CN107807318A - A kind of clamp for testing electronic device - Google Patents
A kind of clamp for testing electronic device Download PDFInfo
- Publication number
- CN107807318A CN107807318A CN201610799056.7A CN201610799056A CN107807318A CN 107807318 A CN107807318 A CN 107807318A CN 201610799056 A CN201610799056 A CN 201610799056A CN 107807318 A CN107807318 A CN 107807318A
- Authority
- CN
- China
- Prior art keywords
- drive circuit
- circuit board
- clamping plate
- magnet
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention belongs to electronic component technical field of measurement and test, and in particular to a kind of clamp for testing electronic device, including the clamping plate and drive circuit board being stacked, be equipped with via on the drive circuit board and clamping plate；Opposite both sides are provided with magnet on the drive circuit board and clamping plate；When the via face on the via and drive circuit board on the clamping plate, the magnet on magnet and drive circuit board on clamping plate is staggeredly arranged, magnetic force between two magnet can make clamping plate and drive circuit board produce the trend mutually sheared, and then the pin of component to be measured is clamped by the hole wall of the via on clamping plate and drive circuit board.The present invention is clamped the pin of electronic component to be measured by the way of shearing motion, and provides clamping force using magnet, can realize the fast assembling-disassembling of electronic component to be measured, and pin will not be damaged in disassembly process.
Description
Technical field
The invention belongs to electronic component technical field of measurement and test, and in particular to a kind of clamp for testing electronic device.
Background technology
The most important device in single-photon detector field or avalanche photodide (APD) at present, it is optical detection neck
The photovoltaic detector element used in domain, its major function are exactly to convert optical signals into electric signal output, because APD's is sensitive
The characteristics of degree height, high-gain and fast response time, turn into the preferred signal sensitive detection parts in optic communication.Avalanche photodide is most
The advantages of big is with enlarge-effect, and photo-detector has very high sensitivity made of it, general than PIN photo-detectors
High sensitivity 10-20dB.In order to test APD service behaviour, it would be desirable to which APD is fixed on pcb board.Existing fixation
Mode is typically that APD is directly welded on drive circuit, and APD is tested.
Existing measuring technology is mainly that use cuts pin and welds tested APD devices to circuit-under-test plate, due to needing
The service behaviour of different APD materials is tested, is unfavorable for multiple dismounting using welding manner, or even can damage in the process of dismounting
Bad device.In the case of this, it is unfavorable for APD materials and is used in normal production.
The content of the invention
It is an object of the invention to provide a kind of clamp for testing electronic device for being easy to electronic component to dismount.
To achieve the above object, the invention provides following technical scheme：A kind of clamp for testing electronic device, including layer
The clamping plate and drive circuit board set is folded, is equipped with and electronic component pin phase to be measured on the drive circuit board and clamping plate
The via matched somebody with somebody；Opposite both sides are provided with magnet on the drive circuit board and clamping plate, the inside magnetic induction line direction of the magnet with
The plate face of clamping plate and drive circuit board is vertical, and the polarity arrangement direction phase of the magnet on clamping plate and the magnet on drive circuit board
Together；When the via face on the via and drive circuit board on the clamping plate, on the magnet and drive circuit board on clamping plate
Magnet is staggeredly arranged, and the magnetic force between two magnet can make clamping plate and drive circuit board produce the trend mutually sheared, and then make
The pin of component to be measured is clamped by the hole wall of the via on clamping plate and drive circuit board.
Preferably, the side of the drive circuit board is that the side opposite with clamping plate is provided with heat-conducting plate, the electronics to be measured
The pin of component inserts the via from the side, and the bottom surface of electronic component to be measured is brought into close contact with heat-conducting plate, described to lead
Radiating fin is connected with hot plate.
Preferably, felt pad is provided between the heat-conducting plate and drive circuit board.
Preferably, the clamping plate and drive circuit board are provided with two groups of magnet, and two groups of magnet are arranged in be measured in yi word pattern
The pin both sides of electronic component, and the direction of staggering of two groups of magnet is identical.
Preferably, the magnet on the clamping plate and drive circuit board mutually stagger magnet its length 50% set.
Preferably, the route arrangement on the drive circuit board with clamping plate corresponding region, should in the side opposite with clamping plate
The circuit in region is turned on by the cable-through hole that the edges of regions opens up with the main line of drive circuit board opposite side.
The technical effects of the invention are that：The present invention is pressed from both sides the pin of electronic component to be measured by the way of shearing motion
Tightly, and using magnet clamping force is provided, the fast assembling-disassembling of electronic component to be measured can be realized, and will not be damaged in disassembly process
Hinder pin.
Brief description of the drawings
Fig. 1 is the dimensional structure diagram that embodiments of the invention are provided；
Fig. 2 is the front view that embodiments of the invention are provided, and APD pins are in releasing orientation in figure；
Fig. 3 is the front view that embodiments of the invention are provided, and APD pin is in clamped condition in figure；
Fig. 4 is the drive circuit plate structure schematic diagram that embodiments of the invention are provided；
Fig. 5 is the clamp region schematic diagram that embodiments of the invention are provided.
Embodiment
The present invention is described in detail below in conjunction with accompanying drawing.
As shown in Fig. 1~5, technical scheme is described in detail by taking APD detection as an example for the present embodiment.
A kind of APD test fixtures, including the clamping plate 12 and drive circuit board 11 being stacked, the He of drive circuit board 11
The via 111,121 to match with APD10 to be measured pin 101 is equipped with clamping plate 12；The drive circuit board 11 and clamping plate
Opposite both sides are provided with magnet 13, inside magnetic induction line direction and the clamping plate 12 and the plate of drive circuit board 11 of the magnet 13 on 12
Face is vertical, and the magnet 13 on clamping plate 12 is identical with the polarity arrangement direction of the magnet 13 on drive circuit board 11；When the folder
When via 121 on plate 12 is with 111 face of via on drive circuit board 11, magnet 13 and drive circuit board 11 on clamping plate 12
On magnet 13 be staggeredly arranged, the magnetic force between two magnet 13 can make clamping plate 12 and drive circuit board produce becoming of mutually shearing
Gesture, and then APD10 pin 101 is clamped by the hole wall of the via 111,121 on clamping plate 12 and drive circuit board 11.The present invention
APD10 to be measured pin 101 is clamped by the way of shearing motion, and clamping force is provided using magnet 13, can realize and treat
The fast assembling-disassembling of electronic component is surveyed, and pin 101 will not be damaged in disassembly process.
Preferably, the side of the drive circuit board 11 is that the side opposite with clamping plate 12 is provided with heat-conducting plate 14, described to treat
The pin 101 for surveying APD10 inserts the via 111,121 from the side, and APD10 to be measured bottom surface is closely pasted with heat-conducting plate 14
Close, radiating fin 15 is connected with the heat-conducting plate 14.Heat-conducting plate 14 can conduct APD10 heat to radiating fin 15, from
And reduce APD10 temperature.
Preferably, felt pad 16 is provided between the heat-conducting plate 14 and drive circuit board 11.Heat-conducting plate 14 is by gold such as copper coins
Category material is made, therefore sets felt pad 16 to prevent that drive circuit board 11 is short between heat-conducting plate 14 and drive circuit board 11
Road.
Preferably, to increase suction, the clamping plate 12 and drive circuit board 11 are provided with two groups of magnet 13, two groups of magnet 13
The APD10 to be measured both sides of pin 101 are arranged in yi word pattern, and the direction of staggering of two groups of magnet 13 is identical.
Preferably, the magnet 13 on the clamping plate 12 and drive circuit board 11 mutually staggers the 50% of its length of magnet 13
Set.When 50% placement is staggered in the position of magnet 13 on clamping plate 12 overlays drive circuit board 11 and on two plates, two boards
Active force in horizontal direction is maximum.
Preferably, the route arrangement on the drive circuit board 11 with the corresponding region of clamping plate 12 is in opposite with clamping plate 12 one
Side, to reduce the frictional force between clamping plate 12 and drive circuit board 11, while circuit board can be avoided to wear；The circuit in the region
Turned on by the main line 112 of the cable-through hole that the edges of regions opens up and the opposite side of drive circuit board 11.
Its both sides is set to be alignd with the both sides edge of drive circuit board 11 with hand propelled clamping plate 12 during use, on upper and lower two boards
Via 111,121 will automatic aligning, now APD10 cans to be measured be smoothly assembled among test fixture.Pass through two pieces
APD10 pin 101 is tightly clamped on drive circuit board 11 by the horizontal suction of plate upper magnet 13.Need to change to be measured
During APD10, only clamping plate 12 need to be promoted its both sides is alignd with the both sides edge of drive circuit board 11, you can to take current APD10
Go out, change next APD10 to be measured.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all essences in the present invention
All any modification, equivalent and improvement made within refreshing and principle etc., should be included in the scope of the protection.
