JPWO2024121921A1 - - Google Patents
Info
- Publication number
- JPWO2024121921A1 JPWO2024121921A1 JP2024562427A JP2024562427A JPWO2024121921A1 JP WO2024121921 A1 JPWO2024121921 A1 JP WO2024121921A1 JP 2024562427 A JP2024562427 A JP 2024562427A JP 2024562427 A JP2024562427 A JP 2024562427A JP WO2024121921 A1 JPWO2024121921 A1 JP WO2024121921A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2022/044849 WO2024121921A1 (ja) | 2022-12-06 | 2022-12-06 | 測定装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2024121921A1 true JPWO2024121921A1 (https=) | 2024-06-13 |
Family
ID=91378837
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024562427A Pending JPWO2024121921A1 (https=) | 2022-12-06 | 2022-12-06 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2024121921A1 (https=) |
| CN (1) | CN120188055A (https=) |
| WO (1) | WO2024121921A1 (https=) |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6350767A (ja) * | 1986-08-21 | 1988-03-03 | Matsushita Electric Ind Co Ltd | 電子部品の位置規正装置 |
| JP2002232200A (ja) * | 2001-02-07 | 2002-08-16 | Pioneer Electronic Corp | 電子部品装着装置 |
| JP4106963B2 (ja) * | 2002-05-20 | 2008-06-25 | 株式会社村田製作所 | チップ型コンデンサの耐圧試験方法および耐圧試験装置 |
| JP2004170360A (ja) * | 2002-11-22 | 2004-06-17 | Kanto Tsusoku Kiki Kk | 積層型プローブ及び接触子 |
| JP5035858B2 (ja) * | 2004-06-16 | 2012-09-26 | 上野精機株式会社 | 電子部品測定装置及び電子部品測定方法 |
| US7456642B2 (en) * | 2006-09-25 | 2008-11-25 | Ceramic Component Technologies, Inc. | Handheld electronic test probe assembly |
| JP4847907B2 (ja) * | 2007-03-29 | 2011-12-28 | ルネサスエレクトロニクス株式会社 | 半導体検査装置 |
| JP5725543B2 (ja) * | 2011-02-17 | 2015-05-27 | 上野精機株式会社 | 電子部品測定装置 |
| JP5916025B1 (ja) * | 2015-12-11 | 2016-05-11 | 上野精機株式会社 | 電気特性テスト装置 |
-
2022
- 2022-12-06 CN CN202280102083.8A patent/CN120188055A/zh active Pending
- 2022-12-06 WO PCT/JP2022/044849 patent/WO2024121921A1/ja not_active Ceased
- 2022-12-06 JP JP2024562427A patent/JPWO2024121921A1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024121921A1 (ja) | 2024-06-13 |
| CN120188055A (zh) | 2025-06-20 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20251008 |