CN1816113A - 成像设备 - Google Patents
成像设备 Download PDFInfo
- Publication number
- CN1816113A CN1816113A CNA2005100766914A CN200510076691A CN1816113A CN 1816113 A CN1816113 A CN 1816113A CN A2005100766914 A CNA2005100766914 A CN A2005100766914A CN 200510076691 A CN200510076691 A CN 200510076691A CN 1816113 A CN1816113 A CN 1816113A
- Authority
- CN
- China
- Prior art keywords
- source follower
- voltage
- follower circuit
- reference voltage
- pixel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 57
- 238000006243 chemical reaction Methods 0.000 claims description 14
- 230000005540 biological transmission Effects 0.000 claims description 7
- 230000005693 optoelectronics Effects 0.000 claims description 5
- 239000011159 matrix material Substances 0.000 claims description 4
- 230000002596 correlated effect Effects 0.000 claims description 3
- 238000005070 sampling Methods 0.000 claims description 3
- 230000008859 change Effects 0.000 abstract description 19
- 230000006866 deterioration Effects 0.000 abstract description 3
- 238000009966 trimming Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 description 11
- 230000008569 process Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- 235000012431 wafers Nutrition 0.000 description 6
- 239000000758 substrate Substances 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 230000004044 response Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000002161 passivation Methods 0.000 description 2
- 230000000875 corresponding effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000003698 laser cutting Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/04—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
- H03F3/08—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light
- H03F3/087—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light with IC amplifier blocks
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/627—Detection or reduction of inverted contrast or eclipsing effects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Power Engineering (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Description
Claims (15)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP027771/2005 | 2005-02-03 | ||
JP2005027771A JP4425809B2 (ja) | 2005-02-03 | 2005-02-03 | 撮像装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1816113A true CN1816113A (zh) | 2006-08-09 |
CN1816113B CN1816113B (zh) | 2010-06-02 |
Family
ID=36756087
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005100766914A Expired - Fee Related CN1816113B (zh) | 2005-02-03 | 2005-06-13 | 成像设备 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7477299B2 (zh) |
JP (1) | JP4425809B2 (zh) |
KR (1) | KR100732140B1 (zh) |
CN (1) | CN1816113B (zh) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101841666A (zh) * | 2009-03-16 | 2010-09-22 | 佳能株式会社 | 图像传感器和摄像设备 |
CN102196201A (zh) * | 2011-06-23 | 2011-09-21 | 格科微电子(上海)有限公司 | 图像传感器的信号读出电路、模块及方法 |
CN102213614A (zh) * | 2010-04-09 | 2011-10-12 | 中国科学院微电子研究所 | 一种消除成像器件工艺失配和成像非线性影响的方法 |
CN102256067A (zh) * | 2010-05-18 | 2011-11-23 | 佳能株式会社 | 成像设备 |
CN102625057A (zh) * | 2011-01-26 | 2012-08-01 | 英属开曼群岛商恒景科技股份有限公司 | 暗阳补偿电路 |
CN102685401A (zh) * | 2006-12-18 | 2012-09-19 | 索尼株式会社 | 成像设备和照相机 |
TWI504259B (zh) * | 2011-01-03 | 2015-10-11 | Himax Imaging Inc | 暗陽補償電路 |
CN107113386A (zh) * | 2015-10-02 | 2017-08-29 | 奥林巴斯株式会社 | 摄像元件和内窥镜 |
CN110635788A (zh) * | 2018-06-25 | 2019-12-31 | 原盛科技股份有限公司 | 影像传感器电路及其中的斜坡信号产生电路 |
CN112119629A (zh) * | 2019-07-31 | 2020-12-22 | 深圳市大疆创新科技有限公司 | 图像传感器以及获取像素信息的方法和装置 |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4720508B2 (ja) * | 2006-01-05 | 2011-07-13 | 株式会社ニコン | 撮像素子および撮像装置 |
JP4614286B2 (ja) * | 2006-06-12 | 2011-01-19 | セイコーインスツル株式会社 | 光電変換装置、イメージセンサ、光学読み取り装置 |
JP4238900B2 (ja) * | 2006-08-31 | 2009-03-18 | ソニー株式会社 | 固体撮像装置、撮像装置 |
JP2008199254A (ja) * | 2007-02-13 | 2008-08-28 | Matsushita Electric Ind Co Ltd | 固体撮像装置およびその駆動方法、撮像装置 |
US20080204567A1 (en) * | 2007-02-23 | 2008-08-28 | Weize Xu | Sample and hold circuits with buffer offset removed |
FR2914499B1 (fr) * | 2007-04-02 | 2009-05-29 | St Microelectronics Sa | Procede et circuit d'obtention d'un echantillon dans un capteur d'images |
WO2008150283A1 (en) * | 2007-05-21 | 2008-12-11 | Micron Technology, Inc. | Suppression of row-wise noise in cmos image sensors |
JP5256711B2 (ja) * | 2007-11-28 | 2013-08-07 | 株式会社ニコン | 撮像素子および撮像装置 |
JP5108713B2 (ja) * | 2008-10-10 | 2012-12-26 | パナソニック株式会社 | 固体撮像装置及び撮像装置 |
US20120211642A1 (en) * | 2009-10-27 | 2012-08-23 | Konica Minolta Opto, Inc. | Solid-State Imaging Device |
JP5810493B2 (ja) | 2010-09-03 | 2015-11-11 | ソニー株式会社 | 半導体集積回路、電子機器、固体撮像装置、撮像装置 |
KR101965632B1 (ko) | 2012-09-07 | 2019-04-05 | 삼성전자 주식회사 | 아날로그-디지털 변환 회로, 이를 포함하는 이미지 센서, 및 그 동작 방법 |
US9274152B2 (en) * | 2013-01-30 | 2016-03-01 | Atmel Corporation | Current-based charge compensation in a touch sensor |
CN105338268B (zh) | 2014-08-12 | 2018-09-11 | 比亚迪股份有限公司 | 图像传感器及其去除太阳黑斑方法和去除太阳黑斑装置 |
KR102519343B1 (ko) | 2016-02-11 | 2023-04-06 | 삼성전자주식회사 | 이미지 센서 |
CN108063905B (zh) * | 2016-11-09 | 2020-04-14 | 京东方科技集团股份有限公司 | 像素感应电路及其驱动方法、图像传感器、电子设备 |
KR20220092211A (ko) * | 2020-12-24 | 2022-07-01 | 엘지디스플레이 주식회사 | 디지털 엑스레이 검출기용 어레이 기판 및 이를 포함하는 디지털 엑스레이 검출기 |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5771070A (en) * | 1985-11-15 | 1998-06-23 | Canon Kabushiki Kaisha | Solid state image pickup apparatus removing noise from the photoelectric converted signal |
US4819070A (en) * | 1987-04-10 | 1989-04-04 | Texas Instruments Incorporated | Image sensor array |
JP3966557B2 (ja) * | 1995-08-11 | 2007-08-29 | 株式会社東芝 | 画像システム並びにそこで用いられる固体撮像装置半導体集積回路および差分出力方法 |
JP3845449B2 (ja) * | 1995-08-11 | 2006-11-15 | 株式会社東芝 | Mos型固体撮像装置 |
JPH0965215A (ja) | 1995-08-29 | 1997-03-07 | Olympus Optical Co Ltd | 固体撮像装置 |
GB2318473B (en) * | 1996-10-17 | 2000-11-29 | Sony Corp | Solid state imaging device,signal processing method and camera |
JP3544084B2 (ja) * | 1996-12-10 | 2004-07-21 | シャープ株式会社 | 増幅型固体撮像装置 |
US6798452B1 (en) * | 1997-07-28 | 2004-09-28 | Matsushita Electric Industrial Co., Ltd. | Amplifying solid-state imaging device, method for driving the same and physical quantity distribution sensing semiconductor device |
SG70128A1 (en) * | 1997-10-06 | 2000-01-25 | Canon Kk | Method of driving image sensor |
US6201572B1 (en) * | 1998-02-02 | 2001-03-13 | Agilent Technologies, Inc. | Analog current mode assisted differential to single-ended read-out channel operable with an active pixel sensor |
JPH11307756A (ja) * | 1998-02-20 | 1999-11-05 | Canon Inc | 光電変換装置および放射線読取装置 |
US6194696B1 (en) * | 1998-03-10 | 2001-02-27 | Photobit Corporation | Active pixel sensor with current mode readout |
KR19990086296A (ko) * | 1998-05-27 | 1999-12-15 | 윤종용 | 영상표시기의 화면출력 검사 및 조정 장치와 그 방법 |
JP2001024949A (ja) * | 1999-07-08 | 2001-01-26 | Canon Inc | 固体撮像装置及びそれを用いた撮像システム |
US6753912B1 (en) * | 1999-08-31 | 2004-06-22 | Taiwan Advanced Sensors Corporation | Self compensating correlated double sampling circuit |
EP1143706A3 (en) * | 2000-03-28 | 2007-08-01 | Fujitsu Limited | Image sensor with black level control and low power consumption |
JP4703815B2 (ja) * | 2000-05-26 | 2011-06-15 | 株式会社半導体エネルギー研究所 | Mos型センサの駆動方法、及び撮像方法 |
EP1475962B1 (en) * | 2002-02-12 | 2010-04-07 | Sony Corporation | Solid state imager and camera system |
JP4187502B2 (ja) * | 2002-07-25 | 2008-11-26 | 富士通マイクロエレクトロニクス株式会社 | 画質を向上させたイメージセンサ |
JP4154268B2 (ja) * | 2003-03-27 | 2008-09-24 | キヤノン株式会社 | 撮像装置 |
US7408577B2 (en) * | 2003-04-09 | 2008-08-05 | Micron Technology, Inc. | Biasing scheme for large format CMOS active pixel sensors |
JP4299697B2 (ja) * | 2004-03-04 | 2009-07-22 | シャープ株式会社 | 固体撮像装置 |
JP5305622B2 (ja) * | 2006-08-31 | 2013-10-02 | キヤノン株式会社 | 光電変換装置の製造方法 |
-
2005
- 2005-02-03 JP JP2005027771A patent/JP4425809B2/ja not_active Expired - Fee Related
- 2005-05-19 KR KR1020050042017A patent/KR100732140B1/ko not_active IP Right Cessation
- 2005-05-20 US US11/133,386 patent/US7477299B2/en not_active Expired - Fee Related
- 2005-06-13 CN CN2005100766914A patent/CN1816113B/zh not_active Expired - Fee Related
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102685401A (zh) * | 2006-12-18 | 2012-09-19 | 索尼株式会社 | 成像设备和照相机 |
CN102685401B (zh) * | 2006-12-18 | 2015-06-10 | 索尼株式会社 | 成像设备和照相机 |
CN101841666A (zh) * | 2009-03-16 | 2010-09-22 | 佳能株式会社 | 图像传感器和摄像设备 |
CN102213614A (zh) * | 2010-04-09 | 2011-10-12 | 中国科学院微电子研究所 | 一种消除成像器件工艺失配和成像非线性影响的方法 |
CN102213614B (zh) * | 2010-04-09 | 2013-05-01 | 中国科学院微电子研究所 | 一种消除成像器件工艺失配和成像非线性影响的方法 |
CN102256067B (zh) * | 2010-05-18 | 2014-05-14 | 佳能株式会社 | 成像设备 |
CN102256067A (zh) * | 2010-05-18 | 2011-11-23 | 佳能株式会社 | 成像设备 |
TWI504259B (zh) * | 2011-01-03 | 2015-10-11 | Himax Imaging Inc | 暗陽補償電路 |
CN102625057A (zh) * | 2011-01-26 | 2012-08-01 | 英属开曼群岛商恒景科技股份有限公司 | 暗阳补偿电路 |
CN102625057B (zh) * | 2011-01-26 | 2015-03-11 | 英属开曼群岛商恒景科技股份有限公司 | 暗阳补偿电路 |
CN102196201B (zh) * | 2011-06-23 | 2013-11-27 | 格科微电子(上海)有限公司 | 图像传感器的信号读出电路、模块及方法 |
CN102196201A (zh) * | 2011-06-23 | 2011-09-21 | 格科微电子(上海)有限公司 | 图像传感器的信号读出电路、模块及方法 |
CN107113386A (zh) * | 2015-10-02 | 2017-08-29 | 奥林巴斯株式会社 | 摄像元件和内窥镜 |
CN110635788A (zh) * | 2018-06-25 | 2019-12-31 | 原盛科技股份有限公司 | 影像传感器电路及其中的斜坡信号产生电路 |
CN112119629A (zh) * | 2019-07-31 | 2020-12-22 | 深圳市大疆创新科技有限公司 | 图像传感器以及获取像素信息的方法和装置 |
WO2021016921A1 (zh) * | 2019-07-31 | 2021-02-04 | 深圳市大疆创新科技有限公司 | 图像传感器以及获取像素信息的方法和装置 |
Also Published As
Publication number | Publication date |
---|---|
US7477299B2 (en) | 2009-01-13 |
US20060170794A1 (en) | 2006-08-03 |
CN1816113B (zh) | 2010-06-02 |
KR100732140B1 (ko) | 2007-06-27 |
KR20060090147A (ko) | 2006-08-10 |
JP2006217244A (ja) | 2006-08-17 |
JP4425809B2 (ja) | 2010-03-03 |
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Owner name: FUJITSU MICROELECTRONICS CO., LTD. Free format text: FORMER OWNER: FUJITSU LIMITED Effective date: 20081024 |
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Address after: Kanagawa Patentee after: Fujitsu Semiconductor Co., Ltd. Address before: Tokyo, Japan Patentee before: Fujitsu Microelectronics Ltd. |
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