CN219533326U - Capacitive detection device - Google Patents
Capacitive detection device Download PDFInfo
- Publication number
- CN219533326U CN219533326U CN202320326182.6U CN202320326182U CN219533326U CN 219533326 U CN219533326 U CN 219533326U CN 202320326182 U CN202320326182 U CN 202320326182U CN 219533326 U CN219533326 U CN 219533326U
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- Prior art keywords
- sucker
- axis
- driving mechanism
- probe
- metal
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
Abstract
The utility model discloses a capacitance type detection device, which comprises an industrial personal computer, a base, an XY axis driving mechanism and a vacuum mechanism, wherein the base is provided with a sucker mechanism, the sucker mechanism comprises a sucker cavity and a metal sucker arranged on the sucker cavity, and a layer of breathable insulating net is arranged above the metal sucker; the vacuum mechanism is communicated with the sucker cavity; the XY axis driving mechanism is correspondingly arranged on the base, and the XY axis driving mechanism is correspondingly provided with the probe driving mechanism; the probe driving mechanism is used for driving the test probe to move up and down along the Z-axis direction; the industrial personal computer is connected with the XY axis driving mechanism and the probe driving mechanism, and judges whether the circuit is faulty or not by detecting the capacitance change between the circuit of the board to be tested and the metal sucker through the test probe. According to the technical scheme, the test points above the board to be tested can be tested only once, each test point is not required to be pricked for multiple times, the scratch phenomenon and the stab phenomenon of the surface of the board to be tested are improved, the board to be tested is protected, and the test efficiency is higher.
Description
Technical Field
The utility model relates to the technical field of PCB and touch screen testing, in particular to a capacitive detection device.
Background
After the PCB or the touch panel waits for the test board to finish production, whether the circuit on the test board is good or not needs to be tested. At present, whether a circuit is disconnected or short-circuited is tested in a resistor mode, the edge of a board to be tested is clamped by adopting a clamp, and then two probes are respectively contacted with two different test points on the board to be tested, so that the resistor of each circuit is measured to judge whether the circuit is problematic.
The traditional test mode using the resistor can not make the flexible board to be tested smooth, and because the end points of each circuit need to test the resistor mutually to judge whether the corresponding circuit has a disconnection problem, the test efficiency is low, the mutual test is required to be carried out between the circuits of the PCB, the end points of the same circuit can be tested for multiple times, the end points can be pricked by the probes for multiple times, the test has obvious traces, and even the test points can be pricked by the probes.
Disclosure of Invention
The technical problem to be solved by the embodiment of the utility model is to provide a capacitive detection device which can be suitable for a flexible board to be detected and can obviously improve the current situation that a test trace appears on the board to be detected or the board to be detected is scratched.
In order to solve the technical problems, the embodiment of the utility model provides a capacitive detection device which comprises an industrial personal computer, a base, an XY axis driving mechanism and a vacuum mechanism, wherein the base is provided with a sucker mechanism, the sucker mechanism comprises a sucker cavity and a metal sucker arranged on the sucker cavity, and a layer of breathable insulating net is arranged above the metal sucker; the vacuum mechanism is communicated with the sucker cavity; the XY axis driving mechanism is correspondingly arranged on the base, and the XY axis driving mechanism is correspondingly provided with the probe driving mechanism; the probe driving mechanism is used for driving the test probe to move up and down along the Z-axis direction; the industrial personal computer is connected with the XY axis driving mechanism and the probe driving mechanism, and the industrial personal computer detects the capacitance change between the circuit of the board to be tested and the metal sucker through the test probe to judge whether the circuit fails.
As an implementation mode, the metal sucker is in a flat plate shape, and a plurality of through holes are uniformly formed in the metal sucker.
As one embodiment, the XY axis driving mechanism includes an X axis moving module set along a length direction of the metal suction cup and a Y axis moving module set along a width direction of the metal suction cup; the Y-axis moving module is connected with the X-axis moving module and can move along the length direction of the metal sucker under the driving of the X-axis moving module; the probe driving mechanism is arranged on the Y-axis moving module and can move along the width direction of the metal sucker under the driving of the Y-axis moving module.
As one implementation mode, the Y-axis moving module is provided with two groups, and each group of Y-axis moving module is correspondingly provided with at least one group of probe driving mechanism.
