CN201548571U

CN201548571U - Chip testing fixture

Info

Publication number: CN201548571U
Application number: CN2009202327309U
Authority: CN
Inventors: 叶本银
Original assignee: Suzhou Pixcir Microelectronics Co Ltd
Current assignee: Suzhou Pixcir Microelectronics Co Ltd
Priority date: 2009-09-09
Filing date: 2009-09-09
Publication date: 2010-08-11
Anticipated expiration: 2019-09-09

Abstract

The utility model relates to a chip testing fixture which is used for fixing a de-encapsulation chip to be tested, comprising a circuit board, a base and an upper cover, wherein the circuit board is provided with a magnet device; the base is provided with a containing groove which is used for placing the de-encapsulation chip; one end of an upper cover main body is provided with a testing hole, and the other end thereof is provided with an iron absorption device corresponding to the magnet device on the circuit board; and when the upper cover main body is buckled with the de-encapsulation chip to be tested, the de-encapsulation chip can be fixed by the testing hole, and the structure inside the chip can be exposed. The chip testing fixture not only can ensure the testing accuracy of the de-encapsulation chip, but also improves the work efficiency of testing personnel, and has simple structure and design as well as low cost.

Description

The chip testing anchor clamps

Technical field

The utility model relates to a kind of chip testing anchor clamps, but refers in particular to a kind of static solution packaged chip and to its chip testing anchor clamps of testing.

Background technology

Chip is meant the silicon chip that includes integrated circuit, usually volume is very little, it usually is the part of computing machine or miscellaneous equipment, for packaged chip, mainly by crystal grain 12, substrate 14, compositions such as encapsulating material 16 and tin ball 18, tradition is if need test chip, see also shown in Figure 2, if at packaged chip, then at first need packaged chip 10 is placed in the test clip 20, test clip 20 comprises a base 22 and a loam cake 24, base 22 is provided with a storage tank 221, so that packaged chip 10 is placed in wherein, then be that to be provided with a plurality of test points 223 corresponding with the tin ball 18 of packaged chip 10 respectively on the surface of storage tank 221, and above-mentioned test point 223 is connected with a circuit board 28, electrical property efficiency in order to test

package chip

10,24 of loam cakes are after packaged chip 10 is inserted, and are covered on the base 22, so that packaged chip 10 is tested.

Existing test fixture 20, after loam cake 24 covers base 22, covered whole packaged chip, therefore when the tested result of some packaged chips proves that this packaged chip can't use, then further impaired where detection chip inside is, when chip is determined to use, the tester further carries out the decapsulation program, with original packaged packaged chip contact encapsulating material, its inner lead crystal grain is exposed, and impaired where detect the decapsulation chip internal by probe more afterwards.Owing to must detect the decapsulation chip internal by probe, if the loam cake of test fixture 20 24 covers entire chip, probe in detecting can't be carried out so.

At the problems referred to above, a kind of test fixture has appearred recently, please refer to shown in Figure 3, by on the transparent upper cover 32 of chip testing anchor clamps 30, instrument connection 3021 being set, when this transparent upper cover main body 302 covers the packaged chip of this test and decapsulation chip, this instrument connection 3021 is exposed this crystal grain and these many leads, so the chip after the tester just can utilize probe to decapsulation is easily tested, though this way has overcome the traditional shortcoming that can't carry out probe in detecting, but utilize probe to carry out test chip itself and just have inconvenience, because when utilizing probe that chip is tested, be used for this structure and do not have stationary installation, so chip possibility warpage when test, cause loose contact, and because chip itself is just very little, so the common syringe needle of probe is less, and the handle place is bigger, the tester is when test, at most once use 4 probes, when test, must be difficult to accurate location like this, increase tester's use difficulty virtually, and when the aiming of location, also waste tester's time, moreover consider that the cost of probe own is just very expensive, if having infringement or a large amount of just the use can increase enterprise cost again.

Therefore need solve above problem for users provide a kind of easier method.

Summary of the invention

The actual technical matters to be solved of the utility model is how a kind of chip testing anchor clamps are provided, these anchor clamps both well the static solution packaged chip also can carry out the test of chip after the decapsulation to it.

In order to realize above-mentioned purpose of the present utility model, the utility model provides a kind of chip testing anchor clamps, be used for fixing decapsulation chip to be measured, these chip testing anchor clamps comprise a base, which is provided with holding tank, be used to place the decapsulation chip, these anchor clamps also comprise a circuit board and a loam cake, wherein, described circuit board is provided with magnet arrangement; And an end is provided with an instrument connection on the described loam cake main body, the other end be provided with circuit board on the corresponding suction iron of magnet arrangement device, when this loam cake main body fastens tested decapsulation chip, can fix this decapsulation chip by this instrument connection, and its inner structure is exposed.

Chip testing anchor clamps described in the utility model, but static solution packaged chip but also can carry out the test of chip after the decapsulation not only to it, and owing to no longer need to utilize the probe test means, but utilize fractographic mode, both guaranteed to understand the test accuracy of packaged chip, improved tester's work efficiency again, and this test fixture structural design is simple, with low cost.

Description of drawings

Fig. 1 is the synoptic diagram of existing packaged chip;

Fig. 2 is the chip testing anchor clamps synoptic diagram of existing packaged chip;

Fig. 3 is the another synoptic diagram of the chip testing anchor clamps of existing packaged chip;

Fig. 4 is the schematic perspective view of a direction of the utility model anchor clamps;

Fig. 5 is the schematic perspective view of another direction of the utility model anchor clamps;

Fig. 6 is the front elevation after the utility model anchor clamps cover;

Embodiment

Below in conjunction with drawings and Examples the utility model is further described.

