CN114902053A - 自动分析装置、自动分析装置的显示系统以及自动分析装置的显示方法 - Google Patents

自动分析装置、自动分析装置的显示系统以及自动分析装置的显示方法 Download PDF

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Publication number
CN114902053A
CN114902053A CN202080090831.6A CN202080090831A CN114902053A CN 114902053 A CN114902053 A CN 114902053A CN 202080090831 A CN202080090831 A CN 202080090831A CN 114902053 A CN114902053 A CN 114902053A
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CN
China
Prior art keywords
screen
information
analysis
display
module
Prior art date
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Pending
Application number
CN202080090831.6A
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English (en)
Chinese (zh)
Inventor
柴和彰
横塚圣
圷正志
近久真章
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Publication of CN114902053A publication Critical patent/CN114902053A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00871—Communications between instruments or with remote terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/026—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having blocks or racks of reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178—Special arrangements of analysers
    • G01N2035/00326—Analysers with modular structure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1002—Reagent dispensers

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  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
CN202080090831.6A 2020-01-07 2020-11-11 自动分析装置、自动分析装置的显示系统以及自动分析装置的显示方法 Pending CN114902053A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020-001085 2020-01-07
JP2020001085 2020-01-07
PCT/JP2020/042016 WO2021140741A1 (ja) 2020-01-07 2020-11-11 自動分析装置、自動分析装置の表示システム、および自動分析装置における表示方法

Publications (1)

Publication Number Publication Date
CN114902053A true CN114902053A (zh) 2022-08-12

Family

ID=76787856

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080090831.6A Pending CN114902053A (zh) 2020-01-07 2020-11-11 自动分析装置、自动分析装置的显示系统以及自动分析装置的显示方法

Country Status (5)

Country Link
US (1) US20230056397A1 (https=)
EP (1) EP4089417A4 (https=)
JP (1) JP7329625B2 (https=)
CN (1) CN114902053A (https=)
WO (1) WO2021140741A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117616285A (zh) * 2021-07-29 2024-02-27 株式会社日立高新技术 自动分析装置以及自动分析装置中的引导方法
US20250306053A1 (en) * 2024-03-31 2025-10-02 Shenzhen Mindray Bio-Medical Electronics Co., Ltd. Sample analysis module and sample analysis system

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009250657A (ja) * 2008-04-02 2009-10-29 Hitachi High-Technologies Corp 自動分析装置
US20100223556A1 (en) * 2006-01-30 2010-09-02 Shimadzu Corporation Operational status display system for analyzing apparatus
JP2010223810A (ja) * 2009-03-24 2010-10-07 Hitachi High-Technologies Corp 自動分析装置
JP2012251909A (ja) * 2011-06-03 2012-12-20 Hitachi High-Technologies Corp 自動分析装置
JP2013076619A (ja) * 2011-09-30 2013-04-25 Sysmex Corp 検体分析装置及びコンピュータプログラム
JP2013140103A (ja) * 2012-01-05 2013-07-18 Hitachi High-Technologies Corp 自動分析装置
US20140241945A1 (en) * 2011-09-28 2014-08-28 Hitachi High-Technologies Corporation Automatic analysis device
WO2018213400A1 (en) * 2017-05-17 2018-11-22 Siemens Healthcare Diagnostics Inc. Alerts with augmented reality

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US6919864B1 (en) * 2000-07-27 2005-07-19 Avaya Technology Corp. Display monitor
US8069239B2 (en) * 2004-07-20 2011-11-29 Beckman Coulter, Inc. Centralized monitor and control system for laboratory instruments
JP4755874B2 (ja) * 2005-09-27 2011-08-24 シスメックス株式会社 検体分析装置、検体分析用処理コンピュータ、検体分析装置における操作用画面の表示方法、及び検体分析装置用処理コンピュータのためのコンピュータプログラム
US9502227B2 (en) * 2007-11-02 2016-11-22 Humanix Co., Ltd. Capturing of cell fluid and analysis of its components under observation of cells and instruments for the cell fluid capturing and the analysis
JP5606875B2 (ja) * 2010-10-29 2014-10-15 シスメックス株式会社 検体処理装置及びコンピュータプログラム
JP6196017B2 (ja) * 2012-01-13 2017-09-13 サターン ライセンシング エルエルシーＳａｔｕｒｎ Ｌｉｃｅｎｓｉｎｇ ＬＬＣ 情報処理装置及び情報処理方法、並びにコンピューター・プログラム
WO2013151920A1 (en) * 2012-04-02 2013-10-10 Siemens Healthcare Diagnostics Inc. Virtual sample queues
JP5988830B2 (ja) * 2012-10-30 2016-09-07 シスメックス株式会社 検体分析装置
US9524139B2 (en) * 2013-10-29 2016-12-20 Dell Products, Lp System and method for positioning an application window based on usage context for dual screen display device
US10248224B2 (en) * 2016-10-25 2019-04-02 Microsoft Technology Licensing, Llc Input based on interactions with a physical hinge
GB2568932B (en) * 2017-12-01 2022-07-13 Applied Scientific Tech Uk Limited Modular system

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100223556A1 (en) * 2006-01-30 2010-09-02 Shimadzu Corporation Operational status display system for analyzing apparatus
JP2009250657A (ja) * 2008-04-02 2009-10-29 Hitachi High-Technologies Corp 自動分析装置
JP2010223810A (ja) * 2009-03-24 2010-10-07 Hitachi High-Technologies Corp 自動分析装置
JP2012251909A (ja) * 2011-06-03 2012-12-20 Hitachi High-Technologies Corp 自動分析装置
US20140241945A1 (en) * 2011-09-28 2014-08-28 Hitachi High-Technologies Corporation Automatic analysis device
JP2013076619A (ja) * 2011-09-30 2013-04-25 Sysmex Corp 検体分析装置及びコンピュータプログラム
JP2013140103A (ja) * 2012-01-05 2013-07-18 Hitachi High-Technologies Corp 自動分析装置
WO2018213400A1 (en) * 2017-05-17 2018-11-22 Siemens Healthcare Diagnostics Inc. Alerts with augmented reality

Also Published As

Publication number Publication date
EP4089417A4 (en) 2024-04-17
US20230056397A1 (en) 2023-02-23
JP7329625B2 (ja) 2023-08-18
EP4089417A1 (en) 2022-11-16
JPWO2021140741A1 (https=) 2021-07-15
WO2021140741A1 (ja) 2021-07-15

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