As an implementation mode, the device further comprises a CCD camera, wherein the CCD camera is arranged on the XY axis driving mechanism and used for positioning the motion of the test probe.
As an implementation mode, the probe driving mechanism comprises a base, wherein a stepping motor and a guide rail are arranged on the base, a sliding block is arranged on the guide rail, and the test probe is arranged at the front end of the sliding block; the output shaft of the stepping motor is provided with a driving wheel, the base is correspondingly provided with a driven wheel, and the driving wheel and the driven wheel are correspondingly sleeved with a synchronous belt for driving the sliding block to move along the Z axis.
The beneficial effects of the utility model are as follows: the metal sucker is used as one polar plate of the capacitor, so that the flexible board to be tested can be tested, and the test point above the board to be tested can be tested only once to measure the result, so that each test point is not required to be pricked for a plurality of times, the scratch phenomenon and the stab phenomenon on the surface of the board to be tested are improved, the board to be tested is protected, and the result can be measured only by pricking one point each time, so that the efficiency is higher.
Drawings
Fig. 1 is a perspective view of a capacitive sensing apparatus according to an embodiment of the utility model.
Fig. 2 is a partial perspective view of a capacitive sensing apparatus according to an embodiment of the utility model.
Fig. 3 is a perspective view of a metal suction cup according to an embodiment of the present utility model.
Fig. 4 is a perspective view of a probe driving mechanism according to an embodiment of the present utility model.
Reference numerals illustrate:
the device comprises an industrial personal computer 10, a base 20, a metal sucker 21, a sucker cavity 22, an XY axis driving mechanism 30, an X axis moving module 31, a Y axis moving module 32, a probe driving mechanism 40, a base 41, a stepping motor 42, a guide rail 43, a sliding block 44 and a test probe 45.
Detailed Description
It should be noted that, without conflict, the embodiments of the present utility model and features of the embodiments may be combined with each other, and the present utility model will be further described in detail with reference to the drawings and the specific embodiments.
In the embodiment of the present utility model, if there is a directional indication (such as up, down, left, right, front, and rear … …) only for explaining the relative positional relationship, movement condition, etc. between the components in a specific posture (as shown in the drawings), if the specific posture is changed, the directional indication is correspondingly changed.
In addition, the description of "first," "second," etc. in this disclosure is for descriptive purposes only and is not to be construed as indicating or implying a relative importance or implying an indication of the number of features being indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature.
In order to facilitate description of the technical solutions of the embodiments, in the present utility model, the X-axis, the Y-axis, and the Z-axis respectively correspond to three directions perpendicular to each other.
Referring to fig. 1 to 4, the capacitive sensing apparatus according to the embodiment of the utility model includes an industrial personal computer 10, a base 20, an XY axis driving mechanism 30, and a vacuum mechanism (not shown).
The base 20 is provided with a sucking disc mechanism, the sucking disc mechanism comprises a sucking disc cavity 22 and a metal sucking disc 21 arranged on the sucking disc cavity 22, a layer of breathable insulating net is arranged above the metal sucking disc 21, and the sucking disc mechanism is used for adsorbing and flattening and fixing a board to be tested (PCB or touch panel and the like) placed on the breathable insulating net. The vacuum mechanism is communicated with the sucker cavity 22, and is vacuum pumping equipment such as a vacuum pump.
The XY axis driving mechanism 30 is correspondingly disposed on the base 20, and the XY axis driving mechanism 30 is preferably an XY axis linear screw driving mechanism. The XY axis drive mechanism 30 is provided with a probe drive mechanism 40. The XY axis drive mechanism 30 drives the probe drive mechanism 40 to move in the XY axis direction above the metal suction cup 21.
The probe driving mechanism 40 is provided with a test probe 45, and the probe driving mechanism 40 drives the test probe 45 to move up and down along the Z-axis direction. The industrial personal computer 10 is connected with the XY axis driving mechanism 30 and the probe driving mechanism 40. The industrial personal computer 10 detects the capacitance change between the circuit of the board to be tested and the metal sucker 21 through the test probe 45 to judge whether the circuit is faulty or not.
According to the technical scheme, the metal sucker is adopted as one polar plate of the capacitor, so that the flexible board to be tested can be tested, and the test point above the board to be tested can be tested only once, so that each test point is not required to be pricked for multiple times, the scratch phenomenon and the stab phenomenon on the surface of the board to be tested are improved, the board to be tested is protected, and the result can be tested only by pricking one point each time, so that the efficiency is higher.
As an embodiment, the metal sucker 21 is in a flat plate shape, and a plurality of through holes are uniformly formed in the metal sucker 21. Under the action of vacuum adsorption, the plate to be tested is closely attached to the metal sucker 21, so that the plate to be tested is fixed and leveled.
Through evenly having offered a plurality of through-holes on with metal sucking disc 21, metal sucking disc 21 can adopt whole face absorption mode, adsorbs the fixed to soft board that awaits measuring from the below, both can guarantee its roughness, can realize reliably fixing again and can not remove. Thus, the metal sucker 21 of the present utility model can be applied to hard and flexible boards to be measured of various sizes.
Wherein, because the ventilative insulating properties of insulating network, it can enough provide the absorption passageway of metal sucking disc 21 to realize the absorption to the board that awaits measuring of insulating network top, can prevent to switch on between the board that awaits measuring of two sides and the metal sucking disc 21 when testing the board that awaits measuring of two sides again, prevent to place to switch on between the lower surface of the board that awaits measuring on the metal sucking disc 21 and the metal sucking disc 21 promptly, influence the test result. Meanwhile, the lower surface of the double-sided board to be detected can not gather water vapor due to negative pressure or long-time surface contact with the metal sucker 21, so that the capacitive detection device can be better suitable for detecting the double-sided board to be detected.
Referring to fig. 1, as an embodiment, the XY axis driving mechanism 30 includes an X axis moving module 31 provided along the length direction of the metal suction cup 21, and a Y axis moving module 32 provided along the width direction of the metal suction cup 21; the Y-axis moving module 32 is connected to the X-axis moving module 31 and can move along the length direction of the metal sucker 21 under the driving of the X-axis moving module 31; the probe driving mechanism 40 is provided on the Y-axis moving module 32, and is movable along the width direction of the metal suction cup 21 by the driving of the Y-axis moving module 32. Further, the probe driving mechanism 40 is movable to a position above any position of the board to be tested by the driving of the XY axis driving mechanism 30.
Referring to fig. 1, as an embodiment, two sets of Y-axis moving modules 32 are provided, and at least one set of probe driving mechanisms 40 is correspondingly provided on each set of Y-axis moving modules 32. Illustratively, two sets of Y-axis moving modules 32 are provided, and each set of Y-axis moving modules 32 is correspondingly provided with a set of probe driving mechanisms 40, that is, two sets of test probes 45 are provided to detect the capacitance change between the circuit of the board to be tested and the metal suction cup 21 to determine whether the circuit fails. During detection, the two groups of test probes 45 can respectively perform opposite movement from two ends of the board to be detected to detect, so that the detection efficiency is improved.
As an embodiment, the capacitive detection device further includes a CCD camera provided on the XY axis driving mechanism 30 for positioning the movement of the test probe 45. Specifically, the CCD camera is also disposed on the Y-axis moving module 32 in the XY-axis driving mechanism 30, and is used in cooperation with the probe driving mechanism 40, and the movement accuracy of the test probe can be improved by adopting the CCD camera positioning.
Because the test probe 45 and the CCD camera are positioned above the metal sucker 21 and are respectively arranged on two sides of the board to be tested together with the metal sucker 21, the interference of other structures such as a limiting structure, an air pipe wire and the like around the metal sucker 21, which are suffered by the test probe 45 and the CCD camera in the moving process, can be reduced.
Referring to fig. 4, as an embodiment, the probe driving mechanism 40 includes a base 41, a stepping motor 42 and a guide rail 43 are provided on the base 41, a slider 44 is provided on the guide rail 43, and a test probe 45 is provided at the front end of the slider 44; the output shaft of the stepping motor 42 is provided with a driving wheel, the base 41 is correspondingly provided with a driven wheel, the driving wheel and the driven wheel are correspondingly sleeved with a synchronous belt for driving the sliding block 44 to move along the Z axis, and the synchronous belt and the sliding block 44 can be fixed together through a fixing clamp or a buckle on the sliding block 44. The synchronous belt drives the sliding block 44, and further drives the test probe 45 to flexibly contact with the test point of the board to be tested. Compared with other driving mechanisms, the utility model adopts the synchronous belt to drive, and the synchronous belt can generate tiny deformation so as to avoid the rigid impact of the test probe on the board to be tested, thereby effectively preventing the test trace from occurring on the circuit of the board to be tested.
The detection method of the capacitive detection device provided by the embodiment of the utility model comprises the following steps:
step 1: inputting information of a board to be measured and line information of the board to be measured, wherein the line information comprises test point information of a line to be measured and projection area information between the line to be measured and the metal sucker 21, and calculating and acquiring a corresponding reference capacitance value according to the area information;
step 2: selecting corresponding CCD opposite sites from a board to be measured, and establishing the relative coordinates of the test points of all lines to be measured and the CCD opposite sites;
step 3: placing the board to be tested on the metal sucker 21, and controlling the vacuum mechanism to suck the board to be tested to be smooth and fixed;
step 4: positioning by a CCD camera, driving a test probe 45 to test a test point of a circuit to be measured on the upper surface of the board to be measured, obtaining a capacitance value between the corresponding circuit to be measured and the metal sucker 21, and judging whether the circuit to be measured is normal, short-circuited or broken according to the measured capacitance value and a reference capacitance value;
step 5: sequentially measuring other circuits to be measured on the board to be measured until all the circuits to be measured on the board to be measured are tested, and then taking down the board to be measured; if the board to be tested is double-sided, turning over the board to be tested after testing one side, testing the other side sequentially, and taking down the board to be tested after all the testing on the other side is completed, so as to complete the testing of the whole board to be tested.
The circuit on the board to be tested and the metal sucker 21 are used as two poles of the capacitor, and when the circuit is short-circuited, the circuit area is increased, namely the measured capacitance value C is increased; when the circuit is broken (open), the area of the circuit is reduced, namely the measured capacitance value C is reduced; therefore, the utility model can rapidly judge whether the line to be measured is normal, short-circuited or broken by comparing the measured capacitance value with the reference capacitance value.
As an embodiment, step 4 further comprises a retest step: if the circuit is judged to be short-circuited or open-circuited, repositioning and retesting the circuit once, thereby further improving the accuracy of the test.
As an implementation manner, in the first test, if the projection area information of all the lines to be measured on the board to be measured is missing, the capacitance value between each line and the metal sucker 21 is tested in turn, and the tested capacitance value is used as the reference capacitance value in the subsequent test, so as to ensure the accuracy of the test, and thus, the open/short circuit is determined quickly.
As an embodiment, in step 1, the reference capacitance value C is calculated using the following formula:
C＝εS/4πd；
where ε is the dielectric constant, d is the distance between the line to be measured and the metal chuck 21, and S is the projected area between the line to be measured and the metal chuck 21.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the spirit and scope of the utility model as defined by the appended claims and their equivalents.
Claims (6)
1. The capacitive detection device is characterized by comprising an industrial personal computer, a base, an XY axis driving mechanism and a vacuum mechanism, wherein the base is provided with a sucker mechanism, the sucker mechanism comprises a sucker cavity and a metal sucker arranged on the sucker cavity, and a layer of breathable insulating net is arranged above the metal sucker; the vacuum mechanism is communicated with the sucker cavity; the XY axis driving mechanism is correspondingly arranged on the base, and the XY axis driving mechanism is correspondingly provided with the probe driving mechanism; the probe driving mechanism is used for driving the test probe to move up and down along the Z-axis direction; the industrial personal computer is connected with the XY axis driving mechanism and the probe driving mechanism, and the industrial personal computer detects the capacitance change between the circuit of the board to be tested and the metal sucker through the test probe to judge whether the circuit fails.
2. The capacitive sensing apparatus of claim 1, wherein the metal suction cup is plate-shaped, and a plurality of through holes are uniformly formed in the metal suction cup.
3. The capacitive sensing apparatus of claim 1, wherein said XY axis drive mechanism comprises an X axis movement module disposed along a length of said metal suction cup and a Y axis movement module disposed along a width of said metal suction cup; the Y-axis moving module is connected with the X-axis moving module and can move along the length direction of the metal sucker under the driving of the X-axis moving module; the probe driving mechanism is arranged on the Y-axis moving module and can move along the width direction of the metal sucker under the driving of the Y-axis moving module.
4. A capacitive sensing apparatus according to claim 3, wherein the Y-axis moving modules are provided in two sets, and each set of the Y-axis moving modules is provided with at least one set of the probe driving mechanism.
5. The capacitive sensing apparatus of claim 2, further comprising a CCD camera disposed on said XY axis drive mechanism for positioning the motion of said test probe.
6. The capacitive sensing apparatus according to any one of claims 1 to 5, wherein the probe driving mechanism comprises a base, a stepping motor and a guide rail are provided on the base, a slider is provided on the guide rail, and the test probe is provided at the front end of the slider; the output shaft of the stepping motor is provided with a driving wheel, the base is correspondingly provided with a driven wheel, and the driving wheel and the driven wheel are correspondingly sleeved with a synchronous belt for driving the sliding block to move along the Z axis.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210216757.9A CN114594368A (en) | 2022-03-07 | 2022-03-07 | Capacitive detection device and detection method thereof |
| CN2022102167579 | 2022-03-07 |
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| CN219533326U true CN219533326U (en) | 2023-08-15 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202210216757.9A Pending CN114594368A (en) | 2022-03-07 | 2022-03-07 | Capacitive detection device and detection method thereof |
| CN202320326182.6U Active CN219533326U (en) | 2022-03-07 | 2023-02-27 | Capacitive detection device |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202210216757.9A Pending CN114594368A (en) | 2022-03-07 | 2022-03-07 | Capacitive detection device and detection method thereof |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116609635A (en) * | 2023-04-11 | 2023-08-18 | 深圳市阳晶电子科技有限公司 | Circuit testing equipment and method |
| CN116482575B (en) * | 2023-04-24 | 2023-12-08 | 常州工程职业技术学院 | Electrical testing vehicle for switch cabinet |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US4229693A (en) * | 1978-11-24 | 1980-10-21 | Honeywell Information Systems Inc. | Method and apparatus for capacitance testing printed circuit boards |
| TWI221922B (en) * | 2001-02-19 | 2004-10-11 | Nihon Densan Read Kabushiki Ka | A circuit board testing apparatus and method for testing a circuit board |
| JP4139738B2 (en) * | 2003-05-30 | 2008-08-27 | 日置電機株式会社 | Circuit board inspection equipment |
| CN101135713A (en) * | 2006-09-01 | 2008-03-05 | 黄桃 | PCB non-contact type test method and apparatus |
| CN101295005B (en) * | 2007-04-28 | 2012-05-23 | 昆山维信诺显示技术有限公司 | Detecting device and method of organic electroluminescent device |
| TW201335605A (en) * | 2012-02-24 | 2013-09-01 | Mirle Automation Corp | Detecting apparatus for detection lines of a touch panel and related method |
| CN203444049U (en) * | 2013-06-21 | 2014-02-19 | 群嘉精密股份有限公司 | Detection apparatus for touch panel |
| CN203386164U (en) * | 2013-06-25 | 2014-01-08 | 群嘉精密股份有限公司 | Touch panel detecting device and system |
| CN105259463A (en) * | 2015-11-06 | 2016-01-20 | 天津普林电路股份有限公司 | A high density laminated board copper clad line short circuit point and trip point test method |
| CN107121632B (en) * | 2017-07-12 | 2023-07-04 | 深圳市迈创力科技有限公司 | Flying probe test system |
| CN107907781B (en) * | 2017-11-30 | 2021-01-29 | 华显光电技术（惠州）有限公司 | Method for judging open circuit position of circuit and broken circuit detection equipment |
| CN109387726A (en) * | 2018-12-05 | 2019-02-26 | 深圳市微特自动化设备有限公司 | A kind of LCR test device of automation |
| JP7468047B2 (en) * | 2020-03-25 | 2024-04-16 | ニデックアドバンステクノロジー株式会社 | Inspection device and inspection method |
| CN212568891U (en) * | 2020-05-29 | 2021-02-19 | 杭州万德激光有限公司 | Device applied to automatic contraction of flying probe tester during power failure |
| CN112946520B (en) * | 2021-02-04 | 2023-06-23 | 厦门天马微电子有限公司 | Capacitive short circuit detection circuit, display device and capacitive short circuit detection method |
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2022
- 2022-03-07 CN CN202210216757.9A patent/CN114594368A/en active Pending
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- 2023-02-27 CN CN202320326182.6U patent/CN219533326U/en active Active
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