CN205067627U - Probe testing apparatus - Google Patents

Abstract

The utility model provides a probe testing apparatus, its includes with probe connector's test wire, its characterized in that of still includes the faller and is located the support plate of faller top install probe module on the faller, product holding recess has been seted up above the support plate, probe module passes the support plate is located in the product holding recess. The utility model discloses a positioning test that carries on to miniaturized product through organic combination of faller and support plate, test wire, can be realized to the probe testing component. Its simple structure is compact, and the test is convenient, is fit for the test of all kinds of miniaturized electronic products.

Description

A probe testing device

technical field

The utility model relates to the field of automatic testing, in particular to the field of testing through probes.

Background technique

With the miniaturization of electronic products, the connectors used in electronic products are becoming smaller and smaller. It is difficult to locate the product during the testing process. A slight movement of the product will lead to inaccurate testing. Therefore, how to perform performance testing on small-sized products is a difficult problem to solve.

Contents of the invention

The technical problem to be solved by the utility model is to provide a probe testing device, which can conveniently locate and detect products.

In order to solve the above technical problems, the technical solution provided by the utility model is a probe testing device, which includes a test line connected to the probe, and is characterized in that it also includes a needle board and a carrier board located above the needle board. A probe module is installed on the needle plate; a product accommodating groove is opened on the carrier plate, and the probe module passes through the carrier plate and is located in the product accommodating groove.

A vacuum chamber is opened in the carrier plate, and several vacuum suction holes communicated with the vacuum chamber are opened in the product accommodating groove.

The carrier plate is fixed on the needle plate by screws, and springs are sheathed on the screws between the carrier plate and the needle plate.

It also includes an installation base plate, on which a test line adapter plate is installed, and the needle plate is installed on the test line adapter plate; the lower end of the probe module extends downward to connect with the test line The contact points connected to the test wires on the adapter board are in contact with each other.

The probe testing device of the utility model places the product in the product accommodating groove of the carrier board, positions it front, back, left, and right, and then sucks the product through the vacuum suction hole for further positioning up and down, so that the product and the probe are kept Test contact. A spring is arranged between the carrier plate and the needle plate, which can adjust the distance that the probe protrudes from the product accommodating groove, which is convenient for testing and protects the probe. The utility model has the advantages of simple and compact structure and convenient positioning, and is especially suitable for performance testing of miniaturized products.

Description of drawings

Fig. 1, the structural representation of the utility model.

Fig. 2 is a schematic exploded view of the structure of the utility model.

detailed description

Aiming at the above-mentioned technical solution, a preferred embodiment is given and described in detail with reference to the drawings. The probe testing device of the present utility model mainly includes a test line adapter plate, a needle, and a carrier plate, as shown in Fig. 1 to Fig. 2 .

The test line 1 is connected to the test line adapter board 2. The test line adapter board is installed on the installation base plate 3 . A pin plate 4 is installed on the test line adapter plate. Contact points for connecting test lines are arranged on the test line adapter plate. Several vertical tiny probe modules are installed on the needle plate 4 . In this embodiment, the probe module is used to test the connectors whose pins are less than 0.35 mm. Of course, the size of the probe module can be changed according to actual needs, so as to be applicable to different connectors or other products to be tested for testing. The test points of the probe module are the same as those of the product. On the needle plate, there are screw holes through which the screws pass. The lower end of the probe module protrudes downward from the bottom of the needle board to the top of the test line adapter board, and contacts with the contact point connected to the test line on the test line adapter board. This structure can pass the test information of the probe test through The test leads are transmitted to the test equipment.

Carrier plate 5 is fixedly installed on the needle plate by contour screws 51. Springs 52 are sheathed on the contour screws between the carrier plate and the needle plate. A product accommodating groove 53 is provided on the carrier board for placing the product and positioning the product front, back, left, and right. A through hole for the probe to pass is opened in the product accommodating groove, and the upper end of the probe passes through the through hole and is located in the product accommodating groove. A vacuum chamber is opened in the carrier plate, and the vacuum chamber is connected with an external vacuum device through a vacuum connector 54 . A vacuum suction hole communicated with the vacuum chamber is opened on the product accommodating groove. When the product is placed in the product accommodating groove, the vacuum suction hole sucks the product, positions it up and down, keeps the product test point in contact with the upper end of the probe, and realizes the product test. Since there is a spring between the needle plate and the carrier plate, the compression state of the spring can be adjusted by tightening or loosening the contour screw, and the distance that the upper end of the probe protrudes from the product accommodating groove can be adjusted to ensure that the probe The needle extends enough distance to contact the product, but also ensure that the probe cannot extend too much, so as not to cause damage to the test product.

The working principle of the probe testing device of the present utility model is as follows: the product is placed in the product accommodating groove, vacuumed, and the vacuum suction hole sucks the product tightly to keep in contact with the test point on the upper end of the probe module; the probe module will The test information is transmitted to the test line through the probe, and the test line transmits the test information to the test equipment, and the test equipment reads the test data to judge whether the performance is good or bad.

The probe test assembly of the utility model can realize the positioning test of miniaturized products through the organic combination of the needle board, the carrier board and the test line. The structure is simple and compact, the test is convenient, and it is suitable for the test work of various miniaturized electronic products.

Claims (4)

1. A probe testing device, which includes a test line connected to a probe, is characterized in that it also includes a needle board and a carrier plate positioned above the needle board, and a probe module is installed on the needle board; A product accommodating groove is opened on the carrier plate, and the probe module passes through the carrier plate and is located in the product accommodating groove. 2. The probe testing device according to claim 1, characterized in that a vacuum chamber is provided in the carrier plate, and several vacuum chambers communicated with the vacuum chamber are provided in the product accommodating groove. suction hole. 3. The probe testing device according to claim 1, wherein the carrier plate is fixed on the needle plate by screws, and the screws between the carrier plate and the needle plate are respectively sleeved with spring. 4. The probe testing device according to claim 1, further comprising a mounting base plate, on which a test line adapter plate is installed, and the needle plate is installed on the test line adapter plate ; The lower end of the probe module extends downward to contact with the contact point connected to the test line on the test line adapter board.