KR20230017312A - 금속띠의 표면 검사 장치, 표면 검사 방법, 및 제조 방법 - Google Patents

금속띠의 표면 검사 장치, 표면 검사 방법, 및 제조 방법 Download PDF

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Publication number
KR20230017312A
KR20230017312A KR1020227046286A KR20227046286A KR20230017312A KR 20230017312 A KR20230017312 A KR 20230017312A KR 1020227046286 A KR1020227046286 A KR 1020227046286A KR 20227046286 A KR20227046286 A KR 20227046286A KR 20230017312 A KR20230017312 A KR 20230017312A
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South Korea
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light
metal strip
light source
source unit
unit
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Pending
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KR1020227046286A
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English (en)
Korean (ko)
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게이스케 요시다
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제이에프이 스틸 가부시키가이샤
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Publication of KR20230017312A publication Critical patent/KR20230017312A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N2021/8924—Dents; Relief flaws

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020227046286A 2020-08-06 2021-05-28 금속띠의 표면 검사 장치, 표면 검사 방법, 및 제조 방법 Pending KR20230017312A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020133820 2020-08-06
JPJP-P-2020-133820 2020-08-06
PCT/JP2021/020340 WO2022030083A1 (ja) 2020-08-06 2021-05-28 金属帯の表面検査装置、表面検査方法、及び製造方法

Publications (1)

Publication Number Publication Date
KR20230017312A true KR20230017312A (ko) 2023-02-03

Family

ID=80117940

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020227046286A Pending KR20230017312A (ko) 2020-08-06 2021-05-28 금속띠의 표면 검사 장치, 표면 검사 방법, 및 제조 방법

Country Status (7)

Country Link
US (1) US12467876B2 (https=)
EP (1) EP4194842A4 (https=)
JP (1) JPWO2022030083A1 (https=)
KR (1) KR20230017312A (https=)
CN (1) CN115867791A (https=)
MX (1) MX2023001531A (https=)
WO (1) WO2022030083A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2023105849A1 (https=) * 2021-12-07 2023-06-15
JP7754028B2 (ja) * 2022-09-05 2025-10-15 Ｊｆｅスチール株式会社 金属帯の表面検査装置、表面検査方法、及び金属帯の製造方法
CN116500042B (zh) * 2023-05-09 2024-01-26 哈尔滨工业大学重庆研究院 缺陷检测方法、装置、系统及存储介质
CN116359230B (zh) * 2023-05-26 2023-08-29 北京博兴远志科技有限公司 一种永磁体表面凹凸缺陷检测系统及方法
WO2025206221A1 (ja) * 2024-03-29 2025-10-02 京セラ株式会社 受発光センサ及び該受発光センサを備えた画像形成装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04113260A (ja) 1990-09-03 1992-04-14 Nkk Corp 表面欠陥の検出方法及び装置
JPH05188010A (ja) 1992-01-14 1993-07-27 Nippon Steel Corp 表面検査装置
JP2003121371A (ja) 2001-10-10 2003-04-23 Nippon Steel Corp 疵検査装置及び疵検査方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60228943A (ja) * 1984-04-27 1985-11-14 Nippon Steel Corp ステンレス鋼板の表面状態検査方法
US5087822A (en) * 1990-06-22 1992-02-11 Alcan International Limited Illumination system with incident beams from near and far dark field for high speed surface inspection of rolled aluminum sheet
JP3021266B2 (ja) 1994-01-31 2000-03-15 新日本製鐵株式会社 光学式鋼板表面検査装置
IT1273968B (it) 1995-02-24 1997-07-11 Finmeccanica Spa Apparecchiatura per il rilevamento ottico di difetti superficiali in particolare per nastri laminati
JP3523945B2 (ja) * 1995-09-28 2004-04-26 日新製鋼株式会社 表面検査方法
JPH09138201A (ja) * 1995-11-15 1997-05-27 Mitsubishi Electric Corp 表面検査装置
JP2001056297A (ja) 1999-08-17 2001-02-27 Electro Techno Kk 表面検査方法及び装置
JP4915057B2 (ja) 2005-05-12 2012-04-11 Ｊｆｅスチール株式会社 ステンレス鋼板の表面検査方法およびステンレス鋼板用表面検査装置
DE102005031957B4 (de) 2005-07-08 2007-03-22 Koenig & Bauer Ag Vorrichtung zur Inspektion eines Bedruckstoffes mit uneinheitlich reflektierenden Oberflächen
JP2010223613A (ja) 2009-03-19 2010-10-07 Futec Inc 光学検査装置
WO2016158873A1 (ja) * 2015-03-31 2016-10-06 日新製鋼株式会社 溶融めっき鋼板の表面欠陥検査装置および表面欠陥検査方法
JP2017053735A (ja) * 2015-09-10 2017-03-16 Ｊｆｅスチール株式会社 表面検査装置
JP6117398B1 (ja) 2016-03-30 2017-04-19 日新製鋼株式会社 鋼板の表面欠陥検査装置および表面欠陥検査方法
JP6822494B2 (ja) * 2018-02-05 2021-01-27 Ｊｆｅスチール株式会社 鋼板の欠陥検査装置及び欠陥検査方法
JP6969500B2 (ja) 2018-05-28 2021-11-24 日本製鉄株式会社 ダル仕上げ材表面の良否判定方法及び良否判定装置
US11126130B2 (en) 2018-08-14 2021-09-21 Canon Kabushiki Kaisha Optical sensor and image forming apparatus
JP2020027197A (ja) * 2018-08-14 2020-02-20 キヤノン株式会社 画像形成装置、光学センサ
JP6863350B2 (ja) * 2018-09-07 2021-04-21 Ｊｆｅスチール株式会社 金属帯表面の検査方法および金属帯表面の検査装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04113260A (ja) 1990-09-03 1992-04-14 Nkk Corp 表面欠陥の検出方法及び装置
JPH05188010A (ja) 1992-01-14 1993-07-27 Nippon Steel Corp 表面検査装置
JP2003121371A (ja) 2001-10-10 2003-04-23 Nippon Steel Corp 疵検査装置及び疵検査方法

Also Published As

Publication number Publication date
MX2023001531A (es) 2023-03-08
US12467876B2 (en) 2025-11-11
CN115867791A (zh) 2023-03-28
WO2022030083A1 (ja) 2022-02-10
US20230349836A1 (en) 2023-11-02
JPWO2022030083A1 (https=) 2022-02-10
EP4194842A4 (en) 2024-01-17
EP4194842A1 (en) 2023-06-14

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