Please in conjunction with consulting Fig. 4 and shown in Figure 5, described test fixture 40 is installed on the circuit board 44, and wherein test fixture 40 comprises a base 41 and loam cake 42, and loam cake 42 can be fastened on the base 41, and decapsulation chip (not shown) is stable in the base 41.

Circuit board 44 is used for fixing whole anchor clamps 40, which is provided with a containing hole 441, one magnet stones 442 and is installed in the described containing hole 441, and whole like this device has just constituted a magnet arrangement 440, is matched with the suction iron device 420 of loam cake 42.

Base 41 is provided with holding tank 411, be used to place the decapsulation chip, be provided with in this holding tank 411 and corresponding each pin of decapsulation chip (not shown), the below of base 41 is provided with a pcb board 43, and base 41 can be fixed on the described pcb board 43 by bolt (not shown), be welded with two row rows' pins 431 on the described pcb board 43, be used for the circuit on the connection PCB plate 43, multiple conducting wires (not shown) is connected on each pin on the holding tank 411 by these row's pins 431.

Loam cake 42 comprises loam cake main body 421 and handle portion 422, and handle portion 422 is fixed on a marginal end of this loam cake main body 421, to make things convenient for the user to point the folding operation, the other end of loam cake main body 421 is provided with a view hole groove 423, the plane of this view hole groove 423 is lower than the plane of this loam cake main body 421, so that the user focuses when using microscopic examination, on described view hole groove 423, offer an instrument connection 424 again, this instrument connection 424 is a through hole, be divided into, following two

parts

4241 and 4242, top 4241 is one to run through the through hole of this view hole groove 423, lower part 4242 is provided with a fixing lug boss 4243, this fixing lug boss 4243 is slightly larger than the through hole on the top 4241 of instrument connection 424, and just in time be the area of chip size, like this after fastening loam cake 42, the instrument connection 424 of this band fixing lug boss 4243 just can be fixed described decapsulation chip, and exposed with regard to the inner structure that makes the decapsulation chip by this instrument connection 424, the tester just is easy to observe its inner structure by microscope like this, this loam cake 42 also is provided with a containing hole 425 near handle portion 422 places, one magnet stone 426 is installed in the described containing hole 425, whole like this device has just constituted one and has inhaled iron device 420, and corresponding on the circuit board 44 magnet arrangement 440, whole magnet arrangement 440 is preferably disposed near the handle portion 422, like this when described loam cake main body 421 is passed through handle portion 422 to circuit board 44 fastenings, magnet arrangement 440 on it and suction iron device 420 are stablized it by attracting each other and are fastened, as shown in Figure 6, and when opening this loam cake 42, only the attractive force that need overcome between the magnet is just passable, so whole operation is very simple.

Anchor clamps described in the utility model, having abandoned tradition utilizes probe to come the structure of test chip inside, utilization covers the method that instrument connection is set and observes chip internal structure by microscope on anchor clamps, easily realized detecting the purpose of decapsulation chip, the structure of the whole anchor clamps that not only make is simple more, cost is cheaper, and can effectively improve the test accuracy of decapsulation chip, strengthened tester's work efficiency simultaneously again.

Claims

1. chip testing anchor clamps are used for fixing decapsulation chip to be measured, and these chip testing anchor clamps comprise a base, which is provided with holding tank, be used to place the decapsulation chip, it is characterized in that: these anchor clamps also comprise a circuit board and a loam cake, wherein, described circuit board is provided with magnet arrangement; And an end is provided with an instrument connection on the described loam cake main body, the other end be provided with circuit board on the corresponding suction iron of magnet arrangement device, when this loam cake main body fastens tested decapsulation chip, can fix this decapsulation chip by this instrument connection, and its inner structure is exposed.

2. chip testing anchor clamps as claimed in claim 1 is characterized in that: described instrument connection is divided into upper and lower two parts, and wherein, the lower part is provided with a boss greater than the top through hole.

3. chip testing anchor clamps as claimed in claim 2 is characterized in that: the fixing lug boss of described instrument connection lower part faces the holding tank in the base.

4. chip testing anchor clamps as claimed in claim 1 is characterized in that: be covered with a view hole groove on described, described instrument connection is located on this view hole groove.

5. chip testing anchor clamps as claimed in claim 1 is characterized in that: described magnet arrangement is to be made of installing one magnetite in the through hole on circuit board.

6. chip testing anchor clamps as claimed in claim 1 is characterized in that: described suction iron device is to be made of installing one magnetite in the through hole of loam cake one end.

7. chip testing anchor clamps as claimed in claim 1 is characterized in that: described loam cake main body is when circuit board fastens, and magnet arrangement on it and suction iron device make its fastening by attracting each other.

8. as claim 1 or 6 described chip testing anchor clamps, it is characterized in that: the suction iron device of described loam cake is positioned near the handle portion of this loam cake.

9. chip testing anchor clamps as claimed in claim 1 is characterized in that: described base is located on the pcb board, and this pcb board is fixed in the described circuit board.

10. chip testing anchor clamps as claimed in claim 9 is characterized in that: described pcb board is provided with and connects weldering plurality of rows pin thereon.