CN1203695A - 在辐射检测器和成象装置的衬底上形成触电的方法 - Google Patents
在辐射检测器和成象装置的衬底上形成触电的方法 Download PDFInfo
- Publication number
- CN1203695A CN1203695A CN96198687.5A CN96198687A CN1203695A CN 1203695 A CN1203695 A CN 1203695A CN 96198687 A CN96198687 A CN 96198687A CN 1203695 A CN1203695 A CN 1203695A
- Authority
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- China
- Prior art keywords
- contact
- layer
- substrate
- radiation detector
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 71
- 230000005855 radiation Effects 0.000 title claims abstract description 56
- 238000000034 method Methods 0.000 title claims abstract description 55
- 238000003384 imaging method Methods 0.000 title description 2
- 239000000463 material Substances 0.000 claims abstract description 75
- 229910052751 metal Inorganic materials 0.000 claims abstract description 34
- 239000002184 metal Substances 0.000 claims abstract description 34
- 239000004065 semiconductor Substances 0.000 claims abstract description 30
- 238000002161 passivation Methods 0.000 claims abstract description 22
- 239000010931 gold Substances 0.000 claims abstract description 18
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 16
- 229910052737 gold Inorganic materials 0.000 claims abstract description 16
- 229920002120 photoresistant polymer Polymers 0.000 claims description 36
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 claims description 32
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 16
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical group [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 claims description 11
- 229910017083 AlN Inorganic materials 0.000 claims description 9
- 238000004519 manufacturing process Methods 0.000 claims description 9
- 229910052697 platinum Inorganic materials 0.000 claims description 7
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 claims description 5
- 239000003292 glue Substances 0.000 claims description 5
- 229910052738 indium Inorganic materials 0.000 claims description 5
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 5
- 238000001259 photo etching Methods 0.000 claims description 5
- 230000005250 beta ray Effects 0.000 claims description 4
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 claims description 3
- 239000004568 cement Substances 0.000 claims description 2
- 238000000151 deposition Methods 0.000 claims description 2
- 230000008020 evaporation Effects 0.000 claims description 2
- 238000001704 evaporation Methods 0.000 claims description 2
- 238000012797 qualification Methods 0.000 claims description 2
- 229910004611 CdZnTe Inorganic materials 0.000 abstract 1
- 230000015556 catabolic process Effects 0.000 abstract 1
- 238000006731 degradation reaction Methods 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 42
- 239000003518 caustics Substances 0.000 description 5
- 241000406668 Loxodonta cyclotis Species 0.000 description 4
- 230000005611 electricity Effects 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 238000002955 isolation Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000002322 conducting polymer Substances 0.000 description 2
- 229920001940 conductive polymer Polymers 0.000 description 2
- 238000001465 metallisation Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000012790 adhesive layer Substances 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 230000009931 harmful effect Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000004224 protection Effects 0.000 description 1
- 238000010301 surface-oxidation reaction Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/823406—Combination of charge coupled devices, i.e. CCD, or BBD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/93—Ternary or quaternary semiconductor comprised of elements from three different groups, e.g. I-III-V
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/958—Passivation layer
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Manufacturing & Machinery (AREA)
- Light Receiving Elements (AREA)
- Measurement Of Radiation (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
Description
Claims (31)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9524387A GB2307785B (en) | 1995-11-29 | 1995-11-29 | Forming contacts on semiconductor substrates for radiation detectors and imaging devices |
GB9524387.9 | 1995-11-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1203695A true CN1203695A (zh) | 1998-12-30 |
CN1113392C CN1113392C (zh) | 2003-07-02 |
Family
ID=10784628
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN96198687.5A Expired - Lifetime CN1113392C (zh) | 1995-11-29 | 1996-11-26 | 辐射检测器和成象装置及其制造方法和用途 |
Country Status (17)
Country | Link |
---|---|
US (2) | US6046068A (zh) |
EP (2) | EP1001469A3 (zh) |
JP (2) | JP3540325B2 (zh) |
CN (1) | CN1113392C (zh) |
AT (1) | ATE198679T1 (zh) |
AU (1) | AU713954B2 (zh) |
CA (1) | CA2238827C (zh) |
DE (1) | DE69611540T2 (zh) |
DK (1) | DK0864171T3 (zh) |
ES (1) | ES2154850T3 (zh) |
GB (1) | GB2307785B (zh) |
GR (1) | GR3035628T3 (zh) |
HK (2) | HK1004243A1 (zh) |
IL (2) | IL124656A0 (zh) |
NO (1) | NO982444L (zh) |
PT (1) | PT864171E (zh) |
WO (1) | WO1997020342A1 (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101720490B (zh) * | 2007-06-29 | 2013-10-23 | 皇家飞利浦电子股份有限公司 | 用于碲化镉部件的电触点 |
CN106707324A (zh) * | 2015-11-16 | 2017-05-24 | Dr科技股份有限公司 | 辐射检测器和具有其的射线照相术设备 |
CN107735869A (zh) * | 2015-02-17 | 2018-02-23 | 瑞德兰科技有限公司 | 高性能辐射检测器和其制造方法 |
Families Citing this family (37)
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GB2289983B (en) | 1994-06-01 | 1996-10-16 | Simage Oy | Imaging devices,systems and methods |
US6410922B1 (en) | 1995-11-29 | 2002-06-25 | Konstantinos Evangelos Spartiotis | Forming contacts on semiconductor substrates for radiation detectors and imaging devices |
GB2352084B (en) * | 1999-07-13 | 2002-11-13 | Simage Oy | Forming contacts on semiconductor substrates for radiation detectors and imaging devices |
US20020158207A1 (en) * | 1996-11-26 | 2002-10-31 | Simage, Oy. | Forming contacts on semiconductor substrates for radiation detectors and imaging devices |
GB2325081B (en) * | 1997-05-06 | 2000-01-26 | Simage Oy | Semiconductor imaging device |
US7001849B2 (en) * | 1998-07-16 | 2006-02-21 | Sandia National Laboratories | Surface treatment and protection method for cadmium zinc telluride crystals |
US9029793B2 (en) | 1998-11-05 | 2015-05-12 | Siemens Aktiengesellschaft | Imaging device |
GB2344550A (en) * | 1998-12-09 | 2000-06-14 | Ibm | Pad design for electronic package |
US6284561B1 (en) * | 1999-10-08 | 2001-09-04 | United Microelectronics Corp. | Method of forming a metal plate of a fingerprint sensor chip on a semiconductor wafer |
FI120561B (fi) | 2000-03-07 | 2009-11-30 | Planmeca Oy | Digitaalikamera, kuvantamislaite ja menetelmä digitaalisessa kuvantamisessa |
JP2002246582A (ja) * | 2000-10-26 | 2002-08-30 | Canon Inc | 放射線検出装置、その製造方法及びシステム |
IL143853A0 (en) * | 2001-06-19 | 2002-04-21 | Real Time Radiography Ltd | Laminated radiation detector and process for its fabrication |
US6781132B2 (en) * | 2001-08-10 | 2004-08-24 | The Regents Of The University Of Michigan | Collimated radiation detector assembly, array of collimated radiation detectors and collimated radiation detector module |
US7170062B2 (en) | 2002-03-29 | 2007-01-30 | Oy Ajat Ltd. | Conductive adhesive bonded semiconductor substrates for radiation imaging devices |
GB0224689D0 (en) * | 2002-10-23 | 2002-12-04 | Simage Oy | Formation of contacts on semiconductor substrates |
