JPWO2023105849A1 - - Google Patents
Info
- Publication number
- JPWO2023105849A1 JPWO2023105849A1 JP2023566087A JP2023566087A JPWO2023105849A1 JP WO2023105849 A1 JPWO2023105849 A1 JP WO2023105849A1 JP 2023566087 A JP2023566087 A JP 2023566087A JP 2023566087 A JP2023566087 A JP 2023566087A JP WO2023105849 A1 JPWO2023105849 A1 JP WO2023105849A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
- G06T7/62—Analysis of geometric attributes of area, perimeter, diameter or volume
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
- G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
- G06V10/141—Control of illumination
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/07—Target detection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Quality & Reliability (AREA)
- Evolutionary Computation (AREA)
- Computing Systems (AREA)
- Databases & Information Systems (AREA)
- Artificial Intelligence (AREA)
- Geometry (AREA)
- Medical Informatics (AREA)
- Software Systems (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Mathematical Physics (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021198581 | 2021-12-07 | ||
| PCT/JP2022/029596 WO2023105849A1 (ja) | 2021-12-07 | 2022-08-02 | 検査方法および検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023105849A1 true JPWO2023105849A1 (https=) | 2023-06-15 |
| JPWO2023105849A5 JPWO2023105849A5 (https=) | 2024-08-20 |
Family
ID=86730061
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023566087A Pending JPWO2023105849A1 (https=) | 2021-12-07 | 2022-08-02 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20240320849A1 (https=) |
| JP (1) | JPWO2023105849A1 (https=) |
| WO (1) | WO2023105849A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20250097416A (ko) * | 2023-12-21 | 2025-06-30 | 삼성에스디아이 주식회사 | 배터리 진단 장치 및 방법, 컴퓨터 프로그램 |
| KR20250133042A (ko) * | 2024-02-29 | 2025-09-05 | 삼성에스디아이 주식회사 | 대상물 겹침 검출 장치 및 방법 |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09222361A (ja) * | 1995-12-12 | 1997-08-26 | Omron Corp | 物体の色等の検出装置及びそれを用いた検査装置 |
| JP2012154628A (ja) * | 2011-01-21 | 2012-08-16 | Olympus Corp | 顕微鏡システム、情報処理装置、及び情報処理プログラム |
| JP2013186075A (ja) * | 2012-03-09 | 2013-09-19 | Hitachi Information & Control Solutions Ltd | 異物検査装置、及び、その異物検査方法 |
| JP2014020910A (ja) * | 2012-07-18 | 2014-02-03 | Omron Corp | 欠陥検査方法及び欠陥検査装置 |
| WO2017169242A1 (ja) * | 2016-03-28 | 2017-10-05 | セーレン株式会社 | 欠陥検査装置、及び欠陥検査方法 |
| JP2018189561A (ja) * | 2017-05-09 | 2018-11-29 | 株式会社キーエンス | 画像検査装置 |
| JP2018189560A (ja) * | 2017-05-09 | 2018-11-29 | 株式会社キーエンス | 画像検査装置 |
| JP2018204999A (ja) * | 2017-05-31 | 2018-12-27 | 株式会社キーエンス | 画像検査装置 |
| JP2019184589A (ja) * | 2018-03-30 | 2019-10-24 | セーレン株式会社 | 欠陥検査装置、及び欠陥検査方法 |
| CN110596130A (zh) * | 2018-05-25 | 2019-12-20 | 上海翌视信息技术有限公司 | 一种具有辅助照明的工业检测装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115867791A (zh) * | 2020-08-06 | 2023-03-28 | 杰富意钢铁株式会社 | 金属带的表面检查装置、表面检查方法及制造方法 |
-
2022
- 2022-08-02 JP JP2023566087A patent/JPWO2023105849A1/ja active Pending
- 2022-08-02 WO PCT/JP2022/029596 patent/WO2023105849A1/ja not_active Ceased
-
2024
- 2024-05-30 US US18/677,993 patent/US20240320849A1/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09222361A (ja) * | 1995-12-12 | 1997-08-26 | Omron Corp | 物体の色等の検出装置及びそれを用いた検査装置 |
| JP2012154628A (ja) * | 2011-01-21 | 2012-08-16 | Olympus Corp | 顕微鏡システム、情報処理装置、及び情報処理プログラム |
| JP2013186075A (ja) * | 2012-03-09 | 2013-09-19 | Hitachi Information & Control Solutions Ltd | 異物検査装置、及び、その異物検査方法 |
| JP2014020910A (ja) * | 2012-07-18 | 2014-02-03 | Omron Corp | 欠陥検査方法及び欠陥検査装置 |
| WO2017169242A1 (ja) * | 2016-03-28 | 2017-10-05 | セーレン株式会社 | 欠陥検査装置、及び欠陥検査方法 |
| JP2018189561A (ja) * | 2017-05-09 | 2018-11-29 | 株式会社キーエンス | 画像検査装置 |
| JP2018189560A (ja) * | 2017-05-09 | 2018-11-29 | 株式会社キーエンス | 画像検査装置 |
| JP2018204999A (ja) * | 2017-05-31 | 2018-12-27 | 株式会社キーエンス | 画像検査装置 |
| JP2019184589A (ja) * | 2018-03-30 | 2019-10-24 | セーレン株式会社 | 欠陥検査装置、及び欠陥検査方法 |
| CN110596130A (zh) * | 2018-05-25 | 2019-12-20 | 上海翌视信息技术有限公司 | 一种具有辅助照明的工业检测装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20240320849A1 (en) | 2024-09-26 |
| WO2023105849A1 (ja) | 2023-06-15 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
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| A521 | Request for written amendment filed |
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