CN206235710U - A kind of intelligent arrangement for testing integrated circuit - Google Patents
A kind of intelligent arrangement for testing integrated circuit Download PDFInfo
- Publication number
- CN206235710U CN206235710U CN201621109808.4U CN201621109808U CN206235710U CN 206235710 U CN206235710 U CN 206235710U CN 201621109808 U CN201621109808 U CN 201621109808U CN 206235710 U CN206235710 U CN 206235710U
- Authority
- CN
- China
- Prior art keywords
- storage tank
- integrated circuit
- boss
- testing integrated
- elastic device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model is related to a kind of intelligent arrangement for testing integrated circuit,Including base plate and cover plate,The side of cover plate is hinged on base plate,The first storage tank is offered on the upper surface of base plate,The bottom surface of the first storage tank is provided with boss,The second storage tank is offered on the lateral surface of boss,The first elastic device is provided with second storage tank,One end of first elastic device is connected with limited post,The end face of limited post is inclined plane,Cover body is provided with above boss,The through hole being adapted with limited post is offered on the side wall of cover body,At least two pieces supporting plates are additionally provided with first storage tank,The second elastic device is provided between the bottom surface of the first storage tank and supporting plate,The top surface of supporting plate is provided with chute,Sliding block is provided with chute,Sliding block and substrate connection,The side of substrate is provided with multiple first metal electrodes,Multiple second metal electrodes are provided with supporting plate.Intelligent arrangement for testing integrated circuit of the present utility model can test Multiple Type IC chip, highly versatile.
Description
Technical field
The utility model is related to a kind of circuit test device, more particularly to a kind of intelligent arrangement for testing integrated circuit.
Background technology
IC chip needs by various tests before dispatching from the factory, the existing device one tested integrated circuit
As a kind of IC chip of model can only be tested, due to different IC chips, its size is not quite similar,
The distance between pin also has difference, therefore is accomplished by changing corresponding integrated when the IC chip for needing test different
Circuit test device, so as to increased the cost of test, reduces the versatility of test device.
In view of above-mentioned defect, the design people is actively subject to research and innovation, to found a kind of intelligence of new structure
Type arrangement for testing integrated circuit.
The content of the invention
In order to solve the above technical problems, the purpose of this utility model is to provide one kind can test Multiple Type integrated circuit
The intelligent arrangement for testing integrated circuit of chip, highly versatile.
Intelligent arrangement for testing integrated circuit of the present utility model, including base plate and cover plate, the side of the cover plate is hinged
On base plate, the first storage tank is offered on the upper surface of the base plate, the bottom surface of first storage tank is provided with boss, institute
State and offered on the lateral surface of boss the second storage tank, the first elastic device, first bullet are provided with second storage tank
One end of property device is connected with boss, and the other end of the first elastic device is connected with limited post, one end projection of the limited post
Go out the lateral surface of boss, and the end face of limited post is inclined plane, and the top of the boss is removably provided with cover body, the cover
Body includes side wall and the roof being arranged on above the wall of side, and the through hole being adapted with the limited post, institute are offered on the side wall
State and at least two pieces supporting plates are additionally provided with the first storage tank, the second bullet is provided between the bottom surface of first storage tank and supporting plate
Property device, one end of second elastic device contacts with the bottom surface with supporting plate, the other end of the second elastic device and first
The bottom surface contact of storage tank, the top surface of the supporting plate is provided with chute, sliding block is provided with the chute, and the sliding block is slidably
Be arranged in chute, the sliding block and substrate connection, the side near cover body of the substrate are provided with multiple and integrated circuit
The first metal electrode that the pin of chip is adapted, is provided with multiple second metal electrodes, second metal in the supporting plate
Electrode is electrically connected with the first metal electrode, and the bottom surface of the cover plate is provided with briquetting, and the briquetting is located at the top of cover body.
Further, intelligent arrangement for testing integrated circuit of the present utility model, the bottom surface of the supporting plate is provided with branch
Post, the bottom surface of first storage tank is provided with multiple the 3rd storage tanks being adapted with the pillar, and the pillar is slidably
Be arranged in the 3rd storage tank, second elastic device is enclosed within the pillar.
Further, intelligent arrangement for testing integrated circuit of the present utility model, first elastic device and the second bullet
Property device is respectively spring.
Further, intelligent arrangement for testing integrated circuit of the present utility model, the top surface of the cover plate is provided with handle.
Further, intelligent arrangement for testing integrated circuit of the present utility model, heating resistor is provided with the boss.
Further, intelligent arrangement for testing integrated circuit of the present utility model, the substrate is provided with locking device.
Further, intelligent arrangement for testing integrated circuit of the present utility model, the number of the supporting plate is four.
By such scheme, the utility model at least has advantages below：Intelligent integrated circuit of the present utility model is surveyed
Trial assembly is put, and is removably disposed on boss by by cover body, so that intelligent arrangement for testing integrated circuit can be tested
With various sizes of IC chip, additionally, by substrate by sliding block it is detachable must set on the supporting plate, when need survey
Operating personnel need to only change corresponding substrate when examination has the IC chip of different pin distances, so as to further increase
The versatility of intelligent arrangement for testing integrated circuit of the present utility model is added.When specifically used, operating personnel are by integrated circuit
Chip is placed on the top of cover body, while the pin of IC chip is contacted with the first metal electrode being arranged on substrate,
Then operating personnel close cover plate, and the briquetting for setting on the cover board produces certain extruding, IC chip to integrated circuit
Certain distance is moved down under the extruding of briquetting and drives its pin to move down, effect of the supporting plate in IC chip
Under also move down a certain distance so that the pin of IC chip closely can connect with the first metal electrode
Touch, the first metal electrode is connected by the second metal electrode with the test main frame of outside, so as to realize to IC chip
Test.When need test different model chip when, the cover body and substrate of the replaceable respective model of operating personnel, by with
On description understand, intelligent arrangement for testing integrated circuit of the present utility model can test Multiple Type IC chip,
Highly versatile.
Described above is only the general introduction of technical solutions of the utility model, in order to better understand skill of the present utility model
Art means, and being practiced according to the content of specification, with preferred embodiment of the present utility model and coordinate accompanying drawing detailed below
Describe in detail bright as after.
Brief description of the drawings
Fig. 1 is the structural representation of the intelligent arrangement for testing integrated circuit of the utility model；
Fig. 2 is the partial enlarged drawing in A portions in Fig. 1.
Specific embodiment
With reference to the accompanying drawings and examples, specific embodiment of the present utility model is described in further detail.Below
Embodiment is used to illustrate the utility model, but is not limited to scope of the present utility model.
Referring to Fig. 1 to Fig. 2, a kind of intelligent arrangement for testing integrated circuit of the preferred embodiment of the utility model one, including
Base plate 1 and cover plate 2, the side of cover plate are hinged on base plate, and the first storage tank 3 is offered on the upper surface of base plate, and first houses
The bottom surface of groove is provided with boss 4, and the second storage tank 5 is offered on the lateral surface of boss, and the first elasticity is provided with the second storage tank
Device 6, one end of the first elastic device is connected with boss, and the other end of the first elastic device is connected with limited post 7, limited post
One end stretches out the lateral surface of boss, and the end face of limited post is inclined plane, and the top of boss is removably provided with cover body 8,
Cover body includes side wall and the roof being arranged on above the wall of side, and the through hole being adapted with limited post is offered on the wall of side, and first houses
At least two pieces supporting plates 9 are additionally provided with groove, the second elastic device 10, second are provided between the bottom surface of the first storage tank and supporting plate
One end of elastic device contacts with the bottom surface with supporting plate, and the other end of the second elastic device connects with the bottom surface of the first storage tank
Touch, the top surface of supporting plate is provided with chute 11, and sliding block 12 is provided with chute, and sliding block is slidably disposed in chute, sliding block with
Substrate 13 is connected, and the side near cover body of substrate is provided with multiple the first metal electricity being adapted with the pin of IC chip
Pole 14, is provided with multiple second metal electrodes 15 in supporting plate, the second metal electrode is electrically connected with the first metal electrode, the bottom of cover plate
Face is provided with briquetting 16, and briquetting is located at the top of cover body.
When specifically used, IC chip is placed on operating personnel the top of cover body, while IC chip
Pin is contacted with the first metal electrode being arranged on substrate, and then operating personnel close cover plate, sets briquetting on the cover board
Certain extruding is produced to integrated circuit, IC chip moves down certain distance under the extruding of briquetting and drives it to draw
Pin is moved down, and supporting plate also moves down a certain distance in the presence of IC chip, so that integrated circuit
The pin of chip can be contacted closely with the first metal electrode, and the first metal electrode is by the second metal electrode and outside survey
Examination main frame connection, so as to realize the test to IC chip.When needing to test the chip of different model, operating personnel can
The cover body and substrate of respective model are changed, changing cover body is, operating personnel's pressing limited post makes its end enter into second
In storage tank, cover body is moved then up up to cover body is unloaded from boss, then cover on boss another cover body, directly
In the through hole entered on faceshield side wall to the end of limited post.Operating personnel can be by original substrate from support when changing substrate
Removed on plate and the sliding block under new supporting plate is arranged in chute, and be moved into precalculated position.
Preferably, intelligent arrangement for testing integrated circuit of the present utility model, the bottom surface of supporting plate is provided with pillar 17,
The bottom surface of the first storage tank is provided with multiple the 3rd storage tanks 18 being adapted with pillar, and pillar is slidably disposed on the 3rd appearance
Put in groove, the second elastic device is enclosed within pillar.
The setting of pillar so that supporting plate can be positioned accurately in the first storage tank, so as to prevent it from occurring laterally
It is mobile.