JP2006504258A (ja) | 2002-10-25 | 2006-02-02 | ゴールドパワー リミテッド | 回路基板およびその製造方法 |
US7223981B1 (en) * | 2002-12-04 | 2007-05-29 | Aguila Technologies Inc. | Gamma ray detector modules |
US7763820B1 (en) | 2003-01-27 | 2010-07-27 | Spectramet, Llc | Sorting pieces of material based on photonic emissions resulting from multiple sources of stimuli |
US20060033029A1 (en) * | 2004-08-13 | 2006-02-16 | V-Target Technologies Ltd. | Low-voltage, solid-state, ionizing-radiation detector |
CN1328598C (zh) * | 2005-01-26 | 2007-07-25 | 上海大学 | 共面栅阳极碲锌镉探测器的制备方法 |
JP2008546177A (ja) * | 2005-05-16 | 2008-12-18 | Ii−Vi インコーポレイテッド | 高性能のCdxZn1−xTe(0≦x≦1)のX線及びγ線の放射線検出器およびその製造方法 |
CA2541256A1 (en) * | 2006-02-22 | 2007-08-22 | Redlen Technologies Inc. | Shielding electrode for monolithic radiation detector |
GB0615452D0 (en) * | 2006-08-03 | 2006-09-13 | Radiation Watch Ltd | Sensors |
DE102006046314A1 (de) * | 2006-09-29 | 2008-04-03 | Siemens Ag | Strahlungsdirektkonvertermodul und Strahlungsdirektkonverter |
US7589324B2 (en) * | 2006-12-21 | 2009-09-15 | Redlen Technologies | Use of solder mask as a protective coating for radiation detector |
US7462833B2 (en) * | 2007-04-17 | 2008-12-09 | Redlen Technologies | Multi-functional cathode packaging design for solid-state radiation detectors |
US7955992B2 (en) * | 2008-08-08 | 2011-06-07 | Redlen Technologies, Inc. | Method of passivating and encapsulating CdTe and CZT segmented detectors |
US8614423B2 (en) * | 2009-02-02 | 2013-12-24 | Redlen Technologies, Inc. | Solid-state radiation detector with improved sensitivity |
US9202961B2 (en) | 2009-02-02 | 2015-12-01 | Redlen Technologies | Imaging devices with solid-state radiation detector with improved sensitivity |
JP2010210590A (ja) * | 2009-03-12 | 2010-09-24 | Fujifilm Corp | 放射線検出器 |
KR101690059B1 (ko) | 2009-05-14 | 2016-12-27 | 데비코어 메디컬 프로덕츠, 인코포레이티드 | 광자 방출 검출용 스택 크리스탈 어레이 |
US8476101B2 (en) * | 2009-12-28 | 2013-07-02 | Redlen Technologies | Method of fabricating patterned CZT and CdTe devices |
US9000389B2 (en) * | 2011-11-22 | 2015-04-07 | General Electric Company | Radiation detectors and methods of fabricating radiation detectors |
CN106415788B (zh) | 2014-04-07 | 2020-10-16 | 菲力尔系统公司 | 用于联接半导体基板的方法和系统 |
DE102014211602B4 (de) * | 2014-06-17 | 2018-10-25 | Siemens Healthcare Gmbh | Detektormodul für einen Röntgendetektor |
US11378701B2 (en) | 2019-10-08 | 2022-07-05 | Redlen Technologies, Inc. | Low dark current radiation detector and method of making the same |
US11733408B2 (en) | 2020-04-28 | 2023-08-22 | Redlen Technologies, Inc. | High-performance radiation detectors and methods of fabricating thereof |
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US4677740A (en) * | 1973-06-29 | 1987-07-07 | Hughes Aircraft Company | Forming monolithic planar opto-isolators by selective implantation and proton bombardment |
JPS5623783A (en) * | 1979-08-01 | 1981-03-06 | Matsushita Electronics Corp | Formation of electrode for semiconductor device |
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JPS604214A (ja) * | 1983-06-22 | 1985-01-10 | Toshiba Corp | 半導体装置の製造方法 |
JPS6226812A (ja) * | 1985-07-26 | 1987-02-04 | Mitsubishi Electric Corp | 半導体装置の製造方法 |
US4670097A (en) * | 1985-12-23 | 1987-06-02 | Gte Products Corporation | Method for patterning transparent layers on a transparent substrate |
JPS62274715A (ja) * | 1986-05-23 | 1987-11-28 | Nec Corp | 半導体装置の製造方法 |
JPS63181481A (ja) * | 1987-01-23 | 1988-07-26 | Matsushita Electric Ind Co Ltd | 半導体放射線検出器 |
JPS63299120A (ja) * | 1987-05-28 | 1988-12-06 | Mitsubishi Electric Corp | 半導体装置の電極形成方法 |
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US5296407A (en) * | 1990-08-30 | 1994-03-22 | Seiko Epson Corporation | Method of manufacturing a contact structure for integrated circuits |
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EP1258740A2 (en) * | 1994-12-23 | 2002-11-20 | Digirad Corporation | Semiconductor gamma-ray camera and medical imaging system |
-
1995
- 1995-11-29 GB GB9524387A patent/GB2307785B/en not_active Expired - Fee Related
-
1996
- 1996-11-26 AU AU10967/97A patent/AU713954B2/en not_active Ceased
- 1996-11-26 US US08/755,826 patent/US6046068A/en not_active Expired - Lifetime
- 1996-11-26 JP JP52019097A patent/JP3540325B2/ja not_active Expired - Lifetime
- 1996-11-26 PT PT96941641T patent/PT864171E/pt unknown
- 1996-11-26 AT AT96941641T patent/ATE198679T1/de not_active IP Right Cessation
- 1996-11-26 WO PCT/EP1996/005348 patent/WO1997020342A1/en active IP Right Grant
- 1996-11-26 DK DK96941641T patent/DK0864171T3/da active
- 1996-11-26 ES ES96941641T patent/ES2154850T3/es not_active Expired - Lifetime
- 1996-11-26 CN CN96198687.5A patent/CN1113392C/zh not_active Expired - Lifetime
- 1996-11-26 EP EP99124797A patent/EP1001469A3/en not_active Ceased
- 1996-11-26 DE DE69611540T patent/DE69611540T2/de not_active Expired - Lifetime
- 1996-11-26 CA CA002238827A patent/CA2238827C/en not_active Expired - Fee Related
- 1996-11-26 IL IL12465696A patent/IL124656A0/xx unknown
- 1996-11-26 EP EP96941641A patent/EP0864171B1/en not_active Expired - Lifetime
-
1998
- 1998-02-04 HK HK98100795A patent/HK1004243A1/xx not_active IP Right Cessation
- 1998-05-26 IL IL12465698A patent/IL124656A/en not_active IP Right Cessation
- 1998-05-28 NO NO982444A patent/NO982444L/no not_active Application Discontinuation
- 1998-10-21 HK HK98111398A patent/HK1010282A1/xx not_active IP Right Cessation
-
1999
- 1999-10-19 US US09/421,115 patent/US6215123B1/en not_active Expired - Lifetime
-
2001
- 2001-03-23 GR GR20010400473T patent/GR3035628T3/el not_active IP Right Cessation
-
2002
- 2002-12-25 JP JP2002375430A patent/JP2003229555A/ja active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101720490B (zh) * | 2007-06-29 | 2013-10-23 | 皇家飞利浦电子股份有限公司 | 用于碲化镉部件的电触点 |
US8847386B2 (en) | 2007-06-29 | 2014-09-30 | Koninklijke Philips N.V. | Electrical contact for a cadmium tellurium component |
CN107735869A (zh) * | 2015-02-17 | 2018-02-23 | 瑞德兰科技有限公司 | 高性能辐射检测器和其制造方法 |
US10276627B2 (en) | 2015-02-17 | 2019-04-30 | Redlen Technologies, Inc. | High-performance radiation detectors and methods of fabricating thereof |
CN106707324A (zh) * | 2015-11-16 | 2017-05-24 | Dr科技股份有限公司 | 辐射检测器和具有其的射线照相术设备 |
CN106707324B (zh) * | 2015-11-16 | 2019-06-04 | Dr科技股份有限公司 | 辐射检测器和具有其的射线照相术设备 |
US11058374B2 (en) | 2015-11-16 | 2021-07-13 | Drtech Corp | Radiation detector and radiography apparatus having the same |
Also Published As
Publication number | Publication date |
---|---|
EP0864171A1 (en) | 1998-09-16 |
EP0864171B1 (en) | 2001-01-10 |
GB2307785A (en) | 1997-06-04 |
CA2238827A1 (en) | 1997-06-05 |
ES2154850T3 (es) | 2001-04-16 |
HK1010282A1 (en) | 1999-06-17 |
US6046068A (en) | 2000-04-04 |
EP1001469A3 (en) | 2000-09-06 |
US6215123B1 (en) | 2001-04-10 |
AU1096797A (en) | 1997-06-19 |
JP2003229555A (ja) | 2003-08-15 |
GB9524387D0 (en) | 1996-01-31 |
PT864171E (pt) | 2001-05-31 |
GR3035628T3 (en) | 2001-06-29 |
NO982444L (no) | 1998-07-29 |
CA2238827C (en) | 2002-10-29 |
IL124656A0 (en) | 1998-12-06 |
NO982444D0 (no) | 1998-05-28 |
IL124656A (en) | 2001-10-31 |
ATE198679T1 (de) | 2001-01-15 |
DE69611540T2 (de) | 2001-04-26 |
JP3540325B2 (ja) | 2004-07-07 |
CN1113392C (zh) | 2003-07-02 |
JP2000516392A (ja) | 2000-12-05 |
DK0864171T3 (da) | 2001-01-29 |
EP1001469A2 (en) | 2000-05-17 |
GB2307785B (en) | 1998-04-29 |
WO1997020342A1 (en) | 1997-06-05 |
DE69611540D1 (de) | 2001-02-15 |
AU713954B2 (en) | 1999-12-16 |
HK1004243A1 (en) | 1998-11-20 |
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