CN1825126B - 用于量化信号路径间的串扰导致的定时误差的方法和装置 - Google Patents
用于量化信号路径间的串扰导致的定时误差的方法和装置 Download PDFInfo
- Publication number
- CN1825126B CN1825126B CN2005100974349A CN200510097434A CN1825126B CN 1825126 B CN1825126 B CN 1825126B CN 2005100974349 A CN2005100974349 A CN 2005100974349A CN 200510097434 A CN200510097434 A CN 200510097434A CN 1825126 B CN1825126 B CN 1825126B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/32—Circuit design at the digital level
- G06F30/33—Design verification, e.g. functional simulation or model checking
- G06F30/3308—Design verification, e.g. functional simulation or model checking using simulation
- G06F30/3312—Timing analysis
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Evolutionary Computation (AREA)
- Geometry (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Geophysics And Detection Of Objects (AREA)
- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Description
Claims (20)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/066,587 | 2005-02-25 | ||
US11/066,587 US7251798B2 (en) | 2005-02-25 | 2005-02-25 | Method and apparatus for quantifying the timing error induced by crosstalk between signal paths |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1825126A CN1825126A (zh) | 2006-08-30 |
CN1825126B true CN1825126B (zh) | 2011-06-29 |
Family
ID=36848264
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005100974349A Active CN1825126B (zh) | 2005-02-25 | 2005-12-28 | 用于量化信号路径间的串扰导致的定时误差的方法和装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7251798B2 (zh) |
KR (1) | KR101225219B1 (zh) |
CN (1) | CN1825126B (zh) |
DE (1) | DE102005055830B4 (zh) |
TW (1) | TWI373929B (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6920402B1 (en) * | 2001-03-07 | 2005-07-19 | Rambus Inc. | Technique for determining performance characteristics of electronic devices and systems |
US10200085B1 (en) * | 2016-05-19 | 2019-02-05 | Keysight Technologies, Inc. | System and method of analyzing crosstalk induced jitter |
US10033554B1 (en) | 2016-05-31 | 2018-07-24 | Keysight Technologies, Inc. | System and method of analyzing crosstalk and intersymbol interference for serial data signals |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6128769A (en) * | 1997-12-31 | 2000-10-03 | Intel Corporation | Method for analyzing and efficiently reducing signal cross-talk noise |
JP3959211B2 (ja) | 1999-09-22 | 2007-08-15 | 株式会社東芝 | 半導体記憶装置 |
US6499131B1 (en) * | 1999-07-15 | 2002-12-24 | Texas Instruments Incorporated | Method for verification of crosstalk noise in a CMOS design |
US6501311B2 (en) * | 2000-01-24 | 2002-12-31 | Broadcom Corporation | System and method for compensating for supply voltage induced signal delay mismatches |
JP3983480B2 (ja) * | 2001-01-29 | 2007-09-26 | 株式会社日立製作所 | 電子回路装置及びその設計方法 |
US6571376B1 (en) * | 2002-01-03 | 2003-05-27 | Intel Corporation | Method and apparatus for analog compensation of driver output signal slew rate against device impedance variation |
JP2004172373A (ja) * | 2002-11-20 | 2004-06-17 | Matsushita Electric Ind Co Ltd | クロストーク修正方法 |
KR100703584B1 (ko) | 2002-12-21 | 2007-04-05 | 마이크론 테크놀로지, 인크 | 조정형 이중-에지 트리거식 데이터 비트 시프팅 회로 및 방법 |
US20040136462A1 (en) * | 2003-01-13 | 2004-07-15 | Albert Chen | Method and apparatus for ensuring receiver lock |
US7058907B2 (en) * | 2003-04-09 | 2006-06-06 | Magma Design Automation, Inc. | Reduction of cross-talk noise in VLSI circuits |
US7036098B2 (en) * | 2003-06-30 | 2006-04-25 | Sun Microsystems, Inc. | On-chip signal state duration measurement and adjustment |
US7062737B2 (en) * | 2004-07-28 | 2006-06-13 | Lsi Logic Corporation | Method of automated repair of crosstalk violations and timing violations in an integrated circuit design |
US7536663B2 (en) * | 2005-02-25 | 2009-05-19 | Verigy (Singapore) Pte. Ltd. | Method and apparatus for quantifying the timing error induced by an impedance variation of a signal path |
-
2005
- 2005-02-25 US US11/066,587 patent/US7251798B2/en active Active
- 2005-09-29 TW TW094134051A patent/TWI373929B/zh active
- 2005-11-23 DE DE102005055830A patent/DE102005055830B4/de not_active Expired - Fee Related
- 2005-12-28 CN CN2005100974349A patent/CN1825126B/zh active Active
-
2006
- 2006-02-23 KR KR1020060017852A patent/KR101225219B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US7251798B2 (en) | 2007-07-31 |
CN1825126A (zh) | 2006-08-30 |
TW200631336A (en) | 2006-09-01 |
KR101225219B1 (ko) | 2013-01-23 |
DE102005055830A1 (de) | 2006-09-07 |
US20060195805A1 (en) | 2006-08-31 |
DE102005055830B4 (de) | 2009-08-06 |
TWI373929B (en) | 2012-10-01 |
KR20060094900A (ko) | 2006-08-30 |
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C06 | Publication | ||
PB01 | Publication | ||
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C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20080314 Address after: Singapore Singapore Applicant after: Verigy Pte Ltd Singapore Address before: American California Applicant before: Anjelen Sci. & Tech. Inc. |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: ADVANTEST (SINGAPORE) PTE. LTD. Free format text: FORMER OWNER: VERIGY (SINGAPORE) PTE. LTD. Effective date: 20120425 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20120425 Address after: Singapore Singapore Patentee after: Verigy Pte Ltd Singapore Address before: Singapore Singapore Patentee before: Inovys Corp. |
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ASS | Succession or assignment of patent right |
Owner name: ADVANTEST CORP. Free format text: FORMER OWNER: ADVANTEST (CHINA) CO., LTD. Effective date: 20150430 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20150430 Address after: Tokyo, Japan, Japan Patentee after: ADVANTEST CORP Address before: Singapore Singapore Patentee before: Verigy Pte Ltd Singapore |