CN1858906A - Super long alignment infrared focus plane detector - Google Patents

Super long alignment infrared focus plane detector Download PDF

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Publication number
CN1858906A
CN1858906A CN 200610027004 CN200610027004A CN1858906A CN 1858906 A CN1858906 A CN 1858906A CN 200610027004 CN200610027004 CN 200610027004 CN 200610027004 A CN200610027004 A CN 200610027004A CN 1858906 A CN1858906 A CN 1858906A
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submodule
alignment
plane detector
splicing
super long
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CN100479150C (en
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张勤耀
何力
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Shanghai Institute of Technical Physics of CAS
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Shanghai Institute of Technical Physics of CAS
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Abstract

This invention discloses a super long line infrared focal plane detector, which is formed by rotating multiple sub-modules to be crossly fixed on a spliced base plate to form the splice without leakage, in which, the sub-modules are small line infrared focal plane detectors of 256x1 or 512x1, which can be either single wave band or double wave band.

Description

A kind of super long alignment infrared focus plane detector
Technical field
The present invention relates to infrared focal plane detector, be meant a kind of super long alignment infrared focus plane detector especially by a plurality of submodule splicings.
Technical background
Infrared detection technique is a comprehensive high-tech in that military project civil areas such as the earth observation, aerial reconnaissance, meteorology, geomorphology, environmental monitoring, resource investigation are had extremely important status.In Aeronautics and Astronautics infrared remote sensing technology field, its main developing direction: be the photoelectric properties that improve Infrared Detectors on the one hand, improve detectivity, to obtain abundanter target information; Be the scale that enlarges Infrared Detectors on the other hand, promptly increase infrared-sensitive unit quantity, to improve infrared system space exploration resolution.Because for the remote sensing instrument of the instrument platform that is operated in equal height, identical swath, responsive first quantity is many more, and then spatial resolution is high more, and the infrared remote sensing instrument of high spatial resolution is the primary index of infrared early warning, search, tracking system.Therefore, large-scale infrared focal plane detector is the core component of high-performance infrared remote sensing instrument.
The infrared remote sensing of the earth of Aeronautics and Astronautics is surveyed, because aerospace vehicle self has one dimension and moves over the ground, so mode of operation that adopts a kind of what is called " to push away and sweep ", promptly surveying responsive unit arranges along the one dimension direction, orientation is vertical with the spacecraft direction of motion, the one dimension relative motion that utilizes aircraft or satellite to orbit the earth in the high-altitude realizes the one-dimensional scanning (mechanical scanning) along the heading earth observation; And combine the scanning (electronic scanning) that realizes another dimension with reading circuit perpendicular to the responsive unit that heading is arranged, form two-dimentional earth observation image thus.For making ground space resolution enough high, then the responsive first quantity of detector must be abundant.Realize high spatial resolution, can adopt and stare profile battle array focus planardetector on a large scale, or adopt the super long alignment detector, realize with " push away and sweep " mode of operation.For example, for realizing that global remote sensing is surveyed, about one kilometer spatial resolution, then the responsive first number of detector must reach 6000 * 12000 yuan scale.The gazing type that reaches scale like this is surveyed, factors such as present infra-red material technology of preparing, device technology technology and physical characteristic restriction (all work at low temperatures by highly sensitive Infrared Detectors, because the existence of thermal stress, the full-size of detector physically is restricted), the gazing type detector is impossible.And utilize " push away and sweep " pattern, employing splicing to make the super long alignment focus planardetector, then can reach desired purpose.
So-called splice type super long alignment (2000~6000 yuan) infrared focal plane detector is exactly on the one dimension direction, a kind of scanning-type infrared focal plane detector that is spliced to form by a plurality of submodules.At present, 1500 yuan long alignment infrared focus planes that adopt the preparation of straight line splicing pattern are arranged also abroad, promptly on a substrate, the infrared-sensitive of a plurality of hundreds of units unit's array chip " closely " is arranged by indium post inverse bonding technology.Adopt this splicing construction, the problem of existence is that technical difficulty is very big, and rate of finished products is very low, and along with the increase of submodule number, rate of finished products is index decreased.So, develop 6000 yuan of long alignment focal planes, hardly may with straight line splicing pattern.
Summary of the invention
Problem based on above-mentioned prior art existence, the objective of the invention is to propose the super long alignment infrared focus plane detector by a plurality of submodules " seamless " splicing that a kind of technology is simple, rate of finished products is high, this super long alignment infrared focus plane detector is not limited by physical condition.
Super long alignment infrared focus plane detector of the present invention comprises: splicing substrate, a plurality of submodule, the window-frame that has cold filter and outer lead band.
But described splicing substrate is to be made as valve, invar by the metal material of low thermal coefficient of expansion, is inlaid with ceramic rebound above, and the surperficial depth of parallelism, the evenness of splicing substrate and ceramic rebound are better than 0.005mm.
Said submodule is the alignment infrared focal plane detector that 256 * 1 or 512 * 1 less alignment photosensitive element chip of a kind of scale connects to form by inverse bonding substrate and reading circuit electricity, this alignment infrared focal plane detector can be single-range, also can be two waveband.
Said single band submodule is connected to form by inverse bonding substrate and single band reading circuit electricity by single alignment photosensitive element chip.
Said two waveband submodule is that the alignment photosensitive element chip by the apportion of two different-wavebands connects to form by inverse bonding substrate and two waveband reading circuit electricity.
Also be provided with on the said inverse bonding substrate and be used to splice the alignment mark that long alignment infrared focal plane detector is used.
Said a plurality of submodule is to be fixed on the ceramic rebound by the splicing of the alignment mark on inverse bonding substrate rotation symmetrical chiasma, forms infrared-sensitive unit perpendicular to the one dimension arrangement architecture on the scanning direction.The splicing of so-called rotation symmetrical chiasma is about to a plurality of submodule branches and weaves into odd number submodule and even number submodule, perhaps with odd number submodule Rotate 180 °, perhaps with even number submodule Rotate 180 °, and make the limit, photosensitive first limit of two submodules tangent, realize so-called do not have " seam ", promptly do not leak the splicing of unit.
Each submodule is separate on electricity, introduces each module working pulse and signal output by film lead-in wire band.
The window-frame that has cold filter is splicing on the substrate by screw, and makes cold filter be positioned at the photosensitive unit of alignment top, and the band of filter is logical to be decided according to the service band of the photosensitive unit of alignment.
Device of the present invention has following advantage:
1) assembled design is beneficial to installation, debugging, uses flexibly;
2) on the one dimension direction, can determine responsive first quantity of super long alignment as required, can reduce;
3) each submodule is a unified specification, helps selecting the submodule of performance unanimity to be used for splicing, reduces the submodule specification, helps reducing cost, and improves the responsiveness and the uniformity of whole super long alignment device;
4) independence on each submodule electricity can be finely tuned the working point of module respectively, is beneficial to the uniformity of super long alignment device;
5) since module mechanically be independently, the less little line array device of size, so because the thermal stress that causes of coefficient of thermal expansion difference is confined to the identical numerical value of module size.Therefore, do not increase because of the thermal stress that increases considerably of super long alignment device dimension.
6) owing to being " seamless " splicing, so on vertical scanning direction, final image does not have " seam ".
7), technical, physically be to realize the manufacturing of super long alignment focal plane device with prior art owing to be multimode splicing.
Description of drawings
Fig. 1 is the floor map of super long alignment infrared focus plane detector structure of the present invention;
Fig. 2 is the cross-sectional view of Fig. 1;
Fig. 3 splices the floor map of photosensitive first position relation for alignment submodule rotation symmetrical chiasma;
Fig. 4 has the submodule schematic diagram of alignment mark.
Embodiment
Be submodule with single-range 256 * 1 alignment focal plane device below, in conjunction with the accompanying drawings the specific embodiment of the present invention elaborated:
Super long alignment focal plane device of the present invention is made of parts such as the splicing substrate 1 that is inlaid with ceramic rebound 3, odd number submodule 6, even number submodule 4, the cold filter window-frame 8 of being with filter 9, odd number module outer lead band 7, even number module outer lead bands 5.
But splicing substrate 1 is to be made by the metal material valve of low thermal coefficient of expansion, is inlaid with ceramic rebound 3 above, and the surperficial depth of parallelism, the evenness of splicing substrate and ceramic rebound are better than 0.005mm.The necessary Luo of part holes 2 such as the cold filter window-frame 8 of series installation, outer lead band 5,7 are arranged, the precision positioning of screw distributing position on the splicing substrate.
Submodule is made up of alignment photosensitive element chip 16, reading circuit 17, inverse bonding substrate 18.The inverse bonding substrate is provided with the alignment mark 19 that relative fixed position relation is arranged with its detectable signal input, because alignment photosensitive element chip 16, reading circuit 17 are connected with electricity by the interconnected realization machinery of inverse bonding with inverse bonding substrate 18, so the alignment mark on the inverse bonding substrate 18 and photosensitive unit also have fixing correspondence position to concern.
The insulating barrier of odd number submodule outer lead band 7 and even number submodule outer lead band 5 is made by polyimide-based low temperature material.
Device mounting: at first, strange, even submodule 6,4 is intersected the rotation symmetric arrays by requirement position roughly, be fixed on DW3 low temperature glue and splice on the substrate on 1 the ceramic rebound 3.Place it in then under the three-dimensional video tester that has the three-dimensional measurement function, measuring accuracy is 0.001mm, under monitoring in real time, utilizes multidimensional fine motion probe, by the position alignment mark on the inverse bonding substrate 18, odd number submodule 6, even number word modules 4 are moved to the exact position.Be between the odd even submodule, the photosensitive unit 13 of the last monobasic of odd number submodule 6 is tangent with the limit, last monobasic photosensitive unit 14 limit of even number submodule 4; The strange intermodule of idol, first yuan of photosensitive unit 15 of even number module is tangent with limit, first yuan 12 photosensitive yuan limits of odd number module, reaches " seamless " splicing, sees Fig. 3.Then, even number submodule outer lead band 5 and odd number submodule outer lead band 7 are installed respectively, the outer lead band will be gone between by screw by outer lead mounting panel 10 and be with 5,7 to fix, and utilize key pressure method to press each module key pressure point to be connected with the outer lead band.At last, on splicing substrate 1, will be with the cold filter window-frame 8 of filter 9 to be installed on the splicing substrate 1 by screw 11.Thus, form complete super long alignment infrared focus plane detector.

Claims (6)

1. super long alignment infrared focus plane detector comprises: splicing substrate, a plurality of submodule, the window-frame that has cold filter and outer lead band is characterized in that:
Said splicing substrate (1) but be to make as valve, invar by the metal material of low thermal coefficient of expansion, be inlaid with ceramic rebound (3) above;
Said submodule is the alignment infrared focal plane detector that 256 * 1 or 512 * 1 less alignment photosensitive element chip of a kind of scale connects to form by inverse bonding substrate (18) and reading circuit electricity;
Also be provided with on the said inverse bonding substrate (18) and be used to splice the alignment mark (19) that long alignment infrared focal plane detector is used;
Said a plurality of submodule is to be fixed on the ceramic rebound (3) by the splicing of the rotation of the alignment mark (19) on the inverse bonding substrate (18) symmetrical chiasma, forms responsive first one dimension arrangement architecture; The splicing of so-called rotation symmetrical chiasma, be about to a plurality of submodule branches and weave into odd number submodule (6) and even number submodule (4), perhaps with odd number submodule Rotate 180 °, perhaps with even number submodule Rotate 180 °, and make the limit, photosensitive first limit of adjacent two submodules tangent, realize so-called do not have " seam ", promptly do not leak the splicing of unit;
Each submodule is separate on electricity, introduces each module working pulse and signal output by outer lead band (7,5);
The window-frame (8) that has cold filter (9) is splicing on the substrate (1) by screw, and makes cold filter be positioned at the photosensitive unit of alignment top, and the band of filter is logical to be decided by the service band of the photosensitive unit of alignment.
2. according to a kind of super long alignment infrared focus plane detector of claim 1, it is characterized in that: the surperficial depth of parallelism of said splicing substrate and ceramic rebound, evenness are better than 0.005mm.
3. according to a kind of super long alignment infrared focus plane detector of claim 1, it is characterized in that: said submodule can be single-range, also can be two waveband.
4. according to a kind of super long alignment infrared focus plane detector of claim 1, it is characterized in that: the insulating barrier of said odd number submodule outer lead band (7) and even number submodule outer lead band (5) is made by polyimide-based low temperature material.
5. according to a kind of super long alignment infrared focus plane detector of claim 3, it is characterized in that: said single band submodule is connected to form by an alignment photosensitive element chip and single band reading circuit electricity.
6. according to a kind of super long alignment infrared focus plane detector of claim 3, it is characterized in that: said two waveband submodule is to be connected to form with two wave band input electricity of two waveband reading circuit respectively by the alignment photosensitive element chip of the apportion of two different-wavebands.
CNB2006100270044A 2006-05-26 2006-05-26 Super long alignment infrared focus plane detector Active CN100479150C (en)

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Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100524720C (en) * 2006-11-24 2009-08-05 中国科学院上海技术物理研究所 Outer down-lead assembly of multimodule spliced long alignment infrared focal plane detector
CN101226925B (en) * 2008-02-01 2011-02-16 中国科学院上海技术物理研究所 Wiring structure of long line series infrared detector dewar assembly and connecting method thereof
CN102820308A (en) * 2012-08-03 2012-12-12 中国科学院上海技术物理研究所 Dual-waveband linear infrared focal plane detector integrated structure
CN103021961A (en) * 2012-12-10 2013-04-03 中国电子科技集团公司第十一研究所 Splicing method of infrared focal plane detector chips
CN104538384A (en) * 2014-10-16 2015-04-22 中国科学院上海技术物理研究所 Densely arrayed and spliced dual-band long linear infrared focal plane detector structure
CN106370310A (en) * 2016-10-13 2017-02-01 中国科学院上海技术物理研究所 Linear detector packaging structure capable of suppressing stray light and evening light flux and realization method
CN107121200A (en) * 2017-07-12 2017-09-01 中国科学院上海技术物理研究所 A kind of distributed cold stop structure of super long alignment splicing detector
CN110793628A (en) * 2019-10-18 2020-02-14 西安交通大学 Irradiation intensity distribution measuring method based on photodiode array
CN111710749A (en) * 2020-04-23 2020-09-25 中国科学院上海技术物理研究所 Long-line detector splicing structure based on multi-substrate secondary splicing and implementation method

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US6965108B2 (en) * 2001-07-30 2005-11-15 Euro-Celtique, S.A. Method and apparatus for three dimensional imaging using infrared radiation
CN2511014Y (en) * 2001-12-19 2002-09-11 华硕电脑股份有限公司 Solid connection mechanism of connector
CN1210548C (en) * 2002-11-20 2005-07-13 中国科学院上海技术物理研究所 Reading circuit structure of double-colour line-array infrared focus plane detector
CN1220887C (en) * 2003-11-04 2005-09-28 中国科学院上海技术物理研究所 Discrete light filter structure of ultralong lines range infrared focal plane detector
CN100443882C (en) * 2005-05-18 2008-12-17 中国科学院上海技术物理研究所 Multichannel detector module on focal plane of infrared ray and installation method

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100524720C (en) * 2006-11-24 2009-08-05 中国科学院上海技术物理研究所 Outer down-lead assembly of multimodule spliced long alignment infrared focal plane detector
CN101226925B (en) * 2008-02-01 2011-02-16 中国科学院上海技术物理研究所 Wiring structure of long line series infrared detector dewar assembly and connecting method thereof
CN102820308A (en) * 2012-08-03 2012-12-12 中国科学院上海技术物理研究所 Dual-waveband linear infrared focal plane detector integrated structure
CN102820308B (en) * 2012-08-03 2015-03-25 中国科学院上海技术物理研究所 Dual-waveband linear infrared focal plane detector integrated structure
CN103021961A (en) * 2012-12-10 2013-04-03 中国电子科技集团公司第十一研究所 Splicing method of infrared focal plane detector chips
CN104538384B (en) * 2014-10-16 2017-08-25 中国科学院上海技术物理研究所 Double wave segment length's alignment infrared focal plane detector structure of solid matter splicing
CN104538384A (en) * 2014-10-16 2015-04-22 中国科学院上海技术物理研究所 Densely arrayed and spliced dual-band long linear infrared focal plane detector structure
CN106370310A (en) * 2016-10-13 2017-02-01 中国科学院上海技术物理研究所 Linear detector packaging structure capable of suppressing stray light and evening light flux and realization method
CN106370310B (en) * 2016-10-13 2023-07-04 中国科学院上海技术物理研究所 Linear array detector packaging structure capable of inhibiting stray light uniform luminous flux and implementation method
CN107121200A (en) * 2017-07-12 2017-09-01 中国科学院上海技术物理研究所 A kind of distributed cold stop structure of super long alignment splicing detector
CN110793628A (en) * 2019-10-18 2020-02-14 西安交通大学 Irradiation intensity distribution measuring method based on photodiode array
CN110793628B (en) * 2019-10-18 2020-08-18 西安交通大学 Irradiation intensity distribution measuring method based on photodiode array
CN111710749A (en) * 2020-04-23 2020-09-25 中国科学院上海技术物理研究所 Long-line detector splicing structure based on multi-substrate secondary splicing and implementation method

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