JPWO2023105849A1 - - Google Patents

Info

Publication number
JPWO2023105849A1
JPWO2023105849A1 JP2023566087A JP2023566087A JPWO2023105849A1 JP WO2023105849 A1 JPWO2023105849 A1 JP WO2023105849A1 JP 2023566087 A JP2023566087 A JP 2023566087A JP 2023566087 A JP2023566087 A JP 2023566087A JP WO2023105849 A1 JPWO2023105849 A1 JP WO2023105849A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023566087A
Other languages
Japanese (ja)
Other versions
JPWO2023105849A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023105849A1 publication Critical patent/JPWO2023105849A1/ja
Publication of JPWO2023105849A5 publication Critical patent/JPWO2023105849A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/70Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00Image enhancement or restoration
    • G06T5/50Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/60Analysis of geometric attributes
    • G06T7/62Analysis of geometric attributes of area, perimeter, diameter or volume
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/10Image acquisition
    • G06V10/12Details of acquisition arrangements; Constructional details thereof
    • G06V10/14Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/141Control of illumination
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00Indexing scheme relating to image or video recognition or understanding
    • G06V2201/07Target detection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Evolutionary Computation (AREA)
  • Computing Systems (AREA)
  • Databases & Information Systems (AREA)
  • Artificial Intelligence (AREA)
  • Geometry (AREA)
  • Medical Informatics (AREA)
  • Software Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2023566087A 2021-12-07 2022-08-02 Pending JPWO2023105849A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021198581 2021-12-07
PCT/JP2022/029596 WO2023105849A1 (ja) 2021-12-07 2022-08-02 検査方法および検査装置

Publications (2)

Publication Number Publication Date
JPWO2023105849A1 true JPWO2023105849A1 (https=) 2023-06-15
JPWO2023105849A5 JPWO2023105849A5 (https=) 2024-08-20

Family

ID=86730061

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023566087A Pending JPWO2023105849A1 (https=) 2021-12-07 2022-08-02

Country Status (3)

Country Link
US (1) US20240320849A1 (https=)
JP (1) JPWO2023105849A1 (https=)
WO (1) WO2023105849A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20250097416A (ko) * 2023-12-21 2025-06-30 삼성에스디아이 주식회사 배터리 진단 장치 및 방법, 컴퓨터 프로그램
KR20250133042A (ko) * 2024-02-29 2025-09-05 삼성에스디아이 주식회사 대상물 겹침 검출 장치 및 방법

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09222361A (ja) * 1995-12-12 1997-08-26 Omron Corp 物体の色等の検出装置及びそれを用いた検査装置
JP2012154628A (ja) * 2011-01-21 2012-08-16 Olympus Corp 顕微鏡システム、情報処理装置、及び情報処理プログラム
JP2013186075A (ja) * 2012-03-09 2013-09-19 Hitachi Information & Control Solutions Ltd 異物検査装置、及び、その異物検査方法
JP2014020910A (ja) * 2012-07-18 2014-02-03 Omron Corp 欠陥検査方法及び欠陥検査装置
WO2017169242A1 (ja) * 2016-03-28 2017-10-05 セーレン株式会社 欠陥検査装置、及び欠陥検査方法
JP2018189561A (ja) * 2017-05-09 2018-11-29 株式会社キーエンス 画像検査装置
JP2018189560A (ja) * 2017-05-09 2018-11-29 株式会社キーエンス 画像検査装置
JP2018204999A (ja) * 2017-05-31 2018-12-27 株式会社キーエンス 画像検査装置
JP2019184589A (ja) * 2018-03-30 2019-10-24 セーレン株式会社 欠陥検査装置、及び欠陥検査方法
CN110596130A (zh) * 2018-05-25 2019-12-20 上海翌视信息技术有限公司 一种具有辅助照明的工业检测装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115867791A (zh) * 2020-08-06 2023-03-28 杰富意钢铁株式会社 金属带的表面检查装置、表面检查方法及制造方法

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09222361A (ja) * 1995-12-12 1997-08-26 Omron Corp 物体の色等の検出装置及びそれを用いた検査装置
JP2012154628A (ja) * 2011-01-21 2012-08-16 Olympus Corp 顕微鏡システム、情報処理装置、及び情報処理プログラム
JP2013186075A (ja) * 2012-03-09 2013-09-19 Hitachi Information & Control Solutions Ltd 異物検査装置、及び、その異物検査方法
JP2014020910A (ja) * 2012-07-18 2014-02-03 Omron Corp 欠陥検査方法及び欠陥検査装置
WO2017169242A1 (ja) * 2016-03-28 2017-10-05 セーレン株式会社 欠陥検査装置、及び欠陥検査方法
JP2018189561A (ja) * 2017-05-09 2018-11-29 株式会社キーエンス 画像検査装置
JP2018189560A (ja) * 2017-05-09 2018-11-29 株式会社キーエンス 画像検査装置
JP2018204999A (ja) * 2017-05-31 2018-12-27 株式会社キーエンス 画像検査装置
JP2019184589A (ja) * 2018-03-30 2019-10-24 セーレン株式会社 欠陥検査装置、及び欠陥検査方法
CN110596130A (zh) * 2018-05-25 2019-12-20 上海翌视信息技术有限公司 一种具有辅助照明的工业检测装置

Also Published As

Publication number Publication date
US20240320849A1 (en) 2024-09-26
WO2023105849A1 (ja) 2023-06-15

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