FI911856A - Foerfarande och apparat foer bestaemning av diametern hos en enskild silikonkristall. - Google Patents

Foerfarande och apparat foer bestaemning av diametern hos en enskild silikonkristall. Download PDF

Info

Publication number
FI911856A
FI911856A FI911856A FI911856A FI911856A FI 911856 A FI911856 A FI 911856A FI 911856 A FI911856 A FI 911856A FI 911856 A FI911856 A FI 911856A FI 911856 A FI911856 A FI 911856A
Authority
FI
Finland
Prior art keywords
silikonkristall
enskild
hos
conditioning
diameter
Prior art date
Application number
FI911856A
Other languages
English (en)
Other versions
FI911856A0 (fi
Inventor
Akihiro Kawashima
Tatsuo Sato
Toshio Okawa
Original Assignee
Nippon Kokan Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Kokan Kk filed Critical Nippon Kokan Kk
Publication of FI911856A0 publication Critical patent/FI911856A0/fi
Publication of FI911856A publication Critical patent/FI911856A/fi

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10—Apparatus
    • Y10T117/1004—Apparatus with means for measuring, testing, or sensing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FI911856A 1990-04-27 1991-04-17 Foerfarande och apparat foer bestaemning av diametern hos en enskild silikonkristall. FI911856A (fi)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11038490 1990-04-27

Publications (2)

Publication Number Publication Date
FI911856A0 FI911856A0 (fi) 1991-04-17
FI911856A true FI911856A (fi) 1991-10-28

Family

ID=14534441

Family Applications (1)

Application Number Title Priority Date Filing Date
FI911856A FI911856A (fi) 1990-04-27 1991-04-17 Foerfarande och apparat foer bestaemning av diametern hos en enskild silikonkristall.

Country Status (5)

Country Link
US (1) US5176787A (fi)
EP (1) EP0454389A3 (fi)
KR (1) KR910018583A (fi)
CN (1) CN1056165A (fi)
FI (1) FI911856A (fi)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5487355A (en) * 1995-03-03 1996-01-30 Motorola, Inc. Semiconductor crystal growth method
US5746828A (en) * 1996-01-16 1998-05-05 General Signal Corporation Temperature control system for growing high-purity monocrystals
US6077345A (en) * 1996-04-10 2000-06-20 Ebara Solar, Inc. Silicon crystal growth melt level control system and method
US6226032B1 (en) 1996-07-16 2001-05-01 General Signal Corporation Crystal diameter control system
US5935321A (en) * 1997-08-01 1999-08-10 Motorola, Inc. Single crystal ingot and method for growing the same
US5882402A (en) * 1997-09-30 1999-03-16 Memc Electronic Materials, Inc. Method for controlling growth of a silicon crystal
JP4089500B2 (ja) * 2003-05-06 2008-05-28 株式会社Ｓｕｍｃｏ 単結晶引き上げ装置内の融液の液面位置測定方法
DE102010003948A1 (de) * 2010-04-14 2011-10-20 Endress + Hauser Flowtec Ag Verfahren zum Bearbeiten eines zeitdiskreten, eindimensionalen Messsignals
KR101218847B1 (ko) * 2010-12-13 2013-01-21 주식회사 엘지실트론 단결정 잉곳 직경 제어시스템 및 이를 포함하는 단결정 잉곳 성장장치
JP6447537B2 (ja) * 2016-02-29 2019-01-09 株式会社Sumco 単結晶の製造方法および製造装置
CN108680106B (zh) * 2018-06-15 2020-05-05 中国科学院上海光学精密机械研究所 Kdp类晶体生长参数的实时测量系统及其测量方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1266724B (de) * 1962-05-16 1968-04-25 Tavkoezlesi Ki Vorrichtung zur Beobachtung der Schmelze bei der Herstellung von Halbleiterkristallen
US4350557A (en) * 1974-06-14 1982-09-21 Ferrofluidics Corporation Method for circumferential dimension measuring and control in crystal rod pulling
US4239583A (en) * 1979-06-07 1980-12-16 Mobil Tyco Solar Energy Corporation Method and apparatus for crystal growth control
US4565598A (en) * 1982-01-04 1986-01-21 The Commonwealth Of Australia Method and apparatus for controlling diameter in Czochralski crystal growth by measuring crystal weight and crystal-melt interface temperature
JPS6033299A (ja) * 1983-07-29 1985-02-20 Toshiba Corp 単結晶の製造装置
JPH0649631B2 (ja) * 1986-10-29 1994-06-29 信越半導体株式会社 結晶径測定装置
JPS63242991A (ja) * 1987-03-31 1988-10-07 Shin Etsu Handotai Co Ltd 結晶径制御方法
US4871251A (en) * 1987-04-27 1989-10-03 Preikschat F K Apparatus and method for particle analysis
JPH0196089A (ja) * 1987-10-07 1989-04-14 Osaka Titanium Co Ltd 単結晶の直径制御方法
JPH0780717B2 (ja) * 1988-12-16 1995-08-30 コマツ電子金属株式会社 単結晶直径自動制御装置

Also Published As

Publication number Publication date
EP0454389A3 (en) 1992-10-14
CN1056165A (zh) 1991-11-13
KR910018583A (ko) 1991-11-30
EP0454389A2 (en) 1991-10-30
US5176787A (en) 1993-01-05
FI911856A0 (fi) 1991-04-17

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