CN112420543A - 一种晶圆自动检测线 - Google Patents
一种晶圆自动检测线 Download PDFInfo
- Publication number
- CN112420543A CN112420543A CN202110085089.6A CN202110085089A CN112420543A CN 112420543 A CN112420543 A CN 112420543A CN 202110085089 A CN202110085089 A CN 202110085089A CN 112420543 A CN112420543 A CN 112420543A
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- Prior art keywords
- wafer
- detection
- fixed mounting
- placing
- cylinder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000001514 detection method Methods 0.000 title claims abstract description 138
- 239000000463 material Substances 0.000 claims abstract description 118
- 238000012546 transfer Methods 0.000 claims abstract description 71
- 238000012360 testing method Methods 0.000 claims abstract description 37
- 238000007599 discharging Methods 0.000 claims abstract description 20
- 238000007664 blowing Methods 0.000 claims abstract description 7
- 235000012431 wafers Nutrition 0.000 claims description 247
- 239000000872 buffer Substances 0.000 claims description 23
- 238000007689 inspection Methods 0.000 claims description 22
- 230000007246 mechanism Effects 0.000 claims description 13
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- 238000000034 method Methods 0.000 abstract description 15
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- 230000008859 change Effects 0.000 description 2
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Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110085089.6A CN112420543B (zh) | 2021-01-22 | 2021-01-22 | 一种晶圆自动检测线 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110085089.6A CN112420543B (zh) | 2021-01-22 | 2021-01-22 | 一种晶圆自动检测线 |
Publications (2)
Publication Number | Publication Date |
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CN112420543A true CN112420543A (zh) | 2021-02-26 |
CN112420543B CN112420543B (zh) | 2021-04-16 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN202110085089.6A Active CN112420543B (zh) | 2021-01-22 | 2021-01-22 | 一种晶圆自动检测线 |
Country Status (1)
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CN (1) | CN112420543B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114713510A (zh) * | 2022-06-10 | 2022-07-08 | 成都泰美克晶体技术有限公司 | 晶圆自动分类设备 |
CN115156083A (zh) * | 2022-06-30 | 2022-10-11 | 缪云 | 单晶硅片分选装置及方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20170345680A1 (en) * | 2016-05-27 | 2017-11-30 | Semes Co., Ltd. | Transfer unit, and apparatus and method for treating substrate |
CN207282471U (zh) * | 2017-09-13 | 2018-04-27 | 深圳市矽电半导体设备有限公司 | 一种晶圆检测设备的扩晶环转送装置 |
CN208086781U (zh) * | 2018-01-31 | 2018-11-13 | 深圳市矽电半导体设备有限公司 | 一种自动上下料系统 |
CN110223931A (zh) * | 2019-06-23 | 2019-09-10 | 广州蓝海智能装备有限公司 | 一种pl检测机及检测方法 |
US20200075380A1 (en) * | 2018-08-30 | 2020-03-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus and methods for determining wafer characters |
US20200081423A1 (en) * | 2018-03-20 | 2020-03-12 | Tokyo Electron Limited | Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same |
-
2021
- 2021-01-22 CN CN202110085089.6A patent/CN112420543B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20170345680A1 (en) * | 2016-05-27 | 2017-11-30 | Semes Co., Ltd. | Transfer unit, and apparatus and method for treating substrate |
CN207282471U (zh) * | 2017-09-13 | 2018-04-27 | 深圳市矽电半导体设备有限公司 | 一种晶圆检测设备的扩晶环转送装置 |
CN208086781U (zh) * | 2018-01-31 | 2018-11-13 | 深圳市矽电半导体设备有限公司 | 一种自动上下料系统 |
US20200081423A1 (en) * | 2018-03-20 | 2020-03-12 | Tokyo Electron Limited | Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same |
US20200075380A1 (en) * | 2018-08-30 | 2020-03-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus and methods for determining wafer characters |
CN110223931A (zh) * | 2019-06-23 | 2019-09-10 | 广州蓝海智能装备有限公司 | 一种pl检测机及检测方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114713510A (zh) * | 2022-06-10 | 2022-07-08 | 成都泰美克晶体技术有限公司 | 晶圆自动分类设备 |
CN115156083A (zh) * | 2022-06-30 | 2022-10-11 | 缪云 | 单晶硅片分选装置及方法 |
Also Published As
Publication number | Publication date |
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CN112420543B (zh) | 2021-04-16 |
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PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: 261000 west area of the third photoelectric Park, north of Yuqing street, west of Yinfeng Road, high tech Zone, Weifang City, Shandong Province Patentee after: Yuanxu Semiconductor Technology Co.,Ltd. Address before: 261000 west area of the third photoelectric Park, north of Yuqing street, west of Yinfeng Road, high tech Zone, Weifang City, Shandong Province Patentee before: SHANDONG NOVOSHINE OPTOELECTRONICS Co.,Ltd. |
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PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: An automatic wafer detection line Effective date of registration: 20220411 Granted publication date: 20210416 Pledgee: Weifang Jinma road sub branch of Bank of Weifang Co.,Ltd. Pledgor: Yuanxu Semiconductor Technology Co.,Ltd. Registration number: Y2022980004083 |
|
PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Granted publication date: 20210416 Pledgee: Weifang Jinma road sub branch of Bank of Weifang Co.,Ltd. Pledgor: Yuanxu Semiconductor Technology Co.,Ltd. Registration number: Y2022980004083 |