is arranged on the rack (1) and above the operation carrier plate (2), so that a sealed bin is formed between the upper housing (8) and the operation carrier plate (2), a feed inlet (9) is formed in the surface of one side of the upper housing (8), a sealing cover (10) is arranged on the feed inlet (9), a plurality of second feed inlets (11) are formed in the sealing cover (10) at intervals, and a second sealing cover (12) is arranged on the second feed inlets (11);
drive mechanism (5) further include Z axle subassembly (501), Y axle subassembly (502), X axle motor and two parallel arrangement's X axle guide rail (504) with Z axle subassembly (501) swing joint, install test probe (4) on Z axle subassembly (501) for drive test probe (4) reciprocate, this Z axle subassembly (501) is installed on Y axle subassembly (502), and can follow Y axle direction reciprocating motion, the both ends of Y axle subassembly (502) are provided with a slider (505) respectively, two slider (505) respectively with two X axle guide rail (504) sliding connection, make Y axle subassembly (502) can follow X axle direction reciprocating motion.
2. The low, ordinary and high temperature test system of the TO optical communication device according TO claim 1, wherein: the test carrying platform (3) further comprises a temperature equalizing plate (18), and the temperature equalizing plate (18) is located above the TEC unit (7) and is in contact with the TEC unit (7).
3. The low, ordinary and high temperature test system of the TO optical communication device according TO claim 1, wherein: the upper part of the sealing cover (10) is rotatably connected with the upper housing (8), and the lower part of the sealing cover (10) is locked with the upper housing (8).
4. The low, ordinary and high temperature test system of the TO optical communication device according TO claim 1, wherein: a lower shell (13) is arranged on the rack (1) and below the operation carrier plate (2), and a control unit and a test source meter are respectively arranged in the lower shell (13).
5. The low, ordinary and high temperature test system of the TO optical communication device according TO claim 1, wherein: one of the two X-axis guide rails (504) is a screw rod (506), one end of the screw rod (506) is connected with the X-axis motor, and one sliding block (505) of the two sliding blocks (505) is sleeved on the screw rod (506) and is in threaded connection with the screw rod (506).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021850011.6U CN213275862U (en) | 2020-08-28 | 2020-08-28 | Low, normal and high temperature test system for TO optical communication device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021850011.6U CN213275862U (en) | 2020-08-28 | 2020-08-28 | Low, normal and high temperature test system for TO optical communication device |
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| Publication Number | Publication Date |
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| CN213275862U true CN213275862U (en) | 2021-05-25 |
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| CN202021850011.6U Active CN213275862U (en) | 2020-08-28 | 2020-08-28 | Low, normal and high temperature test system for TO optical communication device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114384404A (en) * | 2022-03-23 | 2022-04-22 | 上海菲莱测试技术有限公司 | Cooling test assembly unit and aging cooling device |
-
2020
- 2020-08-28 CN CN202021850011.6U patent/CN213275862U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114384404A (en) * | 2022-03-23 | 2022-04-22 | 上海菲莱测试技术有限公司 | Cooling test assembly unit and aging cooling device |
| CN114384404B (en) * | 2022-03-23 | 2022-08-23 | 上海菲莱测试技术有限公司 | Cooling test assembly unit and aging cooling device |
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Address after: Building 5, No. 1508, Xiangjiang Road, Suzhou High-tech Zone, Suzhou City, Jiangsu Province 215129 Patentee after: Suzhou Lianxun Instrument Co.,Ltd. Address before: 215011 Building 5, no.1508 Xiangjiang Road, high tech Zone, Suzhou City, Jiangsu Province Patentee before: STELIGHT INSTRUMENT Inc. |