CN113994217A - 测试插座 - Google Patents

测试插座 Download PDF

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Publication number
CN113994217A
CN113994217A CN202080042461.9A CN202080042461A CN113994217A CN 113994217 A CN113994217 A CN 113994217A CN 202080042461 A CN202080042461 A CN 202080042461A CN 113994217 A CN113994217 A CN 113994217A
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CN
China
Prior art keywords
hole
conductive portion
conductive
sheet
elastic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202080042461.9A
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English (en)
Chinese (zh)
Other versions
CN113994217B (zh
Inventor
郑永倍
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ISC Co Ltd
Original Assignee
ISC Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ISC Co Ltd filed Critical ISC Co Ltd
Publication of CN113994217A publication Critical patent/CN113994217A/zh
Application granted granted Critical
Publication of CN113994217B publication Critical patent/CN113994217B/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
CN202080042461.9A 2019-04-12 2020-04-08 测试插座 Active CN113994217B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR1020190043190A KR102093854B1 (ko) 2019-04-12 2019-04-12 테스트 소켓
KR10-2019-0043190 2019-04-12
PCT/KR2020/004707 WO2020209583A1 (fr) 2019-04-12 2020-04-08 Prise d'essai

Publications (2)

Publication Number Publication Date
CN113994217A true CN113994217A (zh) 2022-01-28
CN113994217B CN113994217B (zh) 2024-08-06

Family

ID=69958742

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080042461.9A Active CN113994217B (zh) 2019-04-12 2020-04-08 测试插座

Country Status (3)

Country Link
KR (1) KR102093854B1 (fr)
CN (1) CN113994217B (fr)
WO (1) WO2020209583A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102093854B1 (ko) * 2019-04-12 2020-03-26 주식회사 아이에스시 테스트 소켓
KR102179457B1 (ko) * 2020-03-25 2020-11-16 (주)티에스이 테스트 소켓 및 이를 포함하는 테스트 장치와, 테스트 소켓의 제조방법

Citations (15)

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CN1806178A (zh) * 2003-06-09 2006-07-19 Jsr株式会社 各向异性导电性连接器以及晶片检测装置
JP2007064934A (ja) * 2005-09-02 2007-03-15 Jsr Corp 中継基板および中継基板の製造方法、ならびに中継基板を用いた検査装置、さらには検査装置を用いた回路基板の検査方法
CN1937333A (zh) * 2006-09-30 2007-03-28 番禺得意精密电子工业有限公司 一种电连接器及其制造方法
CN1989606A (zh) * 2004-08-31 2007-06-27 Jsr株式会社 晶片检验用各向异性导电性连接器及其制造方法和其应用
CN1989657A (zh) * 2004-07-15 2007-06-27 Jsr株式会社 各向异性导电连接器装置以及电路装置的检查装置
JP2008014898A (ja) * 2006-07-10 2008-01-24 Jsr Corp 異方導電性コネクター及び検査装置用変換アダプタ並びに異方導電性コネクターの製造方法
US20090230975A1 (en) * 2005-10-11 2009-09-17 Jsr Corporation Anisotropic conductive connector and inspection equipment of circuit device
KR20100005535A (ko) * 2008-07-07 2010-01-15 이재학 전도성 와이어를 가진 테스트 소켓
CN202930669U (zh) * 2012-04-10 2013-05-08 番禺得意精密电子工业有限公司 电连接器
CN104752904A (zh) * 2013-12-31 2015-07-01 财团法人工业技术研究院 连接器
CN105008940A (zh) * 2013-02-19 2015-10-28 株式会社Isc 具有高密度传导部的测试插座
KR20160045544A (ko) * 2014-10-17 2016-04-27 주식회사 아이에스시 검사용 소켓
TW201630280A (zh) * 2015-02-03 2016-08-16 Tse Co Ltd 測試用插座
CN108780115A (zh) * 2016-05-11 2018-11-09 株式会社Isc 测试插座以及导电颗粒
TW201903423A (zh) * 2017-05-11 2019-01-16 南韓商Ｉｓｃ股份有限公司 測試插座

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JP2000164041A (ja) * 1998-11-27 2000-06-16 Jsr Corp 異方導電性シート
JP2000292484A (ja) * 1999-04-12 2000-10-20 Jsr Corp 半導体素子接続装置、半導体素子検査装置および検査方法
JP2000304808A (ja) * 1999-04-23 2000-11-02 Matsushita Electric Ind Co Ltd 半導体装置の検査装置
JP2006184199A (ja) * 2004-12-28 2006-07-13 Renesas Technology Corp ソケットおよびそれを用いた半導体装置の製造方法
KR101366171B1 (ko) * 2013-02-19 2014-02-24 주식회사 아이에스시 고밀도 도전부를 가지는 테스트용 소켓
KR101471116B1 (ko) * 2014-02-13 2014-12-12 주식회사 아이에스시 고밀도 도전부를 가지는 테스트용 소켓
KR101718865B1 (ko) * 2015-11-26 2017-03-22 (주)티에스이 검사용 소켓
KR101895002B1 (ko) * 2016-09-19 2018-09-05 (주)티에스이 반도체 테스트 소켓
KR102093854B1 (ko) * 2019-04-12 2020-03-26 주식회사 아이에스시 테스트 소켓

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1806178A (zh) * 2003-06-09 2006-07-19 Jsr株式会社 各向异性导电性连接器以及晶片检测装置
CN1989657A (zh) * 2004-07-15 2007-06-27 Jsr株式会社 各向异性导电连接器装置以及电路装置的检查装置
CN1989606A (zh) * 2004-08-31 2007-06-27 Jsr株式会社 晶片检验用各向异性导电性连接器及其制造方法和其应用
JP2007064934A (ja) * 2005-09-02 2007-03-15 Jsr Corp 中継基板および中継基板の製造方法、ならびに中継基板を用いた検査装置、さらには検査装置を用いた回路基板の検査方法
US20090230975A1 (en) * 2005-10-11 2009-09-17 Jsr Corporation Anisotropic conductive connector and inspection equipment of circuit device
JP2008014898A (ja) * 2006-07-10 2008-01-24 Jsr Corp 異方導電性コネクター及び検査装置用変換アダプタ並びに異方導電性コネクターの製造方法
CN1937333A (zh) * 2006-09-30 2007-03-28 番禺得意精密电子工业有限公司 一种电连接器及其制造方法
KR20100005535A (ko) * 2008-07-07 2010-01-15 이재학 전도성 와이어를 가진 테스트 소켓
CN202930669U (zh) * 2012-04-10 2013-05-08 番禺得意精密电子工业有限公司 电连接器
CN105008940A (zh) * 2013-02-19 2015-10-28 株式会社Isc 具有高密度传导部的测试插座
CN104752904A (zh) * 2013-12-31 2015-07-01 财团法人工业技术研究院 连接器
KR20160045544A (ko) * 2014-10-17 2016-04-27 주식회사 아이에스시 검사용 소켓
TW201630280A (zh) * 2015-02-03 2016-08-16 Tse Co Ltd 測試用插座
CN108780115A (zh) * 2016-05-11 2018-11-09 株式会社Isc 测试插座以及导电颗粒
TW201903423A (zh) * 2017-05-11 2019-01-16 南韓商Ｉｓｃ股份有限公司 測試插座

Non-Patent Citations (1)

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Title
刘葆华;黄金泉;: "航空发动机电子控制系统的小型化SIP技术", 航空动力学报, no. 09, 26 September 2013 (2013-09-26) *

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Publication number Publication date
WO2020209583A1 (fr) 2020-10-15
CN113994217B (zh) 2024-08-06
KR102093854B1 (ko) 2020-03-26

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