CN208421158U - A kind of IC test fixture - Google Patents

A kind of IC test fixture Download PDF

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Publication number
CN208421158U
CN208421158U CN201820590358.8U CN201820590358U CN208421158U CN 208421158 U CN208421158 U CN 208421158U CN 201820590358 U CN201820590358 U CN 201820590358U CN 208421158 U CN208421158 U CN 208421158U
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CN
China
Prior art keywords
plate
cylinder
pcb board
board
test fixture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201820590358.8U
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Chinese (zh)
Inventor
杨飞
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Kai Li Di Technology Co Ltd
Original Assignee
Shenzhen Kai Li Di Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Kai Li Di Technology Co Ltd filed Critical Shenzhen Kai Li Di Technology Co Ltd
Priority to CN201820590358.8U priority Critical patent/CN208421158U/en
Application granted granted Critical
Publication of CN208421158U publication Critical patent/CN208421158U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model is a kind of IC test fixture, its structure includes: pedestal, pcb board, IC fixes device, probe groups and vacuum slot, the base top is connected with support plate, the touch display screen that the support plate is arranged with fore side is detachably connected, the side gusset that the touch display screen is arranged with two sides is detachably connected, bottom plate is connected at the top of the support plate, pcb board is set at the top of the bottom plate, connecting cover plate at the top of the pcb board, the cover board is slidably connected with the fixed device of the IC that top is arranged, the first cylinder is connected at the top of the cover board, first cylinder is connect with the probe fixed plate that bottom is arranged, probe groups are arranged in the probe fixed plate bottom, the second cylinder is connected at the top of the cover board, second cylinder is connect with the suction nozzle fixed plate that bottom is arranged, suction nozzle fixed plate bottom is set Set vacuum slot.A kind of IC test fixture, may be implemented multiple IC and meanwhile carry out detection and discharging, automatic operation reduce cost of labor and improve detection efficiency.

Description

A kind of IC test fixture
Technical field
The utility model relates to electronic component test fixture technical field, specially a kind of IC test fixture.
Background technique
With the fast development of electronic information, IC (integrated circuit component) application is more and more, and application range is also more next Wider: such as computer and relevant device class have north and south bridge IC, video card IC, network interface card IC, printer IC;There is mobile phone again in communication class IC, wireless network card IC, GPS module etc.;In network class, there are also ADSL module, hub IC, router IC etc..For guarantee quality and Reduction is done over again, and the producer of IC finished product application is bought, and judges whether it is non-defective unit that all first can carry out test to these IC before, It is that just mountable be connected on PCB carries out subsequent attachment to non-defective unit.
In the prior art, the test fixture that representative IC test uses is mainly by more probes, test board and a pressure Trigger structure is constituted, and the probe lower end is the welding end connecting with pcb board, and upper end is the probe with telescopic resilience;Test board It is one piece optionally gone out in the pcb board that a batch need to be connect with IC, each pad (pad number on test board in IC connection position Measure it is more, have more than ten it is even several hundred) on correspond the welding end for welding upper each probe, constitute a probe array.When detection, IC to be measured is placed on probe array, make its plant the pin of ball or pad with the probe of each probe is corresponding contacts;Trigger squeeze Structure, which gently acts between IC and test board to be measured, keeps the two relatively close, to make the probe on the pin and test board of IC to be measured The probe reliable contacts of array are electrically connected, and are electrified the reaction for seeing test board output at this time, can smoothly be detected determinand It whether is non-defective unit.Existing IC test fixture can complete test assignment substantially, but find it in actual use still and have and is following Shortcoming: testing efficiency is lower, can only once test an IC, and mostly use manual test, artificial intensity is larger.And one As jig can rarely test the matching problem between IC and pcb board.Therefore, we have proposed a kind of IC tests to control Tool.
Utility model content
The purpose of this utility model is to provide a kind of IC test fixtures, solve the problems, such as proposed in background technique.
To achieve the above object, the utility model provides the following technical solutions: a kind of IC test fixture, structure include: The fixed device of pedestal, pcb board, IC, probe groups and vacuum slot, the base top are connected with support plate, the support plate with The touch display screen of fore side setting is detachably connected, and the side gusset that the touch display screen is arranged with two sides is detachably connected, It is connected with bottom plate at the top of the support plate, pcb board, connecting cover plate at the top of the pcb board, the cover board are set at the top of the bottom plate It is slidably connected with the fixed device of IC of top setting, is connected with the first cylinder, first cylinder and bottom at the top of the cover board The probe fixed plate of setting connects, and probe groups are arranged in the probe fixed plate bottom, is connected with the second cylinder at the top of the cover board, Second cylinder is connect with the suction nozzle fixed plate that bottom is arranged, and vacuum slot is arranged in suction nozzle fixed plate bottom.
As a kind of preferred embodiment of the utility model, the heat sink that the pcb board is arranged with left side detachably connects It connects, the heat dissipation plate surface opens up bar radiating hole, connects the first protective cover, the first protective cover material on the left of the heat sink Matter is elastic material, the second protective cover is connected on the left of first protective cover, second protective cover surface opens up air hole.
As a kind of preferred embodiment of the utility model, connecting rod, the company is arranged in the fixed bottom of device of the IC Truckle is arranged in extension bar bottom, and miniature brake gear is arranged in the truckle.
As a kind of preferred embodiment of the utility model, sliding rail is set at the top of the cover board, the sliding rail is three, Wherein one is total sliding rail, separates two sliding rails from total sliding rail, is separately connected probe groups and vacuum slot.
As a kind of preferred embodiment of the utility model, the pcb board is rectangle.
Compared with prior art, the beneficial effects of the utility model are as follows:
1. novel a kind of IC test fixture is matched by the fixed device of the IC with pulley of setting with the sliding rail on cover board It closes, and the probe groups and vacuum slot of automation, multiple IC may be implemented while carrying out detection and discharging, automatic operation, Reduce cost of labor to improve work efficiency;And setting pcb board can help to exclude the matching problem between IC and pcb board.
Detailed description of the invention
Upon reading the detailed description of non-limiting embodiments with reference to the following drawings, other spies of the utility model Sign, objects and advantages will become more apparent upon:
Fig. 1 is a kind of overall structure diagram of IC test fixture of the utility model;
Fig. 2 is a kind of side view of IC test fixture of the utility model;
Fig. 3 is a kind of top view of IC test fixture of the utility model;
In figure: pedestal -1, support plate -2, touch display screen -3, bottom plate -4, pcb board -5, heat sink -6, the first protective cover - 7, the fixed device -8 of IC, probe groups -9, probe fixed plate -10, the first cylinder -11, vacuum slot -12, suction nozzle fixed plate -13, Second cylinder -14, side gusset -15, air hole -16, sliding rail -17, the second protective cover -18, cover board -19.
