CN120188055A - 测定装置 - Google Patents

测定装置 Download PDF

Info

Publication number
CN120188055A
CN120188055A CN202280102083.8A CN202280102083A CN120188055A CN 120188055 A CN120188055 A CN 120188055A CN 202280102083 A CN202280102083 A CN 202280102083A CN 120188055 A CN120188055 A CN 120188055A
Authority
CN
China
Prior art keywords
terminals
pair
measuring
measuring device
held
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280102083.8A
Other languages
English (en)
Chinese (zh)
Inventor
水越刚
泽田利幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Corp
Original Assignee
Fuji Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Corp filed Critical Fuji Corp
Publication of CN120188055A publication Critical patent/CN120188055A/zh
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
CN202280102083.8A 2022-12-06 2022-12-06 测定装置 Pending CN120188055A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/044849 WO2024121921A1 (ja) 2022-12-06 2022-12-06 測定装置

Publications (1)

Publication Number Publication Date
CN120188055A true CN120188055A (zh) 2025-06-20

Family

ID=91378837

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280102083.8A Pending CN120188055A (zh) 2022-12-06 2022-12-06 测定装置

Country Status (3)

Country Link
JP (1) JPWO2024121921A1 (https=)
CN (1) CN120188055A (https=)
WO (1) WO2024121921A1 (https=)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6350767A (ja) * 1986-08-21 1988-03-03 Matsushita Electric Ind Co Ltd 電子部品の位置規正装置
JP2002232200A (ja) * 2001-02-07 2002-08-16 Pioneer Electronic Corp 電子部品装着装置
JP4106963B2 (ja) * 2002-05-20 2008-06-25 株式会社村田製作所 チップ型コンデンサの耐圧試験方法および耐圧試験装置
JP2004170360A (ja) * 2002-11-22 2004-06-17 Kanto Tsusoku Kiki Kk 積層型プローブ及び接触子
JP5035858B2 (ja) * 2004-06-16 2012-09-26 上野精機株式会社 電子部品測定装置及び電子部品測定方法
US7456642B2 (en) * 2006-09-25 2008-11-25 Ceramic Component Technologies, Inc. Handheld electronic test probe assembly
JP4847907B2 (ja) * 2007-03-29 2011-12-28 ルネサスエレクトロニクス株式会社 半導体検査装置
JP5725543B2 (ja) * 2011-02-17 2015-05-27 上野精機株式会社 電子部品測定装置
JP5916025B1 (ja) * 2015-12-11 2016-05-11 上野精機株式会社 電気特性テスト装置

Also Published As

Publication number Publication date
JPWO2024121921A1 (https=) 2024-06-13
WO2024121921A1 (ja) 2024-06-13

Similar Documents

Publication Publication Date Title
WO2017009987A1 (ja) 検査装置
US11483953B2 (en) Measurement device and measurement method
JP6607719B2 (ja) 検査装置
CN120188055A (zh) 测定装置
JP7404072B2 (ja) 測定装置
JP7326277B2 (ja) 測定装置
US20250052794A1 (en) Electrical characteristic acquiring device
JP6568733B2 (ja) 検査装置
JP7389130B2 (ja) 測定装置、実装機、クランプ状態取得装置
WO2017009986A1 (ja) 検査装置
WO2017037887A1 (ja) 検査装置
WO2017056300A1 (ja) 検査装置
CN121488165A (zh) 测定装置、安装机
JP6852127B2 (ja) 検査装置および検査方法
JP2022169619A (ja) 電子部品装着機
JP2026023630A (ja) 電気的特性取得装置
JP7504134B2 (ja) 実装機
US12535502B2 (en) Measuring device
JP7804030B2 (ja) 装着機
JP6908676B2 (ja) 電気的特性取得方法および部品装着方法
JP6912620B2 (ja) 検査装置
US12584952B2 (en) Measuring device
JP2020096206A (ja) 検査装置
JP7203273B2 (ja) 装着機
JP7164924B2 (ja) 電子部品装着機および検査方法

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination