CN113825990A - 应力发光测定装置、应力发光测定方法和应力发光测定系统 - Google Patents

应力发光测定装置、应力发光测定方法和应力发光测定系统 Download PDF

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Publication number
CN113825990A
CN113825990A CN202080035888.6A CN202080035888A CN113825990A CN 113825990 A CN113825990 A CN 113825990A CN 202080035888 A CN202080035888 A CN 202080035888A CN 113825990 A CN113825990 A CN 113825990A
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CN
China
Prior art keywords
stress
sample
measuring device
holder
camera
Prior art date
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Pending
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CN202080035888.6A
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English (en)
Chinese (zh)
Inventor
篠山智生
中川利久
津田智哉
安藤直继
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Clip Corp
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Shimadzu Corp
Yuasa System Co Ltd
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Application filed by Shimadzu Corp, Yuasa System Co Ltd filed Critical Shimadzu Corp
Publication of CN113825990A publication Critical patent/CN113825990A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/70—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light mechanically excited, e.g. triboluminescence

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
CN202080035888.6A 2019-05-13 2020-04-06 应力发光测定装置、应力发光测定方法和应力发光测定系统 Pending CN113825990A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019090599 2019-05-13
JP2019-090599 2019-05-13
PCT/JP2020/015557 WO2020230473A1 (ja) 2019-05-13 2020-04-06 応力発光測定装置、応力発光測定方法および応力発光測定システム

Publications (1)

Publication Number Publication Date
CN113825990A true CN113825990A (zh) 2021-12-21

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CN202080035888.6A Pending CN113825990A (zh) 2019-05-13 2020-04-06 应力发光测定装置、应力发光测定方法和应力发光测定系统

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JP (1) JPWO2020230473A1 (https=)
CN (1) CN113825990A (https=)
WO (1) WO2020230473A1 (https=)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015075477A (ja) * 2013-10-11 2015-04-20 独立行政法人産業技術総合研究所 応力発光評価装置並びに応力発光評価方法
CN105403583A (zh) * 2014-09-09 2016-03-16 日本株式会社日立高新技术科学 荧光x射线分析装置以及其测定位置调整方法
CN105865673A (zh) * 2016-04-09 2016-08-17 南昌航空大学 一种单光谱实现多点应力分布监测的方法
CN207395678U (zh) * 2016-09-20 2018-05-22 日本电产东测有限公司 三维形状测定装置
CN108732179A (zh) * 2017-04-14 2018-11-02 中国科学院城市环境研究所 一套无线智能应力发光结构健康监测系统
JP2019002702A (ja) * 2017-06-12 2019-01-10 株式会社トヨタプロダクションエンジニアリング 歪み量算出装置、歪み量算出方法及び歪み量算出プログラム
JP6470864B1 (ja) * 2018-08-31 2019-02-13 株式会社トヨタプロダクションエンジニアリング 応力発光計測装置及び応力発光計測方法
JP2019039743A (ja) * 2017-08-24 2019-03-14 ユアサシステム機器株式会社 変形試験器

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003253261A (ja) * 2001-12-28 2003-09-10 Sony Corp 蛍光性物質、複合材料、コート材料、塗料、インク、人工皮膚、人工皮膚の接触情報処理方法、人工発光皮膚、人工発光毛髪、発光素子、電子装置、発光システム、表示システム、フレキシブル発光材料、超音波発光性物質、交通標識、発光方法、複合材料の製造方法および発光素子の製造方法
JP5234546B2 (ja) * 2009-02-20 2013-07-10 独立行政法人産業技術総合研究所 応力発光解析装置、応力発光解析方法、応力発光解析プログラムおよび記録媒体
US9964493B2 (en) * 2013-09-10 2018-05-08 The University Of Akron Mechanoluminescence paint sensor for stress and crack visualizations

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015075477A (ja) * 2013-10-11 2015-04-20 独立行政法人産業技術総合研究所 応力発光評価装置並びに応力発光評価方法
CN105403583A (zh) * 2014-09-09 2016-03-16 日本株式会社日立高新技术科学 荧光x射线分析装置以及其测定位置调整方法
CN105865673A (zh) * 2016-04-09 2016-08-17 南昌航空大学 一种单光谱实现多点应力分布监测的方法
CN207395678U (zh) * 2016-09-20 2018-05-22 日本电产东测有限公司 三维形状测定装置
CN108732179A (zh) * 2017-04-14 2018-11-02 中国科学院城市环境研究所 一套无线智能应力发光结构健康监测系统
JP2019002702A (ja) * 2017-06-12 2019-01-10 株式会社トヨタプロダクションエンジニアリング 歪み量算出装置、歪み量算出方法及び歪み量算出プログラム
JP2019039743A (ja) * 2017-08-24 2019-03-14 ユアサシステム機器株式会社 変形試験器
JP6470864B1 (ja) * 2018-08-31 2019-02-13 株式会社トヨタプロダクションエンジニアリング 応力発光計測装置及び応力発光計測方法

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WO2020230473A1 (ja) 2020-11-19

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