CN1333459C - 电路装置 - Google Patents
电路装置 Download PDFInfo
- Publication number
- CN1333459C CN1333459C CNB2005100081230A CN200510008123A CN1333459C CN 1333459 C CN1333459 C CN 1333459C CN B2005100081230 A CNB2005100081230 A CN B2005100081230A CN 200510008123 A CN200510008123 A CN 200510008123A CN 1333459 C CN1333459 C CN 1333459C
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- circuit arrangement
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- Expired - Fee Related
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/483—Containers
- H01L33/486—Containers adapted for surface mounting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14618—Containers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/16—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
- H01L25/167—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits comprising optoelectronic devices, e.g. LED, photodiodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19041—Component type being a capacitor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Abstract
Description
Claims (27)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004040883A JP4315833B2 (ja) | 2004-02-18 | 2004-02-18 | 回路装置 |
JP040883/2004 | 2004-02-18 | ||
JP040883/04 | 2004-02-18 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1658736A CN1658736A (zh) | 2005-08-24 |
CN1333459C true CN1333459C (zh) | 2007-08-22 |
Family
ID=35007918
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005100081230A Expired - Fee Related CN1333459C (zh) | 2004-02-18 | 2005-02-05 | 电路装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7317199B2 (zh) |
JP (1) | JP4315833B2 (zh) |
CN (1) | CN1333459C (zh) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007012895A (ja) * | 2005-06-30 | 2007-01-18 | Sanyo Electric Co Ltd | 回路装置およびその製造方法 |
JP4463793B2 (ja) * | 2006-10-10 | 2010-05-19 | 浜松ホトニクス株式会社 | 光検出装置 |
JP5132957B2 (ja) * | 2007-03-14 | 2013-01-30 | パナソニック株式会社 | 半導体デバイス、その製造方法および光ピックアップモジュール |
JP2008227233A (ja) * | 2007-03-14 | 2008-09-25 | Matsushita Electric Ind Co Ltd | 半導体デバイスの製造方法、光ピックアップモジュール、および半導体デバイス |
DE102008021091A1 (de) * | 2008-04-28 | 2009-10-29 | Epcos Ag | Drucksensor |
JP5543724B2 (ja) * | 2008-08-28 | 2014-07-09 | セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー | 樹脂封止型半導体装置及びその製造方法 |
JP5363789B2 (ja) * | 2008-11-18 | 2013-12-11 | スタンレー電気株式会社 | 光半導体装置 |
US20100207140A1 (en) * | 2009-02-19 | 2010-08-19 | Koninklijke Philips Electronics N.V. | Compact molded led module |
JP2010245337A (ja) * | 2009-04-07 | 2010-10-28 | Elpida Memory Inc | 半導体装置及びその製造方法 |
CN102074543B (zh) * | 2009-11-20 | 2012-08-29 | 中芯国际集成电路制造(上海)有限公司 | 一种半导体封装基座 |
JP6051577B2 (ja) * | 2012-04-20 | 2016-12-27 | セイコーエプソン株式会社 | 電子デバイスおよび電子機器 |
CN106206614B (zh) * | 2016-08-25 | 2019-03-12 | 上海天马微电子有限公司 | 一种柔性显示面板和柔性显示装置 |
JP6703029B2 (ja) * | 2018-03-26 | 2020-06-03 | キヤノン株式会社 | 電子モジュールおよび撮像システム |
JP7362280B2 (ja) * | 2019-03-22 | 2023-10-17 | キヤノン株式会社 | パッケージユニットの製造方法、パッケージユニット、電子モジュール、および機器 |
US11500433B2 (en) * | 2020-01-14 | 2022-11-15 | Au Optronics Corporation | Flexible electronic device |
CN117374014B (zh) * | 2023-12-07 | 2024-03-08 | 潮州三环(集团)股份有限公司 | 一种封装基座及其制备方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6021414B2 (ja) * | 1978-12-29 | 1985-05-27 | ソニー株式会社 | テ−プレコ−ダ等のモ−ド切換え装置 |
JPH07263591A (ja) * | 1994-03-22 | 1995-10-13 | Mitsubishi Materials Corp | マイクロ波パッケージ及びその製造方法 |
JP2001077277A (ja) * | 1999-09-03 | 2001-03-23 | Sony Corp | 半導体パッケージおよび半導体パッケージ製造方法 |
JP2001156278A (ja) * | 1999-11-26 | 2001-06-08 | Fuji Film Microdevices Co Ltd | 固体撮像装置 |
JP2003142616A (ja) * | 2001-11-08 | 2003-05-16 | Sanyo Electric Co Ltd | 半導体装置およびその製造方法 |
US6680525B1 (en) * | 2003-01-09 | 2004-01-20 | Kingpak Technology Inc. | Stacked structure of an image sensor |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4399707A (en) * | 1981-02-04 | 1983-08-23 | Honeywell, Inc. | Stress sensitive semiconductor unit and housing means therefor |
US4843454A (en) * | 1985-11-26 | 1989-06-27 | Nippondenso Co., Ltd. | Semiconductor pressure transducer |
US4732042A (en) * | 1986-04-22 | 1988-03-22 | Motorola Inc. | Cast membrane protected pressure sensor |
US5436492A (en) * | 1992-06-23 | 1995-07-25 | Sony Corporation | Charge-coupled device image sensor |
JPH09222372A (ja) * | 1996-02-19 | 1997-08-26 | Mitsubishi Electric Corp | 半導体式センサ |
JPH10104101A (ja) * | 1996-10-02 | 1998-04-24 | Mitsubishi Electric Corp | 半導体圧力センサ |
FR2764113B1 (fr) * | 1997-05-28 | 2000-08-04 | Motorola Semiconducteurs | Dispositif capteur et son procede de fabrication |
JP3958864B2 (ja) | 1998-05-21 | 2007-08-15 | 浜松ホトニクス株式会社 | 透明樹脂封止光半導体装置 |
US6229190B1 (en) * | 1998-12-18 | 2001-05-08 | Maxim Integrated Products, Inc. | Compensated semiconductor pressure sensor |
-
2004
- 2004-02-18 JP JP2004040883A patent/JP4315833B2/ja not_active Expired - Fee Related
-
2005
- 2005-02-05 CN CNB2005100081230A patent/CN1333459C/zh not_active Expired - Fee Related
- 2005-02-14 US US11/057,932 patent/US7317199B2/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6021414B2 (ja) * | 1978-12-29 | 1985-05-27 | ソニー株式会社 | テ−プレコ−ダ等のモ−ド切換え装置 |
JPH07263591A (ja) * | 1994-03-22 | 1995-10-13 | Mitsubishi Materials Corp | マイクロ波パッケージ及びその製造方法 |
JP2001077277A (ja) * | 1999-09-03 | 2001-03-23 | Sony Corp | 半導体パッケージおよび半導体パッケージ製造方法 |
JP2001156278A (ja) * | 1999-11-26 | 2001-06-08 | Fuji Film Microdevices Co Ltd | 固体撮像装置 |
JP2003142616A (ja) * | 2001-11-08 | 2003-05-16 | Sanyo Electric Co Ltd | 半導体装置およびその製造方法 |
US6680525B1 (en) * | 2003-01-09 | 2004-01-20 | Kingpak Technology Inc. | Stacked structure of an image sensor |
Also Published As
Publication number | Publication date |
---|---|
JP4315833B2 (ja) | 2009-08-19 |
US7317199B2 (en) | 2008-01-08 |
US20050248009A1 (en) | 2005-11-10 |
JP2005235886A (ja) | 2005-09-02 |
CN1658736A (zh) | 2005-08-24 |
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