CN113436956B - 电极、干蚀刻设备和制造电极的方法 - Google Patents
电极、干蚀刻设备和制造电极的方法 Download PDFInfo
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- CN113436956B CN113436956B CN202110984975.2A CN202110984975A CN113436956B CN 113436956 B CN113436956 B CN 113436956B CN 202110984975 A CN202110984975 A CN 202110984975A CN 113436956 B CN113436956 B CN 113436956B
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- 238000001312 dry etching Methods 0.000 title claims abstract description 15
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 8
- 239000000758 substrate Substances 0.000 claims abstract description 61
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 59
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 59
- 239000000919 ceramic Substances 0.000 claims abstract description 8
- 238000000034 method Methods 0.000 claims description 15
- 238000005530 etching Methods 0.000 claims description 14
- 230000013011 mating Effects 0.000 claims description 6
- 239000011148 porous material Substances 0.000 claims description 4
- 238000005488 sandblasting Methods 0.000 claims description 3
- 238000007751 thermal spraying Methods 0.000 claims 4
- 239000007789 gas Substances 0.000 description 37
- 239000010410 layer Substances 0.000 description 29
- 238000002347 injection Methods 0.000 description 8
- 239000007924 injection Substances 0.000 description 8
- 230000008569 process Effects 0.000 description 7
- 230000006378 damage Effects 0.000 description 6
- 238000010292 electrical insulation Methods 0.000 description 6
- 239000011521 glass Substances 0.000 description 6
- 238000009413 insulation Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000005507 spraying Methods 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 239000011247 coating layer Substances 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000002035 prolonged effect Effects 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 238000002048 anodisation reaction Methods 0.000 description 1
- 238000005422 blasting Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- 238000011900 installation process Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002028 premature Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/3255—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32559—Protection means, e.g. coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/3174—Etching microareas
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
Abstract
Description
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202110984975.2A CN113436956B (zh) | 2021-08-26 | 2021-08-26 | 电极、干蚀刻设备和制造电极的方法 |
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CN202110984975.2A CN113436956B (zh) | 2021-08-26 | 2021-08-26 | 电极、干蚀刻设备和制造电极的方法 |
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Publication Number | Publication Date |
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CN113436956A CN113436956A (zh) | 2021-09-24 |
CN113436956B true CN113436956B (zh) | 2022-02-25 |
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CN202110984975.2A Active CN113436956B (zh) | 2021-08-26 | 2021-08-26 | 电极、干蚀刻设备和制造电极的方法 |
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Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102290312A (zh) * | 2011-09-26 | 2011-12-21 | 中国科学院微电子研究所 | 一种平板电极固定结构 |
CN102779715A (zh) * | 2011-05-10 | 2012-11-14 | 东京毅力科创株式会社 | 等离子体生成用电极和等离子体处理装置 |
CN103794460A (zh) * | 2012-10-29 | 2014-05-14 | 中微半导体设备(上海)有限公司 | 用于半导体装置性能改善的涂层 |
CN107546092A (zh) * | 2016-06-28 | 2018-01-05 | 周业投资股份有限公司 | 上电极装置 |
CN110120329A (zh) * | 2018-02-05 | 2019-08-13 | 株式会社日立高新技术 | 等离子体处理装置 |
CN209708939U (zh) * | 2019-06-25 | 2019-11-29 | 重庆臻宝实业有限公司 | 蚀刻用上部电极 |
CN111696906A (zh) * | 2019-03-12 | 2020-09-22 | 新光电气工业株式会社 | 基板固定装置 |
CN211980557U (zh) * | 2020-04-22 | 2020-11-20 | 周业投资股份有限公司 | 上电极装置 |
CN211980558U (zh) * | 2020-04-22 | 2020-11-20 | 周业投资股份有限公司 | 上电极装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102619877B1 (ko) * | 2019-09-11 | 2024-01-03 | 삼성전자주식회사 | 기판 처리 장치 |
-
2021
- 2021-08-26 CN CN202110984975.2A patent/CN113436956B/zh active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102779715A (zh) * | 2011-05-10 | 2012-11-14 | 东京毅力科创株式会社 | 等离子体生成用电极和等离子体处理装置 |
CN102290312A (zh) * | 2011-09-26 | 2011-12-21 | 中国科学院微电子研究所 | 一种平板电极固定结构 |
CN103794460A (zh) * | 2012-10-29 | 2014-05-14 | 中微半导体设备(上海)有限公司 | 用于半导体装置性能改善的涂层 |
CN107546092A (zh) * | 2016-06-28 | 2018-01-05 | 周业投资股份有限公司 | 上电极装置 |
CN110120329A (zh) * | 2018-02-05 | 2019-08-13 | 株式会社日立高新技术 | 等离子体处理装置 |
CN111696906A (zh) * | 2019-03-12 | 2020-09-22 | 新光电气工业株式会社 | 基板固定装置 |
CN209708939U (zh) * | 2019-06-25 | 2019-11-29 | 重庆臻宝实业有限公司 | 蚀刻用上部电极 |
CN211980557U (zh) * | 2020-04-22 | 2020-11-20 | 周业投资股份有限公司 | 上电极装置 |
CN211980558U (zh) * | 2020-04-22 | 2020-11-20 | 周业投资股份有限公司 | 上电极装置 |
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CN113436956A (zh) | 2021-09-24 |
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Address after: 430073 No. 03, floor 5, unit 2, building 3, SBI Chuangye street, Dongxin Road, Donghu New Technology Development Zone, Wuhan City, Hubei Province (Wuhan area of free trade zone) Patentee after: Hubei canrui Photoelectric Technology Co.,Ltd. Patentee after: Hefei Weirui Technology Co.,Ltd. Address before: 430073 No. 03, floor 5, unit 2, building 3, SBI Chuangye street, Dongxin Road, Donghu New Technology Development Zone, Wuhan City, Hubei Province (Wuhan area of free trade zone) Patentee before: Hubei canrui Photoelectric Technology Co.,Ltd. Patentee before: HEFEI WEIRUI OPTOELECTRONIC TECHNOLOGY CO.,LTD. |
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Effective date of registration: 20240306 Address after: 230000 No. 1766, Jiudingshan Road, Xinzhan District, Hefei City, Anhui Province Patentee after: Hefei Weirui Technology Co.,Ltd. Country or region after: China Address before: 430073 No. 03, floor 5, unit 2, building 3, SBI Chuangye street, Dongxin Road, Donghu New Technology Development Zone, Wuhan City, Hubei Province (Wuhan area of free trade zone) Patentee before: Hubei canrui Photoelectric Technology Co.,Ltd. Country or region before: China Patentee before: Hefei Weirui Technology Co.,Ltd. |
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