Claims (6)
- A kind of 1. clamp for testing electronic device, it is characterised in that：Including the clamping plate and drive circuit board being stacked, the drive The via to match with electronic component pin to be measured is equipped with dynamic circuit board and clamping plate；On the drive circuit board and clamping plate Opposite both sides are provided with magnet, and the inside magnetic induction line direction of the magnet is vertical with the plate face of clamping plate and drive circuit board, and press from both sides Magnet on plate is identical with the polarity arrangement direction of the magnet on drive circuit board；When the via and drive circuit on the clamping plate During via face on plate, the magnet on magnet and drive circuit board on clamping plate is staggeredly arranged, the magnetic force energy between two magnet Clamping plate and drive circuit board is produced the trend mutually sheared, and then make the pin of component to be measured by clamping plate and drive circuit The hole wall of via on plate clamps.
- 2. clamp for testing electronic device according to claim 1, it is characterised in that：The side of the drive circuit board is The side opposite with clamping plate is provided with heat-conducting plate, and the pin of the electronic component to be measured inserts the via from the side, and to be measured The bottom surface of electronic component is brought into close contact with heat-conducting plate, and radiating fin is connected with the heat-conducting plate.
- 3. clamp for testing electronic device according to claim 2, it is characterised in that：The heat-conducting plate and drive circuit board Between be provided with felt pad.
- 4. clamp for testing electronic device according to claim 1, it is characterised in that：On the clamping plate and drive circuit board Provided with two groups of magnet, two groups of magnet are arranged in the pin both sides of electronic component to be measured in yi word pattern, and two groups of magnet staggers Direction is identical.
- 5. clamp for testing electronic device according to claim 1, it is characterised in that：On the clamping plate and drive circuit board Magnet mutually stagger magnet its length 50% set.
- 6. according to the clamp for testing electronic device described in claim 1 to 5 any one, it is characterised in that：The driving electricity Opened on the plate of road with the route arrangement of clamping plate corresponding region in the side opposite with clamping plate, the circuit in the region by the edges of regions If cable-through hole turned on the main line of drive circuit board opposite side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610799056.7A CN107807318A (en) | 2016-08-31 | 2016-08-31 | A kind of clamp for testing electronic device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610799056.7A CN107807318A (en) | 2016-08-31 | 2016-08-31 | A kind of clamp for testing electronic device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107807318A true CN107807318A (en) | 2018-03-16 |
Family
ID=61575866
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610799056.7A Pending CN107807318A (en) | 2016-08-31 | 2016-08-31 | A kind of clamp for testing electronic device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107807318A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110320390A (en) * | 2019-08-08 | 2019-10-11 | 郑州威科特电子科技有限公司 | A kind of pin protection type Test Diode clamping tooling |
| CN110618370A (en) * | 2018-06-04 | 2019-12-27 | 苏州能讯高能半导体有限公司 | Testing device |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1895874A (en) * | 2002-08-07 | 2007-01-17 | 宾夕法尼亚州研究基金会 | System and method for bonding and debonding a workpiece to a manufacturing fixture |
| CN101154877A (en) * | 2006-09-28 | 2008-04-02 | 村田机械株式会社 | Linear motor and machine tool having the same mounted thereon |
| JP2008263065A (en) * | 2007-04-12 | 2008-10-30 | Matsushita Electric Ind Co Ltd | Printed circuit board mounting pad |
| CN201548571U (en) * | 2009-09-09 | 2010-08-11 | 苏州瀚瑞微电子有限公司 | Chip testing fixture |
| CN101877939A (en) * | 2009-04-29 | 2010-11-03 | 元港 | Circuit board stationary fixture |
