CN1443004A - 扫描电路和图像传感器 - Google Patents
扫描电路和图像传感器 Download PDFInfo
- Publication number
- CN1443004A CN1443004A CN03110713A CN03110713A CN1443004A CN 1443004 A CN1443004 A CN 1443004A CN 03110713 A CN03110713 A CN 03110713A CN 03110713 A CN03110713 A CN 03110713A CN 1443004 A CN1443004 A CN 1443004A
- Authority
- CN
- China
- Prior art keywords
- circuit
- signal
- data
- scanning circuit
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/04—Synchronising
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/767—Horizontal readout lines, multiplexers or registers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/42—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by switching between different modes of operation using different resolutions or aspect ratios, e.g. switching between interlaced and non-interlaced mode
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C2029/3202—Scan chain
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Facsimile Heads (AREA)
- Facsimile Scanning Arrangements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Shift Register Type Memory (AREA)
Abstract
Description
Claims (6)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP45035/2002 | 2002-02-21 | ||
JP45035/02 | 2002-02-21 | ||
JP2002045035 | 2002-02-21 | ||
JP376093/02 | 2002-12-26 | ||
JP2002376093A JP4005499B2 (ja) | 2002-02-21 | 2002-12-26 | 走査回路およびイメージセンサー |
JP376093/2002 | 2002-12-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1443004A true CN1443004A (zh) | 2003-09-17 |
CN1443004B CN1443004B (zh) | 2010-05-26 |
Family
ID=27736556
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN031107133A Expired - Fee Related CN1443004B (zh) | 2002-02-21 | 2003-02-21 | 图像传感器集成电路和图像传感器 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7721169B2 (zh) |
JP (1) | JP4005499B2 (zh) |
KR (1) | KR100895923B1 (zh) |
CN (1) | CN1443004B (zh) |
TW (1) | TWI252037B (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102006428A (zh) * | 2009-09-02 | 2011-04-06 | 株式会社理光 | 光电转换装置,传感器控制电路,以及图像读取装置 |
CN103312302A (zh) * | 2013-06-24 | 2013-09-18 | 浙江禾川科技股份有限公司 | 单主站多从站结构的通信系统和多路扫描选通信号发生器 |
CN113269018A (zh) * | 2020-02-14 | 2021-08-17 | 群创光电股份有限公司 | 感应装置 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101670994B (zh) * | 2009-08-12 | 2012-02-29 | 杭州赛奇高空作业机械有限公司 | 施工升降工作平台 |
KR102302595B1 (ko) | 2017-05-08 | 2021-09-15 | 삼성전자주식회사 | 테스트 회로를 포함하는 이미지 센서 |
US10839190B2 (en) * | 2018-04-16 | 2020-11-17 | Fingerprint Cards Ab | Gate driver for a fingerprint sensor |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8730363D0 (en) * | 1987-12-31 | 1988-08-24 | British Aerospace | Digital signal processing device |
JP2741119B2 (ja) * | 1991-09-17 | 1998-04-15 | 三菱電機株式会社 | バイパススキャンパスおよびそれを用いた集積回路装置 |
GB9219836D0 (en) * | 1992-09-18 | 1992-10-28 | Philips Electronics Uk Ltd | Electronic drive circuits for active matrix devices,and a method of self-tasting and programming such circuits |
US5712653A (en) * | 1993-12-27 | 1998-01-27 | Sharp Kabushiki Kaisha | Image display scanning circuit with outputs from sequentially switched pulse signals |
JP2738351B2 (ja) * | 1995-06-23 | 1998-04-08 | 日本電気株式会社 | 半導体集積論理回路 |
JPH09135390A (ja) * | 1995-11-10 | 1997-05-20 | Olympus Optical Co Ltd | 撮像装置 |
US5719879A (en) * | 1995-12-21 | 1998-02-17 | International Business Machines Corporation | Scan-bypass architecture without additional external latches |
US5909453A (en) * | 1997-07-02 | 1999-06-01 | Xilinx, Inc. | Lookahead structure for fast scan testing |
JPH11275306A (ja) * | 1998-03-23 | 1999-10-08 | Rohm Co Ltd | イメージセンサチップおよびラインイメージセンサ |
US6615380B1 (en) * | 1999-12-21 | 2003-09-02 | Synopsys Inc. | Dynamic scan chains and test pattern generation methodologies therefor |
-
2002
- 2002-12-26 JP JP2002376093A patent/JP4005499B2/ja not_active Expired - Fee Related
-
2003
- 2003-02-14 US US10/367,130 patent/US7721169B2/en not_active Expired - Fee Related
- 2003-02-20 TW TW092103555A patent/TWI252037B/zh not_active IP Right Cessation
- 2003-02-21 KR KR1020030010959A patent/KR100895923B1/ko active IP Right Grant
- 2003-02-21 CN CN031107133A patent/CN1443004B/zh not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102006428A (zh) * | 2009-09-02 | 2011-04-06 | 株式会社理光 | 光电转换装置,传感器控制电路,以及图像读取装置 |
US8797606B2 (en) | 2009-09-02 | 2014-08-05 | Ricoh Company, Limited | Photoelectric conversion device, sensor control circuit, image reading device, and image forming apparatus |
CN102006428B (zh) * | 2009-09-02 | 2015-07-08 | 株式会社理光 | 光电转换装置,传感器控制电路,以及图像读取装置 |
CN103312302A (zh) * | 2013-06-24 | 2013-09-18 | 浙江禾川科技股份有限公司 | 单主站多从站结构的通信系统和多路扫描选通信号发生器 |
CN103312302B (zh) * | 2013-06-24 | 2016-02-03 | 浙江禾川科技股份有限公司 | 单主站多从站结构的通信系统和多路扫描选通信号发生器 |
CN113269018A (zh) * | 2020-02-14 | 2021-08-17 | 群创光电股份有限公司 | 感应装置 |
Also Published As
Publication number | Publication date |
---|---|
TW200304322A (en) | 2003-09-16 |
KR20030069887A (ko) | 2003-08-27 |
CN1443004B (zh) | 2010-05-26 |
JP2003319135A (ja) | 2003-11-07 |
US7721169B2 (en) | 2010-05-18 |
US20030156105A1 (en) | 2003-08-21 |
KR100895923B1 (ko) | 2009-05-07 |
JP4005499B2 (ja) | 2007-11-07 |
TWI252037B (en) | 2006-03-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160307 Address after: Chiba County, Japan Patentee after: SEIKO INSTR INC Address before: Chiba, Chiba, Japan Patentee before: Seiko Instruments Inc. |
|
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: Chiba County, Japan Patentee after: EPPs Lingke Co. Ltd. Address before: Chiba County, Japan Patentee before: SEIKO INSTR INC |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100526 Termination date: 20200221 |