CN116941016A - 半导体基板和其制造方法以及制造装置、模板基板 - Google Patents
半导体基板和其制造方法以及制造装置、模板基板 Download PDFInfo
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- CN116941016A CN116941016A CN202280016192.8A CN202280016192A CN116941016A CN 116941016 A CN116941016 A CN 116941016A CN 202280016192 A CN202280016192 A CN 202280016192A CN 116941016 A CN116941016 A CN 116941016A
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- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/24—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
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- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/27—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials
- H10P14/271—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials characterised by the preparation of substrate for selective deposition
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- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/27—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials
- H10P14/276—Lateral overgrowth
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0617—AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/042—Coating on selected surface areas, e.g. using masks using masks
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/34—Nitrides
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- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
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- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/183—Epitaxial-layer growth characterised by the substrate being provided with a buffer layer, e.g. a lattice matching layer
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- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/186—Epitaxial-layer growth characterised by the substrate being specially pre-treated by, e.g. chemical or physical means
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- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021-031036 | 2021-02-26 | ||
| JP2021031036 | 2021-02-26 | ||
| PCT/JP2022/007587 WO2022181686A1 (ja) | 2021-02-26 | 2022-02-24 | 半導体基板並びにその製造方法および製造装置、テンプレート基板 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116941016A true CN116941016A (zh) | 2023-10-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202280016192.8A Pending CN116941016A (zh) | 2021-02-26 | 2022-02-24 | 半导体基板和其制造方法以及制造装置、模板基板 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20240234141A9 (https=) |
| EP (1) | EP4300605A4 (https=) |
| JP (1) | JP7646806B2 (https=) |
| KR (2) | KR102869418B1 (https=) |
| CN (1) | CN116941016A (https=) |
| TW (2) | TWI897836B (https=) |
| WO (1) | WO2022181686A1 (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12463033B2 (en) | 2022-10-19 | 2025-11-04 | Kyocera Corporation | Semiconductor substrate, and manufacturing method and manufacturing apparatus of semiconductor substrate |
| WO2024084634A1 (ja) * | 2022-10-19 | 2024-04-25 | 京セラ株式会社 | 半導体基板、半導体基板の製造方法および製造装置 |
| WO2024084664A1 (ja) * | 2022-10-20 | 2024-04-25 | 京セラ株式会社 | 半導体基板、テンプレート基板、並びにテンプレート基板の製造方法および製造装置 |
| WO2024201629A1 (ja) * | 2023-03-27 | 2024-10-03 | 京セラ株式会社 | 半導体成長用テンプレート基板、半導体基板、半導体成長用テンプレート基板の製造方法および製造装置、並びに半導体基板の製造方法および製造装置 |
| TW202528574A (zh) * | 2023-09-22 | 2025-07-16 | 日商京瓷股份有限公司 | 模片基板及其製造方法、半導體基板及其製造方法、模片基板之製造裝置以及半導體裝置之製造方法 |
| WO2025115743A1 (ja) * | 2023-11-30 | 2025-06-05 | 京セラ株式会社 | 半導体基板並びにその製造方法および製造装置、半導体デバイス |
| WO2025115999A1 (ja) * | 2023-12-01 | 2025-06-05 | 京セラ株式会社 | 半導体基板およびその製造方法、半導体基板の製造装置、並びに半導体デバイス |
| TW202537182A (zh) * | 2023-12-11 | 2025-09-16 | 日商京瓷股份有限公司 | 半導體基板以及其製造方法及製造裝置、半導體器件 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0575163A (ja) * | 1991-09-13 | 1993-03-26 | Canon Inc | 半導体装置の製造方法 |
| CA2311132C (en) * | 1997-10-30 | 2004-12-07 | Sumitomo Electric Industries, Ltd. | Gan single crystalline substrate and method of producing the same |
| JP5065625B2 (ja) * | 1997-10-30 | 2012-11-07 | 住友電気工業株式会社 | GaN単結晶基板の製造方法 |
| JP4406999B2 (ja) * | 2000-03-31 | 2010-02-03 | 豊田合成株式会社 | Iii族窒化物系化合物半導体の製造方法及びiii族窒化物系化合物半導体素子 |
| JP3679720B2 (ja) * | 2001-02-27 | 2005-08-03 | 三洋電機株式会社 | 窒化物系半導体素子および窒化物系半導体の形成方法 |
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-
2022
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- 2022-02-24 KR KR1020237029293A patent/KR102869418B1/ko active Active
- 2022-02-24 KR KR1020257033024A patent/KR20250151589A/ko active Pending
- 2022-02-24 WO PCT/JP2022/007587 patent/WO2022181686A1/ja not_active Ceased
- 2022-02-24 JP JP2023502483A patent/JP7646806B2/ja active Active
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| KR20250151589A (ko) | 2025-10-21 |
| KR102869418B1 (ko) | 2025-10-14 |
| KR20230138501A (ko) | 2023-10-05 |
| JP7646806B2 (ja) | 2025-03-17 |
| EP4300605A1 (en) | 2024-01-03 |
| TW202534757A (zh) | 2025-09-01 |
| US20240234141A9 (en) | 2024-07-11 |
| US20240136181A1 (en) | 2024-04-25 |
| JPWO2022181686A1 (https=) | 2022-09-01 |
| EP4300605A4 (en) | 2025-01-15 |
| WO2022181686A1 (ja) | 2022-09-01 |
| TW202249079A (zh) | 2022-12-16 |
| TWI897836B (zh) | 2025-09-11 |
| TWI886379B (zh) | 2025-06-11 |
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