CN1265943C - 产业用机器人 - Google Patents
产业用机器人 Download PDFInfo
- Publication number
- CN1265943C CN1265943C CNB2003101046625A CN200310104662A CN1265943C CN 1265943 C CN1265943 C CN 1265943C CN B2003101046625 A CNB2003101046625 A CN B2003101046625A CN 200310104662 A CN200310104662 A CN 200310104662A CN 1265943 C CN1265943 C CN 1265943C
- Authority
- CN
- China
- Prior art keywords
- hand
- laser
- industrial robot
- test portion
- corpuscular counter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002245 particle Substances 0.000 claims abstract description 42
- 238000012360 testing method Methods 0.000 claims description 41
- 239000012530 fluid Substances 0.000 claims description 38
- 238000000034 method Methods 0.000 claims description 9
- 230000008569 process Effects 0.000 claims description 3
- 239000000428 dust Substances 0.000 abstract description 3
- 238000000149 argon plasma sintering Methods 0.000 abstract description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 11
- 235000012431 wafers Nutrition 0.000 description 11
- 238000007689 inspection Methods 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 8
- 238000009434 installation Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 6
- 229920000049 Carbon (fiber) Polymers 0.000 description 5
- 230000009471 action Effects 0.000 description 5
- 239000004917 carbon fiber Substances 0.000 description 5
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 5
- 239000011347 resin Substances 0.000 description 5
- 229920005989 resin Polymers 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000002131 composite material Substances 0.000 description 3
- 230000003028 elevating effect Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000005693 optoelectronics Effects 0.000 description 2
- 230000004043 responsiveness Effects 0.000 description 2
- 238000012552 review Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000011020 pilot scale process Methods 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J15/00—Gripping heads and other end effectors
- B25J15/0014—Gripping heads and other end effectors having fork, comb or plate shaped means for engaging the lower surface on a object to be transported
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Analytical Chemistry (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Mechanical Engineering (AREA)
- Manipulator (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002316738A JP3970749B2 (ja) | 2002-10-30 | 2002-10-30 | 産業用ロボット |
JP2002316738 | 2002-10-30 | ||
JP2002319387 | 2002-11-01 | ||
JP2002319387A JP2004148476A (ja) | 2002-11-01 | 2002-11-01 | 搬送用ロボットのハンド |
JP2003287784 | 2003-08-06 | ||
JP2003287784 | 2003-08-06 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 200610004488 Division CN1862246A (zh) | 2002-10-30 | 2003-10-30 | 粒子计数器 |
CN 200610004487 Division CN1861334A (zh) | 2002-10-30 | 2003-10-30 | 产业用机器人 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1498732A CN1498732A (zh) | 2004-05-26 |
CN1265943C true CN1265943C (zh) | 2006-07-26 |
Family
ID=34279462
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2003101046625A Expired - Lifetime CN1265943C (zh) | 2002-10-30 | 2003-10-30 | 产业用机器人 |
Country Status (3)
Country | Link |
---|---|
KR (3) | KR20040038783A (ko) |
CN (1) | CN1265943C (ko) |
TW (3) | TWI250924B (ko) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4731267B2 (ja) * | 2005-09-29 | 2011-07-20 | 日本電産サンキョー株式会社 | ロボットのハンドおよびこれを用いたワーク搬送ロボット |
CN101342994B (zh) * | 2008-08-20 | 2011-01-12 | 哈尔滨博实自动化股份有限公司 | 托叉平移式码垛机械手 |
CN101823263B (zh) * | 2009-03-07 | 2013-02-13 | 鸿富锦精密工业(深圳)有限公司 | 机器人的臂部件及其制造方法以及具有该臂部件的机器人 |
KR101139854B1 (ko) * | 2010-04-13 | 2012-05-02 | 광주과학기술원 | 입자계수기 |
KR101139858B1 (ko) * | 2010-04-13 | 2012-05-02 | 광주과학기술원 | 입자계수기 |
JP6271266B2 (ja) * | 2014-01-29 | 2018-01-31 | 日本電産サンキョー株式会社 | 産業用ロボット |
JP6456065B2 (ja) * | 2014-05-16 | 2019-01-23 | 日本電産サンキョー株式会社 | 産業用ロボットのハンドおよび産業用ロボット |
CN106001817A (zh) * | 2016-06-29 | 2016-10-12 | 北京金迈斯智能设备科技有限公司 | 一种电火花机床专用机器人 |
CN109015722A (zh) * | 2018-10-15 | 2018-12-18 | 重庆电讯职业学院 | 一种工业机器人复合夹具 |
CN113340776A (zh) * | 2020-03-02 | 2021-09-03 | 长鑫存储技术有限公司 | 物料搬送系统、自动化天车走行区域微粒监控系统及监控方法 |
CN112102515A (zh) * | 2020-09-14 | 2020-12-18 | 深圳优地科技有限公司 | 机器人巡检方法、装置、设备及存储介质 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0612943U (ja) * | 1992-07-18 | 1994-02-18 | 株式会社堀場製作所 | 微粒子測定装置 |
US5479252A (en) * | 1993-06-17 | 1995-12-26 | Ultrapointe Corporation | Laser imaging system for inspection and analysis of sub-micron particles |
JPH07209185A (ja) * | 1994-01-13 | 1995-08-11 | Yokogawa Electric Corp | 表面散乱形濁度計 |
JPH09178645A (ja) * | 1995-12-26 | 1997-07-11 | Rion Co Ltd | 光散乱式粒子計数装置 |
US5963315A (en) * | 1997-08-18 | 1999-10-05 | Motorola, Inc. | Method and apparatus for processing a semiconductor wafer on a robotic track having access to in situ wafer backside particle detection |
JPH11165281A (ja) * | 1997-12-04 | 1999-06-22 | Mitsubishi Heavy Ind Ltd | ロボットの移動構造 |
JP2000085963A (ja) * | 1998-09-16 | 2000-03-28 | Shin Meiwa Ind Co Ltd | クリーン作業装置 |
JP3973006B2 (ja) * | 2000-03-23 | 2007-09-05 | 日本電産サンキョー株式会社 | ダブルアーム型ロボット |
KR100414157B1 (ko) * | 2001-09-28 | 2004-01-13 | 삼성전자주식회사 | 유체 샘플링 장치 및 이를 갖는 분석 장치 |
KR20030091426A (ko) * | 2002-05-28 | 2003-12-03 | 삼성전자주식회사 | 파티클 검출장치가 구비된 제조설비 |
-
2003
- 2003-10-29 KR KR1020030075853A patent/KR20040038783A/ko active Search and Examination
- 2003-10-30 CN CNB2003101046625A patent/CN1265943C/zh not_active Expired - Lifetime
- 2003-10-30 TW TW092130201A patent/TWI250924B/zh not_active IP Right Cessation
- 2003-10-30 TW TW095108122A patent/TWI289201B/zh not_active IP Right Cessation
- 2003-10-30 TW TW094109741A patent/TWI274639B/zh not_active IP Right Cessation
-
2006
- 2006-03-28 KR KR1020060027769A patent/KR100807433B1/ko not_active IP Right Cessation
- 2006-03-28 KR KR1020060027783A patent/KR20060079763A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
TW200408513A (en) | 2004-06-01 |
TW200624794A (en) | 2006-07-16 |
TWI289201B (en) | 2007-11-01 |
TW200533483A (en) | 2005-10-16 |
TWI250924B (en) | 2006-03-11 |
CN1498732A (zh) | 2004-05-26 |
KR20040038783A (ko) | 2004-05-08 |
KR20060079763A (ko) | 2006-07-06 |
KR20060039415A (ko) | 2006-05-08 |
TWI274639B (en) | 2007-03-01 |
KR100807433B1 (ko) | 2008-02-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100807433B1 (ko) | 파티클 카운터 | |
CN106662519B (zh) | 用于检测颗粒的装置、系统和方法 | |
CN101067597A (zh) | 测量单元及具备该测量单元的输送系统 | |
CN1862246A (zh) | 粒子计数器 | |
CN1261745C (zh) | 纳米级分子阵列排布机 | |
US6431014B1 (en) | High accuracy aerosol impactor and monitor | |
CN100345273C (zh) | 准直装置 | |
EP1862793A1 (en) | High throughput particle counter | |
CN1485609A (zh) | 取样管型烟雾探测器 | |
JP6773188B2 (ja) | 塗布膜形成装置及び塗布膜形成システム | |
CN101158645B (zh) | 基于输入输出光纤的旋转式多通道激发荧光方法 | |
CN111069078A (zh) | 一种多功能视觉检测平台 | |
CN108943444A (zh) | 切削装置 | |
CN107314958A (zh) | 一种带自定标装置的激光粉尘浓度测量装置及方法 | |
KR20160148071A (ko) | 오염입자 샘플링 유도관 모듈을 구비하는 오염입자측정시스템 | |
CN201107271Y (zh) | 基于输入输出光纤的旋转式多通道激发荧光装置 | |
JP5379405B2 (ja) | 超音波接合装置 | |
WO2021175182A1 (zh) | 物料搬送系统、自动化天车走行区域微粒监控系统及监控方法 | |
CN107378480A (zh) | 一种自动组装仪表系统 | |
KR20140125167A (ko) | 클린룸에 발생되는 유해물질 모니터링 장치 | |
CN212278812U (zh) | 一种气吸式计数排种装置 | |
JP6590274B2 (ja) | 粉塵検出装置および粉塵検出システム | |
JP6593744B2 (ja) | 粉塵検出装置および粉塵検出システム | |
TWM612833U (zh) | 可調速之粉體光學檢測系統 | |
CN107322295A (zh) | 一种仪表旋转组装系统 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20170323 Address after: No. two Xingping Road, Pinghu Economic Development Zone, Zhejiang, China, No. 888 Patentee after: NIDEC SANKYO (ZHEJIANG) Corp. Patentee after: NIDEC SANKYO Corp. Address before: Japan, Suwa, Nagano Patentee before: NIDEC SANKYO Corp. |
|
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20060726 |