| CN201792289U (en) * | 2010-09-26 | 2011-04-13 | 飞旭电子(苏州)有限公司 | Tooling clamp for production line assembly hair-clipping device |
| CN102474143A (en) * | 2009-08-12 | 2012-05-23 | 日立汽车系统株式会社 | Dynamo-electric machine for use in vehicles |
| CN203204898U (en) * | 2013-04-19 | 2013-09-18 | 叶少芬 | Circuit teaching board |
| CN104325420A (en) * | 2014-10-11 | 2015-02-04 | 江苏亨通光电股份有限公司 | Fast positioning and disassembling device for testing mechanical performance of optical cable |
| CN206002649U (en) * | 2016-08-31 | 2017-03-08 | 科大国盾量子技术股份有限公司 | A kind of clamp for testing electronic device |
-
2016
- 2016-08-31 CN CN201610799056.7A patent/CN107807318A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1895874A (en) * | 2002-08-07 | 2007-01-17 | 宾夕法尼亚州研究基金会 | System and method for bonding and debonding a workpiece to a manufacturing fixture |
| CN101154877A (en) * | 2006-09-28 | 2008-04-02 | 村田机械株式会社 | Linear motor and machine tool having the same mounted thereon |
| JP2008263065A (en) * | 2007-04-12 | 2008-10-30 | Matsushita Electric Ind Co Ltd | Printed circuit board mounting pad |
| CN101877939A (en) * | 2009-04-29 | 2010-11-03 | 元港 | Circuit board stationary fixture |
| CN102474143A (en) * | 2009-08-12 | 2012-05-23 | 日立汽车系统株式会社 | Dynamo-electric machine for use in vehicles |
| CN201548571U (en) * | 2009-09-09 | 2010-08-11 | 苏州瀚瑞微电子有限公司 | Chip testing fixture |
| CN201792289U (en) * | 2010-09-26 | 2011-04-13 | 飞旭电子(苏州)有限公司 | Tooling clamp for production line assembly hair-clipping device |
| CN203204898U (en) * | 2013-04-19 | 2013-09-18 | 叶少芬 | Circuit teaching board |
| CN104325420A (en) * | 2014-10-11 | 2015-02-04 | 江苏亨通光电股份有限公司 | Fast positioning and disassembling device for testing mechanical performance of optical cable |
| CN206002649U (en) * | 2016-08-31 | 2017-03-08 | 科大国盾量子技术股份有限公司 | A kind of clamp for testing electronic device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110618370A (en) * | 2018-06-04 | 2019-12-27 | 苏州能讯高能半导体有限公司 | Testing device |
| CN110618370B (en) * | 2018-06-04 | 2022-02-01 | 苏州能讯高能半导体有限公司 | Testing device |
| CN110320390A (en) * | 2019-08-08 | 2019-10-11 | 郑州威科特电子科技有限公司 | A kind of pin protection type Test Diode clamping tooling |
| CN110320390B (en) * | 2019-08-08 | 2021-12-10 | 深圳市研测科技有限公司 | Clamping tool for pin protection type diode test |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN201548571U (en) | Chip testing fixture | |
| CN203645321U (en) | A foolproof protection circuit | |
| CN206740922U (en) | A kind of nucleus module test device of stamp hole encapsulation | |
| CN206002649U (en) | A kind of clamp for testing electronic device | |
| CN107807318A (en) | A kind of clamp for testing electronic device | |
| CN110398657A (en) | Measured value needle and measuring mechanism | |
| CN103852707B (en) | A kind of power semiconductor chip test fixture | |
| CN202159074U (en) | Power-on test device for solar cell | |
| CN205355795U (en) | Detect device and IGBT protection circuit of IGBT BUS capacitors electric current | |
| CN105277864B (en) | Experimental rig, test method and the hookup of semiconductor chip | |
| CN207458957U (en) | Cell piece and the test system tested it for imbrication component | |
| CN209199078U (en) | Touch base plate, touch device and display device | |
| CN206300973U (en) | The guide-localization mechanism of Novel square electrokinetic cell production detection | |
| CN204694812U (en) | A kind of paster rectifier bridge diode polarity test frock | |
| CN108470690A (en) | Detector | |
| CN209311632U (en) | A kind of test fixture | |
| CN203092019U (en) | Electric energy meter neck board welding fixture | |
| CN205103137U (en) | Cell detector | |
| CN103630802A (en) | TSV (through silicon via) through hole insulation layer test structure based on SOI (silicon on insulator) substrate | |
| CN210876341U (en) | LED chip testing device | |
| CN205049623U (en) | A test needle bed for circuit board | |
| CN208334054U (en) | Material clamp of tensile machine device | |
| CN208001397U (en) | A kind of integrated circuit board with circuit alarm function | |
| CN206906467U (en) | A kind of Multi-functional test pencil | |
| CN106595455A (en) | Conductive metal product flatness gauge and detection method thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |