CN1478301A - 具有半导电层的基板、电子组件、电子电路、可印刷组合物,以及制造半导体基板的方法 - Google Patents
具有半导电层的基板、电子组件、电子电路、可印刷组合物,以及制造半导体基板的方法 Download PDFInfo
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- CN1478301A CN1478301A CNA018198910A CN01819891A CN1478301A CN 1478301 A CN1478301 A CN 1478301A CN A018198910 A CNA018198910 A CN A018198910A CN 01819891 A CN01819891 A CN 01819891A CN 1478301 A CN1478301 A CN 1478301A
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- H01—ELECTRIC ELEMENTS
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02387—Group 13/15 materials
- H01L21/02395—Arsenides
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02601—Nanoparticles
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02628—Liquid deposition using solutions
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- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/484—Insulated gate field-effect transistors [IGFETs] characterised by the channel regions
- H10K10/486—Insulated gate field-effect transistors [IGFETs] characterised by the channel regions the channel region comprising two or more active layers, e.g. forming pn heterojunctions
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- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
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- H10K71/13—Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Nanotechnology (AREA)
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- Thin Film Transistor (AREA)
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Abstract
Description
Claims (34)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10059498.0 | 2000-11-30 | ||
DE10059498A DE10059498A1 (de) | 2000-11-30 | 2000-11-30 | Substrat mit einer halbleitenden Schicht, elektronisches Bauelement mit diesem Substrat, elektronische Schaltung mit mindestens einem solchen elektronischen Bauelement, druckbare Zusammensetzung sowie Verfahren zur Herstellung eines Substrats |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1478301A true CN1478301A (zh) | 2004-02-25 |
CN1266774C CN1266774C (zh) | 2006-07-26 |
Family
ID=7665261
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB018198910A Expired - Fee Related CN1266774C (zh) | 2000-11-30 | 2001-11-30 | 电子组件及其制造方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7432126B2 (zh) |
EP (1) | EP1338038B1 (zh) |
JP (1) | JP2004515081A (zh) |
KR (1) | KR100581074B1 (zh) |
CN (1) | CN1266774C (zh) |
DE (1) | DE10059498A1 (zh) |
WO (1) | WO2002045183A2 (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102474254A (zh) * | 2009-08-05 | 2012-05-23 | 寇比欧股份有限公司 | 用于印刷电子器件的印刷兼容设计及布图方案 |
CN101685845B (zh) * | 2008-09-26 | 2012-11-14 | 索尼株式会社 | 半导体薄膜的形成方法以及电子设备的制造方法 |
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-
2000
- 2000-11-30 DE DE10059498A patent/DE10059498A1/de not_active Ceased
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2001
- 2001-11-30 EP EP01999011A patent/EP1338038B1/de not_active Expired - Lifetime
- 2001-11-30 JP JP2002547242A patent/JP2004515081A/ja active Pending
- 2001-11-30 KR KR1020037007143A patent/KR100581074B1/ko not_active IP Right Cessation
- 2001-11-30 WO PCT/DE2001/004511 patent/WO2002045183A2/de active IP Right Grant
- 2001-11-30 CN CNB018198910A patent/CN1266774C/zh not_active Expired - Fee Related
- 2001-11-30 US US10/432,767 patent/US7432126B2/en not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101685845B (zh) * | 2008-09-26 | 2012-11-14 | 索尼株式会社 | 半导体薄膜的形成方法以及电子设备的制造方法 |
CN102474254A (zh) * | 2009-08-05 | 2012-05-23 | 寇比欧股份有限公司 | 用于印刷电子器件的印刷兼容设计及布图方案 |
CN103262252A (zh) * | 2010-11-23 | 2013-08-21 | 德拉鲁国际公司 | 二极管,其用途,及其制备方法 |
CN103262252B (zh) * | 2010-11-23 | 2016-03-02 | 德拉鲁国际公司 | 二极管,其用途,及其制备方法 |
CN103250473A (zh) * | 2010-12-06 | 2013-08-14 | 3M创新有限公司 | 复合材料二极管、电子器件及其制备方法 |
CN103250473B (zh) * | 2010-12-06 | 2016-08-31 | 3M创新有限公司 | 复合材料二极管、电子器件及其制备方法 |
Also Published As
Publication number | Publication date |
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JP2004515081A (ja) | 2004-05-20 |
KR100581074B1 (ko) | 2006-05-16 |
WO2002045183A3 (de) | 2002-08-01 |
EP1338038A2 (de) | 2003-08-27 |
WO2002045183A2 (de) | 2002-06-06 |
DE10059498A1 (de) | 2002-06-13 |
CN1266774C (zh) | 2006-07-26 |
US20040082098A1 (en) | 2004-04-29 |
KR20030055324A (ko) | 2003-07-02 |
US7432126B2 (en) | 2008-10-07 |
EP1338038B1 (de) | 2013-03-27 |
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