Preferably, intelligent arrangement for testing integrated circuit of the present utility model, the first elastic device and the second elasticity dress
Put respectively spring.
Preferably, intelligent arrangement for testing integrated circuit of the present utility model, the top surface of cover plate is provided with handle 19.
Preferably, intelligent arrangement for testing integrated circuit of the present utility model, is provided with heating resistor 20 in boss.
The setting of heating resistor enables intelligent arrangement for testing integrated circuit of the present utility model to ic core
Piece does the test of heat resistance.
Preferably, intelligent arrangement for testing integrated circuit of the present utility model, substrate is provided with locking device 21.
Preferably, intelligent arrangement for testing integrated circuit of the present utility model, the number of supporting plate is four.
The above is only preferred embodiment of the present utility model, be not limited to the utility model, it is noted that for
For those skilled in the art, on the premise of the utility model know-why is not departed from, if can also make
Dry to improve and modification, these are improved and modification also should be regarded as protection domain of the present utility model.
Claims (7)
1. a kind of intelligent arrangement for testing integrated circuit, it is characterised in that：Including base plate and cover plate, the side of the cover plate is hinged
On base plate, the first storage tank is offered on the upper surface of the base plate, the bottom surface of first storage tank is provided with boss, institute
State and offered on the lateral surface of boss the second storage tank, the first elastic device, first bullet are provided with second storage tank
One end of property device is connected with boss, and the other end of the first elastic device is connected with limited post, one end projection of the limited post
Go out the lateral surface of boss, and the end face of limited post is inclined plane, and the top of the boss is removably provided with cover body, the cover
Body includes side wall and the roof being arranged on above the wall of side, and the through hole being adapted with the limited post, institute are offered on the side wall
State and at least two pieces supporting plates are additionally provided with the first storage tank, the second bullet is provided between the bottom surface of first storage tank and supporting plate
Property device, one end of second elastic device contacts with the bottom surface with supporting plate, the other end of the second elastic device and first
The bottom surface contact of storage tank, the top surface of the supporting plate is provided with chute, sliding block is provided with the chute, and the sliding block is slidably
Be arranged in chute, the sliding block and substrate connection, the side near cover body of the substrate are provided with multiple and integrated circuit
The first metal electrode that the pin of chip is adapted, is provided with multiple second metal electrodes, second metal in the supporting plate
Electrode is electrically connected with the first metal electrode, and the bottom surface of the cover plate is provided with briquetting, and the briquetting is located at the top of cover body.
2. intelligent arrangement for testing integrated circuit according to claim 1, it is characterised in that：On the bottom surface of the supporting plate
Pillar is provided with, the bottom surface of first storage tank is provided with multiple the 3rd storage tanks being adapted with the pillar, the pillar
It is slidably disposed in the 3rd storage tank, second elastic device is enclosed within the pillar.
3. intelligent arrangement for testing integrated circuit according to claim 2, it is characterised in that：First elastic device and
Second elastic device is respectively spring.
4. intelligent arrangement for testing integrated circuit according to claim 1, it is characterised in that：The top surface of the cover plate is provided with
Handle.
5. intelligent arrangement for testing integrated circuit according to claim 1, it is characterised in that：Heating is provided with the boss
Resistance.
6. intelligent arrangement for testing integrated circuit according to claim 1, it is characterised in that：The substrate is provided with locking
Device.
7. intelligent arrangement for testing integrated circuit according to claim 1, it is characterised in that：The number of the supporting plate is
Four.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621109808.4U CN206235710U (en) | 2016-10-10 | 2016-10-10 | A kind of intelligent arrangement for testing integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621109808.4U CN206235710U (en) | 2016-10-10 | 2016-10-10 | A kind of intelligent arrangement for testing integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206235710U true CN206235710U (en) | 2017-06-09 |
Family
ID=58982113
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621109808.4U Expired - Fee Related CN206235710U (en) | 2016-10-10 | 2016-10-10 | A kind of intelligent arrangement for testing integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206235710U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108459179A (en) * | 2018-03-26 | 2018-08-28 | 长江存储科技有限责任公司 | Apparatus for testing chip |
| CN112154335A (en) * | 2018-05-28 | 2020-12-29 | 三菱电机株式会社 | Electrical characteristic measuring device for semiconductor device |
-
2016
- 2016-10-10 CN CN201621109808.4U patent/CN206235710U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108459179A (en) * | 2018-03-26 | 2018-08-28 | 长江存储科技有限责任公司 | Apparatus for testing chip |
| CN112154335A (en) * | 2018-05-28 | 2020-12-29 | 三菱电机株式会社 | Electrical characteristic measuring device for semiconductor device |
| CN112154335B (en) * | 2018-05-28 | 2023-08-22 | 三菱电机株式会社 | Electrical characteristic measuring device for semiconductor device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170609 Termination date: 20181010 |