CN206649122U - A kind of test device based on PLCC and QFP encapsulation chips - Google Patents
A kind of test device based on PLCC and QFP encapsulation chips Download PDFInfo
- Publication number
- CN206649122U CN206649122U CN201720316454.9U CN201720316454U CN206649122U CN 206649122 U CN206649122 U CN 206649122U CN 201720316454 U CN201720316454 U CN 201720316454U CN 206649122 U CN206649122 U CN 206649122U
- Authority
- CN
- China
- Prior art keywords
- test
- lid
- elastic contact
- standing groove
- chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a kind of test device based on PLCC and QFP encapsulation chips, including：Testboard；Test fixture, it includes base, test lid, shackle member and multiple elastic contact blades, testboard is fixed in Its lower side face, upper side is provided with standing groove, test lid side outer rim is articulated with base, shackle member, which is arranged at test lid opposite side and can coordinated, is connected in base, and multiple elastic contact blades are arranged in the test side surface of lid one and the pin of the encapsulation chip with being positioned in standing groove corresponds setting；And test suite, it is connected with multiple elastic contact blades.On the one hand the utility model sets standing groove, the lower end of encapsulation chip, which can coordinate, is built in standing groove so that encapsulation chip to be fixed, on the other hand covered in test and elastic contact blade is set to coordinate the pin of detection encapsulation chip, it is advantageous to test completion post package chip and is located at standing groove and is easy to take out, the taking-up difficulty of encapsulation chip is reduced, improves the testing efficiency of encapsulation chip.
Description
Technical field
Chip testing technology is the utility model is related to, more particularly, to a kind of test that chip is encapsulated based on PLCC and QFP
Device.
Background technology
, it is necessary to carry out power consumption test, electrical performance indexes test, signal reception interpretation to chip after the completion of chip package
Multiple tests such as test, short circuit current test, pin test.Existing chip testing uses push type fixture more, i.e., by chip
It is positioned in the test trough of clamping, elastic contact blade is set in the side wall of test trough to connect the pin of chip, consequently facilitating test.
But because elastic contact blade has certain elasticity, after chip is pressed into test trough, in the resilient force of elastic contact blade
Under, chip is then not easy, by taking out in test trough, to which reduce the testing efficiency of chip.
Utility model content
The purpose of this utility model is to overcome above-mentioned technical deficiency, proposes a kind of based on PLCC and QFP encapsulation chips
Test device, chip easily card falls within the technology for causing testing efficiency low in test trough and asked when solving chip testing in the prior art
Topic.
To reach above-mentioned technical purpose, the technical solution of the utility model provides a kind of based on PLCC and QFP encapsulation chips
Test device, including：
Testboard；
Test fixture, it includes base, test lid, shackle member and multiple elastic contact blades, the Its lower side face and is fixed on
The testboard, upper side are provided with the standing groove being engaged with encapsulating the lower surface of chip, the test lid side outer rim hinge
It is connected to the base and can turns to above the standing groove, the shackle member is arranged at the test lid opposite side and can
Cooperation is connected in the base, and multiple elastic contact blades are arranged in the test side surface of lid one and with being positioned over the placement
The pin of encapsulation chip in groove, which corresponds, to be set；And
Test suite, it is connected with multiple elastic contact blades.
Preferably, the testboard includes table top, is connected to multiple legs of the table top downside and located at the branch
The slipmat of underfooting end face.
Preferably, the test suite include be fixedly arranged on the leg test cabinet, be built in the test cabinet
Controller, the human-computer interaction module that is connected with the controller, the controller is connected with the elastic contact blade.
Preferably, the shackle member includes being rotationally connected with institute with the bearing pin that is rotatably connected of test lid, middle part
State the latch of bearing pin and be sheathed on the bearing pin and elasticity abuts the torsion spring of the latch, be provided with the side of the base with
The neck that the latch lower end coordinates.
Preferably, the test fixture also includes the elastic component located at the test lid middle part, and it includes and the test
The pressing plate be arrangeding in parallel and multiple springs are covered, each equal one end of spring is connected to the test and covers relatively described elastic contact blade one
Side, the other end are connected with the pressing plate.
Compared with prior art, on the one hand the utility model sets standing groove, encapsulates the lower end of chip and can coordinate and is built in
On the other hand standing groove covers in test so that encapsulation chip to be fixed and sets elastic contact blade to coordinate drawing for detection encapsulation chip
Pin, it is advantageous to test completion post package chip and is located at standing groove and is easy to take out, reduces the taking-up difficulty of encapsulation chip, carry
The high testing efficiency of encapsulation chip.
Brief description of the drawings
Fig. 1 is the attachment structure schematic diagram of the test device of the present utility model based on PLCC and QFP encapsulation chips；
Fig. 2 is the attachment structure schematic diagram of test fixture of the present utility model；
Fig. 3 is Fig. 2 of the present utility model A portions enlarged drawing.
Embodiment
In order that the purpose of this utility model, technical scheme and advantage are more clearly understood, below in conjunction with accompanying drawing and implementation
Example, the utility model is further elaborated.It should be appreciated that specific embodiment described herein is only explaining
The utility model, it is not used to limit the utility model.
Fig. 1~3 are referred to, embodiment of the present utility model provides a kind of test based on PLCC and QFP encapsulation chips
Device, including：
Testboard 1；
Test fixture 2, it includes base 21, tests lid 22, shackle member 23 and multiple elastic contact blades 24, under the base 21
The testboard 1 is fixed in side, upper side is provided with the standing groove 211 being engaged with encapsulating the lower surface of chip 4, the survey
The examination side outer rim of lid 22 is articulated with the base 21 and can turn to the top of standing groove 211, and the shackle member 23 is set
In the test opposite side of lid 22 and it can coordinate and be connected in the base 21, multiple elastic contact blades 24 are arranged in the survey
The pin of the examination side surface of lid 22 1 and the encapsulation chip 4 with being positioned in the standing groove 211, which corresponds, to be set；And
Test suite 3, it is connected with multiple elastic contact blades 24.
During specific test, encapsulation chip 4 lower end can be positioned in standing groove 211, therefore the depth of standing groove 211 should not mistake
Deep, the upper surface that standing groove 211 and base 21 are built in order to place the lower end of encapsulation chip 4 is not abutted on encapsulation chip 4
Pin be preferred, it can be positioned to encapsulation chip 4, while avoided encapsulating chip 4 and its pin and be under pressure deformation；Rotate
Lid 22 is tested, the one-to-one pin for being connected to encapsulation chip 4 of the elastic contact blade 24 tested on lid 22, to ensure good electricity
Property connection, while by shackle member 23 by test lid 22 fix so that encapsulation chip 4 be fixed on base 21 with test lid 22 it
Between, it advantageously ensures that the stability abutted between the pin and elastic contact blade 24 of encapsulation chip 4；Test fixture 2 fixes envelope
After cartridge chip 4, encapsulation chip 4 can be tested by test suite 3, its test mode can use existing routine side
Formula.The present embodiment is corresponded with the pin on encapsulation chip 4 respectively using multiple elastic contact blades 24, consequently facilitating drawing to difference
Pin carries out the test of difference in functionality.After the completion of test, Turnover testing lid 22, encapsulation chip 4 departs from elasticity and touched under gravity
Piece 24 is simultaneously fallen into standing groove 211, because the encapsulation only part of chip 4 is positioned in standing groove 211, therefore is taken out extremely after testing
It is convenient.
Testboard 1 described in the present embodiment includes table top 11, is connected to multiple legs 12 of the downside of table top 11 and sets
Slipmat 13 in the lower surface of leg 12, the present embodiment slipmat 13 use quality of rubber materials, and it is advantageous to improve testboard 1
Stability.
Test suite 3 described in the present embodiment include be fixedly arranged on the leg 12 test cabinet 31, be built in the survey
The controller 32 of test-run a machine case 31, the human-computer interaction module 33 being connected with the controller 32, the controller 32 and the elasticity
Contact 24 connects.Wherein, human-computer interaction module 33 is mainly display screen and keyboard, its can personnel control easy to operation test,
It is easy to observation test result controllers 32 mainly to include master controller and peripheral circuit.During test, main controller controls can be passed through
Peripheral circuit inputs high/low level and receives the high/low electrical property of the test of external signal ability, logic to be packaged chip 4
Index test, short circuit current test, power consumption test etc., above-mentioned test is the conventionally test of this area, therefore the present embodiment is not
It is described in detail.
