CN116670503B - 缺陷检测装置、缺陷检测方法、缺陷检测系统以及旋转电机的制造方法 - Google Patents

缺陷检测装置、缺陷检测方法、缺陷检测系统以及旋转电机的制造方法

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Publication number
CN116670503B
CN116670503B CN202180089571.5A CN202180089571A CN116670503B CN 116670503 B CN116670503 B CN 116670503B CN 202180089571 A CN202180089571 A CN 202180089571A CN 116670503 B CN116670503 B CN 116670503B
Authority
CN
China
Prior art keywords
defect detection
defect
electrode
detection device
winding
Prior art date
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Application number
CN202180089571.5A
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English (en)
Chinese (zh)
Other versions
CN116670503A (zh
Inventor
三泽贵浩
猿渡秀宪
高桥贞治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Publication of CN116670503A publication Critical patent/CN116670503A/zh
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Publication of CN116670503B publication Critical patent/CN116670503B/zh
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/24—Investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/92—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating breakdown voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CN202180089571.5A 2021-01-14 2021-12-23 缺陷检测装置、缺陷检测方法、缺陷检测系统以及旋转电机的制造方法 Active CN116670503B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021003909 2021-01-14
JP2021-003909 2021-01-14
PCT/JP2021/047803 WO2022153821A1 (ja) 2021-01-14 2021-12-23 欠陥検出装置、欠陥検出方法、欠陥検出システムおよび回転電機の製造方法

Publications (2)

Publication Number Publication Date
CN116670503A CN116670503A (zh) 2023-08-29
CN116670503B true CN116670503B (zh) 2026-03-10

Family

ID=82447273

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CN202180089571.5A Active CN116670503B (zh) 2021-01-14 2021-12-23 缺陷检测装置、缺陷检测方法、缺陷检测系统以及旋转电机的制造方法

Country Status (3)

Country Link
JP (1) JP7378649B2 (https=)
CN (1) CN116670503B (https=)
WO (1) WO2022153821A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023139910A1 (ja) * 2022-01-24 2023-07-27 三菱電機株式会社 巻線負荷再現装置、マグネットワイヤ絶縁被膜の検査装置、マグネットワイヤ絶縁被膜の検査方法、および回転電機の製造方法
CN116660789B (zh) * 2023-06-25 2024-02-20 新疆天成鲁源电气工程有限公司 一种用于电缆的智能带电检测装置
CN119001376B (zh) * 2024-10-23 2025-03-11 中国电建集团山东电力建设第一工程有限公司 测量装置

Citations (4)

* Cited by examiner, † Cited by third party
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JPH05332981A (ja) * 1992-06-02 1993-12-17 Fujikura Ltd 絶縁被覆層のピンホール等の検査方法及び検査装置
JP2003248028A (ja) * 2002-02-25 2003-09-05 Nissan Motor Co Ltd コイル傷検査装置、およびその方法
KR200418696Y1 (ko) * 2006-03-27 2006-06-14 여상현 선재의 재권취장치
JP2009236887A (ja) * 2008-03-28 2009-10-15 Furukawa Electric Co Ltd:The 絶縁不良検出用電極構造および絶縁不良検出方法

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JPS5324626B1 (https=) * 1967-07-10 1978-07-21
JPH02222845A (ja) * 1989-02-23 1990-09-05 Showa Electric Wire & Cable Co Ltd 試験ケーブルの放電点検知方法
JPH08211115A (ja) * 1995-02-06 1996-08-20 Toshiba Corp 被覆電線用絶縁被膜劣化診断装置
CN1214509C (zh) * 2001-09-06 2005-08-10 建准电机工业股份有限公司 直流马达及其线圈绕线方法
JP2004347523A (ja) * 2003-05-23 2004-12-09 Hitachi Ltd コイルの絶縁特性試験方法
JP2006098362A (ja) * 2004-09-30 2006-04-13 Kobe Steel Ltd 絶縁性薄膜の欠陥検出方法
JP2006300532A (ja) 2005-04-15 2006-11-02 Toyota Motor Corp コイルの品質検査方法、及び、コイルの品質検査装置
JP5108251B2 (ja) * 2006-04-26 2012-12-26 住友電気工業株式会社 絶縁電線およびこれを用いた電気コイル
CN101329305A (zh) * 2008-07-25 2008-12-24 常熟泓淋电线电缆有限公司 导线检测装置
JP5839986B2 (ja) * 2011-12-26 2016-01-06 日産自動車株式会社 検査方法および検査システム
JP5949612B2 (ja) 2013-03-21 2016-07-13 日立金属株式会社 絶縁特性の検査装置、絶縁特性の検査方法及び絶縁電線の製造方法
CN107209226A (zh) * 2015-03-12 2017-09-26 三菱电机株式会社 电动机的绝缘检查装置以及电动机的绝缘检查方法
JP6507767B2 (ja) * 2015-03-23 2019-05-08 日立金属株式会社 部分放電測定方法および部分放電測定装置、並びに絶縁電線の製造方法
CN104965152B (zh) * 2015-05-29 2018-01-26 广西电网有限责任公司电力科学研究院 一种电缆绝缘状态诊断方法及诊断装置
CN106442716B (zh) * 2016-11-04 2019-08-13 西安交通大学 一种复合绝缘子内部缺陷检测方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05332981A (ja) * 1992-06-02 1993-12-17 Fujikura Ltd 絶縁被覆層のピンホール等の検査方法及び検査装置
JP2003248028A (ja) * 2002-02-25 2003-09-05 Nissan Motor Co Ltd コイル傷検査装置、およびその方法
KR200418696Y1 (ko) * 2006-03-27 2006-06-14 여상현 선재의 재권취장치
JP2009236887A (ja) * 2008-03-28 2009-10-15 Furukawa Electric Co Ltd:The 絶縁不良検出用電極構造および絶縁不良検出方法

Also Published As

Publication number Publication date
CN116670503A (zh) 2023-08-29
JP7378649B2 (ja) 2023-11-13
JPWO2022153821A1 (https=) 2022-07-21
WO2022153821A1 (ja) 2022-07-21

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