CN115867791A - 金属带的表面检查装置、表面检查方法及制造方法 - Google Patents

金属带的表面检查装置、表面检查方法及制造方法 Download PDF

Info

Publication number
CN115867791A
CN115867791A CN202180046808.1A CN202180046808A CN115867791A CN 115867791 A CN115867791 A CN 115867791A CN 202180046808 A CN202180046808 A CN 202180046808A CN 115867791 A CN115867791 A CN 115867791A
Authority
CN
China
Prior art keywords
light
metal strip
light source
unit
source unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202180046808.1A
Other languages
English (en)
Chinese (zh)
Inventor
吉田圭佑
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
JFE Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JFE Steel Corp filed Critical JFE Steel Corp
Publication of CN115867791A publication Critical patent/CN115867791A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N2021/8924—Dents; Relief flaws

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN202180046808.1A 2020-08-06 2021-05-28 金属带的表面检查装置、表面检查方法及制造方法 Pending CN115867791A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020133820 2020-08-06
JP2020-133820 2020-08-06
PCT/JP2021/020340 WO2022030083A1 (ja) 2020-08-06 2021-05-28 金属帯の表面検査装置、表面検査方法、及び製造方法

Publications (1)

Publication Number Publication Date
CN115867791A true CN115867791A (zh) 2023-03-28

Family

ID=80117940

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180046808.1A Pending CN115867791A (zh) 2020-08-06 2021-05-28 金属带的表面检查装置、表面检查方法及制造方法

Country Status (7)

Country Link
US (1) US12467876B2 (https=)
EP (1) EP4194842A4 (https=)
JP (1) JPWO2022030083A1 (https=)
KR (1) KR20230017312A (https=)
CN (1) CN115867791A (https=)
MX (1) MX2023001531A (https=)
WO (1) WO2022030083A1 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116359230A (zh) * 2023-05-26 2023-06-30 北京博兴远志科技有限公司 一种永磁体表面凹凸缺陷检测系统及方法
CN116500042A (zh) * 2023-05-09 2023-07-28 哈尔滨工业大学重庆研究院 缺陷检测方法、装置、系统及存储介质

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2023105849A1 (https=) * 2021-12-07 2023-06-15
JP7754028B2 (ja) * 2022-09-05 2025-10-15 Ｊｆｅスチール株式会社 金属帯の表面検査装置、表面検査方法、及び金属帯の製造方法
WO2025206221A1 (ja) * 2024-03-29 2025-10-02 京セラ株式会社 受発光センサ及び該受発光センサを備えた画像形成装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001056297A (ja) * 1999-08-17 2001-02-27 Electro Techno Kk 表面検査方法及び装置
US20090109430A1 (en) * 2005-07-08 2009-04-30 Koenig & Bauer Aktiengesellschaft Device for Inspecting a Surface
JP2017053735A (ja) * 2015-09-10 2017-03-16 Ｊｆｅスチール株式会社 表面検査装置
CN107533013A (zh) * 2016-03-30 2018-01-02 日新制钢株式会社 钢板的表面缺陷检查装置及表面缺陷检查方法
CN107533012A (zh) * 2015-03-31 2018-01-02 日新制钢株式会社 熔融镀覆钢板的表面缺陷检查装置及表面缺陷检查方法
JP2020041835A (ja) * 2018-09-07 2020-03-19 Ｊｆｅスチール株式会社 金属帯表面の検査方法および金属帯表面の検査装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60228943A (ja) * 1984-04-27 1985-11-14 Nippon Steel Corp ステンレス鋼板の表面状態検査方法
US5087822A (en) * 1990-06-22 1992-02-11 Alcan International Limited Illumination system with incident beams from near and far dark field for high speed surface inspection of rolled aluminum sheet
JPH04113260A (ja) 1990-09-03 1992-04-14 Nkk Corp 表面欠陥の検出方法及び装置
JPH05188010A (ja) 1992-01-14 1993-07-27 Nippon Steel Corp 表面検査装置
JP3021266B2 (ja) 1994-01-31 2000-03-15 新日本製鐵株式会社 光学式鋼板表面検査装置
IT1273968B (it) 1995-02-24 1997-07-11 Finmeccanica Spa Apparecchiatura per il rilevamento ottico di difetti superficiali in particolare per nastri laminati
JP3523945B2 (ja) * 1995-09-28 2004-04-26 日新製鋼株式会社 表面検査方法
JPH09138201A (ja) * 1995-11-15 1997-05-27 Mitsubishi Electric Corp 表面検査装置
JP2003121371A (ja) 2001-10-10 2003-04-23 Nippon Steel Corp 疵検査装置及び疵検査方法
JP4915057B2 (ja) 2005-05-12 2012-04-11 Ｊｆｅスチール株式会社 ステンレス鋼板の表面検査方法およびステンレス鋼板用表面検査装置
JP2010223613A (ja) 2009-03-19 2010-10-07 Futec Inc 光学検査装置
JP6822494B2 (ja) * 2018-02-05 2021-01-27 Ｊｆｅスチール株式会社 鋼板の欠陥検査装置及び欠陥検査方法
JP6969500B2 (ja) 2018-05-28 2021-11-24 日本製鉄株式会社 ダル仕上げ材表面の良否判定方法及び良否判定装置
US11126130B2 (en) 2018-08-14 2021-09-21 Canon Kabushiki Kaisha Optical sensor and image forming apparatus
JP2020027197A (ja) * 2018-08-14 2020-02-20 キヤノン株式会社 画像形成装置、光学センサ

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001056297A (ja) * 1999-08-17 2001-02-27 Electro Techno Kk 表面検査方法及び装置
US20090109430A1 (en) * 2005-07-08 2009-04-30 Koenig & Bauer Aktiengesellschaft Device for Inspecting a Surface
CN107533012A (zh) * 2015-03-31 2018-01-02 日新制钢株式会社 熔融镀覆钢板的表面缺陷检查装置及表面缺陷检查方法
JP2017053735A (ja) * 2015-09-10 2017-03-16 Ｊｆｅスチール株式会社 表面検査装置
CN107533013A (zh) * 2016-03-30 2018-01-02 日新制钢株式会社 钢板的表面缺陷检查装置及表面缺陷检查方法
JP2020041835A (ja) * 2018-09-07 2020-03-19 Ｊｆｅスチール株式会社 金属帯表面の検査方法および金属帯表面の検査装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116500042A (zh) * 2023-05-09 2023-07-28 哈尔滨工业大学重庆研究院 缺陷检测方法、装置、系统及存储介质
CN116500042B (zh) * 2023-05-09 2024-01-26 哈尔滨工业大学重庆研究院 缺陷检测方法、装置、系统及存储介质
CN116359230A (zh) * 2023-05-26 2023-06-30 北京博兴远志科技有限公司 一种永磁体表面凹凸缺陷检测系统及方法
CN116359230B (zh) * 2023-05-26 2023-08-29 北京博兴远志科技有限公司 一种永磁体表面凹凸缺陷检测系统及方法

Also Published As

Publication number Publication date
MX2023001531A (es) 2023-03-08
US12467876B2 (en) 2025-11-11
WO2022030083A1 (ja) 2022-02-10
US20230349836A1 (en) 2023-11-02
JPWO2022030083A1 (https=) 2022-02-10
EP4194842A4 (en) 2024-01-17
KR20230017312A (ko) 2023-02-03
EP4194842A1 (en) 2023-06-14

Similar Documents

Publication Publication Date Title
CN115867791A (zh) 金属带的表面检查装置、表面检查方法及制造方法
US10267747B2 (en) Surface defect inspecting device and method for steel sheets
TWI627399B (zh) 熔融鍍覆鋼板的表面缺陷檢查裝置及表面缺陷檢查方法
JP5108003B2 (ja) 多波長光による画像品質の改善
KR20170053707A (ko) 금속체의 형상 검사 장치 및 금속체의 형상 검사 방법
JP2020042044A (ja) 外観検査装置、照明装置、撮影照明装置
JP2001514386A (ja) 移動表面の自動的な検査のための方法及び装置
KR20170129949A (ko) 피검사체 촬상 장치, 피검사체 촬상 방법, 표면 검사 장치 및 표면 검사 방법
JP6926822B2 (ja) 金属帯表面の検査方法および検査装置
EP1557661A1 (en) Inspection apparatus of wiring pattern, inspection method, detection apparatus, detection method
JP2023067750A (ja) 金属帯の表面欠陥判定モデルの生成方法及びその装置、金属帯の合否判定方法及びその装置、及び、金属帯の製造方法
JP6950811B2 (ja) 金属板の表面欠陥検出方法及び装置並びにめっき鋼板の製造方法
JP2025135005A (ja) 鋼材の表面検査方法及び表面検査装置
JP7613336B2 (ja) 金属帯の表面検査装置、表面検査方法、及び製造方法
JP7136064B2 (ja) 被検査体の表面検査装置および被検査体の表面検査方法
JP4015436B2 (ja) 金めっき欠陥検査装置
JP2736521B2 (ja) ロール状フィルムの検査方法及び装置
JP3687441B2 (ja) 表面疵マーキング装置およびマーキング付き金属帯の製造方法
JP7517385B2 (ja) 金属帯の合否判定方法および金属帯の製造方法
JP4821044B2 (ja) マーキング付き金属帯の製造方法
JP7754028B2 (ja) 金属帯の表面検査装置、表面検査方法、及び金属帯の製造方法
JP2025036089A (ja) 金属材料の表面検査方法、金属材料の表面検査装置、金属材料、金属材料の製造方法、金属材料の品質管理方法、及び金属材料の製造設備
JP4377872B2 (ja) 表面検査装置
CN109444149A (zh) 一种电感检测设备的检测方法

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination