CN1674154B - 时钟停止检测器 - Google Patents
时钟停止检测器 Download PDFInfo
- Publication number
- CN1674154B CN1674154B CN2005100592433A CN200510059243A CN1674154B CN 1674154 B CN1674154 B CN 1674154B CN 2005100592433 A CN2005100592433 A CN 2005100592433A CN 200510059243 A CN200510059243 A CN 200510059243A CN 1674154 B CN1674154 B CN 1674154B
- Authority
- CN
- China
- Prior art keywords
- clock signal
- signal
- capacitor
- clock
- response
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000003990 capacitor Substances 0.000 claims abstract description 57
- 230000004044 response Effects 0.000 claims abstract description 32
- 230000002093 peripheral effect Effects 0.000 claims description 24
- 230000009849 deactivation Effects 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 9
- 230000001360 synchronised effect Effects 0.000 claims description 6
- 238000007599 discharging Methods 0.000 claims description 5
- 230000004913 activation Effects 0.000 claims description 4
- 230000005669 field effect Effects 0.000 claims description 3
- 229910044991 metal oxide Inorganic materials 0.000 claims description 3
- 150000004706 metal oxides Chemical class 0.000 claims description 3
- 230000003213 activating effect Effects 0.000 claims description 2
- 238000001514 detection method Methods 0.000 claims 3
- 238000004891 communication Methods 0.000 description 8
- 238000004321 preservation Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229920001690 polydopamine Polymers 0.000 description 2
- 108010076504 Protein Sorting Signals Proteins 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/32—Means for saving power
- G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
- G06F1/3206—Monitoring of events, devices or parameters that trigger a change in power modality
- G06F1/3215—Monitoring of peripheral devices
- G06F1/3225—Monitoring of peripheral devices of memory devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4076—Timing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/225—Clock input buffers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/22—Control and timing of internal memory operations
- G11C2207/2227—Standby or low power modes
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Dram (AREA)
Abstract
Description
Claims (29)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/804840 | 2004-03-19 | ||
US10/804,840 US7142478B2 (en) | 2004-03-19 | 2004-03-19 | Clock stop detector |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1674154A CN1674154A (zh) | 2005-09-28 |
CN1674154B true CN1674154B (zh) | 2010-05-26 |
Family
ID=34983122
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005100592433A Expired - Fee Related CN1674154B (zh) | 2004-03-19 | 2005-03-19 | 时钟停止检测器 |
Country Status (4)
Country | Link |
---|---|
US (2) | US7142478B2 (zh) |
KR (1) | KR100645648B1 (zh) |
CN (1) | CN1674154B (zh) |
DE (1) | DE102005011424B4 (zh) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7995043B2 (en) * | 2004-10-18 | 2011-08-09 | Tamiras Per Pte. Ltd., Llc | Arbitration for acquisition of extended display identification data (EDID) |
US7477244B2 (en) * | 2004-10-18 | 2009-01-13 | Genesis Microchip Inc. | Automatic activity detection in a display controller |
KR101258877B1 (ko) * | 2009-11-26 | 2013-04-29 | 한국전자통신연구원 | 클럭 검출기 및 이를 이용한 바이어스 전류 조절 회로 |
US8564332B2 (en) * | 2011-07-20 | 2013-10-22 | Stmicroelectronics International N.V. | Automatic clock-activity based chip/IO ring design—a novel architecture to reduce standby consumption |
CN102439534A (zh) * | 2011-10-25 | 2012-05-02 | 华为技术有限公司 | 降低数据类芯片外挂ddr功耗的方法及数据类芯片系统 |
US10303235B2 (en) | 2015-03-04 | 2019-05-28 | Qualcomm Incorporated | Systems and methods for implementing power collapse in a memory |
US10303203B2 (en) | 2016-01-25 | 2019-05-28 | Samsung Electronics Co., Ltd. | Semiconductor device, semiconductor system and method for operating semiconductor device |
KR102467172B1 (ko) | 2016-01-25 | 2022-11-14 | 삼성전자주식회사 | 반도체 장치 |
DE102017110821A1 (de) | 2016-01-25 | 2018-07-26 | Samsung Electronics Co., Ltd. | Halbleitervorrichtung |
US10296066B2 (en) | 2016-01-25 | 2019-05-21 | Samsung Electronics Co., Ltd. | Semiconductor device, semiconductor system, and method of operating the semiconductor device |
US10429881B2 (en) | 2016-01-25 | 2019-10-01 | Samsung Electronics Co., Ltd. | Semiconductor device for stopping an oscillating clock signal from being provided to an IP block, a semiconductor system having the semiconductor device, and a method of operating the semiconductor device |
US10248155B2 (en) | 2016-01-25 | 2019-04-02 | Samsung Electronics Co., Ltd. | Semiconductor device including clock generating circuit and channel management circuit |
US10141044B2 (en) * | 2016-02-02 | 2018-11-27 | Mediatek Inc. | Memory interface circuit having signal detector for detecting clock signal |
KR20240117196A (ko) * | 2023-01-25 | 2024-08-01 | 삼성전자주식회사 | 클럭 드라이버, 이의 동작 방법, 클럭 드라이버를 포함하는 메모리 장치, 및 메모리 시스템 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5606531A (en) * | 1994-10-27 | 1997-02-25 | Sgs-Microelectronics, S.R.L. | Method and circuit for detecting a fault in a clock signal for microprocessor electronic devices including memory elements |
CN1261965A (zh) * | 1997-05-06 | 2000-08-02 | 艾利森电话股份有限公司 | 具有集成加电复位电路与瞬变干扰检测器的芯片的电子系统 |
CN1353504A (zh) * | 2000-11-10 | 2002-06-12 | 日本电气株式会社 | 时钟中断检测电路 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4230958A (en) | 1978-08-09 | 1980-10-28 | Bell Telephone Laboratories, Incorporated | Loss of clock detector circuit |
JP3277410B2 (ja) * | 1993-06-25 | 2002-04-22 | ソニー株式会社 | パワーオンリセット回路 |
US5841299A (en) * | 1997-02-06 | 1998-11-24 | Intel Corporation | Method and apparatus for implementing an adiabatic logic family |
KR100355226B1 (ko) * | 1999-01-12 | 2002-10-11 | 삼성전자 주식회사 | 뱅크별로 선택적인 셀프 리프레쉬가 가능한 동적 메모리장치 |
JP4748828B2 (ja) * | 1999-06-22 | 2011-08-17 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
US6649476B2 (en) * | 2001-02-15 | 2003-11-18 | Micron Technology, Inc. | Monotonic dynamic-static pseudo-NMOS logic circuit and method of forming a logic gate array |
JP2003177834A (ja) | 2001-12-07 | 2003-06-27 | Mitsubishi Electric Corp | Pll内蔵マイクロコンピュータ |
US6552578B1 (en) * | 2002-06-10 | 2003-04-22 | Pericom Semiconductor Corp. | Power down circuit detecting duty cycle of input signal |
US7165824B2 (en) * | 2002-12-02 | 2007-01-23 | Silverbrook Research Pty Ltd | Dead nozzle compensation |
-
2004
- 2004-03-19 US US10/804,840 patent/US7142478B2/en not_active Expired - Fee Related
-
2005
- 2005-03-11 DE DE102005011424.5A patent/DE102005011424B4/de not_active Expired - Fee Related
- 2005-03-18 KR KR1020050022754A patent/KR100645648B1/ko not_active IP Right Cessation
- 2005-03-19 CN CN2005100592433A patent/CN1674154B/zh not_active Expired - Fee Related
-
2006
- 2006-08-16 US US11/504,923 patent/US7545192B2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5606531A (en) * | 1994-10-27 | 1997-02-25 | Sgs-Microelectronics, S.R.L. | Method and circuit for detecting a fault in a clock signal for microprocessor electronic devices including memory elements |
CN1261965A (zh) * | 1997-05-06 | 2000-08-02 | 艾利森电话股份有限公司 | 具有集成加电复位电路与瞬变干扰检测器的芯片的电子系统 |
CN1353504A (zh) * | 2000-11-10 | 2002-06-12 | 日本电气株式会社 | 时钟中断检测电路 |
Also Published As
Publication number | Publication date |
---|---|
CN1674154A (zh) | 2005-09-28 |
KR20060044419A (ko) | 2006-05-16 |
US20050206410A1 (en) | 2005-09-22 |
DE102005011424B4 (de) | 2016-08-25 |
US7142478B2 (en) | 2006-11-28 |
US7545192B2 (en) | 2009-06-09 |
KR100645648B1 (ko) | 2006-11-14 |
DE102005011424A1 (de) | 2005-10-13 |
US20060274599A1 (en) | 2006-12-07 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee | ||
CP01 | Change in the name or title of a patent holder |
Address after: Munich, Germany Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: INFINEON TECHNOLOGIES AG |
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TR01 | Transfer of patent right |
Effective date of registration: 20120920 Address after: Munich, Germany Patentee after: QIMONDA AG Address before: Munich, Germany Patentee before: Infineon Technologies AG |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20151230 Address after: German Berg, Laura Ibiza Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: QIMONDA AG |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100526 Termination date: 20160319 |
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CF01 | Termination of patent right due to non-payment of annual fee |