CN114236197A - Mobile probe type testing machine and testing method thereof - Google Patents
Mobile probe type testing machine and testing method thereof Download PDFInfo
- Publication number
- CN114236197A CN114236197A CN202111568397.0A CN202111568397A CN114236197A CN 114236197 A CN114236197 A CN 114236197A CN 202111568397 A CN202111568397 A CN 202111568397A CN 114236197 A CN114236197 A CN 114236197A
- Authority
- CN
- China
- Prior art keywords
- screw mechanism
- lead screw
- axis lead
- pcb
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
Abstract
The embodiment of the invention discloses a mobile probe type testing machine and a testing method thereof, wherein the testing machine comprises an industrial personal computer, a base, a first X-axis lead screw mechanism, a second X-axis lead screw mechanism, a first Y-axis lead screw mechanism and a second Y-axis lead screw mechanism, a clamp used for placing a PCB to be tested in an inserted mode is arranged on the base, the first X-axis lead screw mechanism and the second X-axis lead screw mechanism are arranged at two ends of the base in parallel, the first Y-axis lead screw mechanism and the second Y-axis lead screw mechanism are arranged on the first X-axis lead screw mechanism and the second X-axis lead screw mechanism in parallel, a probe driving mechanism and a CCD camera are correspondingly arranged on the first Y-axis lead screw mechanism and the second Y-axis lead screw mechanism, probes are arranged at the front ends of the probe driving mechanisms, and 2 independent testing probes are arranged on the probes. The invention can quickly detect the resistance value of the circuit on the PCB and judge whether the circuit conductivity meets the design requirement; the invention can test the point with the size of only 100um, the test speed can reach 500 points/minute, and the test precision can reach 0.4 milliohm.
Description
Technical Field
The invention relates to the technical field of PCB testing, in particular to a mobile probe type testing machine and a testing method thereof.
Background
After the PCB is produced, the resistance value of a circuit on the PCB (printed circuit board) needs to be tested, and whether the circuit conductivity on the circuit board meets the design requirement can be quickly judged by measuring the resistance value.
At present, the four-wire four-terminal test of the PCB is mainly carried out in a mode of instruments and a mode of holding a test probe by hands, the test efficiency of the test is low, and the test point on the precise PCB (printed circuit board) cannot be measured by the handheld probe; in addition, the speed of manual testing is generally only 10 points/minute, and the testing precision can only reach 1 milliohm.
Disclosure of Invention
The technical problem to be solved by the embodiments of the present invention is to provide a mobile probe type testing machine and a testing method thereof, so as to improve testing efficiency and testing precision.
In order to solve the above technical problems, an embodiment of the present invention provides a mobile probe type testing machine, which includes an industrial personal computer, a base, a first X-axis screw mechanism, a second X-axis screw mechanism, a first Y-axis screw mechanism, and a second Y-axis screw mechanism, wherein a fixture for placing a PCB to be tested is disposed on the base, the first X-axis screw mechanism and the second X-axis screw mechanism are disposed at two ends of the base in parallel, the first Y-axis screw mechanism and the second Y-axis screw mechanism are disposed on the first X-axis screw mechanism and the second X-axis screw mechanism in parallel, the first X-axis screw mechanism and the second X-axis screw mechanism respectively drive the first Y-axis screw mechanism and the second Y-axis screw mechanism to move in an X-axis direction, a probe driving mechanism and a CCD camera are correspondingly disposed on the first Y-axis screw mechanism and the second Y-axis screw mechanism, probes are disposed at front ends of the probe driving mechanisms, the probe is provided with 2 independent test probes, and the industrial personal computer is electrically connected with the first X-axis lead screw mechanism, the second X-axis lead screw mechanism, the first Y-axis lead screw mechanism, the second Y-axis lead screw mechanism, the probe driving mechanism, the CCD camera and the test probes.
Further, the base is vertically arranged, a through hole is formed in the middle of the base, and the clamp is arranged in the through hole; first X axle screw mechanism, second X axle screw mechanism, first Y axle screw mechanism, second Y axle screw mechanism all have 2 groups, locate both ends around the base respectively.
Furthermore, the probe driving mechanism comprises a stepping motor and a guide rail, a sliding block is arranged on the guide rail, the probe is arranged on the sliding block, and the stepping motor drives the sliding block to move along the Z axis through a belt.
Furthermore, a pressure sensor is also arranged on the probe.
Correspondingly, the embodiment of the invention also provides a test method of the mobile probe type test machine, which comprises the following steps:
step 1: inputting PCB information to be measured and circuit information of the PCB to be measured, wherein the circuit information comprises end point information of the circuit to be measured and resistance information set by the circuit to be measured;
step 2: selecting corresponding CCD (charge coupled device) contraposition points from a PCB to be measured, and establishing relative coordinates of end points of all lines to be measured and the CCD contraposition points;
and step 3: placing a PCB to be tested into a clamp, fixing the PCB, driving a CCD camera to acquire an image of a contraposition point, obtaining the current coordinate of the CCD contraposition point, and storing image information;
and 4, step 4: driving the first X-axis lead screw mechanism, the second X-axis lead screw mechanism, the first Y-axis lead screw mechanism and the second Y-axis lead screw mechanism according to relative coordinates to enable the test probes on the first Y-axis lead screw mechanism and the second Y-axis lead screw mechanism to respectively move to the end points of two ends of the line to be tested, and binding down the test probes through the probe driving mechanism to ensure good contact between the test probes and the end points of the line to be tested;
and 5: performing Kelvin test, testing the resistance, comparing the resistance with the set resistance, judging as a problem line if the resistance exceeds the set resistance, and judging as a good line if the resistance is lower than the set resistance;
step 6: and sequentially measuring other lines to be measured on the PCB, and taking down the PCB until all the lines to be measured on the PCB to be measured are tested, thereby completing the test of the whole PCB to be measured.
Further, step 5 is followed by a retest step: if the line is judged to be a problem line, the line is relocated and retested once again.
Further, during the first test, if the resistance information of all the lines to be measured on the PCB is missing, the resistance value of each line is sequentially tested, and the tested resistance value is used as the set resistance during the subsequent test, so as to ensure the accuracy of the test.
The invention has the beneficial effects that: the resistance value of the circuit on the PCB can be rapidly detected, whether the circuit conductivity on the circuit board meets the design requirement or not can be rapidly judged, and meanwhile, the circuit can be rapidly and accurately measured in a CCD automatic alignment and movable probe mode; the invention can test the point with the size of only 100um, the test speed can reach 500 points/minute, and the test precision can reach 0.4 milliohm.
Drawings
Fig. 1 is a perspective view of a mobile probe tester according to an embodiment of the present invention.
Fig. 2 is a perspective view of another angle of the mobile probe tester according to the embodiment of the present invention.
Fig. 3 is a perspective view of the mobile probe tester according to the embodiment of the present invention when the PCB is not mounted.
Fig. 4 is a perspective view of the probe driving mechanism according to the embodiment of the present invention.
Fig. 5 is a partial configuration diagram of a probe driving mechanism according to an embodiment of the present invention.
FIG. 6 is a flowchart illustrating a testing method of the mobile probe tester according to an embodiment of the invention.
FIG. 7 is a schematic diagram of the test resistor of an embodiment of the present invention.
Description of the reference numerals
The device comprises a base 1, a base 2, a first X-axis screw rod mechanism 3, a second X-axis screw rod mechanism 4, a first Y-axis screw rod mechanism 5, a second Y-axis screw rod mechanism 6, a clamp 7, a probe driving mechanism 8, a CCD camera 9, a test probe 10, a PCB 11, a stepping motor 12, a belt 13, a guide rail 14 and a sliding block 15.
Detailed Description
It should be noted that the embodiments and features of the embodiments in the present application can be combined with each other without conflict, and the present invention is further described in detail with reference to the drawings and specific embodiments.
If directional indications (such as up, down, left, right, front, and rear … …) are provided in the embodiment of the present invention, the directional indications are only used to explain the relative position relationship between the components, the movement, etc. in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indications are changed accordingly.
In addition, the descriptions related to "first", "second", etc. in the present invention are only used for descriptive purposes and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature.
Referring to fig. 1 to 5, a mobile probe type testing machine according to an embodiment of the present invention includes an industrial personal computer, a base, a first X-axis screw mechanism, a second X-axis screw mechanism, a first Y-axis screw mechanism, and a second Y-axis screw mechanism.
The base is provided with a clamp used for being inserted into a PCB to be tested. In specific implementation, the base can be vertically arranged on a base. The clamp is preferably a slotted clamp. The first X-axis screw rod mechanism and the second X-axis screw rod mechanism are arranged on the upper end and the lower end of the base in parallel. The first Y-axis screw rod mechanism and the second Y-axis screw rod mechanism are arranged on the first X-axis screw rod mechanism and the second X-axis screw rod mechanism in parallel. The two ends of the first Y-axis screw rod mechanism and the second Y-axis screw rod mechanism are respectively arranged on the first X-axis screw rod mechanism and the second X-axis screw rod mechanism, so that the stability of overall operation is improved, and the measurement precision is further improved. The first X-axis screw rod mechanism and the second X-axis screw rod mechanism respectively drive the first Y-axis screw rod mechanism and the second Y-axis screw rod mechanism to move in the X-axis direction. The first X-axis lead screw mechanism and the first Y-axis lead screw mechanism form an XY-axis lead screw mechanism, and the second X-axis lead screw mechanism and the second Y-axis lead screw mechanism form another XY-axis lead screw mechanism.
And the first Y-axis screw rod mechanism and the second Y-axis screw rod mechanism are correspondingly provided with a probe driving mechanism and a CCD camera. The front ends of the probe driving mechanisms are provided with probes, and the probes are provided with 2 independent test probes, so that the end points at the two ends of a line to be tested are provided with 2 test probes for Kelvin test, and the principle of the Kelvin test is shown in figure 6. The probe driving mechanism drives the test probe to stretch and retract.
During specific implementation, the industrial personal computer can be electrically connected with the first X-axis screw rod mechanism, the second X-axis screw rod mechanism, the first Y-axis screw rod mechanism, the second Y-axis screw rod mechanism, the probe driving mechanism, the CCD camera and the test probe through the electronic control system. The CCD camera collects images, and the industrial personal computer performs visual positioning according to the images.
As an implementation mode, the base is vertically arranged, a through hole is formed in the middle of the base, and the clamp is arranged in the through hole; first X axle screw mechanism, second X axle screw mechanism, first Y axle screw mechanism, second Y axle screw mechanism all have 2 groups, locate both ends around the base respectively. The invention can test both sides of the PCB at the same time, and can also test two PCBs at the same time. The front end and the rear end of the base of the invention are provided with 4 groups of XY axis screw rod mechanisms, which respectively drive 4 groups of test probes to carry out testing and can carry out any combination test according to the end point distribution of the PCB circuit.
As an implementation mode, the probe driving mechanism can adopt synchronous cog belt transmission and comprises a stepping motor and a guide rail, wherein a sliding block is arranged on the guide rail, a probe is arranged on the sliding block, and the stepping motor drives the sliding block to move along the Z axis through a belt. And a pressure sensor is also arranged on the probe, so that the pressure of the probe penetrating to the end point of the line to be detected is always constant, and closed-loop pressure control is formed.
Referring to fig. 6, the testing method of the mobile probe tester according to the embodiment of the invention includes steps 1 to 6.
Step 1: inputting to-be-tested PCB information and to-be-tested PCB line information, wherein the line information comprises end point information of the to-be-tested line and resistance information set by the to-be-tested line. The invention processes the data of the PCB to be measured, mainly determines the end point of the line to be measured, sets the resistance of the related line, and can automatically read the resistance of all lines by equipment if the specific line resistance can not be determined.
Step 2: and selecting corresponding CCD (charge coupled device) alignment points from the PCB to be measured, and establishing relative coordinates of the end points of all lines to be measured and the CCD alignment points.
And step 3: and placing the PCB to be detected into a clamp, fixing the PCB, driving a CCD camera to acquire an image of the alignment point, obtaining the current coordinate of the CCD alignment point, storing image information and making image reference for subsequent automatic alignment.
And 4, step 4: the CCD camera is used for aligning, the first X-axis screw rod mechanism, the second X-axis screw rod mechanism, the first Y-axis screw rod mechanism and the second Y-axis screw rod mechanism are driven according to relative coordinates, the test probes on the first Y-axis screw rod mechanism and the second Y-axis screw rod mechanism are respectively moved to the end points of the two ends of the line to be measured, the test probes are downwards pricked through the probe driving mechanism, and good contact between the test probes and the end points of the line to be measured is guaranteed.
And 5: the kelvin test (the principle is shown in fig. 7) is performed to test the resistance, and the resistance is compared with the set resistance, if the resistance exceeds the set resistance, the circuit is judged to be a problem circuit, and if the resistance is lower than the set resistance, the circuit is judged to be a good circuit.
Step 6: and sequentially measuring other lines to be measured on the PCB, and taking down the PCB until all the lines to be measured on the PCB to be measured are tested, thereby completing the test of the whole PCB to be measured.
As an embodiment, step 5 further includes a retesting step after: if the line is judged to be a problem line, the line is relocated and retested once again. The invention can carry out secondary test aiming at the problem line and improve the accuracy.
When the test is carried out for the first time, if the resistance information of all the lines to be measured on the PCB is lost, namely the resistance of all the lines on the PCB is unknown, the resistance value of each line is sequentially tested in an automatic learning mode, and the tested resistance value is used as the set resistance in the subsequent test, so that the test accuracy is ensured.
The invention can also be used for testing electronic devices such as FPC (flexible printed circuit) and connectors.
The test capabilities of the present invention are shown in table 1:
TABLE 1
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. A movable probe type testing machine is characterized by comprising an industrial personal computer, a base, a first X-axis lead screw mechanism, a second X-axis lead screw mechanism, a first Y-axis lead screw mechanism and a second Y-axis lead screw mechanism, wherein a clamp used for placing a PCB to be tested is arranged on the base, the first X-axis lead screw mechanism and the second X-axis lead screw mechanism are arranged at two ends of the base in parallel, the first Y-axis lead screw mechanism and the second Y-axis lead screw mechanism are arranged on the first X-axis lead screw mechanism and the second X-axis lead screw mechanism in parallel, the first X-axis lead screw mechanism and the second X-axis lead screw mechanism respectively drive the first Y-axis lead screw mechanism and the second Y-axis lead screw mechanism to move in the X-axis direction, a probe driving mechanism and a CCD camera are correspondingly arranged on the first Y-axis lead screw mechanism and the second Y-axis lead screw mechanism, probes are arranged at the front ends of the probe driving mechanisms, and 2 independent testing probes are arranged on the probe driving mechanism, the industrial personal computer is electrically connected with the first X-axis lead screw mechanism, the second X-axis lead screw mechanism, the first Y-axis lead screw mechanism, the second Y-axis lead screw mechanism, the probe driving mechanism, the CCD camera and the test probe.
2. The mobile probe testing machine of claim 1, wherein the base is vertically disposed, a through hole is formed in the middle of the base, and the clamp is disposed in the through hole; first X axle screw mechanism, second X axle screw mechanism, first Y axle screw mechanism, second Y axle screw mechanism all have 2 groups, locate both ends around the base respectively.
3. The moving probe tester as claimed in claim 1, wherein the probe driving mechanism comprises a stepping motor and a guide rail, the guide rail is provided with a slide block, the probe is provided on the slide block, and the stepping motor drives the slide block to move along the Z-axis through a belt.
4. The mobile probe testing machine as claimed in claim 1, wherein the probe is further provided with a pressure sensor.
5. A test method of a mobile probe type tester is characterized by comprising the following steps:
step 1: inputting PCB information to be measured and circuit information of the PCB to be measured, wherein the circuit information comprises end point information of the circuit to be measured and resistance information set by the circuit to be measured;
step 2: selecting corresponding CCD (charge coupled device) contraposition points from a PCB to be measured, and establishing relative coordinates of end points of all lines to be measured and the CCD contraposition points;
and step 3: placing a PCB to be tested into a clamp, fixing the PCB, driving a CCD camera to acquire an image of a contraposition point, obtaining the current coordinate of the CCD contraposition point, and storing image information;
and 4, step 4: driving the first X-axis lead screw mechanism, the second X-axis lead screw mechanism, the first Y-axis lead screw mechanism and the second Y-axis lead screw mechanism according to relative coordinates to enable the test probes on the first Y-axis lead screw mechanism and the second Y-axis lead screw mechanism to respectively move to the end points of two ends of the line to be tested, and binding down the test probes through the probe driving mechanism to ensure good contact between the test probes and the end points of the line to be tested;
and 5: performing Kelvin test, testing the resistance, comparing the resistance with the set resistance, judging as a problem line if the resistance exceeds the set resistance, and judging as a good line if the resistance is lower than the set resistance;
step 6: and sequentially measuring other lines to be measured on the PCB, and taking down the PCB until all the lines to be measured on the PCB to be measured are tested, thereby completing the test of the whole PCB to be measured.
6. The method of testing a mobile probe tester as claimed in claim 5, further comprising a retest step after step 5: if the line is judged to be a problem line, the line is relocated and retested once again.
7. The method as claimed in claim 5, wherein in the first test, if the resistance information of all the lines to be tested on the PCB is lost, the resistance of each line is tested in turn, and the measured resistance is used as the set resistance in the subsequent test to ensure the accuracy of the test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111568397.0A CN114236197A (en) | 2021-12-21 | 2021-12-21 | Mobile probe type testing machine and testing method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111568397.0A CN114236197A (en) | 2021-12-21 | 2021-12-21 | Mobile probe type testing machine and testing method thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114236197A true CN114236197A (en) | 2022-03-25 |
Family
ID=80760034
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111568397.0A Pending CN114236197A (en) | 2021-12-21 | 2021-12-21 | Mobile probe type testing machine and testing method thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114236197A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116609635A (en) * | 2023-04-11 | 2023-08-18 | 深圳市阳晶电子科技有限公司 | Circuit testing equipment and method |
| CN117389815A (en) * | 2023-12-08 | 2024-01-12 | 浙江普可医疗科技有限公司 | Testing device, method and equipment of wearable data acquisition terminal and storage medium |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104914375A (en) * | 2015-05-11 | 2015-09-16 | 南京协辰电子科技有限公司 | Error correction method of flying probe tester |
| CN105223389A (en) * | 2015-09-28 | 2016-01-06 | 大族激光科技产业集团股份有限公司 | A kind of alignment method of flying probe tester |
| CN105785257A (en) * | 2016-04-13 | 2016-07-20 | 大族激光科技产业集团股份有限公司 | Flying needle test machine correction method |
| CN206002654U (en) * | 2016-08-05 | 2017-03-08 | 深圳市维圳泰科技有限公司 | The flying probe tester of screw drive |
| CN206348432U (en) * | 2016-12-01 | 2017-07-21 | 深圳市凯码时代科技有限公司 | Full-automatic flexible circuit board testing machine |
| CN107064770A (en) * | 2016-12-01 | 2017-08-18 | 深圳市凯码时代科技有限公司 | Full-automatic flexible circuit board testing machine |
| CN108680852A (en) * | 2018-07-16 | 2018-10-19 | 东莞理工学院 | A kind of automatic test device |
| CN108761148A (en) * | 2018-07-16 | 2018-11-06 | 东莞理工学院 | A kind of automation double station testing device |
| CN109696616A (en) * | 2019-01-30 | 2019-04-30 | 大族激光科技产业集团股份有限公司 | The test method and device of flying probe tester |
-
2021
- 2021-12-21 CN CN202111568397.0A patent/CN114236197A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104914375A (en) * | 2015-05-11 | 2015-09-16 | 南京协辰电子科技有限公司 | Error correction method of flying probe tester |
| CN105223389A (en) * | 2015-09-28 | 2016-01-06 | 大族激光科技产业集团股份有限公司 | A kind of alignment method of flying probe tester |
| CN105785257A (en) * | 2016-04-13 | 2016-07-20 | 大族激光科技产业集团股份有限公司 | Flying needle test machine correction method |
| CN206002654U (en) * | 2016-08-05 | 2017-03-08 | 深圳市维圳泰科技有限公司 | The flying probe tester of screw drive |
| CN206348432U (en) * | 2016-12-01 | 2017-07-21 | 深圳市凯码时代科技有限公司 | Full-automatic flexible circuit board testing machine |
| CN107064770A (en) * | 2016-12-01 | 2017-08-18 | 深圳市凯码时代科技有限公司 | Full-automatic flexible circuit board testing machine |
| CN108680852A (en) * | 2018-07-16 | 2018-10-19 | 东莞理工学院 | A kind of automatic test device |
| CN108761148A (en) * | 2018-07-16 | 2018-11-06 | 东莞理工学院 | A kind of automation double station testing device |
| CN109696616A (en) * | 2019-01-30 | 2019-04-30 | 大族激光科技产业集团股份有限公司 | The test method and device of flying probe tester |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116609635A (en) * | 2023-04-11 | 2023-08-18 | 深圳市阳晶电子科技有限公司 | Circuit testing equipment and method |
| CN117389815A (en) * | 2023-12-08 | 2024-01-12 | 浙江普可医疗科技有限公司 | Testing device, method and equipment of wearable data acquisition terminal and storage medium |
| CN117389815B (en) * | 2023-12-08 | 2024-03-22 | 浙江普可医疗科技有限公司 | Testing device, method and equipment of wearable data acquisition terminal and storage medium |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN114236197A (en) | Mobile probe type testing machine and testing method thereof | |
| US6759853B2 (en) | Automated domain reflectometry testing system | |
| KR100602450B1 (en) | Apparatus for testing of flexible printed circuit board | |
| JP4799880B2 (en) | Inspection apparatus, inspection method, and positioning method | |
| US7868635B2 (en) | Probe | |
| CN206002654U (en) | The flying probe tester of screw drive | |
| CN114441942B (en) | Flying probe testing method, system and equipment for PCB and storage medium | |
| CN217007585U (en) | Improve flying probe testing arrangement of location needle inserting precision | |
| CN219533326U (en) | Capacitive detection device | |
| KR100428782B1 (en) | Apparatus for measuring tension of pogo pin | |
| CN114460442B (en) | High-precision needle drop compensation method and device for flying needle test and storage medium | |
| CN113740571A (en) | Array testing device capable of realizing automatic precise control of single probe block | |
| CN212379520U (en) | Circuit board electrical parameter measurement system | |
| EP1655612A1 (en) | Universal test fixture | |
| CN210181111U (en) | Resistance measuring device | |
| CN104251966A (en) | Automation measurement system and method | |
| KR20220128206A (en) | Method for Chips Test using Flying Probe Tester | |
| CN102105806B (en) | Method and machine for multidimensional testing of an electronic device on the basis of a monodirectional probe | |
| KR20020046981A (en) | Positioning apparatus for probe card and TAB | |
| US20040249595A1 (en) | Method of calibrating a component placement machine, device suitable for carrying out such a method, and calibration component suitable for use in such a method or device | |
| CN209342769U (en) | Phase shifter electrical property monitor station | |
| CN109596971B (en) | Alignment method of flying probe tester | |
| CN106841991A (en) | The alignment detecting method of a kind of needle mould and circuit board, device and alignment system | |
| KR101981653B1 (en) | PCB test apparatus | |
| CN111308237A (en) | Survey value needle, survey value needle structure and automatic value measuring machine |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |