CN116736061A

CN116736061A - Triode matching precision detection method, controller and storage medium

Info

Publication number: CN116736061A
Application number: CN202310521115.4A
Authority: CN
Inventors: 熊剑锋; 刘弋波; 赖鼐; 龚晖
Original assignee: Zhuhai Miaocun Technology Co ltd
Current assignee: Zhuhai Miaocun Technology Co ltd
Priority date: 2023-05-09
Filing date: 2023-05-09
Publication date: 2023-09-12

Abstract

The application discloses a method for detecting matching precision of triodes, a controller and a storage medium, wherein the method comprises the steps of obtaining circuit diagram parameters of a plurality of triodes to be matched in a circuit diagram to be detected, obtaining a circuit diagram matching result according to a preset circuit diagram matching standard, and modifying the circuit diagram parameters according to the circuit diagram matching result; obtaining a layout to be detected generated according to a circuit diagram to be detected, and obtaining layout parameters of a plurality of triodes to be matched in the layout to be detected; obtaining a layout matching result according to a plurality of preset layout matching standards and layout parameters, modifying the layout parameters according to the layout matching result, ensuring that the matching precision detection can be timely carried out in both a circuit design stage and a layout design stage, finding problems, improving the detection efficiency, carrying out layout detection according to the matching characteristics of compactness, consistency, symmetry, dispersity and the like, and effectively ensuring the integrity and accuracy of detecting the matching result of the detection triode.

Description

Triode matching precision detection method, controller and storage medium

Technical Field

The application relates to the technical field of integrated circuit design, in particular to a triode matching precision detection method, a controller and a storage medium.

Background

In the prior art, in the integrated circuit design process, the matching result of the triode is an important index, because the performance of a circuit is reduced when the matching result is poor, and the mismatch caused by the poor matching result of the triode can be divided into two types of random mismatch and system mismatch, and the two types of mismatch are required to be reduced in the circuit design process and the layout design process so as to achieve a higher matching result;

the conventional triode matching precision detection method at present carries out the related detection of density and virtual co-lining by covering specific layers, and cannot directly and effectively detect the matching result among the triodes needing to be matched, so that the detection of the matching result is required to be carried out manually, the manual detection is time-consuming and the detection integrity and accuracy cannot be guaranteed, the detection efficiency and accuracy of the conventional precision detection method are poor, the detection is carried out only in the layout design stage in the prior art, and once the problem occurs, the circuit design possibly needs to be carried out again, so that the layout design cannot be carried out effectively.

Disclosure of Invention

The embodiment of the application provides a triode matching precision detection method, a controller and a computer storage medium, which can at least ensure that the scheme of the application can effectively shorten the detection time and improve the detection efficiency by respectively detecting matching results in a circuit design stage and a layout design stage, and respectively detect according to matching characteristics such as compactness, consistency, symmetry, dispersibility and the like, thereby effectively ensuring the integrity and accuracy of detecting the matching results of the detection triode.

In a first aspect, an embodiment of the present application provides a method for detecting matching accuracy of a triode, where the method includes:

acquiring circuit diagram parameters of a plurality of triodes to be matched in a circuit diagram to be detected;

performing matching precision detection processing on the circuit diagram parameters according to a preset circuit diagram matching standard to obtain a circuit diagram matching result, and modifying the circuit diagram parameters according to the circuit diagram matching result;

obtaining a layout to be detected generated according to the circuit diagram to be detected, and obtaining layout parameters of a plurality of triodes to be matched in the layout to be detected;

performing matching precision detection processing on the layout parameters according to a plurality of preset layout matching standards to obtain a plurality of layout matching results, and modifying the layout parameters according to the layout matching results, wherein the layout matching standards comprise: compact matching criteria, consistent matching criteria, symmetric matching criteria, and dispersive matching criteria.

In some embodiments, the circuit diagram parameters include transistor type, emitter length, emitter width, emitter area and multiple, and the obtaining circuit diagram parameters of a plurality of transistors to be matched in the circuit diagram to be detected includes:

Acquiring the triode types, the emitter lengths, the emitter widths, the emitter lengths and the multiples of a plurality of triodes to be matched in a circuit diagram to be detected;

and obtaining the emitter area according to the emitter width and the emitter length.

In some embodiments, the circuit diagram parameters include a triode type, an emitter length, an emitter width, an emitter area and a multiple, the emitter area is a product of the emitter length and the emitter width, the circuit diagram parameters are subjected to matching precision detection according to a preset circuit diagram matching standard to obtain a circuit diagram matching result, and the circuit diagram parameters are modified according to the circuit diagram matching result, including:

under the condition that the types of the triodes to be matched are different, or the emitter lengths are different, or the emitter widths are different, a first circuit matching result is obtained, and the circuit diagram parameters are modified according to the first circuit matching result;

under the conditions that the types, emitter lengths and emitter widths of the plurality of the triodes to be matched are the same and the emitter lengths and emitter widths are unequal, obtaining a second circuit matching result, and modifying the circuit diagram parameters according to the second circuit matching result and a first preset matching requirement;

Under the conditions that the types, emitter lengths and emitter widths of the plurality of the triodes to be matched are the same, the emitter lengths and emitter widths are equal, the open square root of the multiple sum is not an integer, a third circuit matching result is obtained, and the circuit diagram parameters are modified according to the third circuit matching result and a second preset matching requirement;

and under the condition that the types, the emitter lengths and the emitter widths of the triodes which are required to be matched are the same, the emitter lengths and the emitter widths are equal, and the open square root of the multiple sum is an integer, generating the layout to be detected according to the circuit diagram to be detected.

In some embodiments, the layout parameters include emitter information, collector information, base information and contact hole information of the triode minimum;

the emitter information comprises the emitter length, the emitter width and the emitter center point coordinates of the triode;

the collector information comprises a plurality of vertex coordinate information on a collector ring;

the base information comprises a plurality of vertex coordinate information on a base polar ring;

the contact hole information comprises sizes, numbers and relative positions of a plurality of contact holes corresponding to the emitter, the collector and the base, wherein the relative positions are the relative positions of the contact holes in the emitter, the collector and the base.

In some embodiments, the performing the matching precision detection processing on the layout parameters according to a plurality of preset layout matching criteria to obtain a plurality of layout matching results, and modifying the layout parameters according to the layout matching results, including:

under the condition that the layout parameters of a plurality of triodes to be matched are the same, carrying out matching precision detection processing on the layout parameters according to a plurality of preset layout matching standards to obtain a plurality of layout matching results, and modifying the layout parameters according to the layout matching results;

outputting an interrupt detection report under the condition that the layout parameters of the triodes to be matched are different, and modifying the layout parameters according to the interrupt detection report.

In some embodiments, the performing the matching precision detection processing on the layout parameters according to a plurality of preset layout matching standards includes:

calculating and generating a triode array distribution graph corresponding to the triode according to the layout parameters;

obtaining the array length and the array width of the corresponding triode array according to the triode array distribution pattern, and carrying out matching precision detection processing on the layout parameters according to the compactness matching standard;

Obtaining a reference centroid coordinate and centroid coordinates of a plurality of triodes to be matched according to the triode array distribution graph, and carrying out matching precision detection processing on the layout parameters according to the consistency matching standard and the symmetry matching standard;

and obtaining the number of row triodes and the number of column triodes in each row and each column of the corresponding triode array according to the triode array distribution pattern, and carrying out matching precision detection processing on the layout parameters according to the dispersity matching standard.

In some embodiments, the performing the matching precision detection processing on the layout parameters according to the compactness matching standard includes:

obtaining an aspect ratio value according to the array length and the array width:

under the condition that the shape of the triode array distribution pattern is not rectangular, a first compactness matching result is obtained;

obtaining a second compactness matching result under the condition that the shape of the triode array distribution pattern is rectangular and the length-width ratio value is in a first preset ratio range;

obtaining a third compactness matching result under the condition that the shape of the triode array distribution pattern is rectangular and the length-width ratio value is in a second preset ratio range;

Under the condition that the shape of the triode array distribution pattern is square, a fourth compactness matching result is obtained;

under the condition that the first compactness matching result is obtained, modifying the layout parameters; and under the condition that the second compactness matching result or the third compactness matching result is obtained, modifying the layout parameters according to a preset layout matching requirement.

In some embodiments, the performing a matching precision detection process on the layout parameters according to a consistency matching standard includes:

calculating a plurality of distances between the centroid coordinates and the reference centroid coordinates;

obtaining a first consistency matching result under the condition that the distance is greater than or equal to a first distance threshold value;

obtaining a second consistency matching result when the distance is smaller than the first distance threshold and larger than or equal to a second distance threshold;

obtaining a third consistency matching result when the distance is smaller than the second distance threshold and larger than 0;

obtaining a fourth consistency matching result under the condition that the distance is equal to 0;

under the condition that the first consistency matching result is obtained, modifying the layout parameters; and under the condition that the second consistency matching result or the third consistency matching result is obtained, modifying the layout parameters according to a preset layout matching requirement.

In some embodiments, the matching precision detection processing for the layout parameters according to the symmetry matching standard includes:

establishing an X axis and a Y axis by taking the reference centroid coordinates as an origin;

under the condition that the barycenter coordinates of the triodes to be matched are not centrosymmetric with respect to the reference barycenter coordinates, a first symmetry matching result is obtained;

under the condition that the barycenter coordinates of the plurality of triodes to be matched are centrosymmetric with respect to the reference barycenter coordinates and are not symmetrical with respect to the X axis and the Y axis, a second symmetry matching result is obtained;

under the condition that the barycenter coordinates of the plurality of triodes to be matched are centrosymmetric with respect to the reference barycenter coordinates and symmetrical with respect to one of the X axis or the Y axis, a third symmetry matching result is obtained;

under the condition that the barycenter coordinates of the plurality of triodes to be matched are centrosymmetric with respect to the reference barycenter coordinates and symmetrical with respect to the X axis and the Y axis, a fourth symmetry matching result is obtained;

under the condition that the first symmetry matching result is obtained, modifying the layout parameters; and under the condition that the second symmetry matching result or the third symmetry matching result is obtained, modifying the layout parameters according to a preset layout matching requirement.

In some embodiments, the performing a matching precision detection process on the layout parameter according to the dispersion matching standard includes:

obtaining the minimum unit number ratio of each row and each column according to the number of the row triodes and the number of the column triodes;

obtaining a line number proportion and a column number proportion of which the minimum unit number ratio is equal to the total multiple ratio of the triode;

obtaining a first dispersibility matching result under the condition that the line number proportion is smaller than a preset proportion or the column number proportion is smaller than the preset proportion;

obtaining a second dispersibility matching result when the line number proportion and the column number proportion are larger than the preset proportion and the line number proportion and the column number proportion are not equal to 1;

obtaining a third dispersibility matching result when the line number proportion and the column number proportion are larger than the first preset proportion and the line number proportion or the column number proportion is equal to 1;

obtaining a fourth dispersibility matching result under the condition that the row number proportion and the column number proportion are equal to 1;

under the condition that the first dispersity matching result is obtained, modifying the layout parameters; and under the condition that the second dispersity matching result or the third dispersity matching result is obtained, modifying the layout parameters according to a preset layout matching requirement.

In some embodiments, the method comprises:

when the circuit diagram matching result or the layout matching result corresponding to the layout matching standards is obtained, a matching precision report is generated according to the circuit diagram matching result or the layout matching result, and the matching precision report is output.

In a second aspect, an embodiment of the present application provides a controller, including a memory, a processor, and a computer program stored in the memory and capable of running on the processor, where the processor implements the method for detecting matching accuracy of a triode according to any one of the embodiments of the first aspect when the processor executes the computer program.

In a third aspect, an embodiment of the present application provides a computer readable storage medium storing computer executable instructions for performing the method for detecting matching accuracy of a triode according to any one of the embodiments of the first aspect.

The application has at least the following beneficial effects: the application provides a method for detecting matching precision of triodes, which comprises the steps of obtaining circuit diagram parameters of a plurality of triodes to be matched in a circuit diagram to be detected; performing matching precision detection processing on the circuit diagram parameters according to a preset circuit diagram matching standard to obtain a circuit diagram matching result, and modifying the circuit diagram parameters according to the circuit diagram matching result; obtaining a layout to be detected generated according to the circuit diagram to be detected, and obtaining layout parameters of a plurality of triodes to be matched in the layout to be detected; according to the scheme, matching precision detection can be timely performed in both the circuit design stage and the layout design stage, problems are found, detection time is effectively shortened, detection efficiency is improved, detection is respectively performed according to matching characteristics such as compactness, consistency, symmetry and dispersibility, integrity and accuracy of detecting triode matching results are effectively guaranteed, automatic process of detecting triodes is improved, and the layout design can be effectively performed.

There are at least the following improvements over the prior art:

1) In some embodiments, the matching result detection is performed on the triode to be matched in the circuit diagram, and the matching result standard is provided, so that the problem can be found in time in the design stage of the circuit diagram;

2) In some embodiments, when detecting the matching result of the transistor to be matched in the layout, the judgment of interrupting the detection flow (when the layout parameters of a plurality of transistors to be matched are different, outputting an interrupt detection report) is added, so that the problem can be found timely in the layout design stage;

3) In some embodiments, in the process of detecting the layout, the layout is detected according to the matching characteristics such as compactness, consistency, symmetry, dispersibility and the like, so that the integrity and the accuracy of the layout matching result detection are improved;

4) In some embodiments, the detection of the four characteristics of triode matching in the process of detecting the layout gives a matching result standard (mismatch, low-level matching, moderate matching and high-level matching) and a default value thereof respectively, and the matching result standard (low-level matching and moderate matching) can be adjusted according to actual requirements (preset layout matching requirements) so as to be more flexible and effective;

5) And all detection results are written into one result report, so that the user can check the detection results conveniently, and the parameters of the triode are modified, so that the user experience is improved effectively.

Drawings

FIG. 1 is a flow chart of a triode matching result detection system according to an embodiment of the present application;

fig. 2 is a schematic diagram of a circuit diagram and layout of a transistor according to another embodiment of the present application;

FIG. 3 is a schematic diagram of a transistor array in a layout according to another embodiment of the present application;

fig. 4 is a flowchart of a matching accuracy detection process for circuit diagram parameters according to a preset circuit diagram matching standard in a matching accuracy detection method for a triode according to another embodiment of the present application;

fig. 5 is a flowchart of a matching accuracy detection process for layout parameters according to a plurality of preset layout matching standards in the detection of a matching result of a triode according to another embodiment of the present application;

FIG. 6 is a flowchart of a matching accuracy detection process for layout parameters according to a compact matching standard in the detection of matching results of transistors according to another embodiment of the present application;

fig. 7 is a flowchart of a matching accuracy detection process for layout parameters according to a consistency matching standard in the detection of a matching result of a triode according to another embodiment of the present application;

FIG. 8 is a flowchart of a matching accuracy detection process for layout parameters according to a symmetry matching standard in the detection of a matching result of a triode according to another embodiment of the present application;

fig. 9 is a flowchart of a matching accuracy detection process for layout parameters according to a dispersion matching standard in the detection of a matching result of a triode according to another embodiment of the present application;

fig. 10 is a block diagram of a controller according to another embodiment of the present application.

Reference numerals: 301. a triode array distribution pattern; 302. triode minimum unit.

Detailed Description

The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.

In some embodiments, although functional block division is performed in a system diagram, logical order is shown in a flowchart, in some cases, steps shown or described may be performed in a different order than block division in a system, or in a flowchart. The terms first, second and the like in the description and in the claims and in the above-described figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order.

Furthermore, unless explicitly specified and limited otherwise, the term "coupled/connected" is to be interpreted broadly, as for example, being either fixedly coupled or movably coupled, being either detachably coupled or not detachably coupled, or being integrally coupled; can be mechanically connected, electrically connected or can be communicated with each other; can be directly connected or indirectly connected through an intermediate medium.

In the description of the embodiments of the present application, the descriptions of the terms "one embodiment/implementation," "another embodiment/implementation," or "certain embodiments/implementations," "the above embodiments/implementations," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or examples is included in at least two embodiments or implementations of the present disclosure. In the present disclosure, schematic representations of the above terms do not necessarily refer to the same illustrative embodiment or implementation. It should be noted that although a logical order is illustrated in the flowchart, in some cases, the steps illustrated or described may be performed in an order different from that in the flowchart.

In the design of integrated circuits, there is a need for transistor matching in various analog circuits, such as differential pairs, current mirrors, etc. However, in the chip manufacturing process, the transistor is often mismatched, and the reasons for the transistor mismatch can be classified into random mismatch and systematic mismatch. The random mismatch refers to mismatch caused by microscopic fluctuation of parameters influencing the characteristics of the triode, such as the size, the doping concentration, the thickness of an oxide layer and the like of the triode. The system mismatch refers to transistor mismatch due to process variations, contact hole resistance, interactions between diffusion regions, mechanical pressure and temperature gradients, process parameter gradients, and the like. In the process of circuit design and layout design, the random mismatch and the system mismatch are required to be reduced to achieve a higher matching result, so that the matching result of the triode to be matched is required to be detected, and the current detection method for the matching result of the triode is as follows: and covering all the triodes to be matched with a specific layer, and then carrying out density and virtual co-lining related inspection, wherein the matching results are different, and the related inspection is also different. However, the conventional method cannot detect the matching result between the triodes to be matched, and the matching result between the triodes has to be checked manually, which is time-consuming and cannot ensure the integrity and accuracy of the check.

In order to solve at least the above-mentioned problem, the application has proposed the matching result of the triode that can be detected and need to match fast, and guarantee the matching accuracy detection method of the triode of integrality and accuracy of detection, through obtaining the circuit diagram parameter of a plurality of triodes that need to match in the circuit diagram to be detected; performing matching precision detection processing on circuit diagram parameters according to a preset circuit diagram matching standard to obtain a circuit diagram matching result, and modifying the circuit diagram parameters according to the circuit diagram matching result; obtaining a layout to be detected generated according to a circuit diagram to be detected, and obtaining layout parameters of a plurality of triodes to be matched in the layout to be detected; according to the scheme, matching precision detection can be timely performed in both a circuit design stage and a layout design stage by performing matching result detection in the circuit design stage and the layout design stage respectively, so that the detection time is effectively shortened, the detection efficiency is improved, the detection integrity and accuracy of triode matching result detection are effectively ensured, the automation process of triode detection is improved, and the layout design can be effectively performed.

Embodiments of the present application are further described below with reference to the accompanying drawings.

Referring to fig. 1, fig. 1 is a flowchart of a method for detecting matching accuracy of a triode according to an embodiment of the present application; in some embodiments, the method for detecting matching accuracy of the triode at least comprises the following steps:

step S110, obtaining circuit diagram parameters of a plurality of triodes to be matched in a circuit diagram to be detected;

step S120, carrying out matching precision detection processing on circuit diagram parameters according to a preset circuit diagram matching standard to obtain a circuit diagram matching result, and modifying the circuit diagram parameters according to the circuit diagram matching result;

step S130, obtaining a to-be-detected layout generated according to the to-be-detected circuit diagram, and obtaining layout parameters of a plurality of triodes to be matched in the to-be-detected layout;

step S140, performing matching precision detection processing on layout parameters according to a plurality of preset layout matching standards to obtain a plurality of layout matching results, and modifying the layout parameters according to the layout matching results, wherein the layout matching standards comprise: compact matching criteria, consistent matching criteria, symmetric matching criteria, and dispersive matching criteria.

In some embodiments, the method for obtaining the circuit diagram parameters of the triodes to be matched in the circuit diagram to be detected and obtaining the layout parameters of the triodes to be matched in the circuit diagram to be detected are obtained by performing simulation analysis through circuit simulation software or importing the layout through layout editing software and then performing layout design analysis, and the simulation or design software for extracting the circuit diagram or the layout parameters is a conventional technical means of a person skilled in the art, and how to obtain the parameters does not limit the implementation of the scheme of the method.

In some embodiments, the present application performs the matching result detection in the circuit design stage and the layout design stage, respectively, and it is conceivable that in the conventional layout design flow, the matching result detection of the transistor is usually performed after the layout design is completed. If the detection result does not meet the design requirement, the circuit diagram and the layout are required to be modified, and then the circuit simulation and the layout design are carried out again, so that the design period is prolonged. In the scheme, the detection of the matching result is advanced to the circuit design stage, which means that if the matching result of the triode cannot meet the design requirement in the circuit diagram design stage, a designer can modify the matching result in time on the premise of not influencing the follow-up step, so that the extension of the design period can be reduced, and the circuit design efficiency is improved.

In some embodiments, the circuit diagram matching corresponding to the steps S110 to S120 is triode detection, by matching preset circuit diagram standards and circuit diagram parameters to be detected, a more accurate matching result can be obtained, the situations of misjudgment and missed detection are reduced, the detection accuracy is improved, and meanwhile, the circuit diagram parameters are modified according to the circuit diagram matching result, so that the accuracy and the robustness of the circuit diagram matching are further improved; the layout matching is a second step of triode detection, and comprises compact matching, consistency matching, symmetry matching, dispersity matching and the like, a more accurate matching result can be obtained by matching preset layout matching standards and layout parameters to be detected, the detection accuracy is improved, and the accuracy and the robustness of the layout matching are further improved by modifying the layout parameters according to the layout matching result, so that the accuracy and the efficiency of triode detection are effectively improved.

Referring to fig. 2, fig. 2 is a schematic diagram of a circuit diagram and a layout of a transistor according to another embodiment of the present application, where (a) in fig. 2 represents that transistor cells in the circuit diagram include an emitter, a collector, and a base, and parameter information corresponding to the emitter length, the emitter width, the emitter area, multiple, and the like, and (b) is 2 (m=2) minimum cells of the transistor in the layout design corresponding to (a), and in the step of detecting whether each transistor to be matched meets a basic condition of matching, it is required to ensure that the minimum cells of the transistor in the layout design are completely identical.

Referring to fig. 3, fig. 3 is a schematic diagram of a triode array in a layout according to another embodiment of the present application, in which, in a process of detecting a triode layout matching result, a distribution pattern 301 of the triode array is calculated according to acquired parameter information, as shown in fig. 3, the triode array distribution pattern 301 is a minimum pattern capable of completely covering all triode minimum units 302, that is, a matching array layout including a plurality of triode minimum unit 302 layouts needing to be matched, and an array length and an array width of the matching array are an array length and an array width in a process of detecting a triode compact matching result, and the matching array is divided into columns of the triode array in a process of detecting a matching result of a triode dispersion corresponding to a row-column number.

Referring to fig. 4, fig. 4 is another flowchart of a triode matching result detection system according to another embodiment of the present application; the circuit diagram parameters comprise triode types, emitter lengths, emitter widths, emitter areas and multiples, and the circuit diagram parameters of a plurality of triodes needing to be matched in the circuit diagram to be detected are obtained, and the method at least comprises the following steps: acquiring Emitter Lengths (EL), emitter Widths (EW) and multiples (M) of a plurality of triodes to be matched in a circuit diagram to be detected; the emitter Area (AE) is obtained from the emitter width and the emitter length, and the emitter Area (AE) =emitter length (EL) ×emitter width (EW).

Performing matching precision detection processing on circuit diagram parameters according to a preset circuit diagram matching standard to obtain a circuit diagram matching result, and modifying the circuit diagram parameters according to the circuit diagram matching result, wherein the method at least comprises the following steps:

step S401, obtaining circuit diagram parameters of all triodes to be matched;

under the condition that the types of the triodes to be matched are different, or the emitter lengths are different, or the emitter widths are different, a first circuit matching result is obtained, and circuit diagram parameters are modified according to the first circuit matching result;

step S402, judging whether the triode types, emitter lengths or emitter widths are the same;

Under the conditions that the types, emitter lengths and emitter widths of the triodes to be matched are the same and the emitter lengths and emitter widths are unequal, obtaining a second circuit matching result, and modifying circuit diagram parameters according to the second circuit matching result and a first preset matching requirement;

step S403, judging whether the emitter length and the emitter width are equal;

under the condition that the types, emitter lengths and emitter widths of the triodes to be matched are the same, the emitter lengths and emitter widths are equal, the open square root of the multiple sum is not an integer, a third circuit matching result is obtained, and circuit diagram parameters are modified according to the third circuit matching result and a second preset matching requirement;

step S404, judging whether the open square root of the multiple sum is an integer;

under the condition that the types, the emitter lengths and the emitter widths of the triodes which are required to be matched are the same, the emitter lengths and the emitter widths are equal, and the open square root of the multiple sum is an integer, generating a layout to be detected according to the circuit diagram to be detected.

In some embodiments, the first circuit is not matched, and the types of the triodes are different, or the emitter lengths of the triodes are different, or the emitter widths are different; the second circuit matching result is low-level matching, the types of the triodes are the same, the emitter length and the emitter width of each triode are the same, but the emitter length and the emitter width of each triode are not equal; the third circuit matching result is moderate matching, the types of the triodes are the same, the emitter length and the emitter width of each triode are the same, and meanwhile, the emitter length and the emitter width of each triode are equal, but the open square root of the multiple sum is not an integer; when the types of the triodes are the same, the emitter length (L) and the emitter width (Fw) of each triode are the same, and the open square root of the multiple sum is an integer, the circuit diagram matching result is high matching, and the parameters of the triodes are not required to be modified at the moment.

In some embodiments, the circuit diagram parameters with the matching result of no matching are modified according to the first circuit matching result, the circuit diagram parameters with the matching result of low-level matching and medium-level matching are modified according to the preset matching requirements respectively, and the circuit diagram parameters with the matching result of high-level matching are not modified, so that the matching result is adjustable, the method can adapt to more application scenes and application requirements, the default value of the matching result standard with the matching result of low-level matching and medium-level matching can adapt to most application scenes and application requirements, and if special application scenes and application requirements exist, the matching result standard or the circuit diagram parameters with the low-level matching and medium-level matching are adjusted in a reasonable range so as to meet the user requirements.

The steps S401 to S404 correspond to the process of detecting the matching result of the transistor to be matched in the circuit diagram in the present application, and the complete process is as follows:

1) Acquiring parameter information of a triode to be matched in a circuit diagram;

2) Detecting the matching result of the triodes to be matched according to the acquired parameter information of each triode to be matched;

3) Outputting a detection result report;

4) Modifying parameters of the triode in the circuit diagram according to the detection result report;

5) Repeating the steps 1-4 until the detection result meets the requirement;

6) And (5) finishing detection.

Through the steps, until the output triode parameter meets the circuit diagram with the precision requirement, the subsequent layout design stage is ensured, and the hidden trouble that the design of the layout needs to be redesigned due to the fact that the matching result of the triode does not meet the design requirement is avoided.

In some embodiments, the layout parameters include emitter information, collector information, base information, and contact hole information of the triode minimum; the emitter information comprises the emitter length, the emitter width and the emitter center point coordinates of the triode; the collector information includes a plurality of vertex coordinate information on the collector ring; the base information comprises a plurality of vertex coordinate information on a base polar ring; the contact hole information comprises the sizes, the numbers and the relative positions of a plurality of contact holes corresponding to the emitter, the collector and the base, wherein the relative positions are the relative positions of the contact holes in the emitter, the collector and the base.

Specifically, emitter information, collector information, base information and contact hole information of each electrode of each triode minimum unit to be matched are obtained, wherein the emitter information comprises: emitter Length (EL), emitter Width (EW), emitter center coordinates; the collector information includes: coordinates of each vertex on the collector ring; the base information includes: coordinates of each vertex on the base ring; contact hole information of each pole: the size of the single contact hole, the number of contact holes, the relative positions of the contact holes at each pole, etc.

In some embodiments, performing matching precision detection processing on layout parameters according to a plurality of preset layout matching standards to obtain a plurality of layout matching results, and modifying the layout parameters according to the layout matching results, including: under the condition that the layout parameters of a plurality of triodes to be matched are the same, carrying out matching precision detection processing on the layout parameters according to a plurality of preset layout matching standards to obtain a plurality of layout matching results, and modifying the layout parameters according to the layout matching results; under the condition that layout parameters of a plurality of triodes needing to be matched are different, outputting an interrupt detection report, and modifying the layout parameters according to the interrupt detection report.

Specifically, whether each triode to be matched meets the basic conditions of matching is detected, and the basic conditions include: the Emitter Length (EL), emitter Width (EW) and the distance from each corresponding peak point to the emitter center point on the collector ring of each triode to be matched are the same, namely the minimum unit in the figure 2 is the same, if the basic condition is not met, the minimum unit is not matched, interruption is detected, an interruption detection report is output, parameters of the triode are modified in the layout, the detection is repeated until the basic condition of matching is met, and the matching result of the triode to be matched in the layout can be more comprehensively known by respectively detecting four characteristics which can be matched in the subsequent step.

Referring to fig. 5, fig. 5 is another flowchart of a matching result detection system for a triode according to another embodiment of the present application, in some embodiments, the matching precision detection process is performed on layout parameters according to a plurality of preset layout matching criteria, and the method at least includes the following steps:

step S510, calculating and generating a triode array distribution pattern corresponding to the triode according to the layout parameters;

step S520, obtaining the array length and the array width of the corresponding triode array according to the triode array distribution pattern, and carrying out matching precision detection processing on layout parameters according to the compactness matching standard;

step S530, obtaining a reference centroid coordinate and centroid coordinates of a plurality of triodes to be matched according to a triode array distribution pattern, and carrying out matching precision detection processing on layout parameters according to a consistency matching standard and a symmetry matching standard;

and S540, obtaining the number of row triodes and the number of column triodes in each row and each column of the corresponding triode array according to the triode array distribution pattern, and carrying out matching precision detection processing on layout parameters according to the dispersity matching standard.

In some embodiments, obtaining a layout matching result according to a plurality of preset layout matching standards and layout parameters includes: generating a triode array distribution pattern corresponding to the triode according to the layout parameter calculation; obtaining a triode array length and a triode array width according to the triode array distribution pattern, and obtaining a compact matching result according to the shape of the triode array distribution pattern, the triode array length and the triode array width; and obtaining a reference centroid coordinate and centroid coordinates of a plurality of triodes to be matched according to the triode array distribution pattern: obtaining a consistency matching result according to the distances between the barycenter coordinates of the triodes to be matched and the reference barycenter coordinates and a preset distance range; and obtaining a reference centroid coordinate and centroid coordinates of a plurality of triodes to be matched according to the triode array distribution pattern, and establishing an X axis and a Y axis according to the reference centroid coordinate to obtain a dispersity matching result.

Corresponding to fig. 6 to 9, the specific process of obtaining a layout matching result according to a plurality of preset layout matching standards and layout parameters and modifying the layout parameters according to the layout matching result is as follows:

referring to fig. 6, fig. 6 is a flowchart of a matching precision detection process for layout parameters according to a compact matching standard in the detection of a matching result of a triode according to another embodiment of the present application, and the matching precision detection process for the layout parameters according to the compact matching standard includes the following steps:

step S601, obtaining an aspect ratio value according to the array length and the array width:

step S602, judging whether the shape of the triode array distribution pattern is rectangular, if so, jumping to step S603, and if not, obtaining a mismatch result; and under the condition that the shape of the triode array distribution pattern is not rectangular, obtaining a first compactness matching result.

Step S603, judging whether the length-width ratio value is smaller than 1.2, if yes, jumping to step S604, otherwise, obtaining a low-level matching result; under the condition that the shape of the triode array distribution pattern is rectangular and the length-width ratio value is in a first preset ratio range, a second compactness matching result is obtained, and the situation that the second compactness matching result is larger than or equal to 1.2 is the preferable preset ratio range;

Step S604, judging whether the length-width ratio value is equal to 1, if so, obtaining a high matching result, and if not, obtaining a moderate matching result; the aspect ratio value is equal to 1, which indicates that the shape of the triode array distribution pattern is square, and a third compactness matching result is obtained under the condition that the shape of the triode array distribution pattern is rectangular and the aspect ratio value is in a second preset ratio range; and under the condition that the shape of the triode array distribution pattern is square, obtaining a fourth compactness matching result.

The first compact matching result is a non-matching result, the second compact matching result is a low-level matching result, the third compact matching result is a medium-level matching result, and the fourth compact matching result is a high-level matching result; under the condition that a first compactness matching result is obtained, modifying layout parameters; and under the condition that the second compact matching result or the third compact matching result is obtained, modifying layout parameters according to the preset layout matching requirement.

Specifically, a distribution pattern of the triode array is calculated through the acquired parameter information, the pattern is a minimum pattern which can completely cover the minimum units of all triodes, the shape and the size of each side of the pattern are detected, a matching result is judged according to the detection result, and the matching result judging standard is as follows: mismatch: the pattern is not rectangular; low-level matching: the pattern is rectangular, and the ratio of the emitter length to the emitter width is more than or equal to 1.2 (other values can be set); moderately matching: the pattern is rectangular, and the ratio of the emitter length to the emitter width is more than 1 and less than 1.2 (other values can be set); height matching: the graph is square; after the detection result is obtained, the detection result is written into a matching precision report so as to be convenient for a user to check.

Referring to fig. 7, fig. 7 is a flowchart illustrating a process of detecting matching accuracy of layout parameters according to a consistency matching criterion in detecting a matching result of a triode according to another embodiment of the present application; performing matching precision detection processing on layout parameters according to consistency matching standards, wherein the method comprises the following steps:

step S701, calculating distances between a plurality of centroid coordinates and a reference centroid coordinate;

step S702, judging whether the distance is smaller than 1pitch, if yes, jumping to step S703, otherwise, obtaining a non-matching result; wherein 1pitch: the distance between emitter center coordinates of the minimum units of adjacent triodes and the distance between the minimum units of adjacent triodes is adjustable, and the distance can be modified according to actual conditions; obtaining a first consistency matching result under the condition that the distance is greater than or equal to a first distance threshold value;

step S703, judging whether the distance is smaller than 0.2pitch, if yes, jumping to step S704, otherwise, obtaining a low-level matching result; obtaining a second consistency matching result when the distance is smaller than the first distance threshold and larger than or equal to the second distance threshold;

step S704, judging whether the distance is equal to 0, if so, obtaining a high matching result, and if not, obtaining a moderate matching result; obtaining a third consistency matching result when the distance is smaller than the second distance threshold and larger than 0; under the condition that the distance is equal to 0, a fourth consistency matching result is obtained;

The first consistency matching result is a non-matching result, the second consistency matching result is a low-level matching result, the third consistency matching result is a medium-level matching result, and the fourth consistency matching result is a high-level matching result; under the condition that a first consistency matching result is obtained, modifying layout parameters; and under the condition that the second consistency matching result or the third consistency matching result is obtained, modifying layout parameters according to the preset layout matching requirement.

The specific process is as follows:

and according to the detected triode array distribution pattern, taking the central point of the pattern as the reference centroid of the matching array. According to the detected parameter information of each triode needing to be matched, calculating to obtain the barycenter coordinate of each triode needing to be matched, detecting the distance between the barycenter coordinate of each triode needing to be matched and the reference barycenter coordinate to judge the matching result, wherein the matching result judging standard is as follows: mismatch: the distance between the barycenter coordinates of the triodes to be matched and the reference barycenter coordinates is more than or equal to 1pitch; low-level matching: the distance between the barycenter coordinates of the triodes to be matched and the reference barycenter coordinates is more than or equal to 0.1pitch and less than 1pitch; moderately matching: the distance between the barycenter coordinates of the triodes to be matched and the reference barycenter coordinates is smaller than 0.1pitch; height matching: the barycenter coordinates of all the triodes to be matched are completely coincident with the reference barycenter coordinates; after the detection result is obtained, the detection result is written into a matching precision report.

Referring to fig. 8, fig. 8 is a flowchart illustrating a process of detecting matching accuracy of layout parameters according to a symmetry matching criterion in detecting matching results of transistors according to another embodiment of the present application; performing matching precision detection processing on layout parameters according to symmetry matching standards, wherein the method comprises the following steps:

step S801, an X axis and a Y axis are established by taking a reference centroid coordinate as an origin;

step S802, if the centroid coordinates are symmetrical about the center of the reference centroid coordinates, jumping to step S803 if yes, and if not, obtaining a non-matching result; under the condition that barycenter coordinates of a plurality of triodes to be matched are not centrosymmetric with respect to a reference barycenter coordinate, a first symmetry matching result is obtained;

step S803, if the barycenter coordinates are symmetrical about the X axis or the Y axis, jumping to step S804 if yes, otherwise obtaining a low-level matching result; under the condition that the barycenter coordinates of the triodes to be matched are centrally symmetrical about the reference barycenter coordinates and are not symmetrical about the X axis and the Y axis, a second symmetry matching result is obtained;

step S804, whether the barycenter coordinates are symmetrical about the X axis and the Y axis, if so, a high matching result is obtained, and if not, a moderate matching result is obtained; under the condition that the barycenter coordinates of the triodes to be matched are centrally symmetrical with respect to the reference barycenter coordinates and symmetrical with respect to one of an X axis or a Y axis, a third symmetry matching result is obtained; under the condition that the barycenter coordinates of the triodes to be matched are centrally symmetrical with respect to the reference barycenter coordinates and symmetrical with respect to the X axis and the Y axis, a fourth symmetry matching result is obtained;

The first symmetry matching result is a non-matching result, the second symmetry matching result is a low-level matching result, the third symmetry matching result is a medium-level matching result, and the fourth symmetry matching result is a high-level matching result; under the condition that a first symmetry matching result is obtained, modifying layout parameters; under the condition that the second symmetry matching result or the third symmetry matching result is obtained, modifying layout parameters according to the preset layout matching requirement

The specific process is as follows:

and according to the detected triode array distribution pattern, taking the central point of the pattern as the reference centroid of the matching array. And establishing a coordinate system by taking the reference centroid as an origin to obtain an X axis and a Y axis, wherein the triode array distribution pattern is symmetrical about the X axis and the Y axis respectively and is symmetrical about the origin center. Detecting symmetry judgment matching results of all triodes needing to be matched in the array about an X axis, a Y axis and an origin, wherein the matching result judgment criteria are as follows: mismatch: each triode to be matched in the array is not centrosymmetric with respect to an origin; low-level matching: each triode to be matched in the array is symmetrical about the center of the origin, and is asymmetrical about the X axis and the Y axis; moderately matching: each triode to be matched in the array is symmetrical about the center of the origin, and is symmetrical about only one of the X axis or the Y axis; height matching: each triode to be matched in the array is symmetrical about the center of the origin, and is symmetrical about the X axis and the Y axis; after the detection result is obtained, the detection result is written into a matching precision report.

Referring to fig. 9, fig. 9 is a flowchart illustrating a process of detecting matching accuracy of layout parameters according to a dispersion matching standard in detecting a matching result of a triode according to another embodiment of the present application; performing matching precision detection processing on layout parameters according to a dispersion matching standard, wherein the method comprises the following steps of:

step S901, obtaining the minimum unit number ratio of each row and each column according to the number of the plurality of row triodes and the number of the column triodes; obtaining a line number proportion and a column number proportion of which the minimum unit number ratio is equal to the total multiple ratio of the triode;

step S902, the line number proportion and the column number proportion are larger than or equal to 0.5, if yes, the step S903 is skipped, and if not, a non-matching result is obtained; obtaining a first dispersity matching result under the condition that the row number proportion is smaller than a preset proportion or the column number proportion is smaller than the preset proportion;

step S903, the line number ratio or the column number ratio is equal to 1, namely judging whether the number ratio of all lines to more than half of columns is the same as the total multiple ratio or the number ratio of all columns to more than half of columns is the same as the total multiple ratio, if yes, jumping to step S904, and if not, obtaining a low-level matching result; obtaining a second dispersibility matching result under the condition that the row number proportion and the column number proportion are larger than a preset proportion and the row number proportion and the column number proportion are not equal to 1;

Step S904, the ratio of the number of rows to the number of columns is equal to 1, namely, whether the ratio of the number of all rows to the number of columns is the same as the total multiple is judged, if yes, a high matching result is obtained, and if not, a moderate matching result is obtained; obtaining a third dispersity matching result under the condition that the row number proportion and the column number proportion are larger than a first preset proportion and the row number proportion or the column number proportion is equal to 1;

the first dispersity matching result is a non-matching result, the second dispersity matching result is a low-level matching result, the third dispersity matching result is a medium-level matching result, and the fourth dispersity matching result is a high-level matching result; under the condition that a first dispersity matching result is obtained, modifying layout parameters; and under the condition that a second dispersive matching result or a third dispersive matching result is obtained, modifying layout parameters according to preset layout matching requirements.

The specific process is as follows:

the matching triodes are distributed according to an array and divided into a row and b columns, the number of minimum units of the triodes to be matched in each row and each column is detected according to the obtained position information of the triodes to be matched, the number ratio of the minimum units of the triodes to be matched in each row and each column is calculated, the number ratio is compared with the total multiple ratio (M) to judge a matching result, and the matching result judging standard is as follows: mismatch: the preset percentage is the same as the ratio (M) of the total multiple of all the triodes to be matched by the ratio of the number of the minimum units of all the triodes to be matched, which are listed as the following, or the preset percentage; low-level matching: the ratio of the number of the minimum units of the triodes to be matched, which are up to the preset percentage and are up to the preset percentage, is the same as the ratio (M) of the total multiples of the triodes to be matched; moderately matching: the ratio of the numbers of the minimum units of all the lines to be matched with the preset percentage is the same as the ratio of the total multiples of all the triodes to be matched (M), or the ratio of the numbers of the minimum units of all the lines to be matched with the preset percentage is the same as the ratio of the total multiples of all the triodes to be matched (M); height matching: the ratio of the number of the minimum units of the triodes to be matched in all rows and all columns is the same as the ratio (M) of the total multiples of the triodes to be matched; the preset percentage can be modified into specific numbers according to actual conditions, the preset percentage is preferably 50%, and the detection of the matching result of the triode dispersibility can be more effectively carried out; after the detection result is obtained, the detection result is written into a matching precision report.

In some embodiments, after the matching result detection of compactness, consistency, symmetry and dispersity of the triode is completed, a detection result report comprising the matching results of all detection items is output, so that a layout designer can be effectively helped to comprehensively know the matching condition of the triode, and the efficiency of the layout design is improved.

In some embodiments, modifying layout parameters based on layout matching results includes: modifying layout parameters under the condition of obtaining a first compactness matching result, a first consistency matching result, a first symmetry matching result or a first dispersivity matching result; under the condition that a second compactness matching result, a second consistency matching result, a second symmetry matching result or a second dispersivity matching result is obtained, layout parameters are modified according to preset layout matching requirements, it is conceivable that corresponding layouts are modified according to detection results, then the detection is repeated until the matching results of all detection items meet the requirements, unmatched detection items are modified, detection items of low-level matching and medium-level matching can be modified according to the matching requirements of triodes, the detection items of high-level matching are not modified, and detection is completed.

The above-mentioned figures 6 to 9 correspond to the detection of matching results of compactness, consistency, symmetry and dispersity of the triode, and the complete process of obtaining the layout matching result according to a plurality of preset layout matching standards and layout parameters and modifying the layout parameters according to the layout matching result is as follows:

1) Acquiring parameter information of triodes to be matched in a layout;

2) Detecting whether each triode to be matched meets the basic condition of matching or not;

3) Detecting a matching result of triode compactness;

4) Detecting a matching result of triode consistency;

5) Detecting the matching result of triode symmetry;

6) Detecting a matching result of triode dispersibility;

7) Outputting detection result reports of all detection items;

8) Modifying the corresponding layout according to the detection result, and repeating the detection until the matching result of each inspection item meets the requirement;

9) And (5) finishing detection.

In some embodiments, the method includes, when obtaining a circuit diagram matching result or a layout matching result corresponding to a plurality of layout matching criteria, generating a matching accuracy report according to the circuit diagram matching result or the layout matching result, and outputting the matching accuracy report.

In summary, the application has at least the following beneficial effects:

The matching result of the triode to be matched can be judged in the circuit design stage, and the project period is greatly shortened. If the matching result of the triode to be matched does not meet the design requirement after the layout design is finished, the triode size needs to be modified in the circuit diagram, the front simulation of the circuit needs to be reworked, and the layout needs to be redesigned, which is equivalent to twice the design period. If the matching result of the triode is found to not meet the design requirement in the circuit design stage, the front simulation of the circuit can be carried out without reworking, and the layout design also has no hidden trouble of redesign caused by the reworking.

The detection time can be greatly shortened by adding the judgment of interrupting the detection flow when the matching result of the matching triode in the detection layout. Because the triode does not meet the basic requirement of matching, the later detection can be omitted, and the time spent in the detection in the layout can be greatly shortened.

The matching result of the triodes to be matched in the layout can be more comprehensively known by respectively detecting the four matched characteristics. According to the final detection result report, the place causing the mismatch of the triode layout can be visually checked, and a layout designer can formulate an optimal layout modification scheme, so that the layout design time is shortened.

The matching result is adjustable, so that the method can adapt to more application scenes and application requirements. The default value of the matching result standard can adapt to most application scenes and application requirements, and if special application scenes and application requirements exist, the matching result standard is also supported in a reasonable range.

The result is written into a result report, so that a layout designer can be helped to comprehensively know the matching condition of the triode, and the efficiency of the layout design is improved.

It is noted that, the application modifies the parameters of the non-matched or low-level matched and moderate-level matched triode according to the detection result, the result report and the interrupt report, so that the triode parameter reaches a higher matching result, and a person skilled in the art can choose a mode of modifying the triode parameter according to the actual situation.

Referring to fig. 10, fig. 10 is a schematic structural diagram of a controller according to an embodiment of the present application.

Some embodiments of the present application provide a controller including a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor executes the computer program to implement the matching accuracy detection method of the triode according to any one of the above embodiments, for example, executing the method steps S110 to S140 in fig. 1, the method steps S401 to S404 in fig. 4, the method steps S601 to S604 in fig. 6, the method steps S701 to S704 in fig. 7, the method steps S801 to S804 in fig. 8, and the method steps S901 to S904 in fig. 9 described above.

The controller 1000 of the present embodiment includes one or more processors 1010 and a memory 1020, one processor 1010 and one memory 1020 being illustrated in fig. 10.

The processor 1010 and the memory 1020 may be connected by a bus or otherwise, for example in fig. 10.

Memory 1020 is a non-transitory computer readable storage medium that may be used to store non-transitory software programs as well as non-transitory computer executable programs. In addition, memory 1020 may include high-speed random access memory and may also include non-transitory memory, such as at least one magnetic disk storage device, flash memory device, or other non-transitory solid state storage device. In some embodiments, memory 1020 optionally includes memory 1020 located remotely from processor 1010, which may be connected to controller 1000 via a network, examples of which include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.

In some embodiments, the matching accuracy detection method of the triode according to any one of the above embodiments is performed at a preset interval when the processor executes the computer program.

Those skilled in the art will appreciate that the device structure shown in fig. 10 is not limiting of the controller 1000 and may include more or fewer components than shown, or may combine certain components, or a different arrangement of components.

In the controller 1000 shown in fig. 10, the processor 1010 may be configured to invoke the matching accuracy detection method of the transistor stored in the memory 1020, thereby implementing the matching accuracy detection method of the transistor.

Based on the hardware structure of the controller 1000, various embodiments of the triode matching result detection system of the present application are presented, and at the same time, a non-transitory software program and instructions required for implementing the triode matching precision detection method of the above embodiments are stored in a memory, and when executed by a processor, the triode matching precision detection method of the above embodiments is executed.

In addition, the embodiment of the application also provides a matching result detection system of the triode, which comprises the controller.

In some embodiments, since the matching result detection system for a triode according to the embodiment of the present application has the controller of the above embodiment, and the controller of the above embodiment is capable of executing the matching precision detection method for a triode of the above embodiment, specific implementation and technical effects of the matching result detection system for a triode of the present application may refer to specific implementation and technical effects of the matching precision detection method for a triode of any of the above embodiments.

The embodiment of the present application also provides a computer-readable storage medium storing computer-executable instructions for performing the above-described matching accuracy detection method of a triode, for example, the one or more processors may be caused to perform the above-described matching accuracy detection method of a triode in the method embodiment, and perform the above-described method steps S110 to S140 in fig. 1, the method steps S401 to S404 in fig. 4, the method steps S601 to S604 in fig. 6, the method steps S701 to S704 in fig. 7, the method steps S801 to S804 in fig. 8, and the method steps S901 to S904 in fig. 9.

The above described apparatus embodiments are merely illustrative, wherein the units illustrated as separate components may or may not be physically separate, i.e. may be located in one place, or may be distributed over a plurality of network nodes. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

Those of ordinary skill in the art will appreciate that all or some of the steps, systems, and methods disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. Some or all of the physical components may be implemented as software executed by a processor, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer readable storage media (or non-transitory media) and communication media (or transitory media). The term computer-readable storage medium includes volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information, such as computer-readable instructions, data structures, program modules or other data, as known to those skilled in the art. Computer-readable storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed by a computer. Furthermore, as is well known to those of ordinary skill in the art, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media.

While the preferred embodiment of the present application has been described in detail, the present application is not limited to the above embodiment, and those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present application, and these equivalent modifications or substitutions are included in the scope of the present application as defined in the appended claims.

Claims

1. The method for detecting the matching precision of the triode is characterized by comprising the following steps of:

2. The method for detecting matching accuracy of a transistor according to claim 1, wherein the circuit diagram parameters include a transistor type, an emitter length, an emitter width, an emitter area and a multiple, the emitter area is a product of the emitter length and the emitter width, the circuit diagram parameters are subjected to matching accuracy detection according to a preset circuit diagram matching standard to obtain a circuit diagram matching result, and the circuit diagram parameters are modified according to the circuit diagram matching result, including:

3. The method for detecting matching accuracy of a transistor according to claim 1, wherein the layout parameters include emitter information, collector information, base information and contact hole information of a minimum unit of the transistor;

4. The method for detecting matching accuracy of a triode according to claim 3, wherein the matching accuracy detection processing is performed on the layout parameters according to a plurality of preset layout matching criteria to obtain a plurality of layout matching results, and the layout parameters are modified according to the layout matching results, comprising:

5. The method for detecting matching accuracy of a triode according to claim 4, wherein the matching accuracy detection processing for the layout parameters according to a plurality of preset layout matching standards comprises:

6. The method for detecting matching accuracy of a triode according to claim 5, wherein the matching accuracy detection processing of the layout parameters according to the compact matching standard comprises:

7. The method for detecting matching accuracy of a triode according to claim 5, wherein the matching accuracy detection processing for the layout parameters according to a consistency matching standard comprises:

8. The method for detecting matching accuracy of a triode according to claim 5, wherein the matching accuracy detection processing of the layout parameters according to the symmetry matching criteria comprises:

9. The method for detecting matching accuracy of a transistor according to claim 5, wherein the matching accuracy detection processing for the layout parameters according to the dispersion matching criteria comprises:

10. The method for detecting matching accuracy of a transistor according to claim 1, wherein the method comprises: