CN204101684U - Apparatus for testing chip - Google Patents
Apparatus for testing chip Download PDFInfo
- Publication number
- CN204101684U CN204101684U CN201420498136.5U CN201420498136U CN204101684U CN 204101684 U CN204101684 U CN 204101684U CN 201420498136 U CN201420498136 U CN 201420498136U CN 204101684 U CN204101684 U CN 204101684U
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- circuit board
- probe
- chip
- holder
- support member
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Abstract
A kind of apparatus for testing chip comprises a pedestal, one circuit board, one holder, some electric-conductors and at least one location-plate, pedestal comprises a support member and is pivotally connected to some cover plates of support member, circuit board to be arranged on support member and pad area upward, holder is arranged on circuit boards, the top of holder is provided with a locating slot, run through in locating slot offer some just to the clamping hole of the pad area of circuit board, electric-conductor is contained in clamping hole respectively, location-plate to be contained in locating slot and to offer the collecting mouth of some collecting chips, the two ends of each electric-conductor are respectively used to the electrical connection pin of chip and the pad area of circuit board, each cover plate is provided with some just to accommodating mouth accordingly for supporting the briquetting of chip towards circuit board, circuit board is held between holder and support member, location-plate is held between cover plate and holder, electric-conductor is electrically connected the pin of the chip pad area corresponding with circuit board, facilitate test chip.
Description
Technical field
The utility model relates to a kind of apparatus for testing chip.
Background technology
During test memory chip (industry also claims memory grain), after usually first memory chip being welded in memory circuit board, then test in the slot of this memory circuit board insertion motherboard.After test terminates, need melt scolding tin could remove memory chip from memory circuit board, very inconvenient.
Utility model content
In view of above content, be necessary to provide a kind of apparatus for testing chip easy to use.
A kind of apparatus for testing chip, for test chip, this apparatus for testing chip comprises a pedestal, one circuit board, one holder, some electric-conductors and at least one location-plate, this pedestal comprises a support member and is pivotally connected to some cover plates of this support member, this circuit board to be arranged on this support member and pad area upward, this holder is arranged on the board, the top of this holder is provided with at least one locating slot, run through in this locating slot and offer some difference just to the clamping hole of the pad area of circuit board, these electric-conductors are contained in these clamping holes respectively, this location-plate to be contained in locating slot and to offer the collecting mouth of some collecting chips, the two ends of each electric-conductor are respectively used to be electrically connected the pin of chip and pad area corresponding to circuit board, these cover plates can be fastened on this holder, each cover plate is provided with some just to accommodating mouth accordingly for supporting the briquetting of chip towards circuit board.
Preferably, this holder is provided with some register pins, and the pilot hole of some these register pins of collecting established by this location-plate, and each register pin is by being made by the material of magnet adsorption, and the top of each pilot hole is provided with one for adsorbing the magnet piece of this register pin.
Preferably, the end face of this support member offers the accepting groove of this circuit board of collecting, and the two ends of this circuit board are respectively equipped with a fixing mouth, and this support member is respectively equipped with one and is fastened in spacer in corresponding fixing mouth in the two ends of this accepting groove.
Preferably, this support member is provided with some reference columns, and this holder offers some through holes for accommodating these reference columns.
Preferably, the side of this circuit board is respectively equipped with some golden fingers that can be plugged in a slot of a testing host in end face and bottom surface, a positioning port is offered respectively in this golden finger place contiguous in the two ends of this circuit board, and the two ends of this slot are respectively equipped with one and are removably fastened in buckle in corresponding positioning port.
Preferably, this support member is also provided with some contiguous blocks being removably fixed on this support member side, these cover plates are rotationally connected with these contiguous blocks respectively, are provided with an elastic component forcing this cover plate to rotate away from this support member between each cover plate and corresponding contiguous block.
Preferably, this holder is provided with some Access Divisions, and each cover plate is provided with the buckle that is removably fastened in corresponding Access Division.
Preferably, each electric-conductor comprises one and is contained in mounting blocks in corresponding clamping hole and some probes being located at this mounting blocks, and each probe comprises the first probe of the pin of a contact chip, the second probe of the pad of a contact circuit plate and the elastic component that is arranged between the first probe and the second probe.
Preferably, each mounting blocks offers some mounting holes, first probe of each probe is contained in the top of corresponding mounting hole, second probe of this probe is contained in the bottom of this mounting hole, the bottom of the first probe of each probe is provided with one first sleeve, the top of the second probe of this probe is provided with one second sleeve, and this elastic component is contained in the second sleeve, and the second sleeve is sheathed in the first sleeve slidably.
Preferably, this location-plate is provided with the chamfering of inclination in the end face surrounding of each collecting mouth.
Compare prior art, circuit board is held on and is held between cover plate and holder between holder and support member and by location-plate by the utility model apparatus for testing chip, location-plate is provided with the collecting mouth of collecting chip, each electric-conductor is electrically connected the pin of the corresponding chip pad corresponding with circuit board, can carry out chip testing easily.
Accompanying drawing explanation
In conjunction with embodiment, the utility model will be further described with reference to the accompanying drawings.
Fig. 1 is the three-dimensional exploded view of the better embodiment of the utility model apparatus for testing chip, and this apparatus for testing chip comprises two keepers.
Fig. 2 is the opposite direction view of Fig. 1.
Fig. 3 is the three-dimensional exploded view of the wherein positioning piece of Fig. 1.
Fig. 4-5 is the assembly drawing of the utility model apparatus for testing chip.
Fig. 6 is the cut-open view along VI-VI line in Fig. 5.
Fig. 7 is the enlarged drawing of VII part in Fig. 6.
Fig. 8 is the using state figure of the utility model apparatus for testing chip.
Main element symbol description
Apparatus for testing chip 100
Pedestal 20
Support member 21
Back up pad 211
Extension board 213
Reference column 215
Accepting groove 216
Spacer 217
Screw 218
Hole clipping 219
Flip-open cover mechanism 23
Contiguous block 231
Cover plate 233
Elastic component 235
Briquetting 237
Buckle 236
Circuit board 30
Plug Division 31
Pad area 33
Pad 331
Fix mouth 35
Positioning port 36
Holder 50
Holding piece 51
Register pin 53
Locating slot 512
Bonding pad 513
Counter sink 515
Through hole 516
Access Division 517
Breach 518
Electric-conductor 60
Mounting blocks 61
Probe 63
Mounting hole 612
First probe 631
Second probe 633
Elastic component 635
Keeper 70
Location-plate 71
Magnet piece 73
Pilot hole 713
Macropore 715
Aperture 716
Supporting surface 717
Chamfering 718
Chip 400
Pin 401
Testing host 300
Slot 301
Buckle 302
Following embodiment will further illustrate the utility model in conjunction with above-mentioned accompanying drawing.
Embodiment
Refer to Fig. 1 and Fig. 2, the better embodiment of the utility model apparatus for testing chip 100 is used for shown in detection chip 400(Fig. 4), this apparatus for testing chip 100 comprises pedestal 20, circuit board 30, holder 50, some electric-conductors 60 and two keepers 70.In present embodiment, chip 400 is memory bar chip.The bottom of each chip 400 is provided with shown in some pin 401(Fig. 8).
This pedestal 20 comprises a support member 21 and some flip-open cover mechanisms 23.This support member 21 is generally in bar shape, and it comprises a rectangular back up pad 211, middle part on front side of this back up pad 211 extends forward an extension board 213 and some reference columns 215.This back up pad 211 offers an accepting groove 216 with the end face of the intersection of this extension board 213.This accepting groove 216 extends to the surrounding of this extension board 213, and the two ends of this accepting groove 216 extend to the relative two ends of this back up pad 211 contiguous, thus makes two ends shape one spacer 217 respectively on front side of this back up pad 211.The rear side of this back up pad 211 end face offers some screws 218 and some hole clippings 219 along its length.The bottom of these reference columns 215 is fastened in the hole clipping 219 of this back up pad 211 correspondence.These flip-open cover mechanisms 23 are positioned at the rear side of this back up pad 211, and are arranged side by side along the length direction of this back up pad 211.Each flip-open cover mechanism 23 comprises cover plate 233 and that a contiguous block 231, being fixed on the trailing flank of this back up pad 211 by screw is articulated in this contiguous block 231 top and to be located between this contiguous block 231 and this cover plate 233 and to force the elastic component 235 that this cover plate 233 rotates away from this back up pad 211.Each cover plate 233 is provided with two flexible briquettings 237 towards the side of this back up pad 211 away from one end of the contiguous block 231 of correspondence.Each cover plate 233 is provided with a flexible buckle 236 in one end of the contiguous block 231 away from correspondence.In other enforcement formulas, also can save contiguous block 231, cover plate 233 directly can be rotationally connected with the trailing flank of back up pad 211.
In present embodiment, this circuit board 30 is a memory bar circuit board, the side of this circuit board 30 forms a Plug Division 31, the end face of Plug Division 31 and bottom surface are respectively equipped with row's golden finger, the middle part of this circuit board 30 end face is provided with some pad areas 33 that can be connected to these chips 400 along its length, form some pads 331 in each pad area 33, fixing mouth 35 and a positioning port 36 is offered at the two ends that this circuit board 30 is relative respectively.Fixing mouth 35 this golden finger more contiguous that the positioning port 36 often held of this circuit board 30 is more corresponding.
This holder 50 comprises rectangular holding piece 51 and some register pins 53.Two locating slots 512 are offered along its length direction in the two ends of this holding piece 51 upper surface middle part.Each locating slot 512 extends the end face of this holding piece 51 away from one end of another locating slot 512.This holding piece 51 is provided with the bonding pad 513 of some pad areas 33 of corresponding circuits plate 30 respectively in the bottom surface of each locating slot 512.These bonding pads 513 are arranged side by side along the length direction of this holding piece 51, and each bonding pad 513 is corresponding with corresponding pad area 33.Each bonding pad 513 is a clamping hole being opened in this locating slot 512 bottom surface.The rear side of this holding piece 51 upper surface offers some counter sinks 515 and some through holes 516 along its length.The two ends of each locating slot 512 bottom surface back are provided with two register pins 53.The front side of this holding piece 51 offers some Access Divisions 517 along its length.Two ends on front side of this holding piece 51 are respectively equipped with a breach 518.Each register pin 53 is by being made by the material of magnet adsorption.In present embodiment, each register pin 53 is fabricated from iron.
Refer to Fig. 7, these electric-conductors 60 can be fastened in the clamping hole of the bonding pad 513 of this holder 50 correspondence, and each electric-conductor 60 comprises the mounting blocks 61 be made up of insulating material and is located at this mounting blocks 61 and the some probes 63 corresponding with the pad 331 of a wherein pad area 33 of this circuit board 30.Each mounting blocks 61 offers some mounting holes 612 for installing these probes 63.Each probe 63 comprises the second probe 633 and elastic component 635 forcing this first probe 631 and the second probe 633 to reset between this first probe 631 and second probe 633 that this mounting hole 612 bottom is located at slidably by first probe 631, being located at corresponding mounting hole 612 top slidably.The bottom of the first probe 631 of each probe 63 is provided with one first sleeve, the top of the second probe 633 of this probe 63 is provided with one second sleeve, this elastic component 635 is contained in the second sleeve, and the second sleeve of the second probe 633 of this probe 63 is sheathed in the first sleeve of the first probe 631 slidably.First probe 631 of each probe 63 and the second probe 633 surface gold-plating are to improve the electric conductivity of this probe 63.
In other embodiments, each probe 63 can be one and has elasticity and the conducting rod at corresponding mounting hole 612 two ends is slightly extended at two ends.
Refer to Fig. 3, every positioning piece 70 comprises rectangular location-plate 71 and two columniform magnet pieces 73.The front side of this location-plate 71 end face offers some collecting mouths 712 for accommodating chip 400 along its length.The large I of these collecting mouths 712 is offered according to the shape of chip 400.Two pilot holes 713 are offered at the two ends of the rear side of this location-plate 71 end face.Each pilot hole 713 is stepped, and it comprises the aperture 716 that a superposed macropore 715 and is positioned at bottom.The supporting surface 717 of an annular is formed between the macropore 715 of each pilot hole 713 and aperture 716.This location-plate 71 is provided with the chamfering 718 of an inclination in the end face surrounding of each collecting mouth 712.
Refer to Fig. 1 to Fig. 4, when assembling this apparatus for testing chip 100, magnet piece 73 is fastened in the macropore 715 of the pilot hole 713 of keeper 70, each magnet piece 73 is supported on corresponding supporting surface 717.The bottom surface of circuit board 30 is contained in the accepting groove 216 of this pedestal 20, makes two spacers 217 of this support member 21 be fastened in two of this circuit board 30 and fix in mouth 35.Now, the pad area 33 of this circuit board 30 upward.Each electric-conductor 60 is fastened in the clamping hole of the bonding pad 513 of this holder 50 correspondence, make the first probe 631 of each probe 63 of this electric-conductor 60 extend the bottom surface of corresponding locating slot 512, and the second probe 633 of this probe 63 extend the bottom surface of this holding piece 51.Be covered in this back up pad 211 by this holder 50, two reference column 215 tops in this back up pad 211 are inserted in corresponding through hole 516, and counter sink 515 is just to the screw 218 of this support member 21, and these electric-conductors 60 are just to the pad area 33 on this circuit board 30.Some screw (not shown) are bolted in corresponding screw 218 through the counter sink 515 of this holder 50, and these screws are contained in counter sink 515.Now, this circuit board 30 is held between this back up pad 211 and this holder 50, second probe 633 of each electric-conductor 60 is resisted against corresponding pad 331, the leading flank of this extension board 213 and holding piece 51 is extended in the Plug Division 31 of this circuit board 30, and two positioning ports 36 of this circuit board 30 are positioned at immediately below two breach 518 of this holder 50.Every positioning piece 70 is contained in the locating slot 512 of this holder 50 correspondence, two register pins 53 in this locating slot 512 are inserted in the aperture 716 of two pilot holes 713 of this keeper 70.Now, the magnet piece 73 of every positioning piece 70 is adsorbed in corresponding register pin 53 and departs from this holder 50 to prevent this keeper 70, and the collecting mouth 712 of this keeper 70 is just to corresponding electric-conductor 60, has namely assembled.
See also Fig. 4 to Fig. 8, during test, some chips 400 are placed on the collecting mouth 712 of keeper 70, each chip 400 is slipped in collecting mouth 712 along the chamfering 718 of correspondence.Now, the pin 401 of each chip 400 is just to the first probe 631 of corresponding electric-conductor 60.Rotate each cover plate 233 towards this holder 50, make corresponding elastic component 235 that elastic deformation occur, be fastened in the Access Division 517 of this holder 50 correspondence to the buckle 236 on this cover plate 233.Now, briquetting 237 on each cover plate 233 to insert in corresponding collecting mouth 712 and flexibly supports corresponding chip 400, the pin 401 of this chip 400 is made to support the first probe 631 of corresponding electric-conductor 60 towards circuit board 30, and make elastic component 635 elastic deformation and to make on the second probe 633 close contact circuit board 30 corresponding pad 331, thus the electric connection of the pin 401 realizing chip 400 pad 331 corresponding with circuit board 30.Again the Plug Division 31 of this circuit board 30 is plugged in a slot 301 of a testing host 300, and can tests in the positioning port 36 making two buckles 302 at these slot 301 two ends snap in this circuit board 30.
After test completes, the cover plate 233 operating each flip-open cover mechanism 23 makes buckle 236 elastic deformation of this cover plate 233 and departs from corresponding Access Division 517, the elastic component 235 of this flip-open cover mechanism 23 recovers elastic deformation and makes this cover plate 233 towards rotating away from holder 50, the briquetting 237 of this cover plate 233 departs from corresponding collecting mouth 712, can conveniently take out chip 400.
This apparatus for testing chip 100 also test pin 401 can be welded with the chip 400 of tin ball.
The utility model apparatus for testing chip 100 clamps this circuit board 30 by holder 50 and support member 21, and by the probe 63 of electric-conductor 60, the pin 401 of chip 400 pad 331 corresponding with circuit board 30 is electrically connected, namely test in the slot 301 again Plug Division 31 of this circuit board 30 being plugged in testing host 300, facilitate chip testing.
Claims (10)
1. an apparatus for testing chip, for test chip, it is characterized in that: this apparatus for testing chip comprises a pedestal, one circuit board, one holder, some electric-conductors and at least one location-plate, this pedestal comprises a support member and is pivotally connected to some cover plates of this support member, this circuit board to be arranged on this support member and pad area upward, this holder is arranged on the board, the top of this holder is provided with at least one locating slot, run through in this locating slot and offer some difference just to the clamping hole of the pad area of circuit board, these electric-conductors are contained in these clamping holes respectively, this location-plate to be contained in locating slot and to offer the collecting mouth of some collecting chips, the two ends of each electric-conductor are respectively used to be electrically connected the pin of chip and pad area corresponding to circuit board, these cover plates can be fastened on this holder, each cover plate is provided with some just to accommodating mouth accordingly for supporting the briquetting of chip towards circuit board.
2. apparatus for testing chip as claimed in claim 1, it is characterized in that: this holder is provided with some register pins, the pilot hole of some these register pins of collecting established by this location-plate, each register pin is by being made by the material of magnet adsorption, and the top of each pilot hole is provided with one for adsorbing the magnet piece of this register pin.
3. apparatus for testing chip as claimed in claim 1, it is characterized in that: the end face of this support member offers the accepting groove of this circuit board of collecting, the two ends of this circuit board are respectively equipped with a fixing mouth, and this support member is respectively equipped with one and is fastened in spacer in corresponding fixing mouth in the two ends of this accepting groove.
4. apparatus for testing chip as claimed in claim 1, it is characterized in that: this support member is provided with some reference columns, this holder offers some through holes for accommodating these reference columns.
5. apparatus for testing chip as claimed in claim 1, it is characterized in that: the side of this circuit board is respectively equipped with some golden fingers that can be plugged in a slot of a testing host in end face and bottom surface, a positioning port is offered respectively in this golden finger place contiguous in the two ends of this circuit board, and the two ends of this slot are respectively equipped with one and are removably fastened in buckle in corresponding positioning port.
6. apparatus for testing chip as claimed in claim 1, it is characterized in that: this support member is also provided with some contiguous blocks being removably fixed on this support member side, these cover plates are rotationally connected with these contiguous blocks respectively, are provided with an elastic component forcing this cover plate to rotate away from this support member between each cover plate and corresponding contiguous block.
7. apparatus for testing chip as claimed in claim 1, is characterized in that: this holder is provided with some Access Divisions, and each cover plate is provided with the buckle that is removably fastened in corresponding Access Division.
8. apparatus for testing chip as claimed in claim 1, it is characterized in that: each electric-conductor comprises one and is contained in mounting blocks in corresponding clamping hole and some probes being located at this mounting blocks, each probe comprises the first probe of the pin of a contact chip, the second probe of the pad of a contact circuit plate and the elastic component that is arranged between the first probe and the second probe.
9. apparatus for testing chip as claimed in claim 8, it is characterized in that: each mounting blocks offers some mounting holes, first probe of each probe is contained in the top of corresponding mounting hole, second probe of this probe is contained in the bottom of this mounting hole, the bottom of the first probe of each probe is provided with one first sleeve, the top of the second probe of this probe is provided with one second sleeve, and this elastic component is contained in the second sleeve, and the second sleeve is sheathed in the first sleeve slidably.
10. apparatus for testing chip as claimed in claim 1, is characterized in that: this location-plate is provided with the chamfering of inclination in the end face surrounding of each collecting mouth.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420498136.5U CN204101684U (en) | 2014-08-29 | 2014-08-29 | Apparatus for testing chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420498136.5U CN204101684U (en) | 2014-08-29 | 2014-08-29 | Apparatus for testing chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204101684U true CN204101684U (en) | 2015-01-14 |
Family
ID=52270101
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420498136.5U Active CN204101684U (en) | 2014-08-29 | 2014-08-29 | Apparatus for testing chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204101684U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108459179A (en) * | 2018-03-26 | 2018-08-28 | 长江存储科技有限责任公司 | Apparatus for testing chip |
| CN109920470A (en) * | 2019-03-20 | 2019-06-21 | 深圳市东方聚成科技有限公司 | A kind of non-destructive testing device and detection method for RAM card |
| EP4170357A1 (en) * | 2021-10-22 | 2023-04-26 | G. Skill International Enterprise Co., Ltd. | Chip test carrier |
-
2014
- 2014-08-29 CN CN201420498136.5U patent/CN204101684U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108459179A (en) * | 2018-03-26 | 2018-08-28 | 长江存储科技有限责任公司 | Apparatus for testing chip |
| CN109920470A (en) * | 2019-03-20 | 2019-06-21 | 深圳市东方聚成科技有限公司 | A kind of non-destructive testing device and detection method for RAM card |
| CN109920470B (en) * | 2019-03-20 | 2024-05-14 | 深圳市东方聚成科技有限公司 | Nondestructive testing device and method for memory card |
| EP4170357A1 (en) * | 2021-10-22 | 2023-04-26 | G. Skill International Enterprise Co., Ltd. | Chip test carrier |
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| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |