CN109920470A - A kind of non-destructive testing device and detection method for RAM card - Google Patents
A kind of non-destructive testing device and detection method for RAM card Download PDFInfo
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- CN109920470A CN109920470A CN201910213012.5A CN201910213012A CN109920470A CN 109920470 A CN109920470 A CN 109920470A CN 201910213012 A CN201910213012 A CN 201910213012A CN 109920470 A CN109920470 A CN 109920470A
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- ram card
- tabletting
- destructive testing
- testing device
- station
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- 238000001514 detection method Methods 0.000 title claims abstract description 56
- 238000009659 non-destructive testing Methods 0.000 title claims abstract description 33
- 238000007599 discharging Methods 0.000 claims description 22
- 239000000853 adhesive Substances 0.000 claims description 18
- 230000001070 adhesive effect Effects 0.000 claims description 18
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 6
- 238000009434 installation Methods 0.000 claims description 3
- 229910052742 iron Inorganic materials 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims 2
- 238000003780 insertion Methods 0.000 abstract description 5
- 230000037431 insertion Effects 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000003031 feeding effect Effects 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 230000002045 lasting effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
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- Tests Of Electronic Circuits (AREA)
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Abstract
The present invention relates to a kind of non-destructive testing devices and detection method for RAM card, which includes monitor station；Monitor station is provided with detection station；Detection station is provided with the contact being electrically connected for the golden finger with RAM card；Monitor station is additionally provided with the limit assembly for preventing RAM card along play before and after contact, and the pressure holding component of pressure holding RAM card；Compared with taking the mode for detecting RAM card insertion in the past, the present apparatus detects easy to operate and not will cause damage to the golden finger of RAM card, is conducive to increase customer satisfaction degree.
Description
Technical field
The present invention relates to RAM card detection technique fields, more specifically to a kind of non-destructive testing for RAM card
Device and detection method.
Background technique
RAM card also known as SD card or storage card, due to having, small in size, data transmission bauds is fast, hot-swappable etc. excellent
Characteristic, by widely in applying on mobile phone, digital camera, portable computer, MP3 and other digital products.Past city on sale
Before, memory card can mostly be detected using plug-in type detection mode, judge whether there is quality problems, in insertion, extracted
During RAM card, damage can be scraped or scratch the golden finger on RAM card, consumer is caused to think that product is defect ware or second-hand
RAM card reduces user experience.Therefore, it still needs to make further improvements detection device, to solve the above problems.
Summary of the invention
The technical problem to be solved in the present invention is that in view of the above drawbacks of the prior art, providing a kind of for RAM card
Non-destructive testing device and a kind of lossless detection method for RAM card.
The technical solution adopted by the present invention to solve the technical problems is:
Construct a kind of non-destructive testing device for RAM card, including monitor station；The monitor station is provided with detection station；
The detection station is provided with the contact being electrically connected for the golden finger with RAM card；It is characterized in that, the monitor station is also set
It is equipped with the limit assembly for preventing RAM card play before and after the contact, and the pressure holding component of pressure holding RAM card.
Preferably, the pressure holding component includes the tabletting for pressing RAM card, and is fixed on the monitor station for inhaling
The magnet of the attached tabletting；The tabletting is iron plate.
Preferably, the edge of the monitor station is arranged in the detection station；Described tabletting one end by hinge with it is described
Monitor station connection, and the other end stretches out the edge of the monitor station.
Preferably, the side of the tabletting towards RAM card is fixed with for viscous pair for taking RAM card in the detection station
Face glue.
Preferably, the tabletting is provided with evacuation user's finger for its escape groove for removing RAM card on the double-sided adhesive；
The detection station is provided with the holding tank for accommodating RAM card；The side surface of the RAM card is provided with convex block；
The limit assembly includes left limit piece and right limit piece；The right limit piece is provided with corresponding with the convex block
Spacing breach；It is provided with the contact in the holding tank, and is distributed in the left limit piece and the institute of the contact two sides
State right limit piece.
Preferably, it is provided on the monitor station in transversely arranged multiple detection stations；The non-destructive testing dress
Setting further includes the rectangular discharging mandril for extending transversely through multiple tablettings；The tabletting, which is provided with, to be distributed on the discharging mandril
Two double-sided adhesives of lower two sides, and inverted L-shaped loose slot corresponding with the discharging mandril；The discharging mandril passes through bullet
Property rubber strip is connect with the tabletting；
The loose slot includes longitudinal subactivity slot A, and lateral subactivity slot B；The subactivity slot A and the pressure
On piece is provided with the side surface connection of the double-sided adhesive；The depth of the subactivity slot B is not less than two points of the discharging mandril
One of height.
Preferably, the axle sleeve for preventing the tabletting play is arranged on the discharging mandril；Adjacent two pieces of pressures
An axle sleeve is provided between piece.
Preferably, it is provided on the monitor station in transversely arranged multiple detection stations；The non-destructive testing dress
Setting further includes the I shape discharge duct for extending transversely through multiple tablettings；It is provided in the tabletting and is distributed in the discharge duct or more
Two double-sided adhesives of two sides, and the mounting groove of the installation discharge duct；The discharge duct is hollow structure, including tube body
With two pieces of baffles for being fixed on the tube body both ends；The baffle offers the air inlet being connected to the inner space of the tube body
Mouthful；Multiple gas outlets with RAM card face on the double-sided adhesive are provided on the tube body；The gas outlet and the tube body
Inner space connection.
Preferably, the tube body is provided with three planes of C-shaped arrangement；Three planes, including fore-and-aft plane, with
And upper plane and lower plane；The fore-and-aft plane and the upper plane are adhesively fixed with non-slip rubber block；The lower plane with
The side wall of the mounting groove is adhesively fixed.
On the other hand, a kind of lossless detection method for RAM card is provided, based on above-mentioned non-destructive testing device,
In, comprising:
Step 1: RAM card is put to detection station, the limit work of RAM card is completed by limit assembly, so that institute
State the golden finger face of the contact and RAM card in detection station；
Step 2: RAM card is pushed by pressure holding component, so that the touching in the golden finger of RAM card and the detection station
Point fits closely；
Step 3: after the detection for completing RAM card, the pressure holding component is removed, that is, can be taken off RAM card.
The beneficial effects of the present invention are: compared with taking the mode for detecting RAM card insertion in the past, the present apparatus
It detects easy to operate and damage not will cause to the golden finger of RAM card, be conducive to increase customer satisfaction degree.Specifically, by memory
Card is put to detection station, the limit work of RAM card is completed by limit assembly, and then push RAM card by pressure holding component,
So that the contact on the golden finger and detection station of RAM card fits closely, after the detection for completing RAM card, the pressure holding is removed
Component can be taken off RAM card.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, below in conjunction with attached drawing and reality
Applying example, the invention will be further described, and the accompanying drawings in the following description is only section Example of the invention, for this field
For those of ordinary skill, without creative efforts, it can also be obtained according to these attached drawings other accompanying drawings:
Fig. 1 is the structural schematic diagram for the non-destructive testing device for RAM card that embodiment one provides；
Fig. 2 is the structural schematic diagram of tabletting in the non-destructive testing device for RAM card of the offer of embodiment one；
Fig. 3 is the structural schematic diagram for the non-destructive testing device for RAM card that embodiment two provides；
Fig. 4 is that the usage state diagram of tabletting in the non-destructive testing device for RAM card of the offer of embodiment two (is located at this time
In RAM card detecting state)；
Fig. 5 is the structural schematic diagram for the non-destructive testing device for RAM card that embodiment three provides；
Fig. 6 is the usage state diagram of tabletting in the non-destructive testing device for RAM card of the offer of embodiment three；
Fig. 7 is the implementation flow chart for the lossless detection method that example IV provides.
Specific embodiment
In order to keep the purposes, technical schemes and advantages of the embodiment of the present invention clearer, implement below in conjunction with the present invention
Technical solution in example carries out clear, complete description, it is clear that and described embodiment is section Example of the invention, and
It is not all of embodiment.Based on the embodiment of the present invention, those of ordinary skill in the art are not before making the creative labor
Every other embodiment obtained is put, protection scope of the present invention is belonged to.
Embodiment one
A kind of non-destructive testing device for RAM card of present pre-ferred embodiments is as depicted in figs. 1 and 2, including detection
Platform 10；Monitor station 10 is provided with detection station 11；Detection station 11 is provided with the touching being electrically connected for the golden finger with RAM card
Point 12；Monitor station 10 is additionally provided with the limit assembly 13 for preventing RAM card along 12 front and back play of contact, and pressure holding memory
The pressure holding component 14 of card, compared with took the mode that detects of RAM card insertion in the past, present apparatus detection it is easy to operate and
Damage not will cause to the golden finger of RAM card, be conducive to increase customer satisfaction degree.Specifically, putting RAM card to detection station
On 11, the limit work of RAM card is completed by limit assembly 13, and then RAM card is pushed by pressure holding component 14, so that memory
The golden finger of card is fitted closely with the contact in detection station 11, after the detection for completing RAM card, removes pressure holding component 14
Take out RAM card.
As depicted in figs. 1 and 2, pressure holding component 14 includes the tabletting 15 of pressure holding RAM card, and is fixed on monitor station 10
For adsorbing the magnet 16 of tabletting 15；Tabletting 15 is iron plate, and pressure holding effect is good and at low cost.
As shown in Figure 1, the edge of monitor station 10 is arranged in detection station 11；15 one end of tabletting passes through hinge 17 and monitor station
10 connections, and the other end stretches out the edge of monitor station 10, personnel easy to produce quickly open tabletting 15, and detection is completed in taking-up
RAM card.
As depicted in figs. 1 and 2, the side of tabletting 15 towards RAM card, which is fixed with, takes RAM card in detection station 11 for viscous
Double-sided adhesive 116, open tabletting 15 while realize feeding again, improve production efficiency.
As depicted in figs. 1 and 2, tabletting 15 is provided with evacuation user's finger and removes keeping away for RAM card on double-sided adhesive 116 for it
It allows slot 180, reserves enough feeding spaces, personnel easy to produce quickly remove product；Detection station 11 is provided with for accommodating
The holding tank 181 of RAM card；The side surface of RAM card is provided with convex block；Limit assembly 13 includes left limit piece 18 and right limit piece
19；Right limit piece 19 is provided with spacing breach 182 corresponding with convex block, and structure is simple, good limit effect；It is set in holding tank 181
It is equipped with contact 12, and is distributed in the left limit piece 18 and right limit piece 19 of 12 two sides of contact.
Embodiment two
A kind of non-destructive testing device for RAM card of present pre-ferred embodiments is as shown in Figure 3 and Figure 4, with embodiment
One something in common repeats no more, the difference is that: it is provided on monitor station 10 in transversely arranged multiple detection stations 11, from
And multiple RAM cards can be detected simultaneously；Non-destructive testing device further includes extending transversely through the rectangular discharging of multiple tablettings 15
Mandril 110；Tabletting 15 is provided with two double-sided adhesives 116 for being distributed in about 110 two sides of discharging mandril, and with discharging mandril
110 corresponding inverted L-shaped loose slots 183；Discharging mandril 110 is connect by elastic rubber strip 111 with tabletting 15；Loose slot 183 wraps
Include longitudinal subactivity slot A184, and lateral subactivity slot B185；Double-sided adhesive is provided in subactivity slot A184 and tabletting 15
116 side surface connection；The depth of subactivity slot B185 is not less than the half height of discharging mandril 110, as shown in figure 4,
When detecting to memory card, tabletting is in horizontality, and subactivity slot B185 is that discharging mandril 110 provides supporting point, bullet
Property rubber strip 111 will not be constantly in the state of being stretched, and elongation is small, is able to maintain preferable elasticity, avoids excessive tensile and leads
Cause the case where discharging mandril 110 also stretches out subactivity slot A184 under non-blanking state；After completing detection, producers pull son living
Discharging mandril 110 in dynamic slot B185 is along the outside pushing tow RAM card of subactivity slot A184, so that RAM card is from double-sided adhesive 116
It falls, pushes a discharging mandril 110 that can remove the RAM card in multiple tablettings 15 simultaneously, feeding speed is fast and at low cost.
As shown in figure 3, being arranged with the axle sleeve 112 for preventing 15 play of tabletting on discharging mandril 110；Adjacent two pieces of tablettings
An axle sleeve 112 is provided between 15, in order to guarantee the smooth of rotation, hinge 17 has reserved certain running clearance in itself, and promotion is unloaded
When expecting mandril 110, the minor shifts of horizontal direction may occur along the shaft of hinge 17 for tabletting 15, by the way that axle sleeve 112 is arranged,
Ensure that the distance between adjacent two pieces of tablettings 15 be it is the same, the offset of tabletting 15 can be effectively avoided, so that between each tabletting 15
Movement it is more consistent, feeding effect is more preferable.
Embodiment three
A kind of non-destructive testing device for RAM card of present pre-ferred embodiments is as shown in Figure 5 and Figure 6, with embodiment
One something in common repeats no more, the difference is that: it is provided on monitor station 10 in transversely arranged multiple detection stations 11, from
And multiple RAM cards can be detected simultaneously；Non-destructive testing device further includes the I shape discharge duct for extending transversely through multiple tablettings
113；It is provided with two double-sided adhesives 116 for being distributed in about 113 two sides of discharge duct in tabletting 15, and discharge duct 113 is installed
Mounting groove 186；Discharge duct 113 is hollow structure, including tube body 114 and two pieces of baffles 115 for being fixed on 114 both ends of tube body, gear
Piece 115 can prevent tube body 114 from play occurs；Baffle 115 offers the air inlet 187 being connected to the inner space of tube body 114；Pipe
Multiple gas outlets 188 with 2 face of RAM card on double-sided adhesive 116 are provided on body 114；The inside of gas outlet 188 and tube body 114
Space connection, discharge duct 113 are hollow structure, can mitigate weight and gas provides the flowing space, by air inlet
187 blow primary gas, can remove the RAM card in multiple tablettings 15 simultaneously, and feeding speed is fast and at low cost.
As shown in fig. 6, tube body 114 is provided with three planes of C-shaped arrangement；Three planes, including fore-and-aft plane 189,
Upper plane 1810 and lower plane 1811；Fore-and-aft plane A189 and upper plane 1810 are adhesively fixed with non-slip rubber block 117,
Blow into tube body 114, the trend expanded outward had in tube body 114, due to non-slip rubber block 117 be it is flexible, can
It keeps can effectively prevent the deformation or torsion of tube body 114 to the extruding force of tube body 114 with lasting；Lower plane 1811 and mounting groove
186 side wall is adhesively fixed, and bond area is big and will not twist.
Example IV
A kind of lossless detection method for RAM card of present pre-ferred embodiments, as shown in fig. 7, being based on any of the above
Non-destructive testing device described in embodiment, comprising:
Step S101: RAM card is put to detection station, and the limit work of RAM card is completed by limit assembly, so that
The golden finger face of contact and RAM card in detection station.
Step S102: RAM card is pushed by pressure holding component, so that the contact on the golden finger and detection station of RAM card
It fits closely.
Step S103: after the detection for completing RAM card, pressure holding component is removed, that is, can be taken off RAM card.
The present embodiment compared with took the mode that detects of RAM card insertion in the past, present apparatus detection it is easy to operate and
Damage not will cause to the golden finger of RAM card, be conducive to increase customer satisfaction degree.
It should be understood that for those of ordinary skills, it can be modified or changed according to the above description,
And all these modifications and variations should all belong to the protection domain of appended claims of the present invention.
Claims (10)
1. a kind of non-destructive testing device for RAM card, including monitor station；The monitor station is provided with detection station；The inspection
It surveys station and is provided with the contact being electrically connected for the golden finger with RAM card；It is characterized in that, the monitor station is additionally provided with use
In the limit assembly for preventing RAM card play before and after the contact, and the pressure holding component of pressure holding RAM card.
2. non-destructive testing device according to claim 1, which is characterized in that the pressure holding component includes pressure holding RAM card
Tabletting, and be fixed on the monitor station for adsorbing the magnet of the tabletting；The tabletting is iron plate.
3. non-destructive testing device according to claim 2, which is characterized in that the detection station is arranged in the monitor station
Edge；Described tabletting one end is connect by hinge with the monitor station, and the other end stretches out the edge of the monitor station.
4. non-destructive testing device according to claim 3, which is characterized in that the side of the tabletting towards RAM card is fixed
Have for the viscous double-sided adhesive for taking RAM card in the detection station.
5. non-destructive testing device according to claim 4, which is characterized in that the tabletting is provided with evacuation user's finger and supplies
Its escape groove for removing RAM card on the double-sided adhesive；The detection station is provided with the holding tank for accommodating RAM card；Institute
The side surface for stating RAM card is provided with convex block；
The limit assembly includes left limit piece and right limit piece；The right limit piece is provided with limit corresponding with the convex block
Notch；The contact is provided in the holding tank, and be distributed in the contact two sides the left limit piece and the right side
Limit film.
6. non-destructive testing device according to claim 3, which is characterized in that be provided on the monitor station in transversely arranged
Multiple detection stations；The non-destructive testing device further includes the rectangular discharging mandril for extending transversely through multiple tablettings；
The tabletting be provided be distributed in the discharging mandril up and down two sides two double-sided adhesives, and with the discharging mandril pair
The inverted L-shaped loose slot answered；The discharging mandril is connect by elastic rubber strip with the tabletting；
The loose slot includes longitudinal subactivity slot A, and lateral subactivity slot B；On the subactivity slot A and the tabletting
It is provided with the side surface connection of the double-sided adhesive；The depth of the subactivity slot B is not less than the half of the discharging mandril
Highly.
7. non-destructive testing device according to claim 6, which is characterized in that be arranged on the discharging mandril for preventing
The axle sleeve of the tabletting play；An axle sleeve is provided between adjacent two pieces of tablettings.
8. non-destructive testing device according to claim 3, which is characterized in that be provided on the monitor station in transversely arranged
Multiple detection stations；The non-destructive testing device further includes the I shape discharge duct for extending transversely through multiple tablettings；It is described
Two double-sided adhesives for being distributed in the discharge duct or more two sides, and the installation of the installation discharge duct are provided in tabletting
Slot；The discharge duct is hollow structure, including tube body and two pieces of baffles for being fixed on the tube body both ends；The baffle offers
The air inlet being connected to the inner space of the tube body；RAM card face on the multiple and double-sided adhesive is provided on the tube body
Gas outlet；The gas outlet is connected to the inner space of the tube body.
9. non-destructive testing device according to claim 8, which is characterized in that the tube body is provided with the three of C-shaped arrangement
A plane；Three planes, including fore-and-aft plane and upper plane and lower plane；The fore-and-aft plane and the upper plane
It is adhesively fixed with non-slip rubber block；The side wall of the lower plane and the mounting groove is adhesively fixed.
10. a kind of lossless detection method for RAM card, based on any non-destructive testing device of claim 1-9,
It is characterized in that, comprising:
Step 1: RAM card is put to detection station, the limit work of RAM card is completed by limit assembly, so that the inspection
Survey the contact on station and the golden finger face of RAM card；
Step 2: RAM card is pushed by pressure holding component, so that the golden finger of RAM card and the contact in the detection station are tight
Closely connected conjunction；
Step 3: after the detection for completing RAM card, the pressure holding component is removed, that is, can be taken off RAM card.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910213012.5A CN109920470B (en) | 2019-03-20 | 2019-03-20 | Nondestructive testing device and method for memory card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910213012.5A CN109920470B (en) | 2019-03-20 | 2019-03-20 | Nondestructive testing device and method for memory card |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109920470A true CN109920470A (en) | 2019-06-21 |
| CN109920470B CN109920470B (en) | 2024-05-14 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910213012.5A Active CN109920470B (en) | 2019-03-20 | 2019-03-20 | Nondestructive testing device and method for memory card |
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| Country | Link |
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| CN (1) | CN109920470B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113539349A (en) * | 2021-07-23 | 2021-10-22 | 曙光信息产业股份有限公司 | Test substrate, LLCR (Linear Log-Critical) measurement method and test substrate test method |
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| CN113539349B (en) * | 2021-07-23 | 2024-05-28 | 曙光信息产业股份有限公司 | Test substrate, LLCR measurement method and test substrate test method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109920470B (en) | 2024-05-14 |
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