CN1798980A - 延迟故障测试方法、相关系统和电路 - Google Patents

延迟故障测试方法、相关系统和电路 Download PDF

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Publication number
CN1798980A
CN1798980A CNA2004800153976A CN200480015397A CN1798980A CN 1798980 A CN1798980 A CN 1798980A CN A2004800153976 A CNA2004800153976 A CN A2004800153976A CN 200480015397 A CN200480015397 A CN 200480015397A CN 1798980 A CN1798980 A CN 1798980A
Authority
CN
China
Prior art keywords
circuit
clock
test
clock signals
objective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2004800153976A
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English (en)
Chinese (zh)
Inventor
N·T·温根
G·E·埃曼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of CN1798980A publication Critical patent/CN1798980A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318577—AC testing, e.g. current testing, burn-in
    • G01R31/31858—Delay testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
CNA2004800153976A 2003-06-03 2004-05-28 延迟故障测试方法、相关系统和电路 Pending CN1798980A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US47523903P 2003-06-03 2003-06-03
US60/475,239 2003-06-03

Publications (1)

Publication Number Publication Date
CN1798980A true CN1798980A (zh) 2006-07-05

Family

ID=33490746

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2004800153976A Pending CN1798980A (zh) 2003-06-03 2004-05-28 延迟故障测试方法、相关系统和电路

Country Status (5)

Country Link
EP (1) EP1634089A1 (fr)
KR (1) KR20060019565A (fr)
CN (1) CN1798980A (fr)
TW (1) TW200508637A (fr)
WO (1) WO2004106958A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101852839A (zh) * 2010-05-19 2010-10-06 中国科学院计算技术研究所 老化预测和超速时延测试双功能的系统及方法
CN108351381A (zh) * 2015-08-14 2018-07-31 诺韦尔达公司 高精度时间测量装置
CN111398775A (zh) * 2019-01-03 2020-07-10 瑞昱半导体股份有限公司 电路运行速度检测电路

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100817236B1 (ko) * 2006-05-08 2008-03-27 엠텍비젼 주식회사 Ｊｔａｇ 컨트롤러를 이용한 지연 결함 테스트 장치 및지연 결함 테스트 방법
US8627160B2 (en) * 2010-04-21 2014-01-07 Lsi Corporation System and device for reducing instantaneous voltage droop during a scan shift operation

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6510534B1 (en) * 2000-06-29 2003-01-21 Logicvision, Inc. Method and apparatus for testing high performance circuits
US6763489B2 (en) * 2001-02-02 2004-07-13 Logicvision, Inc. Method for scan testing of digital circuit, digital circuit for use therewith and program product for incorporating test methodology into circuit description
JP4971557B2 (ja) * 2001-07-03 2012-07-11 パナソニック株式会社 半導体集積回路
JP2003043109A (ja) * 2001-07-30 2003-02-13 Nec Corp 半導体集積回路装置及びその試験装置

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101852839A (zh) * 2010-05-19 2010-10-06 中国科学院计算技术研究所 老化预测和超速时延测试双功能的系统及方法
CN108351381A (zh) * 2015-08-14 2018-07-31 诺韦尔达公司 高精度时间测量装置
TWI705259B (zh) * 2015-08-14 2020-09-21 挪威商諾凡爾達艾斯公司 高準確性時間測量裝置
CN108351381B (zh) * 2015-08-14 2020-10-16 诺韦尔达公司 高精度时间测量装置
US10969430B2 (en) 2015-08-14 2021-04-06 Novelda Asa High precision time measurement apparatus
CN111398775A (zh) * 2019-01-03 2020-07-10 瑞昱半导体股份有限公司 电路运行速度检测电路
CN111398775B (zh) * 2019-01-03 2024-02-06 瑞昱半导体股份有限公司 电路运行速度检测电路

Also Published As

Publication number Publication date
KR20060019565A (ko) 2006-03-03
TW200508637A (en) 2005-03-01
EP1634089A1 (fr) 2006-03-15
WO2004106958A1 (fr) 2004-12-09

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