For the ease of clamping, shackle member 23 described in the present embodiment includes the bearing pin being rotatably connected with the test lid 22
231st, middle part is rotationally connected with the latch 232 of the bearing pin 231 and is sheathed on the bearing pin 231 and the elasticity abutting latch
232 torsion spring 233, the neck 212 coordinated with the lower end of latch 232, specific clamping are provided with the side of the base 21
When, torsion spring 233 produces the elastic force that driving latch 232 lower end pushes against neck 212, latch 232 can be set it is L-shaped, when pressing latch
Neck 212 is exited in its lower end during 232 upper end, can open test lid 22.For the ease of test lid 22 to base 21 rotate when, clamping
Part 23 coordinates clamping with neck 212 automatically, and the setting of the lower end of the present embodiment latch 232 is tapered, when test lid 22 is close to base 21
When, lateral surface of the lower end one side of latch 232 along base 21 slides, until its lower end is slipped into neck 212, which obviates test
Lid 22 presses latch 232 when fixing encapsulation chip 4, and it is advantageous to the convenience for improving operation.
In order to ensure the stability electrically connected between pin of the elastic contact blade 24 with encapsulating chip 4, the elasticity of the present embodiment
Contact 24 unavoidably gives the encapsulation certain elastic force of the pin of chip 4, in order to avoid under the effect of above-mentioned elastic force, encapsulation chip 4 exists
Rotated after having tested with elastic contact blade 24, test fixture 2 described in the present embodiment also includes the bullet located at the middle part of test lid 22
Property part 25, it includes and test lid 22 pressing plate 251 and multiple springs 252 that be arranged in parallel, and each 252 equal one end of spring connects
Be connected to the relatively described side of elastic contact blade 24 of the test lid 22, the other end is connected with the pressing plate 251, after the completion of test,
Test lid 22 is rotated to away from base 21, and elastic component 25 gives encapsulation chip 4 certain elastic force so that encapsulation chip 4 is remote to be surveyed
Lid 22 is tried, is connected in so as to avoid encapsulating chip 4 on elastic contact blade 24.Wherein, pressing plate 251 may be configured as flexible material, so as to
Encapsulation chip 4 is avoided to be damaged under the elastic force of spring 252 because of unbalance stress.
Compared with prior art, the utility model on the one hand set standing groove 211, encapsulation chip 4 lower end can coordinate in
Standing groove 211 is placed in so that encapsulation chip 4 to be fixed, on the other hand elastic contact blade 24 is set on test lid 22 to coordinate detection envelope
The pin of cartridge chip 4, it is advantageous to test and completes post package chip 4 positioned at standing groove 211 and be easy to take out, and reduces encapsulation core
The taking-up difficulty of piece 4, improve the testing efficiency of encapsulation chip 4.
Specific embodiment of the present utility model described above, the restriction to scope of protection of the utility model is not formed.
Any various other corresponding changes and deformation made according to technical concept of the present utility model, should be included in this practicality
In new scope of the claims.
Claims (5)
- A kind of 1. test device based on PLCC and QFP encapsulation chips, it is characterised in that including：Testboard；Test fixture, it includes base, test lid, shackle member and multiple elastic contact blades, the Its lower side face and is fixed on described Testboard, upper side are provided with the standing groove being engaged with encapsulating the lower surface of chip, and test lid side outer rim is articulated with The base can be simultaneously turned to above the standing groove, and the shackle member is arranged at the test lid opposite side and can coordinated The base is connected in, multiple elastic contact blades are arranged in the test side surface of lid one and with being positioned in the standing groove Encapsulation chip pin correspond set；AndTest suite, it is connected with multiple elastic contact blades.
- 2. apparatus for testing chip according to claim 1, it is characterised in that the testboard includes table top, is connected to institute State multiple legs of table top downside and the slipmat located at the leg lower surface.
- 3. apparatus for testing chip according to claim 2, it is characterised in that the test suite includes being fixedly arranged on the branch Test cabinet on pin, the controller for being built in the test cabinet, the human-computer interaction module being connected with the controller, it is described Controller is connected with the elastic contact blade.
- 4. apparatus for testing chip according to claim 3, it is characterised in that the shackle member includes can with the test lid The bearing pin of rotation connection, middle part are rotationally connected with the latch of the bearing pin and are sheathed on the bearing pin and the elasticity abutting card The torsion spring of tooth, the neck coordinated with the latch lower end is provided with the side of the base.
- 5. apparatus for testing chip according to claim 4, it is characterised in that the test fixture also includes being located at the survey The elastic component at examination lid middle part, it includes the pressing plate being be arranged in parallel with the test lid and multiple springs, and each equal one end of spring connects It is connected to the relatively described elastic contact blade side of the test lid, the other end is connected with the pressing plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720316454.9U CN206649122U (en) | 2017-03-29 | 2017-03-29 | A kind of test device based on PLCC and QFP encapsulation chips |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720316454.9U CN206649122U (en) | 2017-03-29 | 2017-03-29 | A kind of test device based on PLCC and QFP encapsulation chips |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206649122U true CN206649122U (en) | 2017-11-17 |
Family
ID=60278563
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720316454.9U Expired - Fee Related CN206649122U (en) | 2017-03-29 | 2017-03-29 | A kind of test device based on PLCC and QFP encapsulation chips |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206649122U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109959856A (en) * | 2017-12-14 | 2019-07-02 | 惠州海格光学技术有限公司 | A kind of PLCC encapsulation chip testing box |
| CN109975678A (en) * | 2017-12-14 | 2019-07-05 | 惠州海格光学技术有限公司 | A kind of PLCC encapsulation chip functions automatic test module |
| CN111830391A (en) * | 2019-04-23 | 2020-10-27 | 中国探针股份有限公司 | Chip pressing device and chip pressing device suite |
| CN114324418A (en) * | 2021-12-29 | 2022-04-12 | 北京京瀚禹电子工程技术有限公司 | Chip fixing device |
-
2017
- 2017-03-29 CN CN201720316454.9U patent/CN206649122U/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109959856A (en) * | 2017-12-14 | 2019-07-02 | 惠州海格光学技术有限公司 | A kind of PLCC encapsulation chip testing box |
| CN109975678A (en) * | 2017-12-14 | 2019-07-05 | 惠州海格光学技术有限公司 | A kind of PLCC encapsulation chip functions automatic test module |
| CN111830391A (en) * | 2019-04-23 | 2020-10-27 | 中国探针股份有限公司 | Chip pressing device and chip pressing device suite |
| CN111830391B (en) * | 2019-04-23 | 2023-05-26 | 台湾中国探针股份有限公司 | Chip pressing device and chip pressing device suite |
| CN114324418A (en) * | 2021-12-29 | 2022-04-12 | 北京京瀚禹电子工程技术有限公司 | Chip fixing device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN206649122U (en) | A kind of test device based on PLCC and QFP encapsulation chips | |
| CN102004337B (en) | Liquid crystal display (LCD) test fixture and test method thereof | |
| CN201548571U (en) | Chip testing fixture | |
| CN204556786U (en) | A kind of modular pcb board measurement jig | |
| CN203054014U (en) | Light emitting diode fixing device | |
| CN209117836U (en) | A kind of motor performance detection device | |
| CN109212315A (en) | A kind of semiconductor crystal wafer convex block resistance testing device | |
| CN208270737U (en) | A kind of testing efficiency is high and accurately lithium battery test device | |
| CN208421158U (en) | A kind of IC test fixture | |
| CN205080202U (en) | Test fixture | |
| CN204789822U (en) | Integrated encapsulation radio frequency device test fixture of surface mounting formula | |
| CN207301268U (en) | Rotary test module | |
| CN206362891U (en) | A kind of semiconductor components and devices test device | |
| CN208937684U (en) | A kind of PCBA board calibration clamp and PCBA board calibrator (-ter) unit | |
| CN206235710U (en) | A kind of intelligent arrangement for testing integrated circuit | |
| CN109709616A (en) | Bluetooth leather sheath keyboard suspend mode magnet test device and test method | |
| CN214795006U (en) | A device that is used for all-in-one test CM product insulation resistance | |
| CN205193190U (en) | Key module test fixture | |
| CN201867470U (en) | Circuit function testing jig of circuit board | |
| CN205484592U (en) | Automatic checkout device is shielded to terminal display | |
| CN205562747U (en) | Automatic IC chip test fixture | |
| CN203101585U (en) | Test device for ZMO (Zinc-Molybdenum Oxide) of sensor chip and ceramic substrate | |
| CN211478378U (en) | Electronic component test fixture | |
| CN108663550B (en) | Clamping jig for conductivity test of fingerprint chip | |
| CN209102862U (en) | A kind of circuit board detecting tooling |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20171117 |