Specific embodiment
To be easy to understand the technical means, creative features, achievement of purpose, and effectiveness of the utility model, below In conjunction with specific embodiment, the utility model is further described.
Please refer to Fig. 1-3, the utility model provides a kind of technical solution: a kind of IC test fixture, structure include: pedestal 1, pcb board 5, IC fix device 8, probe groups 9 and vacuum slot 12, are connected with support plate 2, the support at the top of the pedestal 1 The touch display screen 3 that plate 2 is arranged with fore side is detachably connected, and the side gusset 15 of the touch display screen 3 and two sides setting can Dismantling connection is connected with bottom plate 4 at the top of the support plate 2, pcb board 5 is arranged at the top of the bottom plate 4, connects at the top of the pcb board 5 Connects cover plate 19, the cover board 19 are slidably connected with the fixed device 8 of the IC that top is arranged, and are connected with the first gas at the top of the cover board 19 Cylinder 11, first cylinder 11 are connect with the probe fixed plate 10 that bottom is arranged, and probe is arranged in 10 bottom of probe fixed plate 9 are organized, the second cylinder 14 is connected at the top of the cover board 19, second cylinder 14 and the suction nozzle fixed plate 13 of bottom setting connect It connects, vacuum slot 12 is arranged in 13 bottom of suction nozzle fixed plate.
Referring to Fig. 1, the heat sink 6 that the pcb board 5 is arranged with left side is detachably connected, 6 surface of heat sink is opened up Bar radiating hole connects the first protective cover 7 on the left of the heat sink 6, and 7 material of the first protective cover is elastic material, described The second protective cover 18 is connected on the left of first protective cover 7,18 surface of the second protective cover opens up air hole 16, plays protection PCB The effect of plate.
Referring to Fig. 1, connecting rod is arranged in fixed 8 bottom of device the IC, truckle is arranged in the connecting rod bottom, described Miniature brake gear is arranged in truckle, realizes the movement and fixation of the fixed device 8 of IC.
Fig. 3 Fig. 3 is please referred to, sliding rail 17 is set at the top of the cover board 19, the sliding rail 17 is three, wherein one is total sliding Rail separates two sliding rails from total sliding rail, is separately connected probe groups 9 and vacuum slot 12, and the movement for the fixed device 8 of IC provides rail Road.
Referring to Fig. 1, the pcb board 5 is rectangle, and convenient for heat dissipation, in case performance is affected.
A kind of IC test fixture described in the utility model, connects power supply for device first, will then need IC to be tested It is mounted in the fixed device 8 of IC, multiple installation sites are arranged in the fixed device 8 of IC, and mountable multiple groups IC passes through touch display screen 3 The tracks for controlling the fixed device 8 of IC, when the fixed device 8 of IC moves to probe groups 9, the first cylinder 11 drives probe groups 9 Close to the fixed device 8 of IC, the performance of IC is detected, after being verified, the fixed device 8 of IC is controlled by touch display screen 3 and is run To vacuum slot 12, the second cylinder 14 drives vacuum slot 12 close to the fixed device 8 of IC, completes discharging, while this jig is set The pcb board 5 set can help to exclude the matching problem between IC and pcb board, and on pcb board side, the heat sink 6, first of setting is protected Cover 7 and the second protective cover 18 can help to radiate, to guarantee the accuracy of test.
The utility model, pedestal -1, support plate -2, touch display screen -3, bottom plate -4, pcb board -5, heat sink -6, The fixed device -8 of one protective cover -7, IC, probe groups -9, probe fixed plate -10, the first cylinder -11, vacuum slot -12, suction nozzle are solid Fixed board -13, the second cylinder -14, side gusset -15, air hole -16, sliding rail -17, the second protective cover -18, -19 component of cover board are Universal standard part or component as known to those skilled in the art, structure and principle are all that this technology personnel can be by technology hand Volume learns or knows by routine experiment method that the utility model may be implemented multiple IC while carry out detection and discharging, automatically Changing operation reduces cost of labor and improves detection efficiency.
The basic principles and main features of the present invention and the advantages of the present invention have been shown and described above, for For those skilled in the art, it is clear that the present invention is not limited to the details of the above exemplary embodiments, and without departing substantially from this In the case where the spirit or essential attributes of utility model, the utility model can be realized in other specific forms.Therefore, no matter From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the utility model is by institute Attached claim rather than above description limit, it is intended that will fall within the meaning and scope of the equivalent elements of the claims All changes are embraced therein.It should not treat any reference in the claims as limiting related right It is required that.
In addition, it should be understood that although this specification is described in terms of embodiments, but not each embodiment is only wrapped Containing an independent technical solution, this description of the specification is merely for the sake of clarity, and those skilled in the art should It considers the specification as a whole, the technical solutions in the various embodiments may also be suitably combined, forms those skilled in the art The other embodiments being understood that.

Claims (5)

1. a kind of IC test fixture, structure includes: pedestal (1), pcb board (5), IC fixed device (8), probe groups (9) and very Suction mouth (12), it is characterised in that: be connected with support plate (2) at the top of the pedestal (1), the support plate (2) sets with fore side The touch display screen (3) set is detachably connected, and the side gusset (15) that the touch display screen (3) is arranged with two sides detachably connects It connects, is connected with bottom plate (4) at the top of the support plate (2), pcb board (5) are set at the top of the bottom plate (4), pcb board (5) top Portion's connecting cover plate (19), the IC fixed device (8) that the cover board (19) is arranged with top is slidably connected, at the top of the cover board (19) It is connected with the first cylinder (11), first cylinder (11) connect with the probe fixed plate (10) that bottom is arranged, and the probe is solid Probe groups (9) are arranged in fixed board (10) bottom, are connected with the second cylinder (14) at the top of the cover board (19), second cylinder (14) It is connect with the suction nozzle fixed plate (13) of bottom setting, vacuum slot (12) are arranged in suction nozzle fixed plate (13) bottom.
2. a kind of IC test fixture according to claim 1, it is characterised in that: the pcb board (5) dissipates with left side setting Hot plate (6) is detachably connected, and heat sink (6) surface opens up bar radiating hole, and connection first is protected on the left of the heat sink (6) Shield (7), the first protective cover (7) material are elastic material, connect the second protective cover on the left of first protective cover (7) (18), the second protective cover (18) surface opens up air hole (16).
3. a kind of IC test fixture according to claim 1, it is characterised in that: fixed device (8) the bottom setting of the IC Truckle is arranged in connecting rod, the connecting rod bottom, and miniature brake gear is arranged in the truckle.
4. a kind of IC test fixture according to claim 1, it is characterised in that: sliding rail is arranged at the top of the cover board (19) (17), the sliding rail (17) is three, wherein one is total sliding rail, separates two sliding rails from total sliding rail, is separately connected probe groups (9) with vacuum slot (12).
5. a kind of IC test fixture according to claim 1, it is characterised in that: the pcb board (5) is rectangle.
CN201820590358.8U 2018-04-24 2018-04-24 A kind of IC test fixture Expired - Fee Related CN208421158U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201820590358.8U CN208421158U (en) 2018-04-24 2018-04-24 A kind of IC test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201820590358.8U CN208421158U (en) 2018-04-24 2018-04-24 A kind of IC test fixture

Publications (1)

Publication Number Publication Date
CN208421158U true CN208421158U (en) 2019-01-22

Family

ID=65117004

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201820590358.8U Expired - Fee Related CN208421158U (en) 2018-04-24 2018-04-24 A kind of IC test fixture

Country Status (1)

Country Link
CN (1) CN208421158U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110189669A (en) * 2019-06-12 2019-08-30 深圳市华星光电半导体显示技术有限公司 A kind of lighting test jig and test method
CN110308383A (en) * 2019-06-25 2019-10-08 东莞阿尔泰显示技术有限公司 A kind of test fixture of LED display circuit plate
CN110940912A (en) * 2019-12-25 2020-03-31 苏州市科林源电子有限公司 Tester for IC carrier plate after ball mounting

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110189669A (en) * 2019-06-12 2019-08-30 深圳市华星光电半导体显示技术有限公司 A kind of lighting test jig and test method
CN110308383A (en) * 2019-06-25 2019-10-08 东莞阿尔泰显示技术有限公司 A kind of test fixture of LED display circuit plate
CN110940912A (en) * 2019-12-25 2020-03-31 苏州市科林源电子有限公司 Tester for IC carrier plate after ball mounting

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GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20190122

Termination date: 20210424

CF01 Termination of patent right due to non-payment of annual fee