CN1205361C - 控制硅晶体生长的方法和系统 - Google Patents

控制硅晶体生长的方法和系统 Download PDF

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Publication number
CN1205361C
CN1205361C CNB988096730A CN98809673A CN1205361C CN 1205361 C CN1205361 C CN 1205361C CN B988096730 A CNB988096730 A CN B988096730A CN 98809673 A CN98809673 A CN 98809673A CN 1205361 C CN1205361 C CN 1205361C
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China
Prior art keywords
crystal
image
border
center
diameter
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Expired - Fee Related
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CNB988096730A
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English (en)
Chinese (zh)
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CN1272147A (zh
Inventor
罗伯特·H·福尔赫夫
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SunEdison Inc
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SunEdison Inc
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Publication of CN1272147A publication Critical patent/CN1272147A/zh
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Publication of CN1205361C publication Critical patent/CN1205361C/zh
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    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20—Controlling or regulating
    • C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
    • C30B15/26—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal using television detectors; using photo or X-ray detectors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10—Apparatus
    • Y10T117/1004—Apparatus with means for measuring, testing, or sensing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10—Apparatus
    • Y10T117/1004—Apparatus with means for measuring, testing, or sensing
    • Y10T117/1008—Apparatus with means for measuring, testing, or sensing with responsive control means
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10—Apparatus
    • Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
    • Y10T117/1032—Seed pulling

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CNB988096730A 1997-09-30 1998-09-29 控制硅晶体生长的方法和系统 Expired - Fee Related CN1205361C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/939,802 US5882402A (en) 1997-09-30 1997-09-30 Method for controlling growth of a silicon crystal
US08/939,802 1997-09-30

Publications (2)

Publication Number Publication Date
CN1272147A CN1272147A (zh) 2000-11-01
CN1205361C true CN1205361C (zh) 2005-06-08

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Family Applications (1)

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CNB988096730A Expired - Fee Related CN1205361C (zh) 1997-09-30 1998-09-29 控制硅晶体生长的方法和系统

Country Status (8)

Country Link
US (1) US5882402A (ko)
EP (1) EP1019567B1 (ko)
JP (1) JP4253123B2 (ko)
KR (1) KR20010015645A (ko)
CN (1) CN1205361C (ko)
DE (1) DE69802557T2 (ko)
MY (1) MY117326A (ko)
WO (1) WO1999016940A1 (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI447271B (zh) * 2009-06-18 2014-08-01 Sumco Phoenix Corp 控制單晶矽碇之成長程序的方法與裝置
CN108344742A (zh) * 2018-04-13 2018-07-31 太原理工大学 一种基于多帧图像运动信息的蓝宝石接种检测装置和方法

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US6776840B1 (en) 1999-03-22 2004-08-17 Memc Electronic Materials, Inc. Method and apparatus for controlling diameter of a silicon crystal in a locked seed lift growth process
US6241818B1 (en) 1999-04-07 2001-06-05 Memc Electronic Materials, Inc. Method and system of controlling taper growth in a semiconductor crystal growth process
FI19991890A (fi) * 1999-09-03 2001-03-04 Euroelektro Internat Oy Prosessinohjausjärjestelmään liitetyn kameran ohjaus
US6203611B1 (en) 1999-10-19 2001-03-20 Memc Electronic Materials, Inc. Method of controlling growth of a semiconductor crystal to automatically transition from taper growth to target diameter growth
TW546423B (en) * 2000-05-01 2003-08-11 Komatsu Denshi Kinzoku Kk Method and apparatus for measuring melt level
JP3528758B2 (ja) * 2000-05-31 2004-05-24 三菱住友シリコン株式会社 単結晶引き上げ装置
US6570663B1 (en) * 2000-07-07 2003-05-27 Seh America, Inc. Calibration method and device for visual measuring systems
US6454851B1 (en) 2000-11-09 2002-09-24 Memc Electronic Materials, Inc. Method for preparing molten silicon melt from polycrystalline silicon charge
US20050049751A1 (en) * 2002-11-11 2005-03-03 Farnworth Warren M. Machine vision systems for use with programmable material consolidation apparatus and systems
US6960254B2 (en) * 2003-07-21 2005-11-01 Memc Electronic Materials, Inc. Method to monitor and control the crystal cooling or quenching rate by measuring crystal surface temperature
US20060005761A1 (en) * 2004-06-07 2006-01-12 Memc Electronic Materials, Inc. Method and apparatus for growing silicon crystal by controlling melt-solid interface shape as a function of axial length
JP4923452B2 (ja) * 2004-08-27 2012-04-25 株式会社デンソー ＳｉＣ単結晶の製造方法
US7223304B2 (en) * 2004-12-30 2007-05-29 Memc Electronic Materials, Inc. Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field
US7291221B2 (en) * 2004-12-30 2007-11-06 Memc Electronic Materials, Inc. Electromagnetic pumping of liquid silicon in a crystal growing process
US7384480B2 (en) * 2005-06-20 2008-06-10 Sumco Corporation Apparatus for manufacturing semiconductor single crystal
JP4862290B2 (ja) * 2005-06-20 2012-01-25 株式会社Ｓｕｍｃｏ シリコン単結晶製造方法
JP4734139B2 (ja) 2006-02-27 2011-07-27 Ｓｕｍｃｏ Ｔｅｃｈｘｉｖ株式会社 位置測定方法
CN100383295C (zh) * 2006-03-31 2008-04-23 浙江大学 直拉式晶体生长炉自动控制方法
US8221545B2 (en) * 2008-07-31 2012-07-17 Sumco Phoenix Corporation Procedure for in-situ determination of thermal gradients at the crystal growth front
US8012255B2 (en) * 2008-07-31 2011-09-06 Sumco Phoenix Corporation Method and apparatus for controlling diameter of a silicon crystal ingot in a growth process
US20100024717A1 (en) * 2008-07-31 2010-02-04 Benno Orschel Reversed action diameter control in a semiconductor crystal growth system
CN101748478B (zh) * 2008-12-15 2013-07-31 有研半导体材料股份有限公司 一种测量坩埚中硅熔体水平面相对高度的方法
DE102010026488A1 (de) * 2010-07-07 2012-01-12 Pva Tepla Ag Verfahren zur Messung und Regelung der Höhe der Schmelzenoberfläche in einer Anlage zum Ziehen von Kristallen, sowie eine nach diesem Verfahren arbeitende Anlage
JP5859566B2 (ja) * 2010-12-30 2016-02-10 エムイーエムシー・エレクトロニック・マテリアルズ・インコーポレイテッドＭｅｍｃ Ｅｌｅｃｔｒｏｎｉｃ Ｍａｔｅｒｉａｌｓ，Ｉｎｃｏｒｐｏｒａｔｅｄ 多数のカメラを用いる結晶の成長特性計測方法
CN103215641B (zh) * 2013-04-10 2016-05-25 江苏双良新能源装备有限公司 一种泡生法蓝宝石视频引晶系统及其控制方法
CN103305905B (zh) * 2013-05-30 2015-08-05 浙江中晶科技股份有限公司 一种变埚比的单晶硅生长方法
JP6036709B2 (ja) * 2014-01-07 2016-11-30 信越半導体株式会社 シリコン単結晶の直径検出用カメラのカメラ位置の調整方法及びカメラ位置調整治具
JP6428372B2 (ja) * 2015-02-26 2018-11-28 株式会社Sumco 原料融液液面と種結晶下端との間隔測定方法、種結晶の予熱方法、および単結晶の製造方法
JP6977619B2 (ja) * 2018-02-28 2021-12-08 株式会社Sumco シリコン単結晶の酸素濃度推定方法、およびシリコン単結晶の製造方法
TWI770661B (zh) 2020-04-20 2022-07-11 日商Ｓｕｍｃｏ股份有限公司 單結晶製造裝置及單結晶的製造方法
CN113818075B (zh) * 2021-09-24 2022-09-30 西安奕斯伟材料科技有限公司 精准调整adc相机的方法、装置、设备及计算机存储介质
CN114688984B (zh) * 2022-01-12 2022-12-06 苏州天准科技股份有限公司 单双光圈的检测方法、存储介质、终端和拉晶设备
CN114399489B (zh) * 2022-01-12 2022-11-25 苏州天准科技股份有限公司 拉晶过程中光圈直径的监测方法、存储介质和终端
CN115491756B (zh) * 2022-11-18 2023-03-10 浙江晶盛机电股份有限公司 晶炉晶体生长调控方法、装置、计算机设备和存储介质

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI447271B (zh) * 2009-06-18 2014-08-01 Sumco Phoenix Corp 控制單晶矽碇之成長程序的方法與裝置
CN108344742A (zh) * 2018-04-13 2018-07-31 太原理工大学 一种基于多帧图像运动信息的蓝宝石接种检测装置和方法

Also Published As

Publication number Publication date
DE69802557T2 (de) 2002-05-23
DE69802557D1 (de) 2001-12-20
CN1272147A (zh) 2000-11-01
MY117326A (en) 2004-06-30
JP4253123B2 (ja) 2009-04-08
KR20010015645A (ko) 2001-02-26
EP1019567A1 (en) 2000-07-19
US5882402A (en) 1999-03-16
WO1999016940A1 (en) 1999-04-08
JP2001518443A (ja) 2001-10-16
EP1019567B1 (en) 2001-11-14

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