FR2914499B1 - Procede et circuit d'obtention d'un echantillon dans un capteur d'images - Google Patents

Procede et circuit d'obtention d'un echantillon dans un capteur d'images

Info

Publication number
FR2914499B1
FR2914499B1 FR0754222A FR0754222A FR2914499B1 FR 2914499 B1 FR2914499 B1 FR 2914499B1 FR 0754222 A FR0754222 A FR 0754222A FR 0754222 A FR0754222 A FR 0754222A FR 2914499 B1 FR2914499 B1 FR 2914499B1
Authority
FR
France
Prior art keywords
sample
obtaining
circuit
image sensor
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR0754222A
Other languages
English (en)
Other versions
FR2914499A1 (fr
Inventor
Laurent Simony
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics France SAS
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Priority to FR0754222A priority Critical patent/FR2914499B1/fr
Priority to US12/060,697 priority patent/US7667181B2/en
Publication of FR2914499A1 publication Critical patent/FR2914499A1/fr
Application granted granted Critical
Publication of FR2914499B1 publication Critical patent/FR2914499B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
    • H04N25/627—Detection or reduction of inverted contrast or eclipsing effects

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
FR0754222A 2007-04-02 2007-04-02 Procede et circuit d'obtention d'un echantillon dans un capteur d'images Active FR2914499B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR0754222A FR2914499B1 (fr) 2007-04-02 2007-04-02 Procede et circuit d'obtention d'un echantillon dans un capteur d'images
US12/060,697 US7667181B2 (en) 2007-04-02 2008-04-01 Method and circuit for obtaining a sample in an image sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0754222A FR2914499B1 (fr) 2007-04-02 2007-04-02 Procede et circuit d'obtention d'un echantillon dans un capteur d'images

Publications (2)

Publication Number Publication Date
FR2914499A1 FR2914499A1 (fr) 2008-10-03
FR2914499B1 true FR2914499B1 (fr) 2009-05-29

Family

ID=38537688

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0754222A Active FR2914499B1 (fr) 2007-04-02 2007-04-02 Procede et circuit d'obtention d'un echantillon dans un capteur d'images

Country Status (2)

Country Link
US (1) US7667181B2 (fr)
FR (1) FR2914499B1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5159676B2 (ja) * 2009-03-13 2013-03-06 株式会社東芝 光通信用受信回路
US20120249851A1 (en) * 2011-03-28 2012-10-04 Aptina Imaging Corporation Eclipse detection using double reset sampling for column parallel adc
JP5788738B2 (ja) * 2011-08-26 2015-10-07 富士フイルム株式会社 放射線検出器の製造方法
KR20130049076A (ko) * 2011-11-03 2013-05-13 삼성디스플레이 주식회사 광검출 화소, 광검출 장치, 및 그 구동방법
US9635296B2 (en) * 2012-10-25 2017-04-25 Sharp Kabushiki Kaisha Solid-state imaging device
US9826180B2 (en) * 2015-10-30 2017-11-21 Sony Semiconductor Solutions Corporation Sample-and-hold circuit with black sun control

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6476751B1 (en) * 2000-03-29 2002-11-05 Photobit Corporation Low voltage analog-to-digital converters with internal reference voltage and offset
US7502059B2 (en) * 2002-08-22 2009-03-10 Aptina Imaging Corporation Asymmetric comparator for use in pixel oversaturation detection
US7456884B2 (en) * 2003-08-05 2008-11-25 Aptina Imaging Corporation Method and circuit for determining the response curve knee point in active pixel image sensors with extended dynamic range
US7825982B2 (en) * 2004-06-17 2010-11-02 Aptina Imaging Corporation Operation stabilized pixel bias circuit
KR100660858B1 (ko) * 2005-01-28 2006-12-26 삼성전자주식회사 선 블랙 현상을 방지하는 시모스 이미지 센서의 칼럼 ａｄｃ
JP4425809B2 (ja) * 2005-02-03 2010-03-03 富士通マイクロエレクトロニクス株式会社 撮像装置
US7916186B2 (en) * 2005-04-07 2011-03-29 Micron Technology, Inc. Anti-eclipse circuitry with tracking of floating diffusion reset level
JP2006352341A (ja) * 2005-06-14 2006-12-28 Micron Technol Inc アンチエクリプス回路及びその動作方法

Also Published As

Publication number Publication date
US20080237448A1 (en) 2008-10-02
FR2914499A1 (fr) 2008-10-03
US7667181B2 (en) 2010-02-23

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